Order this document AN1556/D ARCHIVED FREESCALE SEMICONDUCTOR, IN
|
|
|
Top Searches for this datasheet
SEMICONDUCTOR APPLICATION NOTE
Order this document AN1556/D
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Designing Sensor Performance Specifications MCU-based Systems
Prepared Eric Jacobsen Jeff Baum Sensor Systems Engineering Group Motorola Sensor Products Division Phoenix,
AN1556
INTRODUCTION
Freescale Semiconductor, Inc.
When designing circuit sensor system, desirable fixed-value components design. This makes system easier cheaper produce high volume. alternatives using fixed-value circuitry very expensive usually impractical: laser-trimming resistances, manually calibrating potentiometers, measuring selecting specific component values very labor-intensive processes. However, every sensor device-to-device variations offset output voltage, full-scale output voltage, dynamic output voltage range (difference between full-scale output voltage zero-scale output voltage which commonly referred span), etc. Moreover, these same parameters also vary with temperature e.g., temperature coefficient offset (TCVoff) temperature coefficient full-scale span (TCVFSS). further complicate this situation, fixed-value circuit which sensor applied also variation e.g., voltage current regulator resistors have specified tolerance. Since today's unamplified solid-state sensors typically have output voltage order tens millivolts (Motorola's basic pressure sensor, MPX10, typical full-scale span when powered with supply), major part fixed-value circuitry gain stage that amplifies signal level that large enough additional processing. Typically, this additional processing digitization amplified analog sensor signal microcontroller's converter. obtain best signal resolution with A/D, sensor's amplified dynamic output voltage range should fill much window (difference between A/D's high reference voltages) possible without extending beyond high reference voltages (i.e., zero-pressure offset voltage must greater than equal reference voltage, full-scale output voltage must less than equal high reference voltage). case, device-to-device, temperature, circuit variations create design dilemma: with fixed-value amplifier circuit, gain well level shift incorporated amplifier design fixed. variation aforementioned sensor parameters large, amplified sensor output saturate amplifier near either high supply rail extend beyond either high reference voltages converter. either case, error (non-linearity) results
system. avoid this scenario, solution design fixed-value circuit that optimizes performance (signal resolution) while taking into account possible types variation that cause sensor output vary. other words, goal this fixed-value sensor system attain best performance possible while ensuring through design, regardless system variation, that sensor's amplified output will ALWAYS within saturation levels amplifier high reference voltages converter. implication ensuring that sensor's amplified output always unsaturated within high reference voltages that accurate software calibration sensor's output possible. sampling sensor's output voltage couple points room temperature (zero full-scale output, example), room temperature device-to-device circuit variations nullified. Obviously, temperature variations will create error system (sensor's output voltage will drift with changing temperature), but, design, sensor's output voltage will remain within A/D's valid range. This paper discusses methodology that optimizes sensor system's performance while considering device-to-device, temperature, circuit variations that create variation amplified sensor output. methodology starts with desired performance some established parameters then considers each type variation worst case analysis determine desired performance attainable. While this paper discusses this methodology pressure sensors specific amplifier topology, methodology applicable low-level, differential-voltage output sensors amplifier circuits general. specific examples presented that apply this methodology. first example uses Motorola's MPX10 pressure sensor, second example uses Motorola's MPX2010 pressure sensor. Both sensors have full-scale rated pressure kPa; difference between devices MPX2010 on-chip calibration temperature compensation circuitry calibrate temperature compensate zero-pressure offset voltage span. comparison these devices will emphasize dramatically device-to-device temperature variations, compensated, affect system's overall performance.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
©Motorola Sensor Device Data Motorola, Inc. 1996
More Information This Product, www.freescale.com
AN1556
EXAMPLE CIRCUIT
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
resistors that establish gain voltage level shift (VREF) considered methodology. voltage regulator's device-to-device tolerance each resistor's tolerance
Referring Figure both pressure sensors interfaced same amplifier circuit topology. Tables relevant characteristics MPX10 MPX2010 show device-to-device temperature variations. Additionally, tolerances voltage regulator
REG. RREF1 VREF RREF2
LM33272
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
MPX10 MPX2010
Figure MPX10/MPX2010 Circuit Schematic Table MPX10 Variation Characteristics
Characteristic Pressure Range Full-Scale Span Zero Pressure Offset Temperature Coefficient Full-Scale Span (see Note Temperature Coefficient Offset (see Note Symbol VFSS Voff TCVFSS TCVoff 0.22 0.19 0.16 Unit %/°C µV/°C
Note Slope end-point straight line full-scale span 40°C +125°C relative 25°C Note Slope end-point straight line zero pressure offset 40°C +125°C relative 25°C
Table MPX2010 Variation Characteristics
Characteristic Pressure Range Full-Scale Span Zero Pressure Offset Temperature Effect Full-Scale Span (see Note Temperature Effect Offset (see Note Note Maximum change full-scale span 85°C relative 25°C Note Maximum change offset 85°C relative 25°C Symbol VFSS Voff TCVFSS TCVoff 12.5 Unit %FSS
