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SP485 Family Products (Revision Prepared Velvet Doung Greg W


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SP485 Family Products
(Revision
Prepared Velvet Doung Greg West Date: 2006
SP485 Product Family Characterization Report
Table Contents
Section Introduction Characterization Procedure Data Summary Parameters 4.75V 5.0V 5.25V Conclusions Data Histograms Page Appendix
Page 8/16/2006
SP485 Product Family Characterization Report
Introduction: This product family characterization done part qualification Sipex's fabrication site transfer from Sipex's Hillview Milpitas, contract foundry, Episil, Taiwan. This characterization report summarizes data SP485 product characteristics contains distributions parameters. complete listing product numbers covered this characterization report included "Conclusion" section this report. Wafer Fab: Episil Location: Taiwan Process: Episil SC2- 1566 Assembly location: Carsem Characterization Procedure: number(s): A192 (Hillview), A951 (Episil) Temperatures: Ambient, 85C, -40C Tester: Test Program: SP485CH01.AT
Page 8/16/2006
SP485 Product Family Characterization Report
Data Summary:
Parameter Data Summary Across Temperature
Parameter 1.000: 3.5V 2.002:VOD 54OHMS 3.1V 2.004:VOD 54OHMS 3.5V 10.000: 12V@ 3.5V 10.004: @3.5V 10.005: 12V@ 3.5V 10.002: 3.5V 3.000: TPHL 3.1V 3.001: TPLH 3.1V 3.002: TPHL 3.1V 3.003: TPLH 3.1V 7.000: INPUT CURRENT V=2V 3.5V 5.000:TPLH 3.1V 5.001: TPHL 3.1V 6.005: 3.5V 6.006: 3.5V
Units Hillview Distribution Mean Hillview Distribution Variance Hillview (across temp) Episil Distribution Mean Episil Distribution Variance Episil (across temp)
1.238E-03
156.669E-06 159.139E-03 163.264E-03 18.304 28.468 17.748 28.437 4.818 4.650 5.271 5.341 19.934 7.075 7.768 6.617 2.064
1.6203 1.1634 1.7820 1.9705 0.9613 2.0004 1.0734 1.4094 1.6976 1.1866 1.2497 >4.00 1.3984 1.2903 2.0995 >4.0000
1.019E-03 1.995 2.298 109.137 -153.243 108.153 -144.149 42.788 39.634 44.707 43.129 109.934 83.903 85.768 20.850 -16.910
90.318E-06 175.263E-03 176.508E-03 22.098 28.797 20.841 26.955 5.425 5.210 5.965 6.003 20.736 7.466 9.418 2.418 2.154
3.6194 0.9418 1.5078 1.6463 1.1200 1.7298 1.3090 1.0576 1.3030 0.8546 0.9368 >4.00 0.7187 0.5037 1.9091 3.6993
2.055
2.373
108.204
-167.897
106.509
-158.427
39.628
36.320
41.236
39.976
-13.351
70.319
69.930
21.467
-18.006
Page 8/16/2006
SP485 Product Family Characterization Report
Conclusion: Characterization data over temperature range show datasheet parameters meet spec. Cpk's most parameters comparable between Hillview Episil although many show strong temperature dependence that tends produce lower Cpk's this analysis. performance SP485 parts fabricated Episil comparable current SP485 parts built from Hillview fab. This Characterization applies following SP485 family product part numbers:
SP485BN SP485BN-L SP485CN SP485CN-L SP485CS SP485CS-L SP485DN SP485DN-L SP485EN SP485EN-L SP485ES SP485ES-L SP485SN SP485SN-L SP485SS SP485SS-L
Page 8/16/2006
SP485 Product Family Characterization Report
Appendix Characterization Data Histograms
Page 8/16/2006
This page intentionally left blank
Vcc=4.75V Test alltempHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 05:47
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
528.093E-06 535.911E-06 493.936E-06 451.961E-06 469.113E-06 58.981E-06 13.992E-06 503.402E-06 492.707E-06 484.077E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 07:49
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
397.032E-06 401.595E-06 21.774E-06 >4.0000 >4.0000 21.774E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
421.477E-06 326.554E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 05:47
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
654.898E-06 670.335E-06 595.470E-06 520.604E-06 557.383E-06 97.515E-06 24.955E-06 613.479E-06 589.921E-06 575.691E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 07:49
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
431.729E-06 439.999E-06 32.874E-06 >4.0000 >4.0000 32.874E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
470.371E-06 325.294E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 05:47
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
386.555E-06 393.972E-06 340.379E-06 286.785E-06 313.117E-06 73.438E-06 17.864E-06 353.523E-06 337.324E-06 324.871E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 07:49
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
152.403E-06 160.864E-06 29.674E-06 1.7120 >4.0000 29.674E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
191.657E-06 59.173E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 05:47
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
386.486E-06 393.834E-06 340.334E-06 286.834E-06 313.161E-06 73.325E-06 17.833E-06 353.183E-06 337.043E-06 324.694E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 07:49
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
152.375E-06 160.708E-06 29.649E-06 1.7131 >4.0000 29.649E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
191.572E-06 59.230E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 05:47
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-3.768 -3.570 -3.981 -4.391 -4.196 428.043E-03 136.959E-03 -3.817 -3.974 -4.137
