Quad 2-Input NAND Gate TC74HC00A high speed CMOS 2-INPUT NAND GAT

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Quad 2-Input NAND Gate TC74HC00A high speed CMOS 2-INPUT NAND GAT

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TC74HC00AP/AF/AFN
Quad 2-Input NAND Gate
TC74HC00A high speed CMOS 2-INPUT NAND GATE fabricated with silicon gate C2MOS technology. achieves high speed operation similar equivalent LSTTL while maintaining CMOS power dissipation. internal circuit composed stages including buffer output, which provide high noise immunity stable output. inputs equipped with protection circuits against static discharge transient excess voltage.
Note: xxxFN (JEDEC SOP) available Japan. TC74HC00AP
Features
High speed: (typ.) power dissipation: (max) 25°C High noise immunity: VNIH VNIL (min) Output drive capability: LSTTL loads Symmetrical output impedance: |IOH| (min) Balanced propagation delays: tpLH tpHL Wide operating voltage range: (opr) function compatible with 74LS00
TC74HC00AFN TC74HC00AF
Assignment
Weight DIP14-P-300-2.54 SOP14-P-300-1.27A SOL14-P-150-1.27
0.96 (typ.) 0.18 (typ.) 0.12 (typ.)
Logic Symbol
2007-10-01
TC74HC00AP/AF/AFN
Truth Table
Absolute Maximum Ratings (Note
Characteristics Supply voltage range input voltage output voltage Input diode current Output diode current output current VCC/ground current Power dissipation Storage temperature Symbol VOUT IOUT Tstg Rating -0.5 -0.5 -0.5 (DIP) (Note 2)/180 (SOP) Unit
Note Exceeding absolute maximum ratings, even briefly, lead deterioration performance even destruction. Using continuously under heavy loads (e.g. application high temperature/current/voltage significant change temperature, etc.) cause this product decrease reliability significantly even operating conditions (i.e. operating temperature/current/voltage, etc.) within absolute maximum ratings operating ranges. Please design appropriate reliability upon reviewing Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept Methods") individual reliability data (i.e. reliability test report estimated failure rate, etc). Note range 65°C. From 85°C derating factor mW/°C shall applied until
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Symbol VOUT Topr Rating 1000 (VCC Input rise fall time (VCC (VCC Unit
Note:
operating ranges must maintained ensure normal operation device. Unused inputs must tied either GND.
2007-10-01
TC74HC00AP/AF/AFN
Electrical Characteristics
Characteristics
Characteristics Symbol Test Condition High-level input voltage Low-level input voltage High-level output voltage -5.2 Low-level output voltage Input leakage current Quiescent supply current 1.50 3.15 4.20 4.18 5.68 25°C Typ. 4.31 5.80 0.17 0.18 0.50 1.35 1.80 0.26 0.26 ±0.1 85°C 1.50 3.15 4.20 4.13 5.63 0.50 1.35 1.80 0.33 0.33 ±1.0 10.0 Unit
Characteristics 25°C, input:
Characteristics Output transition time Symbol tTLH tTHL tpLH tpHL Test Condition Typ. Unit
Propagation delay time
2007-10-01
TC74HC00AP/AF/AFN
Characteristics input:
Characteristics Symbol Test Condition tTLH tTHL 25°C Typ. 85°C Unit
Output transition time
Propagation delay time Input capacitance Power dissipation capacitance
tpLH tpHL (Note)
Note:
defined value internal equivalent capacitance which calculated from operating current consumption without load. Average operating current obtained equation: (opr) CPDVCCfIN ICC/4 (per gate)
2007-10-01
TC74HC00AP/AF/AFN
Package Dimensions
Weight: 0.96 (typ.)
2007-10-01
TC74HC00AP/AF/AFN
Package Dimensions
Weight: 0.18 (typ.)
2007-10-01
TC74HC00AP/AF/AFN
Package Dimensions (Note)
Note: This package available Japan. Weight: 0.12 (typ.)
2007-10-01
TC74HC00AP/AF/AFN
RESTRICTIONS PRODUCT