amplifier topology used two-operational amplifier gain stage that desirable characteristics differential-signal instrumentation amplifier: high input impedance output impedance differential single-ended conversion input signal high gain capability level shifting capability
good common mode rejection, following resistor ratios used: With this simplification, transfer function amplifier VREF
More Information This Product, www.freescale.com
Motorola Sensor Device Data
Where gain
differential output voltage quantity S-), positive voltage level shift, created voltage divider comprised RREF1 RREF2, VREF. addition using above resistor ratios preserve common mode rejection, effective resistance parallel combination RREF1 RREF2 should impedance ground relative resistance
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
pressure sensor's
AN1556
RESOLUTION FACTORS THAT AFFECT
Performance pressure sensor system directly related resolution. Resolution smallest increment pressure that system resolve e.g., system that measures pressure (full-scale) with resolution full-scale resolve pressure increments kPa. Similarly, resolution (smallest increment voltage) 8-bit converter with window high reference voltage reference voltage
limits linear output ranges op-amps converter, also accommodates complete distribution possible sensor spans? same question presented additional sources variation: device-to-device variation zero-pressure offset voltage temperature effects both sensor's span zero-pressure offset voltage. Also component tolerances voltage regulator resistors must considered. Designing system when only source variation involved difficult; however, when these variations interacting, solution becomes complicated. rest this paper describes design methodology that considers above variations their interactions. Worst case limits will used designing fixed-value system.
RESOLUTION HEADROOM
stated previously, amplified span sensor must "fit" within high references avoid nonlinearity errors. span must also large enough provide resolution required application. part A/D's "window" that used sensor's dynamic signal range called headroom. Headroom thought cushion between high reference voltages sensor's dynamic output range. This "cushion" used allow sensor's dynamic range move and/or vary within A/D's window. general description shown Figure total amount sensor output signal variation (due temperature effects, device-to-device variation, interface circuit component tolerances) cannot exceed headroom that available requisite amount system resolution. larger sensor span (more bits used signal resolution) means smaller amount headroom available accommodate sensor parameter interface circuit variations. This makes tradeoff between resolution variation obvious. more variation system, more headroom that required allow variation and, consequently, less window available sensor's "true-signal" span. Less span results poorer resolution (less bits used resolving sensor output signal).
HIGH REFERENCE HIGH SAT. LEVEL AMPLIFIER FULL-SCALE OUTPUT VOLTAGE
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
bits)
19.6
Many pressure sensor systems interface converter. above system example requires resolution when interfaced A/D, pressure sensor signal's span must least 19.6 1.96 system resolution required 0.5%, pressure sensor signal's span must least 19.6 3.92 0.5% From these examples, greater resolution required, greater sensor's amplified span must meet resolution requirement. Since pressure sensor's span before amplification only order tens millivolts, amplifier must designed provide minimum span that gives desired resolution. amplifier fixed gain, device-to-device variation sensor's unamplified span will result variation amplified span. example, sensor's span variation results amplified span that smaller than required, resolution system will high desired. Alternately, sensor's span variation results amplified span that larger than required, resolution will better than desired, amplified span also either saturate amplifier near supply rails extend outside high reference voltages A/D. Voltages above high reference will digitally converted decimal (for 8-bit A/D), voltages below reference will converted This creates non-linearity analog-to-digital conversion overall system transfer function. presented above, variation sensor's span creates dilemma: does design fixed-gain amplifier that gives desired resolution, does violate
HEADROOM
SENSOR'S FULL-SCALE VOLTAGE SPAN ZERO PRESSURE OFFSET VOLTAGE REFERENCE SAT. LEVEL AMPLIFIER
A/D'S AMPLIFIER'S DYNAMIC RANGE
HEADROOM
Figure Sensor's Full-Scale Span Headroom
Motorola Sensor Device Data
More Information This Product, www.freescale.com
AN1556
METHODOLOGY OPTIMIZE PERFORMANCE
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
HIGH REFERENCE
STEP
Resolution MaxFSS
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Desired system resolution Maximum full-scale voltage span pressure sensor Minimum full-scale voltage span MinFSS pressure sensor maximum temperature coefficient TCVFSS sensor's full-scale voltage span MaxSensOff maximum zero pressure offset voltage pressure sensor MinSensOff minimum zero pressure offset voltage pressure sensor sensor's maximum temperature TCVoff coefficient offset voltage saturation level amplifier reference voltage (whichever most limiting case) high saturation level amplifier high reference voltage (whichever most limiting case) reference voltage positive VREF voltage level shifting voltage regulator tolerance Vtol application's minimum operating MinTemp temperature application's maximum operating Maxtemp temperature
A/D'S DYNAMIC RANGE
methodology starts with defining known parameters. parameters with asterisk specified 25°C.
