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Part Manufacturer Description Datasheet BUY
HA5351IB Intersil Corporation SAMPLE AND HOLD AMPLIFIER, 0.09us ACQUISITION TIME, PDSO8 visit Intersil
HA9P5320-5 Intersil Corporation SAMPLE AND HOLD AMPLIFIER, 1us ACQUISITION TIME, PDSO16 visit Intersil
HA1-2425-5 Intersil Corporation SAMPLE AND HOLD AMPLIFIER, 3.2us ACQUISITION TIME, CDIP14 visit Intersil
5962-87677012A Intersil Corporation SAMPLE AND HOLD AMPLIFIER, CQCC20, CERAMIC, QCC-20 visit Intersil
HA1-5330-2 Intersil Corporation SAMPLE AND HOLD AMPLIFIER, 0.65us ACQUISITION TIME, CDIP14 visit Intersil
HA3-5330-5 Intersil Corporation SAMPLE AND HOLD AMPLIFIER, 0.65us ACQUISITION TIME, PDIP14 visit Intersil

defect ppm sampling resistor

Catalog Datasheet MFG & Type PDF Document Tags

defect ppm sampling resistor

Abstract: B 472G Resistor Networks SIP Series page 1/3 INSTRUCTION Thick film resistor networks have metal glaze , n/2+2 Resistor Networks SIP Series page 2/3 CHARACTERISTICS 1. POWER RATING: SERIES , mechanical defect. Visual Size Within specification Calipers 3. ELECTRICAL CHARACTERISTICS ITEM REQUIREMENT TEST METHODS Temperature Coefficient (ppm/ â"ƒ) R< 50Ω TCR( PPM/â"ƒ ) = ±250 PPM/â"ƒ 50Ω≦R< 2.2MΩ, ±100 PPM/â"ƒ R≧ 2.2MΩ ±250 PPM/â"ƒ Insulation Resistance Short-Time
Hitano Enterprise
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a 472g

Abstract: a472g Resistor Networks SIP Series page 1/3 INSTRUCTION Thick film resistor networks have metal glaze , R1 2 3 4 n/2+2 0.50 2.54 Resistor Networks SIP Series page 2/3 CHARACTERISTICS , for 2 times No mechanical damage. No mechanical defect. Visual Size Within specification R , . ELECTRICAL CHARACTERISTICS ITEM REQUIREMENT TEST METHODS Temperature Coefficient (ppm/ ) R < 50 TCR( PPM/ ) = ±250 PPM/ 50 R < 2.2M, ±100 PPM/ R 2.2M ±250 PPM/ Short-Time Overload R ±
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Abstract: specified accuracy â'¢ Choice of sampling or analog true rms techniques â'¢ 100 ppm best accuracy dc , 3458Aâ'™s precision sampling technique offers extraordinary accuracy. With 100 ppm absolute accuracy for , resolution â'¢ Up to 100,000 readings/sec (4.5 digits) â'¢ Maximum sensitivity: 10 nV â'¢ 0.6 ppm 24 hour accuracy â'¢ 8 ppm (4 ppm optional)/year voltage reference stability â'¢ â'¢ â'¢ â'¢ â'¢ 2 , readings/sec (5.5 digits) Maximum sensitivity: 10 µâ"¦ 2.2 ppm 24 hour accuracy ac volts â'¢ 6 Agilent Technologies
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3458a Multimeter service manual

Abstract: IEEE-4888 to specified accuracy · Choice of sampling or analog true rms techniques · 100 ppm best accuracy dc , 's precision sampling technique offers extraordinary accuracy. With 100 ppm absolute accuracy for 45 Hz to 1 , readings/sec (4.5 digits) · Maximum sensitivity: 10 nV · 0.6 ppm 24 hour accuracy · 8 ppm (4 ppm optional , compensation Up to 50,000 readings/sec (5.5 digits) Maximum sensitivity: 10 µ 2.2 ppm 24 hour accuracy ac , ppm 24 hour accuracy ac current 5 ranges: 100 µA to 1 A 10 Hz to 100 kHz bandwidth Up to 50 readings
Agilent Technologies
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RCR07 resistor

