The Datasheet Archive - 100 Million Datasheets from 7500 Manufacturers.    


Datasheet Search Engine   
 
Part # or Description: • 5V RS232 Driver • 2SC5066* • "Real Time Clock" • "USB connector" • "blue led" 5mm • 10 watt zener diode • 2N3055* motorola
 
Search Tip: Try entering the part number only. Include a wildcard (eg. lm317* or 1n4148*)

 

 

SCBS182C FEBRUARY 1991 REVISED JULY 1995 State-of-the-Art EPIC-B


Datasheet Thumbnail

  

Download PDF



Top Searches for this datasheet



SN54ABT125, SN74ABT125 QUADRUPLE BUFFER GATES WITH 3-STATE OUTPUTS
SCBS182C FEBRUARY 1991 REVISED JULY 1995
State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Dissipation Protection Exceeds 2000 MIL-STD-883C, Method 3015; Exceeds Using Machine Model Latch-Up Performance Exceeds JEDEC Standard JESD-17 Typical VOLP (Output Ground Bounce) 25°C High-Drive Outputs 32-mA IOH, 64-mA Package Options Include Plastic Small-Outline (D), Shrink Small-Outline (DB), Thin Shrink Small-Outline (PW) Packages, Ceramic Chip Carriers (FK), Plastic Ceramic DIPs
SN54ABT125 PACKAGE SN74ABT125 PACKAGE (TOP VIEW)
SN54ABT125 PACKAGE (TOP VIEW)
description
ABT125 quadruple buffer gates feature independent line drivers with 3-state outputs. Each output disabled when associated output-enable (OE) input high. ensure high-impedance state during power power down, should tied through pullup resistor; minimum value resistor determined current-sinking capability driver.
internal connection OUTPUT
Copyright 1995, Texas Instruments Incorporated
SN74ABT125 available TI's shrink small-outline package (DB), which provides same count functionality standard small-outline packages less than half printed-circuit-board area. SN54ABT125 characterized operation over full military temperature range 55°C 125°C. SN74ABT125 characterized operation from 40°C 85°C.
FUNCTION TABLE (each buffer) INPUTS
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. EPIC-B trademark Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters. POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT125, SN74ABT125 QUADRUPLE BUFFER GATES WITH 3-STATE OUTPUTS
SCBS182C FEBRUARY 1991 REVISED JULY 1995
logic symbol
logic diagram (positive logic)
This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12. numbers shown packages.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, Input voltage range, (see Note Voltage range applied output high state power-off state, Current into output state, SN54ABT125 SN74ABT125 Input clamp current, Output clamp current, Maximum power dissipation 55°C still air) (see Note package 1.25 package package Storage temperature range, Tstg 65°C 150°C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output negative-voltage ratings exceeded input output clamp-current ratings observed. maximum package power dissipation calculated using junction temperature 150°C board trace length mils, except package, which trace length zero. more information, refer Package Thermal Considerations application note 1994 Advanced BiCMOS Technology Data Book, literature number SCBD002B.
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT125, SN74ABT125 QUADRUPLE BUFFER GATES WITH 3-STATE OUTPUTS
SCBS182C FEBRUARY 1991 REVISED JULY 1995
recommended operating conditions (see Note
SN54ABT125 /VCC Supply voltage High-level input voltage Low-level input voltage Input voltage High-level output current Low-level output current Input transition rise fall rate Power-up ramp rate SN74ABT125 UNIT
Operating free-air temperature NOTE Unused floating inputs must held high low.
PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice.
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT125, SN74ABT125 QUADRUPLE BUFFER GATES WITH 3-STATE OUTPUTS
SCBS182C FEBRUARY 1991 REVISED JULY 1995
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER IOZPU IOZPD IOZH IOZL Ioff ICEX TEST CONDITIONS 0.55 0.55* ±100 Outputs high Outputs Outputs disabled Outputs enabled Outputs disabled -100 0.05 0.05 0.55 0.55 ±100 0.05 25°C -1.2 SN54ABT125 -1.2 SN74ABT125 -1.2 UNIT
Outputs high
input Other inputs
Data inputs
Control inputs
products compliant MIL-STD-883, Class this parameter does apply. typical values more than output should tested time, duration test should exceed second. This limit vary among suppliers. This increase supply current each input that specified voltage level rather than GND.
switching characteristics over recommended ranges supply voltage operating free-air temperature (unless otherwise noted) (see Figure
PARAMETER tPHZ FROM (INPUT) (OUTPUT) 25°C SN54ABT125 SN74ABT125 UNIT
This limit vary among suppliers.
PRODUCT PREVIEW information concerns products formative design phase development. Characteristic data other specifications design goals. Texas Instruments reserves right change discontinue these products without notice.
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT125, SN74ABT125 QUADRUPLE BUFFER GATES WITH 3-STATE OUTPUTS
SCBS182C FEBRUARY 1991 REVISED JULY 1995
PARAMETER MEASUREMENT INFORMATION
Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Open
From Output Under Test (see Note
LOAD CIRCUIT OUTPUTS
Timing Input
Input VOLTAGE WAVEFORMS PULSE DURATION Data Input VOLTAGE WAVEFORMS SETUP HOLD TIMES Output Control tPZL Output Waveform (see Note Output Waveform Open (see Note tPZH tPLZ tPHZ
Input tPLH Output tPHL Output tPHL tPLH VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING
NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement.
Figure Load Circuit Voltage Waveforms
POST OFFICE 655303
DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments (TI) reserves right make changes products discontinue semiconductor product service without notice, advises customers obtain latest version relevant information verify, before placing orders, that information being relied current. warrants performance semiconductor products related software specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. Certain applications using semiconductor products involve potential risks death, personal injury, severe property environmental damage ("Critical Applications"). SEMICONDUCTOR PRODUCTS DESIGNED, INTENDED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT APPLICATIONS, DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. Inclusion products such applications understood fully risk customer. products such applications requires written approval appropriate officer. Questions concerning potential risk applications should directed through local sales office. order minimize risks associated with customer's applications, adequate design operating safeguards should provided customer minimize inherent procedural hazards. assumes liability applications assistance, customer product design, software performance, infringement patents services described herein. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used.
Copyright 1995, Texas Instruments Incorporated

Other recent searches


STP25NM60N - STP25NM60N   STP25NM60N Datasheet
STF25NM60N - STF25NM60N   STF25NM60N Datasheet
STB25NM60N - STB25NM60N   STB25NM60N Datasheet
STW25NM60N - STW25NM60N   STW25NM60N Datasheet
SN74ALVTH16821 - SN74ALVTH16821   SN74ALVTH16821 Datasheet
SN54ALVTH16821 - SN54ALVTH16821   SN54ALVTH16821 Datasheet
RT8208A - RT8208A   RT8208A Datasheet
MC3425 - MC3425   MC3425 Datasheet
MAX1722 - MAX1722   MAX1722 Datasheet
MAX1723 - MAX1723   MAX1723 Datasheet
MAX1724 - MAX1724   MAX1724 Datasheet
K5Q6432YCM - K5Q6432YCM   K5Q6432YCM Datasheet
CY7C460A - CY7C460A   CY7C460A Datasheet
CY7C462A - CY7C462A   CY7C462A Datasheet
CY7C464A - CY7C464A   CY7C464A Datasheet
CY7C466A - CY7C466A   CY7C466A Datasheet
CP1016 - CP1016   CP1016 Datasheet
AUY20A - AUY20A   AUY20A Datasheet

 

Privacy Policy | Disclaimer
© 2012 Datasheet Archive