STEP
REFERENCE
STEP
Figure Digital Steps 8-Bit Calculate minimum amplified sensor span (defined Minimum Required Span Figure required this resolution requirement. Using 8-bit with window where step equals 19.6 (for nominal regulator voltage), minimum amplified sensor span Minimum Required Span
HIGH REFERENCE FULL-SCALE OUTPUT VOLTAGE MAXIMUM SPAN A/D'S MINIMUM DYNAMIC REQUIRED RANGE SPAN ZERO PRESSURE OFFSET VOLTAGE REFERENCE
(Number
These parameters either chosen application (e.g., system resolution) determined from sensor's data sheet. Tables provide necessary information design examples presented here.
Note: data Tables scaled supply voltage, whereas MPX10 MPX2010 data sheets specified supply voltage, respectively.
following steps outline methodology that will applied MPX10 first design example then applied MPX2010 second design example. Determine/choose required Resolution system. Calculate number steps required chosen resolution. resolution determines number steps into which pressure signal needs broken [see Figure where 8-bit (255 steps resolution) assumed]. conservative approach determining this number steps assume that with A/D, digital quantization pressure signal plus minus step. Therefore, assume that takes twice number steps previously determined resolve given minimum incremental pressure. number steps chosen resolution Number Steps Resolution
Figure Minimum Required Span Required Resolution Maximum Span Sensor Span Variations Calculate amplifier's gain. gain must large enough achieve, over entire distribution sensor spans, Minimum Required Span. Therefore, this gain calculated using smallest pressure sensor voltage span, MinFSS. using worst case smallest pressure sensor voltage span calculate gain, Minimum Required Span (the minimum span that will achieve resolution requirement) guaranteed entire distribution sensor spans. worst case minimum full-scale sensor span will occur hottest temperature, Maxtemp, application (not exceeding operating temperature sensor), since span decreases with increasing temperature (TCV negative). Gain
Minimum Required Span [MinFSS]
scaling factor numerator converts resolution from percentage decimal fraction.
term TCVFSS (Maxtemp 25)] temperature effect span.
TCVFSS (Maxtemp-25)]
More Information This Product, www.freescale.com
Motorola Sensor Device Data
Summarizing (through Step calculations based minimum desired resolution. resolution requirement determines number steps "pieces" into which signal must broken. This number steps "pieces" multiplied number millivolts step equals minimum voltage range which defined Minimum Required Span. Finally ensure that this Minimum Required Span achieved over entire distribution sensor spans, gain calculated using worst case smallest sensor span.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
VS's NOMINAL VALUE (NOT INCLUDING Vtol) (INCLUDING Vtol) HIGH REFERENCE HIGH SAT. LEVEL AMPLIFIER FULL-SCALE OUTPUT VOLTAGE ZERO PRESSURE OFFSET VOLTAGE MAXIMUM SPAN
AN1556
AMPLIFIER'S DYNAMIC RANGE
Note: gain also will have variation resistor tolerances amplifier circuit. ensure that system variation resistor tolerances negligible when compared other sources variation, system should designed using resistors with tolerances better.
