Compact EDFA gain block applications compatible Compact size powe
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31/WDM
Compact EDFA gain block applications
compatible Compact size power consumption (uncooled option) Integrated gain flattening filter Operating wavelength range: 1528-1562nm Gain flatness ±0.75dB
Applications
Used booster, line pre-amplifier applications
Description
This compact EDFA gain block intended applications C-band wavelength range. optimized perform booster, line preamplifier systems subsystems metro long haul applications. gain block contains input output monitor diodes configured uncooled pump laser that enables power consumption.
31/WDM
Optical input signal
Optical gain
Optical output signal
electrical interface
Figure Block diagram.
Base view
Dimensions
square male connector
Description GND, monitor Input monitor cathode Input monitor anode Output monitor cathode Output monitor anode Thermistor Laser anode Laser anode Pump monitor cathode Pump monitor anode anode anode anode cathode cathode cathode GND, pump Thermistor Laser cathode Laser cathode
Side view
view
Erbium Doped Fiber Amplifier
Figure Mechanical outline drawing connection.
31/WDM
Optical characteristics
Electrical optical characteristics over recommended operating conditions, unless otherwise noted.
Parameter Symbol Unit
Operating wavelength Input power Output power Noise figure Polarization mode dispersion Polarization dependent loss Optical return loss input/output Gain flatness
GFlat
1528 -0.75
1562
0.75
Electrical characteristics
Parameter Symbol Unit
Operating current Operating voltage Power consumption Thermistor resistance current voltage
ITEC VTEC
Recommended operating conditions
Parameter Symbol Unit
Operating case temperature
TCase
Absolute maximum ratings
Parameter Symbol Unit
Storage temperature
TStg
CAUTION: Stresses outside those listed "Absolute maximum ratings" cause permanent damage device. This stress only rating operation device these other conditions above those indicated operational sections this specification implied.
Handling precautions
This device damaged result electrostatic discharge (ESD). Take proper precautions during both handling testing. This typically includes grounded wrist wraps, workbenches floor mats controlled areas. Semiconductor devices damaged current surges, appropriate transient protection.
Quality assurance
Ericsson Microelectronics commitment quality been proven through decade semiconductor device production been confirmed 9001. Opto product qualification made according intention applicable Telcordia standards.
Connector options
SC/PC (Other connectors available request)
INVISIBLE LASER RADIATION
AVOID DIRECT EXPOSURE BEAM
WAVELENGTH 1300 1600 CLASS LASER
Information given this data sheet believed accurate reliable. However responsibility assumed consequences infringement patents other rights third parties which result from use. license granted implication otherwise under patent patent rights Ericsson Microelectronics. These products sold only according Ericsson Microelectronics' general conditions sale, unless otherwise confirmed writing. Product specifications subject change without notice.
Ericsson Microelectronics SE-164 Kista, Sweden Telephone: local sales contacts, please refer website call: Fax:
Preliminary Data Sheet
EN/LZT Ericsson Microelectronics April 2002
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