Abstract: RCR05 Resistor with 4.6.1.2.2 and EIA-554. Individual PPN defect level (I.e., PPM-2 and PPM-3) and an overall PPM , the group A Inspections. The defect level for PPM-2 shall be less than 100 PPM. The implementation of , movfng qnd an overall PPM defect level PPM-2 and PPM-3) Individual PPM categories (f.e. (f.e., PPM-5). , -3) and overall PPM ? PPN defect defect rate (PPM.5). This information shall be submlttod on q detafl q , Procedures. Faflure rate Sampling Plans Relfabilfty Assurance Program for Electronic Parts $pecfffcations.
Rockwell Automation
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MIL-R-39008B RCR07 resistor RCR05 Resistor RCR05 RCR07 rcr42 RCr20 resistors 41L-R-39008C FM30RESS 239-Z340

max11049

Abstract: MAX11047 parameters guaranteed by the Datasheet. 0.1% For all Visual Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI. Reliability Evaluation A. Accelerated Life Test , (T/H) and SAR circuitry, these parts provide simultaneous sampling at 250ksps for each channel. The , providing overrange protection with a simple external resistor. Other features include a 4MHz T/H input
Maxim Integrated Products
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MAX11047 max11049 MAX11048 MAX11047ETN MAX11047/MAX11048/MAX11049 MAX11057/MAX11058/MAX11059 THZYFU002O AC80-1

3458A

Abstract: IEEE-728 ,000 readings/sec (4.5 digits) · Maximum sensitivity: 10 nV · 0.6 ppm 24 hour accuracy · 8 ppm (4 ppm optional) / year voltage reference stability Ohms · 9 ranges: 10 to 1G · Two-wire and , : 10µ · 2.2 ppm 24 hour accuracy 2 ac Volts · 6 ranges: 10 mV to 1000 V · 1 Hz to 10 MHz bandwidth · Up to 50 readings/sec with all readings to specified accuracy · Choice of sampling or analog true rms techniques · 100 ppm best accuracy dc Current · 8 ranges: 100 nA to 1 A · Up to 1,350
Agilent Technologies
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3458A IEEE-728 Multimeter calibration manual 50623 IEEE-4888 11174A 5965-4971E

EIA-554-1

Abstract: rwr70 requirements. RWR71 1/ +650 ppm +400 ppm ±50 ppm ±20 ppm RWR74 1/ +650 ppm +400 ppm ±50 ppm ±20 ppm RWR78 RWR80 RWR81 RWR84 RWR89 RWR82 +650 ppm +400 ppm ±50 ppm ±20 ppm +650 ppm +400 ppm ±50 ppm ±20 ppm +650 ppm +400 ppm ±50 ppm ±20 ppm +650 ppm +400 ppm ±50 ppm ±20 ppm +650 ppm +400 ppm ±50 ppm ±20 ppm +650 ppm +400 ppm ±50 ppm ±20 ppm , and Electrical Component Parts, Test Methods for . Failure Rate Sampling Plans and Procedures
DEPARTMENT OF DEFENSE
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MIL-PRF-39007J EIA-554-1 rwr70 EIA-557 MIL-STD-1285 MIL-STD-690 MIL-R-39007H

sot23 theta jc value

Abstract: Theta JB by the Datasheet. 0.1% For all Visual Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI. Reliability Evaluation A. Accelerated Life Test The results of the , , such as volume control and fading/balancing audio signals. The MAX5407 consists of a resistor string , transitions. This device has nominal resistor temperature coefficients of 35ppm/°C end-to-end and 5ppm/°C
Maxim Integrated Products
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sot23 theta jc value Theta JB potentiometer mttf MAX5407EKA I1U0BQ001D N1U0BQ001D
Abstract: Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI , an external resistor, these devices offer a supply current that is virtually independent of the supply voltage (8µA/V variation) and do not require an external resistor. Additionally, the internally Maxim Integrated Products
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MAX6164 MAX6164AESA MAX6161-MAX6168 SXE5AQ002D RF44-5

MAX14566E

Abstract: Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI , Charging Specification Revision 1.1 including data contact detection and a set resistor bias for , chargers with shorted DP/DM detection and to provide support for Apple-compliant devices using a resistor
Maxim Integrated Products
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MAX14566E MAX14566EETA MAX14566E/MAX14566AE/MAX14566BE MAX14566AE JESD22-A114 TL9ZCQ001L
Abstract: Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI , resistor string uses its own analog supplies (VDD and VSS) that require V DD - VSS to be greater than 9V , ratio-metric resistor temperature coefficients, a 3-wire SPI(tm)/QSPI(tm)/MICROWIRE(tm)-compatible serial Maxim Integrated Products
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MAX5436 MAX5436EUB MAX5436-MAX5439 NAJ0BA006A NAJ1B3017C
Abstract: Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI , resistor string uses its own analog supplies (VDD and VSS) that require V DD - VSS to be greater than 9V , ratio-metric resistor temperature coefficients, a 3-wire SPI(tm)/QSPI(tm)/MICROWIRE(tm)-compatible serial Maxim Integrated Products
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MAX5438 MAX5438EUB NAJ1BA006B DP14-1 NAJ1B4013C