Calculate worst case Maximum Span. Maximum Span largest possible span calculated using maximum full-scale sensor voltage span, MaxFSS, Gain. worst case maximum full-scale sensor span occurs coldest temperature, MinTemp. After calculating Maximum Span, remaining dynamic range within A/D's window saturation levels amplifier smallest number "bits" (most limiting case) available headroom. Maximum Span [Gain] [MaxFSS] TCVFSS (MinTemp 25)] term TCVFSS (MinTemp 25)] temperature effect span. Maximum Span calculated from above equation depicted Figure Calculate Calculated Headroom. Calculated Headroom subset general term "headroom" because reserves "bits" A/D's dynamic range only sources variation from sensor's zero-pressure offset voltage. Headroom, general, reserved sources variation: system components, resistor tolerances significant), sensor. However, largest part "headroom" must reserved device-to-device variations temperature effects sensor's zero-pressure offset voltage. Therefore, sources variation from other system components subtracted immediately from headroom that focus sensor-related variations (refer Figure following equation Calculated Headroom). these design examples, supply single, regulated supply (the regulator tolerance referred Vtol). assumption typical rail-to-rail op-amp's saturation levels (referred Vhi) above supply rail (ground) below high supply rail Additionally, worst case (smallest) supply voltage 4.75 Calculated Headroom
SAT. LEVEL AMPLIFIER GROUND REFERENCE
CALCULATED HEADROOM
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Figure From Ground Section Voltage Reserved Each Source Variation Step considered pivotal step because transitions methodology's calculations from performance requirements headroom requirements. Step methodology considered only span sensor guarantee minimum resolution despite device-to-device variation, component tolerances, temperature effects. Upon calculating Calculated Headroom, remaining steps methodology that detailed below consider offset variations (due device-to-device temperature). These offset variations added together comprise what defined Required Headroom which required number "bits" A/D's dynamic range needed accommodate offset variations. This Required Headroom then compared Calculated Headroom (from preceding calculation) determine Calculated Headroom sufficient allow offset variations (i.e., Calculated Headroom must greater than equal Required Headroom). case that Calculated Headroom sufficiently large, relaxing resolution requirement reducing, possible, variation either offset, span, component tolerances, combination three required. Calculate maximum offset drift temperature fluctuations (defined Maximum Temperature Effect Offset). conservative approach this calculation determine maximum total voltage change offset over application's entire operating temperature range. This maximum change offset product Gain, TCVoff, application's entire operating temperature range (from Maxtemp MinTemp). Since temperature coefficient offset positive negative, offset increase decrease with increasing temperature and, likewise, decreasing temperature. Though this step only considers maximum magnitude change offset temperature, segment Required Headroom reserved both possibilities positive negative temperature coefficient offset (see Figure sign (positive negative) total offset change temperature also considered upcoming steps.
Maximum Span
Vtol
preceding equation assumes that difference between high supply rail high reference A/D) equal difference between supply rail reference A/D); thus term Vlo).
Motorola Sensor Device Data
More Information This Product, www.freescale.com
AN1556
Maximum Temperature Effect Offset (Gain) (TCVoff) (Maxtemp MinTemp)
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Maximum Offset [Gain] [MaxSensOff] Maximum Temperature Effect Offset
MAXIMUM OFFSET MAX. TEMPERATURE EFFECT OFFSET (POSITIVE TEMP. COEFF.) MAX. TEMPERATURE EFFECT OFFSET (POSITIVE TEMP. COEFF.)
REQUIRED HEADROOM
MAX. OFFSET VARIATION REQUIRED (BEFORE ADDING HEADROOM TEMP. EFFECTS)
Freescale Semiconductor, Inc.
MAX. TEMPERATURE EFFECT OFFSET (NEGATIVE TEMP. COEFF.)
MAX. TEMPERATURE EFFECT OFFSET (NEGATIVE TEMP. COEFF.) MINIMUM OFFSET
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Figure Maximum Temperature Effect Offset Calculate Maximum Offset Variation. Maximum Offset Variation total amount Required Headroom that must reserved account entire distribution sensor offsets room temperature refer Figure Maximum Offset Variation [Gain] [MaxSensOff MinSensOff] where largest offset [Gain] [MaxSensOff] smallest offset [Gain] [MinSensOff] Calculate worst case Minimum Offset. worst case Minimum Offset includes both temperature effects (from Step device-to-device variations (from Step determine smallest possible offset over entire distribution sensor offsets over operating temperature range. This worst case Minimum Offset occurs when sensor nominal room temperature offset MinSensOff (smallest offset sensor offset distribution) negative temperature coefficient that offset decreases with increasing temperature. Refer Figure Minimum Offset [Gain] [MinSensOff] Maximum Temperature Effect Offset Similar Step calculate worst case Maximum Offset. worst case Maximum Offset includes both temperature effects (from Step device-to-device variations (from Step determine largest possible offset over entire distribution sensor offsets over operating temperature range. This worst case Maximum Offset occurs when sensor nominal room temperature offset MaxSensOff (largest offset sensor offset distribution) positive temperature coefficient that offset increases with increasing temperature. Refer Figure Figure Calculating Maximum Minimum Offsets Calculate Required Headroom. Referring Figure Required Headroom difference between Maximum Offset Minimum Offset amount voltage range (bits A/D) required allow device-to-device temperature variations sensor's offset. Required Headroom Maximum Offset Minimum Offset Compare Required Headroom Step Calculated Headroom Step Calculated Headroom absolute maximum amount offset variation (due device-to-device variations temperature effects) that system allow desired resolution. Required Headroom greater than Calculated Headroom, desired resolution attainable worst case variations temperature effects, component tolerances, device-to-device variations. Therefore, requirement attain desired system resolution Calculated Headroom Required Headroom this requirement met, stated previously, alternatives meeting this requirement following: Relax Resolution requirement repeat methodology. Reduce (tighten) span offset both) variation repeat methodology. Reduce temperature coefficients. Reduce component tolerances repeat methodology. Repeat methodology performing combination above suggestions.
