00-06-21 Monica Poelking 02-02-08 Thomas Hess CURR
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REVISIONS DESCRIPTION vendor CAGE F8859. device class criteria. Editorial changes throughout. Correct data limits paragraph test conditions table case outline table III, delta limits. Editorial changes throughout. Correct table Update boilerplate MIL-PRF-38535 requirements. DATE (YR-MO-DA) 99-11-05 APPROVED Monica Poelking
00-06-21
Monica Poelking
02-02-08
Thomas Hess
CURRENT CAGE CODE 67268
SHEET SHEET STATUS SHEETS PMIC SHEET
PREPARED Greg Pitz
DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 http://www.dscc.dla.mil
STANDARD MICROCIRCUIT DRAWING
THIS DRAWING AVAILABLE DEPARTMENTS AGENCIES DEPARTMENT DEFENSE AMSC
CHECKED DiCenzo
APPROVED Robert Evans DRAWING APPROVAL DATE 84-10-17 REVISION LEVEL
MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCHES WITH THREESTATE OUTPUTS, MONOLITHIC SILICON
CAGE
SHEET
14933
84072
DSCC FORM 2233 DISTRIBUTION STATEMENT Approved public release; distribution unlimited.
5962-E206-02
SCOPE Scope. This drawing documents product assurance class levels consisting high reliability (device classes space application (device class choice case outlines lead finishes available reflected Part Identifying Number (PIN). When available, choice Radiation Hardness Assurance (RHA) levels reflected PIN. PIN. shown following examples. 84072
Drawing number device class 5962
Device type (see 1.2.2)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
84072
Federal stock class designator
designator (see 1.2.1) Drawing number
Device type (see 1.2.2)
Device class designator (see 1.2.3)
Case outline (see 1.2.4)
Lead finish (see 1.2.5)
1.2.1 designator. Device classes marked devices meet MIL-PRF-38535 specified levels marked with appropriate designator. Device class marked devices meet MIL-PRF-38535, appendix specified levels marked with appropriate designator. dash indicates non-RHA device. 1.2.2 Device type(s). device type(s) identify circuit function follows: Device type Generic number 54HC373 Circuit function Octal transparent D-type latches with three-state outputs
1.2.3 Device class designator. device class designator single letter identifying product assurance level listed below. Since device class designator been added after original issuance this drawing, device classes designators will included will marked device. Device class Device requirements documentation Vendor self-certification requirements MIL-STD-883 compliant, non-JAN class level microcircuits accordance with MIL-PRF-38535, appendix Certification qualification MIL-PRF-38535
1.2.4 Case outline(s). case outline(s) designated MIL-STD-1835 follows: Outline letter Descriptive designator GDIP1-T20 CDIP2-T20 GDFP2-F20 CDFP3-F20 figure CQCC1-N20 Terminals Package style Dual-in-line Flat pack Flat pack Square leadless chip carrier
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
REVISION LEVEL
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1.2.5 Lead finish. lead finish specified MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class Absolute maximum ratings. Supply voltage range (VCC). input voltage range (VIN). output voltage range (VOUT). Input clamp current (IIK) (VIN VCC) Output clamp current (IOK) (VOUT VOUT VCC). Continuous output current (IOUT) (VOUT VCC) Continuous current through Storage temperature range (TSTG). Maximum power dissipation (PD):. Lead temperature (soldering, seconds). Thermal resistance, junction-to-case (JC) Junction temperature (TJ) Recommended operating conditions. Supply voltage range (VCC). Case operating temperature range (TC) Input rise fall time tf): Minimum setup time, data before (ts): +25°C: -55°C +125°C: +2.0 +6.0 -55°C +125°C 1,000 -0.5 +7.0 -0.5 +0.5 -0.5 +0.5 -65°C +150°C +260°C MIL-STD-1835 +175°C
Stresses above absolute maximum rating cause permanent damage device. Extended operation maximum levels degrade performance affect reliability. Unless otherwise noted, voltages referenced GND. limits parameters specified herein shall apply over full specified range case temperature range -55°C +125°C. +100°C +125°C, derate linearly mW/°C. Maximum junction temperature shall exceeded except allowable short duration burn-in screening conditions accordance with method 5004 MIL-STD-883.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
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Minimum hold time, data after (th): +25°C: -55°C +125°C: Minimum pulse width high (tw): +25°C: -55°C +125°C: APPLICABLE DOCUMENTS
Government specification, standards, handbooks. following specification, standards, handbooks form part this drawing extent specified herein. Unless otherwise specified, issues these documents those listed issue Department Defense Index Specifications Standards (DoDISS) supplement thereto, cited solicitation. SPECIFICATION DEPARTMENT DEFENSE MIL-PRF-38535 Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT DEFENSE MIL-STD-883 MIL-STD-1835 HANDBOOKS DEPARTMENT DEFENSE MIL-HDBK-103 MIL-HDBK-780 List Standard Microcircuit Drawings. Standard Microcircuit Drawings. Test Method Standard Microcircuits. Interface Standard Electronic Component Case Outlines.