LMP8601

Abstract: Q100 enhanced manufacturing and support processes for the automotive market, including defect detection , mA AV Total Gain 19.9 20 20.1 V/V -2.7 ±20 ppm/°C Gain Drift (Note 14 , (Note 14) RF-INT Output Impedance Filter Resistor TCRF-INT Output Impedance Filter Resistor , 3.25 k ppm/°C mV V Parameter Conditions Min Typ Max (Note 6) (Note 5) (Note 6 , AV Total Gain (Note 14) 19.9 1.1 1.5 mA 20 20.1 V/V -2.8 ±20 ppm/°C
National Semiconductor
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LMP8601 LMP8601Q Q100 AEC-Q100 LMP8601MA LMP8601MAX LMP8601/LMP8601Q
Abstract: Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI , an external resistor, these devices offer a supply current that is virtually independent of the supply voltage (8µA/V variation) and do not require an external resistor. Additionally, the internally Maxim Integrated Products
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MAX6163 MAX6163AESA I5HDAQ001C RF24-3 I5HABQ002B
Abstract: , including defect detection methodologies. Reliability qualification is compliant with the requirements and , 80 250 500 295 590 ±0.15 96 94 85 27 10.05 101 ±50 10 350 700 ±1 k k mV dB dB V V/V k ppm/°C mV V DC , Noise mA V/V ppm/°C V/s kHz mV V/°C VP-P nV/Hz dB % DC CMRR DC Common Mode Rejection Ratio AC CMRR AC , Gain (Note 14) Output Impedance Filter Resistor Output Impedance Filter Resistor Drift A1 Output , Resistor Output Impedance Filter Resistor Drift A1 Ouput Voltage Swing 250 165 500 300 295 193 590 386 National Semiconductor
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Abstract: Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI , Charging Specification Revision 1.1 including data contact detection and a set resistor bias for , with shorted DP/DM detection and to provide support for Apple-compliant devices using a resistor bias Maxim Integrated Products
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MAX14566BE MAX14566BEETA TL9XAQ001E AL07-2 JESD78

LMP8601Q

Abstract: rcm 083 enhanced manufacturing and support processes for the automotive market, including defect detection , mA AV Total Gain 19.9 20 20.1 V/V -2.7 ±20 ppm/°C Gain Drift (Note 14 , (Note 14) RF-INT Output Impedance Filter Resistor TCRF-INT Output Impedance Filter Resistor , 3.25 k ppm/°C mV V Parameter Conditions Min Typ Max (Note 6) (Note 5) (Note 6 , AV Total Gain (Note 14) 19.9 1.1 1.5 mA 20 20.1 V/V -2.8 ±20 ppm/°C
National Semiconductor
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rcm 083

ISO STANDARDS SHEET METAL THINNING

Abstract: MIL-STD-883H sampling techniques are not practical here because of the large sample size that would be required. The wafer sampling requirements defined in table I, taken in conjunction with specific dice locations within , process drop in. 3.1.1 Sampling conditions. This sampling condition applies to devices which have , or more other wafers on a wafer lot acceptance basis), one of the following sampling conditions may be used at the manufacturer's option: 3.1.1.2.1 Sampling quadrants. Immediately following the
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MIL-STD-883H ISO STANDARDS SHEET METAL THINNING Ultrasonic Cleaning Transducer IPC-4101-92 MIL-T-27730 SEM 2006

MAX15038

Abstract: parameters guaranteed by the Datasheet. 0.1% For all Visual Defects. C. Observed Outgoing Defect Rate: < 50 ppm D. Sampling Plan: Mil-Std-105D VI. Reliability Evaluation A. Accelerated Life Test , fixed-frequency PWM mode operation with a switching frequency range of 500kHz to 2MHz set by an external resistor
Maxim Integrated Products
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MAX15038 MAX15038ETG JESD22-A114-D C/150
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