Toshiba Corporation, subsidiaries affiliates (collectively "TOSHIBA"), reserve right make changes information this document, related hardware, software systems (collectively "Product") without notice. This document information herein reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's written permission, reproduction permissible only reproduction without alteration/omission. Though TOSHIBA works continually improve Product's quality reliability, Product malfunction fail. Customers responsible complying with safety standards providing adequate designs safeguards their hardware, software systems which minimize risk avoid situations which malfunction failure Product could cause loss human life, bodily injury damage property, including data loss corruption. Before creating producing designs using, customers must also refer comply with latest versions relevant TOSHIBA information, including without limitation, this document, specifications, data sheets application notes Product precautions conditions forth "TOSHIBA Semiconductor Reliability Handbook" instructions application that Product will used with for. Customers solely responsible aspects their product design applications, including limited determining appropriateness this Product such design applications; evaluating determining applicability information contained this document, charts, diagrams, programs, algorithms, sample application circuits, other referenced documents; validating operating parameters such designs applications. TOSHIBA ASSUMES LIABILITY CUSTOMERS' PRODUCT DESIGN APPLICATIONS. Product intended general electronics applications (e.g., computers, personal equipment, office equipment, measuring equipment, industrial robots home electronics appliances) specific applications expressly stated this document. Product neither intended warranted equipment systems that require extraordinarily high levels quality and/or reliability and/or malfunction failure which cause loss human life, bodily injury, serious property damage serious public impact ("Unintended Use"). Unintended includes, without limitation, equipment used nuclear facilities, equipment used aerospace industry, medical equipment, equipment used automobiles, trains, ships other transportation, traffic signaling equipment, equipment used control combustions explosions, safety devices, elevators escalators, devices related electric power, equipment used finance-related fields. Product Unintended unless specifically permitted this document. disassemble, analyze, reverse-engineer, alter, modify, translate copy Product, whether whole part. Product shall used incorporated into products systems whose manufacture, use, sale prohibited under applicable laws regulations. information contained herein presented only guidance Product use. responsibility assumed TOSHIBA infringement patents other intellectual property rights third parties that result from Product. license intellectual property right granted this document, whether express implied, estoppel otherwise. ABSENT WRITTEN SIGNED AGREEMENT, EXCEPT PROVIDED RELEVANT TERMS CONDITIONS SALE PRODUCT, MAXIMUM EXTENT ALLOWABLE LAW, TOSHIBA ASSUMES LIABILITY WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, INCIDENTAL DAMAGES LOSS, INCLUDING WITHOUT LIMITATION, LOSS PROFITS, LOSS OPPORTUNITIES, BUSINESS INTERRUPTION LOSS DATA, DISCLAIMS EXPRESS IMPLIED WARRANTIES CONDITIONS RELATED SALE, PRODUCT, INFORMATION, INCLUDING WARRANTIES CONDITIONS MERCHANTABILITY, FITNESS PARTICULAR PURPOSE, ACCURACY INFORMATION, NONINFRINGEMENT. otherwise make available Product related software technology military purposes, including without limitation, design, development, use, stockpiling manufacturing nuclear, chemical, biological weapons missile technology products (mass destruction weapons). Product related software technology controlled under Japanese Foreign Exchange Foreign Trade U.S. Export Administration Regulations. Export re-export Product related software technology strictly prohibited except compliance with applicable export laws regulations. Please contact your TOSHIBA sales representative details environmental matters such RoHS compatibility Product. Please Product compliance with applicable laws regulations that regulate inclusion controlled substances, including without limitation, RoHS Directive. TOSHIBA assumes liability damages losses occurring result noncompliance with applicable laws regulations.
2007-10-01

Quad 2-Input NAND Gate TC74HC00A high speed CMOS 2-INPUT NAND GAT

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