(Unless otherwise indicated, copies specification, standards, handbooks available from Standardization Document Order Desk, Robbins Avenue, Building Philadelphia, 19111-5094.) Order precedence. event conflict between text this drawing references cited herein, text this drawing takes precedence. Nothing this document, however, supersedes applicable laws regulations unless specific exemption been obtained.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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REVISION LEVEL
84072 SHEET
REQUIREMENTS Item requirements. individual item requirements device classes shall accordance with MIL-PRF-38535 specified herein modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. individual item requirements device class shall accordance with MIL-PRF-38535, appendix non-JAN class level devices specified herein. Design, construction, physical dimensions. design, construction, physical dimensions shall specified MIL-PRF-38535 herein device classes MIL-PRF-38535, appendix herein device class 3.2.1 Case outlines. case outlines shall accordance with 1.2.4 herein figure 3.2.2 Terminal connections. terminal connections shall specified figure 3.2.3 Truth table. truth table shall specified figure 3.2.4 Logic diagram. logic diagram shall specified figure 3.2.5 Switching waveforms test circuit. switching waveforms test circuit shall specified figure Electrical performance characteristics postirradiation parameter limits. Unless otherwise specified herein, electrical performance characteristics postirradiation parameter limits specified table shall apply over full case operating temperature range. Electrical test requirements. electrical test requirements shall subgroups specified table electrical tests each subgroup defined table Marking. part shall marked with listed herein. addition, manufacturer's also marked listed MIL-HDBK-103. packages where marking entire number feasible space limitations, manufacturer option marking "5962-" device. product using this option, designator shall still marked. Marking device classes shall accordance with MIL-PRF-38535. Marking device class shall accordance with MIL-PRF-38535, appendix 3.5.1 Certification/compliance mark. certification mark device classes shall "QML" required MIL-PRF-38535. compliance mark device class shall required MIL-PRF-38535, appendix Certificate compliance. device classes certificate compliance shall required from QML-38535 listed manufacturer order supply requirements this drawing (see 6.6.1 herein). device class certificate compliance shall required from manufacturer order listed approved source supply MIL-HDBK-103 (see 6.6.2 herein). certificate compliance submitted DSCC-VA prior listing approved source supply this drawing shall affirm that manufacturer's product meets, device classes requirements MIL-PRF-38535 herein device class requirements MIL-PRF-38535, appendix herein. Certificate conformance. certificate conformance required device classes MIL-PRF-38535 device class MIL-PRF-38535, appendix shall provided with each microcircuits delivered this drawing. Notification change device class device class notification DSCC-VA change product (see herein) involving devices acquired this drawing required change defined MIL-PRF-38535, appendix Verification review device class device class DSCC, DSCC's agent, acquiring activity retain option review manufacturer's facility applicable required documentation. Offshore documentation shall made available onshore option reviewer. 3.10 Microcircuit group assignment device class Device class devices covered this drawing shall microcircuit group number (see MIL-PRF-38535, appendix
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
REVISION LEVEL
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TABLE Electrical performance characteristics. Test Symbol Test conditions -55°C +125°C unless otherwise specified minimum maximum minimum maximum -6.0 minimum maximum -7.8 minimum maximum minimum maximum +6.0 minimum maximum +7.8 High level input voltage Group subgroups 3.98 5.48 0.26 0.40 0.26 0.40 3.15 10.0 160.0 ±100.0 ±1000.0 ±0.5 ±10.0 Limits Unit
High level output voltage
level output voltage
level input voltage
Input capacitance Quiescent supply current Input leakage current Three-state output Leakage current
+25°C, 4.4.1c IOUT VOUT
footnotes table.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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REVISION LEVEL
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TABLE Electrical performance characteristics Continued. Test Symbol Test conditions -55°C +125°C unless otherwise specified 4.4.1c Group subgroups Limits 100.0 Unit
Power dissipation capacitance Functional tests
4.4.1b +25°C figure -55°C +125°C figure
Propagation delay time, tPHL1, data output, tPLH1
Propagation delay time, tPHL2, latch enable tPLH2 output,
+25°C figure
-55°C +125°C figure
Propagation delay time, tPZH, output enable tPZL output,
+25°C figure
-55°C +125°C figure
footnotes table
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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REVISION LEVEL
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TABLE Electrical performance characteristics Continued. Test Symbol Test conditions -55°C +125°C unless otherwise specified +25°C figure -55°C +125°C figure Transition time, output rise fall tTHL, tTLH +25°C figure -55°C +125°C figure Group subgroups Limits Unit
Propagation delay time, output disable output,
tPHZ, tPLZ
power supply ±10%, worst case output voltages (VOH VOL) occur Thus, values should used when designing with this supply. Worst cases occur respectively. (The value 3.85 worst case leakage currents (IIN, ICC, IOZ) occur CMOS higher voltage, values should used. Power dissipation capacitance (CPD), typically latch, determines load dynamic power consumption, VCC, load dynamic current consumption, VCCf ICC. tests required because they used forcing functions VOL. testing shall guaranteed, tested, specified limits table Transition time (tTLH, tTHL), tested, shall guaranteed specified limits table
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Case outline
Symbol .045 .015 .003 .505 .275 0.045 .250 .010
Device type case outline Inches .085 1.14 .019 0.38 .006 0.076 .515 12.83 .285 6.99 0.055 1.14 .370 6.35 0.25
Millimeters
2.16 0.48 0.152 13.08 7.24 1.40 9.39
FIGURE Case outlines.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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REVISION LEVEL
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Device type Case Outline Terminal Number
Terminal Symbol
FIGURE Terminal connections.
