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fastscan

Catalog Datasheet MFG & Type PDF Document Tags

HG71G

Abstract: HG73C Scan,Module test,B/S) FastScan(M) Test Compiler (S) Silicon Ensemble (C) Verilog-XL (C) VCS , Silicon Ensemble Cadence Novas FastScan (v8.6_4.5) Debussy (4.3
Hitachi Semiconductor
Original
HG71G HG76C HG73C LSI12 ieee1149.1 0D001 HP-UX10 E8000SE10AE20 E8000S

Celaro

Abstract: TC240 Synopsys ATPG JTAG Mentor Graphics DFTAdvisor FastScan ATPG JTAG , TetraMAX DFTAdvisor / FastScan PowerTheater Power Compiler , Mentor Mentor Graphics Seamless XRAY DFTAdvisor FastScan ModelSim CelaroMentor Graphics
Toshiba
Original
Celaro TC240 green hills compiler fastscan G7M datasheet tc160 BCJ0011D BCJ0011C 1TC300CTC280C 2TC300C

rxfe

Abstract: 10gbps serdes (Fastscan) GDSII Encrypted Spice Netlist Datasheet and Specifications Application Notes ASIC/SOC
Prism Circuits
Original
rxfe 10gbps serdes Prism Circuits 160GB 8B/10B

astro tool

Abstract: Mentor EDA Design Tool Support EDA Vendor Synopsys Mentor Graphics Cadence Software Package DesignCompiler PowerCompiler DFTCompiler TetraMax VHDLCompiler HDLCompiler PrimeTime VCS * VCS-MX * / Scirocco * Formality Astro Pro StarRC-XT ModelSim * Leonardo Spectrum 3 QuickFault DesignArchitect FastScan * Verilog-XL * Conformal / Verplex Encounter * Dracula Purpose Logic Synthesis Power Synthesis / Analysis Test Circuitry Synthesis ATPG Read VHDL Designs Read Verilog Designs Sign-off
Aeroflex
Original
astro tool Mentor AEROFLEX Software in VHDL Simulation

MCP8245

Abstract: MPC8245 debug address mode. None. Y Reduced FastScan test coverage In debug address mode, the , address signal. FastScan test patterns cannot be relied on to screen the part on the factory tester , FastScan testing resulting in the total test coverage being reduced to 25% coverage. 1.1 None, do , non-participating agent. 7 Error No. 1: Reduced FastScan test coverage Detailed Description: The COP scan chain contains defects. The COP scan chain must be disabled for FastScan testing resulting in the total
Motorola
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MPC8241 MPC8245 MCP8245 AN2164 MPC8240 MPC8245CE/D MPC8245/MPC8241

z80 vhdl

Abstract: TOSHIBA TC160 TetraMAX DFTAdvisor / FastScan PowerTheater Power Compiler , Mentor Mentor Graphics Seamless XRAY DFTAdvisor FastScan ModelSim CelaroMentor Graphics
Toshiba
Original
TC280 TC190 USBIEEE1394 z80 vhdl TOSHIBA TC160 PLL in RTL TOSHIBA TC203 tc260c TC320 TC300 TC260 TC200 TC203
Abstract: Mentor Design Flow Schematics Schematics Composer Verilog/VHDL PMG Models PMG SystemBuilder QuickSim or QuickSim Pro or ModelSim Behavioural Simulation DFT Advisor DFT Insight Synopsys Design Compiler Synthesis, Optimization and scan insertion Synopsys Test Compiler SST Velocity Static Timing Analysis DFT Advisor + FastScan ATPG or FlexTest QuickGrade II + TPV + DFT Insight Test Pattern Verification Mitel MLE and/or Layout Mitel Semiconductor
Original

Gate level simulation without timing

Abstract: Verilog Design Flow Composer Schematics Schematics Verilog SystemBuilder PMG PMG PMG models Megacells RAM/ROM models Any Verilog Compliant simulator Behavioural Simulation Synopsys Design Compiler Synthesis and Optimization Mitel UDC + Any Verilog Compliant simulator Full timing gate level pre-layout simulation Synopsys Test Compiler or Mentor Fastscan or Flextest Synopsys TestGen Scan overlay & ATPG Mitel TPV + Cadence Verifault Test Pattern
Mitel Semiconductor
Original
Gate level simulation without timing
Abstract: VITAL Design Flow Composer Schematics Schematics VHDL SystemBuilder PMG PMG PMG models Megacells RAM/ROM models Any VHDL / VITAL Compliant simulator Behavioural Simulation Synopsys Design Compiler Synthesis and Optimization Mitel UDC + Any VHDL / VITAL Compliant simulator Full timing gate level pre-layout simulation Synopsys Test Compiler or Mentor Fastscan or Scan overlay & ATPG Synopsys TestGen Mitel TPV + Cadence Verifault Test Pattern Verification Mitel Semiconductor
Original

