Download

PDF Abstract Text:

CY7C122

256 x 4 Static RAM - RAM2.1

Qualification Report
December 1994 QTP 94261 Version 1.0
CY7C122
256 x 4 Static RAM - RAM2.1
PRODUCT DESCRIPTION (for qualification)
Information provided in this document is intended for generic qualification and technically describes the Cypress part supplied: Marketing Part #: Device Description: Cypress Division: Die Size (stepping): CY7C122 256 X 4 Static RAM, Separate I / O Cypress Semiconductor Y 7C122A Aug. / 1994 Now 57 mil x 120 mil What ID markings on Die:
Overall Die (or Mask) REV Level (pre-requisite for qualification): Cypress Qualification completion / Marketing Availability Dates (Current REV):
DIE / FAB DESCRIPTION
PLASTIC PACKAGE / ASSEMBLY DESCRIPTION
Name / Location of Assembly (prime) facility:
PAGE 3
CYPRESS SEMICONDUCTOR
HERMETIC PACKAGE / ASSEMBLY DESCRIPTION
Name / Location of Assembly (prime) facility:
PAGE 4
CYPRESS SEMICONDUCTOR
OTHER INFORMATION
ESD Voltage Rating (per MIL STD-008, Method 3018):
PAGE 5
CYPRESS SEMICONDUCTOR
PRODUCT INFORMATION FOR QUALIFICATION BY SIMILARITY
Product Family: Mfg Division: 1K Static RAM Cypress Bangkok, Thailand
Rated Pkg Size / Die Speed Type Revision / ID
Die Size mil x mil
Design Rule (µ) µ
Fabrication
Passivatio Mold n Type Compound
Assembly Line Location
ESD Volt Rating
Availability (mm / yy)
Process Line ID ID
CY9122
7C122A
Sumitomo
CY91L22
7C122A
Sumitomo
CY93422
7C122A
Sumitomo
CY93L422PC
"xx" replaces all speed grades for device. Options for 7C122 are 15ns, 25ns, 35ns, and 45ns Military grade starts at 25ns (xMB) for 7C122 AND 9122 and 35ns for 91L22, 93422, and 93L422.
PAGE 6
CYPRESS SEMICONDUCTOR
DEVICE RELIABILITY SUMMARY
Marketing Part: Pkg Description:
CY7C122 22-pin 400 mil PDIP 22-pin 400 mil CDIP
Wafer Fab: Assembly:
Fab 2 - Round Rock, TX Cypress Bangkok, Thailand
High Temperature Dynamic Operating Life Family Data1(HTOL, 5.75V, 150°C), Early Failure Rate Device CY7C185-PC CY7C185-PC CY7C185-PC Assy Lot# 219404141 219404140 219407517 Fab Lot # 2409204 2409204 2421297 48 Hours 0 / 510 0 / 977 0 / 3782 Cumulative 0 / 5269
High Temperature Dynamic Operating Life (HTOL, 5.75V, 150°C), Long Term Failrue Rate Device CY7C122-PC Assy Lot# 219407781 Fab Lot # 2419092 80 Hours 0 / 120 500 Hours 0 / 120 Cumulative 0 / 120
High Temperature Dynamic Operating Life Family Data2 (HTOL, 5.75V, 150°C), Long Term Failrue Rate Device CY7C199-PC CY7C199-PC CY7C199-PC CY7C199-PC Assy Lot# 49300989 903223 / 4 90909 91734 Fab Lot # 2315366 2233797 2238148 2239275 168 Hours 0 / 200 0 / 124 0 / 198 0 / 125 500 Hours 0 / 200 0 / 124 0 / 198 0 / 125 1000 Hours 0 / 200 0 / 124 0 / 198 0 / 125 Cumulative 0 / 647
High Temperature Dynamic Operating Life (HTOL, 5.75V, 150°C), Group C Device Assy Lot# Fab Lot # 2419092 184 Hours 0 / 80 Cumulative 0 / 80
CY7C122-DMB 219407433
64K SRAM, R21 Technology, QTP# 93133 256K SRAM, R21 Technology, Reliability Monitor #M33005, M33006, M24001, M32001.
PAGE 7
CYPRESS SEMICONDUCTOR
Temperature Cycle Family Data1 (Condition C, -65°C to 150°C)
Device CY7C185-PC
Assy Lot# 219404141
Fab Lot # 2409204
300 Cycles 0 / 45
1000 Cycles 0 / 45
Cumulative 0 / 45
PAGE 8
CYPRESS SEMICONDUCTOR
Device Reliability Summary