Inputs
Outputs
High voltage level. voltage level. Irrelevant. High impedance. level output before steady-state input conditions were established. FIGURE Truth table.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
REVISION LEVEL
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FIGURE Logic diagram.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
REVISION LEVEL
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NOTES: tPLH tPHL: open tTLH tTHL: open tPZH tPLZ: open closed tPZL tPLZ: closed open (includes probe test fixture capacitance). tPZL tPLZ reference waveform output under test with internal conditions such that output except when disabled output enable control. tPZH tPHZ reference waveform output under test with internal conditions such that output except when disabled output enable control. Phase relationships between waveforms were chosen arbitrarily. input pulses supplied generators having following characteristics: MHz, outputs measured time with input transition measurement. FIGURE Switching waveforms test circuit.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
REVISION LEVEL
84072 SHEET
QUALITY ASSURANCE PROVISIONS Sampling inspection. device classes sampling inspection procedures shall accordance with MIL-PRF-38535 modified device manufacturer's Quality Management (QM) plan. modification plan shall affect form, fit, function described herein. device class sampling inspection procedures shall accordance with MIL-PRF-38535, appendix Screening. device classes screening shall accordance with MIL-PRF-38535, shall conducted devices prior qualification technology conformance inspection. device class screening shall accordance with method 5004 MIL-STD-883, shall conducted devices prior quality conformance inspection. 4.2.1 Additional criteria device class Burn-in test, method 1015 MIL-STD-883. Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015. +125°C, minimum. Interim final electrical test parameters shall specified table herein.
4.2.2 Additional criteria device classes burn-in test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. burn-in test circuit shall maintained under document revision level control device manufacturer's Technology Review Board (TRB) accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1015 MIL-STD-883. Interim final electrical test parameters shall specified table herein. Additional screening device class beyond requirements device class shall specified MIL-PRF-38535, appendix
Qualification inspection device classes Qualification inspection device classes shall accordance with MIL-PRF-38535. Inspections performed shall those specified MIL-PRF-38535 herein groups inspections (see 4.4.1 through 4.4.4). Conformance inspection. Technology conformance inspection classes shall accordance with MIL-PRF-38535 including groups inspections specified herein. Quality conformance inspection device class shall accordance with MIL-PRF-38535, appendix specified herein. Inspections performed device class shall those specified method 5005 MIL-STD-883 herein groups inspections (see 4.4.1 through 4.4.4). 4.4.1 Group inspection Tests shall specified table herein. device class subgroups tests shall sufficient verify truth table figure herein. test vectors used verify truth table shall, minimum, test functions each input output. possible input output logic patterns function shall guaranteed, tested, truth table figure herein. device classes subgroups shall include verifying functionality device.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
REVISION LEVEL
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shall measured only initial qualification after process design changes which affect capacitance. shall measured between designated terminal frequency MHz. shall tested accordance with latest revision JEDEC Standard table herein. CPD, test applicable pins five devices with zero failures. TABLE Electrical test requirements. Test requirements Subgroups accordance with MIL-STD-883, method 5005, table Device class Interim electrical parameters (see 4.2) Final electrical parameters (see 4.2) Group test requirements (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Group end-point electrical parameters (see 4.4) Subgroups accordance with MIL-PRF-38535, table III) Device class Device class 7,8,
applies subgroup applies subgroups deltas. Delta limits specified table shall required where specified delta limits shall completed with reference zero hour electrical parameters.