More Information This Product, www.freescale.com
Motorola Sensor Device Data
Once above headroom requirement met, final step determine proper value VREF: offset, VREF, required position sensor's span within window that device-to-device temperature variation component tolerances cause sensor's output outside window. Therefore, calculate VREF required ensure that sensor's smallest zero-pressure offset voltage (Minimum Offset) greater than equal (refer Figures other words, reference voltage Minimum Offset must greater than equal amplifier's saturation voltage: VREF Minimum Offset Solving VREF: VREF Minimum Offset
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
AN1556
DESIGN EXAMPLES WITH MPX10 MPX2010
following table lists methodology's steps. table entries (names) will correspond names used methodology outlined above; additionally, step number (Step etc.) bracketed superscripted next entry which step refers. first column lists given parameters that should available derived from appropriate component's (sensor, amplifier, voltage regulator, resistors) data sheet. second column lists performance requirements sensor system (i.e., this column lists calculations that relate ensuring minimum sensor span achieve desired resolution despite device-to-device variations, temperature effects component tolerances). third column lists calculations that determine headroom system given component tolerances device-to-device variations temperature effects sensor's offset. table associated system design equations easily implemented spreadsheet efficiently perform required calculations.
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Note: reference voltage, VREF, also will have variation resistor tolerances resistor divider used create VREF. ensure that system variation resistor tolerances negligible when compared other sources variation, system should designed using resistors with tolerances better. following design examples methodology.
Table Design Example Using MPX10
Given Parameters MaxFSS 25°C) MinFSS 25°C) TCVFSS FSS/°C) 0.22 MaxSensOff 25°C) MinSensOff 25°C) TCVoff (µV/°C) Vtol Maxtemp (°C) MinTemp (°C)
[12]I Calculated Headroom Required Headroom [6]Calculated Headroom [11]Required Headroom
Performance Parameters
[1]Resolution
Headroom Parameters
[7]Maximum
FSS)
[2]Number
Temperature Effect Offset 0.03 Offset Variation 1.76
Steps
[8]Maximum
[3]Minimum
Required Span 0.87
[9]Minimum
Offset 0.03 Offset 1.73
[4]Gain
[10]Maximum
[5]Maximum
Span
[13]V
2.57
0.23
1.78
1.75
Motorola Sensor Device Data
More Information This Product, www.freescale.com
AN1556
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Table Design Example Using MPX2010
Performance Parameters
[1]Resolution
Given Parameters MaxFSS 25°C) MinFSS 25°C) TCVFSS FSS) MaxSensOff 25°C) MinSensOff 25°C)
Headroom Parameters
[7]Maximum
FSS)
[2]Number
Temperature Effect Offset 0.14 Offset Variation 0.55
Steps
[8]Maximum
[3]Minimum
Required Span 3.27
[9]Minimum
Offset 0.27 Offset 0.27
[4]Gain
[10]Maximum
[5]Maximum
Span
[13]V
Freescale Semiconductor, Inc.