ICX 061

Abstract: ICX-061 High Performance Digital CCD Camera C7300-10 DATA SHEET SPECTRAL RESPONSE CHARACTERISTICS 60 Quantum efficiency (%) 50 40 30 20 10 0 400 600 800 Wavelength (nm) v Naturally air-cooled (compact) head 1000 * This is typical, not guaranteed. This is a high-resolution, high-sensitivity digital CCD camera that achieves a frame rate of 13 Hz (1280 × 1024 pixels) using a 20 MHz / pixel fast-scan clock. A partial scan function allows the user to select only a
Hamamatsu Photonics
Original
ICX 061 ICX-061 CCD ICX ICX061 interline C7300 C7300-10-12 D-82211 SE-171-41 SICS1066E06 MAR/2002

SCR-7204

Abstract: ARX-5000 spectrum display units, IF-to-tape converters and other ancillary equipment. B The SCR-2725 FastSCAN High
-
OCR Scan
ARX-5000 SCP-2960 SCR-2900DF SCR-7204 RT-0518SW RT-0518SV esm elint 5101-A1 5101-B1 RDU-2960

tdc 310

Abstract: HP9000 Fastscan V-System Design capture Simulation Simulation Timing analysis Fault grading Design
-
Original
RS6000 tdc 310 HP9000 tpl 624 MG113P/114P/115P/73P/74P/75P MG113P/73P MG114P/74P MG115P/75P HP9000/7

O4N10

Abstract: 54XX processes. Design analysis tools include : DESIGN ANALYSIS TOOL FastScan ®/ FlexTest ® / Test , , FastScan, FlexTest and DFT Advisor a re registered trademarks of Mentor Graphics Corporation Sun is a
UTMC Microelectronic Systems
Original
O4N10 54XX 80C31 UTR100 UTR25 UTR35 0E-10 MIL-PRF-38535 800-MIL-UTMC UTR-1-11-96

80C196 users manual

Abstract: IC5050 CompilerTM Viewlogic VantageTM FastScan / Flextest / DFTAdvisor® Test Compiler PlusTM Any , , FastScan, FlexTest and DFT Advisor are registered trademarks of Mentor Graphics Corporation Sun is a
UTMC Microelectronic Systems
Original
80C196 users manual IC5050 UTMC Gate Array 1553 VHDL 80C196 UT100

ARM dual port SRAM compiler

Abstract: synopsys dc ultra Insertion Synopsys TestGen, Synopsys TestComand ATPG piler, Synopsys TetraMax, Mentor Fastscan Static
Samsung Electronics
Original
STD130 ARM dual port SRAM compiler synopsys dc ultra DSPG rm2510 16C450 16C550 ARM920T/ARM940T

5962-96B02

Abstract: fpga radiation processes. Design analysis tools include: DESIGN ANALYSIS TOOL FastScan ®/ FlexTest® / Test , Graphics, AutoLogic II, QuickSim II, QuickFault III, QuickVHDL, QuickGrade II, FastScan, FlexTest and DFT
Aeroflex UTMC
Original
5962-96B02 fpga radiation 64KPROM-2-6-96

O4N10

Abstract: intel 80C31 . Design analysis tools include: DESIGN ANALYSIS TOOL FastScan ®/ FlexTest® / DFT Advisor® Test , , FastScan, FlexTest and DFT Advisor are registered trademarks of Mentor Graphics Corporation Sun is a
UTMC Microelectronic Systems
Original
intel 80C31 Micromaster UTR50 UTR75 MIL-STD-883

2500k

Abstract: leon3 . 5 Mentor Graphics - ModelSim - FastScan Synopsys - Design Compiler (with Power Compiler) - , , Mentor Graphics, AutoLogic II, QuickSim II, QuickFault II, QuickHDL, QuickGrade II, FastScan, FlexTest
Aeroflex
Original
2500k leon3 MIL-STD-1553 vhdl hp 530 xilinx series 7 seu stub 25HBD

tsmc 130nm metal process

Abstract: teradyne tiger AEROFLEX Aeroflex supports libraries for: · Mentor Graphics - ModelSim - Tessent FastScan - Tessent , °C. Intel is a registered trademark of Intel Corporation Mentor, Mentor Graphics, FastScan, FlexTest and
Aeroflex
Original
tsmc 130nm metal process teradyne tiger aeroflex sram edac charactristics of cmos logic gates CCGA 472 teradyne flex tester UT130

ARM dual port SRAM compiler

Abstract: designware i2c Systems, Inc. Design Architect, DFTAdvisor, FastScan, Falcon Framework, FlexTest, MentorGraphics , FastScan, FlexText, DFT Advisor, LogicVision MEMBIST Fault grading Cadence Verifault Evaluation
Texas Instruments
Original
designware i2c verilog code voltage regulator NEC-V850 LogicVision ARM10 ARM946 SRST143
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