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Quad 2-Input NAND Gate TC74HCT00A high speed CMOS 2-INPUT NAND GA
Top Searches for this datasheetTC74HCT00AP/AF/AFN Quad 2-Input NAND Gate TC74HCT00A high speed CMOS 2-INPUT NAND GATE fabricated with silicon gate C2MOS technology. achieves high speed operation similar equivalent LSTTL while maintaining CMOS power dissipation. This device used level converter interfacing NMOS High Speed CMOS. inputs compatible with TTL, NMOS CMOS output voltage levels. internal circuit composed stages including buffer output, which provide high noise immunity stable output. inputs equipped with protection circuits against static discharge transient excess voltage. Note: xxxFN (JEDEC SOP) available Japan. TC74HCT00AP TC74HCT00AF Features High speed: (typ.) power dissipation: (max) 25°C Compatible with outputs: (min) (max) Wide interfacing ability: LSTTL, NMOS, CMOS Output drive capability: LSTTL loads Symmetrical output impedance: |IOH| (min) Balanced propagation delays: tpLH tpHL function compatible with 74LS00 TC74HCT00AFN Assignment Weight DIP14-P-300-2.54 SOP14-P-300-1.27A SOL14-P-150-1.27 0.96 (typ.) 0.18 (typ.) 0.12 (typ.) 2007-10-01 TC74HCT00AP/AF/AFN Logic Symbol Truth Table Absolute Maximum Ratings (Note Characteristics Supply voltage range input voltage output voltage Input diode current Output diode current output current VCC/ground current Power dissipation Storage temperature Symbol VOUT IOUT Tstg Rating -0.5~7 -0.5~VCC -0.5~VCC (DIP) (Note 2)/180 (SOP) -65~150 Unit Note Exceeding absolute maximum ratings, even briefly, lead deterioration performance even destruction. Using continuously under heavy loads (e.g. application high temperature/current/voltage significant change temperature, etc.) cause this product decrease reliability significantly even operating conditions (i.e. operating temperature/current/voltage, etc.) within absolute maximum ratings operating ranges. Please design appropriate reliability upon reviewing Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept Methods") individual reliability data (i.e. reliability test report estimated failure rate, etc). Note range 65°C. From 85°C derating factor mW/°C shall applied until Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise fall time Symbol VOUT Topr Rating 4.5~5.5 0~VCC 0~VCC -40~85 0~500 Unit Note: operating ranges must maintained ensure normal operation device. Unused inputs must tied either GND. 2007-10-01 TC74HCT00AP/AF/AFN Electrical Characteristics Characteristics Characteristics High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Input leakage current Quiescent supply current Symbol Test Condition input: Other input: 4.5~5.5 4.5~5.5 4.18 25°C Typ. 4.31 0.17 0.26 ±0.1 -40~85°C 4.13 0.33 ±1.0 10.0 Unit Characteristics 25°C, input: Characteristics Output transition time Symbol tTLH tTHL tpLH tpHL Test Condition Typ. Unit Propagation delay time Characteristics input: Characteristics Symbol tTLH tTHL tpLH tpHL (Note) Test Condition 25°C Typ. -40~85°C Unit Output transition time Propagation delay time Input capacitance Power dissipation capacitance Note: defined value internal equivalent capacitance which calculated from operating current consumption without load. Average operating current obtained equation: (opr) CPDVCCfIN ICC/4 (per gate) 2007-10-01 TC74HCT00AP/AF/AFN Package Dimensions Weight: 0.96 (typ.) 2007-10-01 TC74HCT00AP/AF/AFN Package Dimensions Weight: 0.18 (typ.) 2007-10-01 TC74HCT00AP/AF/AFN Package Dimensions (Note) Note: This package available Japan. Weight: 0.12 (typ.) 2007-10-01 TC74HCT00AP/AF/AFN RESTRICTIONS PRODUCT Toshiba Corporation, subsidiaries affiliates (collectively "TOSHIBA"), reserve right make changes information this document, related hardware, software systems (collectively "Product") without notice. This document information herein reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's written permission, reproduction permissible only reproduction without alteration/omission. Though TOSHIBA works continually improve Product's quality reliability, Product malfunction fail. 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