Table III. Burn-in operating life test delta parameters (+25°C) Parameter Quiescent current Input current level Input current high level Output voltage level (IOL Output voltage high level (IOH Symbol Delta Limits ±120 ±0.026 ±0.20
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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REVISION LEVEL
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4.4.2 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.2.1 Additional criteria device class Steady-state life test conditions, method 1005 MIL-STD-883: Test condition test circuit shall maintained manufacturer under document revision level control shall made available preparing acquiring activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. +125°C, minimum. Test duration: 1,000 hours, except permitted method 1005 MIL-STD-883.
4.4.2.2 Additional criteria device classes steady-state life test duration, test condition test temperature, approved alternatives shall specified device manufacturer's plan accordance with MIL-PRF-38535. test circuit shall maintained under document revision level control device manufacturer's accordance with MIL-PRF-38535 shall made available acquiring preparing activity upon request. test circuit shall specify inputs, outputs, biases, power dissipation, applicable, accordance with intent specified test method 1005 MIL-STD-883. 4.4.3 Group inspection. group inspection end-point electrical parameters shall specified table herein. 4.4.4 Group inspection. Group inspection required only parts intended marked radiation hardness assured (see herein). End-point electrical parameters shall specified table herein. device classes devices test vehicle shall subjected radiation hardness assured tests specified MIL-PRF-38535 level being tested. device class devices shall subjected radiation hardness assured tests specified MIL-PRF-38535, appendix level being tested. device classes must meet postirradiation end-point electrical parameter limits defined table +25°C ±5°C, after exposure, subgroups specified table herein.
When specified purchase order contract, copy delta limits shall supplied. Methods inspection. Methods inspection shall specified follows: 4.5.1 Voltage current. Unless otherwise specified, voltages given referenced microcircuit terminal. Currents given conventional current positive when flowing into referenced terminal. PACKAGING Packaging requirements. requirements packaging shall accordance with MIL-PRF-38535 device classes MIL-PRF-38535, appendix device class NOTES Intended use. Microcircuits conforming this drawing intended Government microcircuit applications (original equipment), design applications, logistics purposes. 6.1.1 Replaceability. Microcircuits covered this drawing will replace same generic device covered contractorprepared specification drawing. 6.1.2 Substitutability. Device class devices will replace device class devices.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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Configuration control SMD's. proposed changes existing SMD's will coordinated with users record individual documents. This coordination will accomplished using Form 1692, Engineering Change Proposal. Record users. Military industrial users should inform Defense Supply Center Columbus when system application requires configuration control which SMD's applicable that system. DSCC will maintain record users this list will used coordination distribution changes drawings. Users drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. Comments. Comments this drawing should directed DSCC-VA Columbus, Ohio 43216-5000, telephone (614) 692-0547. Abbreviations, symbols, definitions. abbreviations, symbols, definitions used herein defined MIL-PRF-38535 MIL-HDBK-1331. Sources supply. 6.6.1 Sources supply device classes Sources supply device classes listed QML-38535. vendors listed QML-38535 have submitted certificate compliance (see herein) DSCC-VA have agreed this drawing. 6.6.2 Approved sources supply device class Approved sources supply class listed MIL-HDBK-103. vendors listed MIL-HDBK-103 have agreed this drawing certificate compliance (see herein) been submitted accepted DSCC-VA.
STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000
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84072 SHEET
STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE: 02-02-08 Approved sources supply 84072 listed below immediate acquisition information only shall added MIL-HDBK-103 QML-38535 during next revision. MIL-HDBK-103 QML-38535 will revised include addition deletion sources. vendors listed below have agreed this drawing certificate compliance been submitted accepted DSCC-VA. This bulletin superseded next dated revision MIL-HDBK-103 QML-38535.
Standard microcircuit drawing 8407201RA 8407201SA 8407201XA 8407201XC 84072012A 5962-8407201VSA 5962-8407201VXA 5962-8407201VXC
Vendor CAGE number 01295 01295 F8859 F8859 01295 F8859 F8859
Vendor similar SNJ54HC373J CD54HC373F3A SNJ54HC373W 54HC373K02Q 54HC373K01Q SNJ54HC373FK 54HC373K02V 54HC373K01V
lead finish shown each representing hermetic package most readily available from manufacturer listed that part. desired lead finish listed contact Vendor determine availability. Caution. this number item acquisition. Items acquired this number satisfy performance requirements this drawing. available from approved source supply. Vendor CAGE number 01295 Vendor name address Texas Instruments Incorporated 13500 Central Expressway P.O. 655303 Dallas, 75265 Point contact: 6412 Highway South
Sherman, 75090-0084
F8859
STMicroelectronics Suisse BP4199 35041 RENNES cedex2-FRANC
information contained herein disseminated convenience only Government assumes liability whatsoever inaccuracies information bulletin.
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