State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Diss

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State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Diss

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SN54ABT377, SN74ABT377 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE
State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Dissipation Latch-Up Performance Exceeds JEDEC Standard JESD-17 Typical VOLP (Output Ground Bounce) 25°C High-Drive Outputs 32-mA IOH, 64-mA Package Options Include Plastic Small-Outline (DW) Shrink Small-Outline (DB) Packages, Ceramic Chip Carriers (FK), Plastic Ceramic DIPs
SN54ABT377 PACKAGE SN74ABT377 PACKAGE (TOP VIEW)
CLKEN
description
ABT377 8-bit positive-edge-triggered D-type flip-flops with clock (CLK) input. They particularly suitable implementing buffer storage registers, shift registers, pattern generators. Data input information that meets setup time requirements transferred outputs positive-going edge clock pulse common clock-enable (CLKEN) input low. Clock triggering occurs particular voltage level directly related transition time positive-going pulse. When buffered clock (CLK) input either high level, input signal effect output. circuits designed prevent false clocking transitions CLKEN.
SN54ABT377 PACKAGE (TOP VIEW)
CLKEN
SN74ABT377 available TI's shrink small-outline package (DB), which provides same count functionality standard small-outline packages less than half printed-circuit-board area. SN54ABT377 characterized operation over full military temperature range 55°C 125°C. SN74ABT377 characterized operation from 40°C 85°C.
FUNCTION TABLE (each flip-flop) INPUTS CLKEN OUTPUT
EPIC-B trademark Texas Instruments Incorporated.
PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
POST OFFICE 655303
DALLAS, TEXAS 75265
Copyright 1994, Texas Instruments Incorporated
SN54ABT377, SN74ABT377 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE
logic symbol
This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12.
logic diagram (positive logic)
CLKEN
Seven Other Channels
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT377, SN74ABT377 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, Input voltage range, (see Note Voltage range applied output high state power-off state, Current into output state, SN54ABT377 SN74ABT377 Input clamp current, Output clamp current, Maximum power dissipation 55°C still air) (see Note package package package Storage temperature range 65°C 150°C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output negative-voltage ratings exceeded input output clamp-current ratings observed. maximum package power dissipation calculated using junction temperature 150°C board trace length mils, except package, which trace length zero. more information, refer Package Thermal Considerations application note 1994 Advanced BiCMOS Technology Data Book, literature number SCBD002B.
recommended operating conditions (see Note
SN54ABT377 Supply voltage High-level input voltage Low-level input voltage Input voltage High-level output current Low-level output current Input transition rise fall rate SN74ABT377 UNIT
Operating free-air temperature NOTE Unused floating inputs must held high low.
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT377, SN74ABT377 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER Ioff ICEX TEST CONDITIONS Outputs high Outputs Outputs high -100 0.55 0.55* ±100 -180 -180 0.55 0.55 ±100 -180 25°C -1.2 SN54ABT377 -1.2 SN74ABT377 -1.2 UNIT
input Other inputs
products compliant MIL-STD-883, Class this parameter does apply. typical values more than output should tested time, duration test should exceed second. This increase supply current each input that specified voltage level rather than GND.
timing requirements over recommended ranges supply voltage operating free-air temperature (unless otherwise noted) (see Figure
25°C fclock Clock frequency Pulse duration Setup time before Hold time after high Data high CLKEN high Data high CLKEN high SN54ABT377 SN74ABT377 UNIT
This data sheet limit vary among suppliers.
switching characteristics over recommended ranges supply voltage operating free-air temperature, (unless otherwise noted) (see Figure
PARAMETER fmax tPLH tPHL FROM (INPUT) (OUTPUT) 25°C SN54ABT377 SN74ABT377 UNIT
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT377, SN74ABT377 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE
PARAMETER MEASUREMENT INFORMATION
From Output Under Test (see Note Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Open
LOAD CIRCUIT OUTPUTS Timing Input Input VOLTAGE WAVEFORMS PULSE DURATION VOLTAGE WAVEFORMS SETUP HOLD TIMES Data Input
Input (see Note tPLH Output
tPHL tPHL tPLH
Output Control tPZL Output Waveform (see Note Output Waveform Open (see Note tPZH
tPLZ tPHZ
Output
VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING
NOTES: includes probe capacitance. input pulses supplied generators having following characteristics: MHz, Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. outputs measured time with transition measurement.
Figure Load Circuit Voltage Waveforms
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT377, SN74ABT377 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLOCK ENABLE
POST OFFICE 655303
DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments subsidiaries (TI) reserve right make changes their products discontinue product service without notice, advise customers obtain latest version relevant information verify, before placing orders, that information being relied current complete. products sold subject terms conditions sale supplied time order acknowledgement, including those pertaining warranty, patent infringement, limitation liability. warrants performance semiconductor products specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS INVOLVE POTENTIAL RISKS DEATH, PERSONAL INJURY, SEVERE PROPERTY ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). SEMICONDUCTOR PRODUCTS DESIGNED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. INCLUSION PRODUCTS SUCH APPLICATIONS UNDERSTOOD FULLY CUSTOMER'S RISK. order minimize risks associated with customer's applications, adequate design operating safeguards must provided customer minimize inherent procedural hazards. assumes liability applications assistance customer product design. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. TI's publication information regarding third party's products services does constitute TI's approval, warranty endorsement thereof.
Copyright 1998, Texas Instruments Incorporated

State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Diss

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