3.61
0.47
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
TCVoff (mV, 85°C) Vtol Maxtemp (°C) MinTemp (°C)
[12]I Calculated Headroom Required Headroom [6]Calculated Headroom [11]Required Headroom
0.74
0.55
More Information This Product, www.freescale.com
Motorola Sensor Device Data
DESIGN EXAMPLE COMPARISON SUMMARY
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
CONCLUSION
AN1556
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
preceding examples show sources variation affect overall system resolution. MPX2010 on-chip temperature compensation calibration circuitry reduce device-to-device variations temperature effects. Consequently, when designing fixed-value amplifier circuitry, resolution possible with MPX2010 almost four times greater than same amplifier circuit using MPX10. both examples, both systems' performance (Resolution) optimized best possible, given distribution sensor device parameters other component variations. stated previously methodology's calculations show that sensor's signal will always within dynamic range amplifier (and high reference voltages A/D), software calibration then implemented nullify room temperature device-to-device component variations. should noted, however, that this methodology does consider obtain best performance from single sensor system. Rather, focus methodology obtain best possible system performance while considering distribution device parameters that result from manufacturing other sources variation. considering sources variation, system then mass-produced without individually calibrating sensor system hardware. Obviously, each sensor system hand-calibrated, performance will better. However, hand-calibration also requires additional cost time when producing sensor system.
guarantee specified performance when designing fixed-value circuit sensor systems, significant sources variation must considered. considering sources variation (device-to-device variations, temperature effects, component tolerances), system designed that specified performance (resolution) achieved while still keeping sensor's amplified dynamic range within window saturation levels amplifier). specified performance achieved cases applying methodology described herein. first calculating Minimum Required Span achieve required resolution scenarios then determining remaining dynamic range headroom large enough accommodate sources variation, methodology determines resolution requirement feasible. sources variation large, resolution requirement attainable. such case, resolution requirement should relaxed, sources variation must decreased. Finally, once system successfully designed ensure that sensor signal will always within dynamic range amplifier (and high reference voltages A/D), software calibration implemented nullify room temperature device-to-device component variations.
Motorola Sensor Device Data
More Information This Product, www.freescale.com
AN1556
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Freescale Semiconductor, Inc.
ARCHIVED FREESCALE SEMICONDUCTOR, INC. 2005
Motorola reserves right make changes without further notice products herein. Motorola makes warranty, representation guarantee regarding suitability products particular purpose, does Motorola assume liability arising application product circuit, specifically disclaims liability, including without limitation consequential incidental damages. "Typical" parameters vary different applications. operating parameters, including "Typicals" must validated each customer application customer's technical experts. Motorola does convey license under patent rights rights others. Motorola products designed, intended, authorized components systems intended surgical implant into body, other applications intended support sustain life, other application which failure Motorola product could create situation where personal injury death occur. Should Buyer purchase Motorola products such unintended unauthorized application, Buyer shall indemnify hold Motorola officers, employees, subsidiaries, affiliates, distributors harmless against claims, costs, damages, expenses, reasonable attorney fees arising directly indirectly, claim personal injury death associated with such unintended unauthorized use, even such claim alleges that Motorola negligent regarding design manufacture part. Motorola registered trademarks Motorola, Inc. Motorola, Inc. Equal Opportunity/Affirmative Action Employer. reach EUROPE: Motorola Literature Distribution; P.O. 20912; Phoenix, Arizona 85036. 1-800-441-2447 MFAX: RMFAX0@email.sps.mot.com TOUCHTONE (602) 244-6609 INTERNET: http://Design-NET.com
JAPAN: Nippon Motorola Ltd.; Tatsumi-SPD-JLDC, Toshikatsu Otsuki, Seibu-Butsuryu-Center, 3-14-2 Tatsumi Koto-Ku, Tokyo 135, Japan. 03-3521-8315 HONG KONG: Motorola Semiconductors H.K. Ltd.; Ping Industrial Park, Ting Road, N.T., Hong Kong. 852-26629298
More Information This Product, www.freescale.com
*AN1556/D*
Motorola Sensor Device Data AN1556/D
Other recent searches
SLLS102B - SLLS102B SLLS102B Datasheet
MC-8L - MC-8L MC-8L Datasheet
MC-8FX - MC-8FX MC-8FX Datasheet
LTL914SEKS - LTL914SEKS LTL914SEKS Datasheet
LTL914SHKS - LTL914SHKS LTL914SHKS Datasheet
LTL914SYKS - LTL914SYKS LTL914SYKS Datasheet
GL112C11 - GL112C11 GL112C11 Datasheet
GL112R13 - GL112R13 GL112R13 Datasheet
DS3695A - DS3695A DS3695A Datasheet
DS3695AT - DS3695AT DS3695AT Datasheet
DS3696A - DS3696A DS3696A Datasheet
RS485 - RS485 RS485 Datasheet
RS422 - RS422 RS422 Datasheet
CEP123 - CEP123 CEP123 Datasheet
BAR63 - BAR63 BAR63 Datasheet
Privacy Policy | Disclaimer
© 2012 Datasheet Archive