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 2.7245 >4.0000 2.7245 -1.550 -5.100
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 07:49
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean Median StdDev StdDev
-4.111 -4.118 108.271E-03 3.0439 >4.0000 108.271E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-3.967 -4.252 -1.550 -5.100
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 05:47
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.351 4.509 4.220 3.931 4.085 266.193E-03 96.198E-03 4.338 4.209 4.113
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 3.0494 3.0494 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 07:49
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean Median StdDev StdDev
4.293 4.294 74.598E-03 3.6059 >4.0000 74.598E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.394 4.133 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 05:47
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.969 2.114 1.862 1.609 1.738 230.646E-03 84.284E-03 1.958 1.867 1.762
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.2324 >4.0000 1.2324 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 07:49
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean Median StdDev StdDev
1.739 1.741 94.297E-03 0.6665 >4.0000 94.297E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.868 1.582 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.003, Test.Name=VOS IN=H
Section
2006, 05:47
Test.Number=2.003, Test.Name=VOS IN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.341 2.509 2.288 2.067 1.621 720.206E-03 73.710E-03 2.313 2.298 2.279
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.003, Test.Name=VOS IN=H
Section
2006, 07:49
Test.Number=2.003, Test.Name=VOS IN=H
Statistics:
Mean Median StdDev StdDev
2.208 2.222 106.722E-03 106.722E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.284 1.513
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 05:47
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.978 2.122 1.872 1.622 1.746 231.389E-03 83.346E-03 1.967 1.878 1.774
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.2876 >4.0000 1.2876 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 07:49
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean Median StdDev StdDev
1.748 1.750 93.105E-03 0.7095 >4.0000 93.105E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.876 1.605 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 05:47
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.330 2.353 2.300 2.247 2.259 71.457E-03 17.628E-03 2.318 2.302 2.285
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 07:49
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean Median StdDev StdDev
2.227 2.227 29.229E-03 29.229E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.269 2.154
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.006, Test.Name=VOD BALANCE
Section
2006, 05:47
Test.Number=2.006, Test.Name=VOD BALANCE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median 29.506E-03 -6.001E-03 -190.735E-06 StatHigh SpecHigh 92.664E-03 SpecLow 11.836E-03 StatLow 34.928E-03
92.473E-03 65.012E-03
>4.0000 >4.0000 >4.0000 >4.0000 195.000E-03 -195.000E-03
29.030E-03 23.590E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=2.006, Test.Name=VOD BALANCE
Section
2006, 07:49
Test.Number=2.006, Test.Name=VOD BALANCE
Statistics:
Mean Median StdDev StdDev
27.842E-03 27.080E-03 5.996E-03 >4.0000 >4.0000 5.996E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
50.593E-03 16.408E-03 195.000E-03 -195.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Section
2006, 05:47
Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.746 4.749 4.745 4.741 4.743 3.658E-03 1.412E-03 4.746 4.745 4.743
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 5.100 3.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Section
2006, 07:49
Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Statistics:
Mean Median StdDev StdDev
4.744 4.744 1.680E-03 >4.0000 >4.0000 1.680E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.746 4.741 5.100 3.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Section
2006, 05:47
Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
123.313E-09 129.509E-09 111.705E-09 93.901E-09 98.604E-09 24.709E-09 5.935E-09 115.193E-09 111.737E-09 106.607E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09 -1000.000E09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Section
2006, 07:49
Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Statistics:
Mean Median StdDev StdDev
42.439E-09 43.066E-09 4.780E-09 3.6656 >4.0000 4.780E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
53.289E-09 27.299E-09 95.000E-09 -95.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Section
2006, 05:47
Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
21.344E-09 22.367E-09 7.790E-09 -6.786E-09 122.782E-12 21.221E-09 4.859E-09 11.171E-09 8.127E-09 3.267E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09 -1000.000E09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Section
2006, 07:49
Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Statistics:
Mean Median StdDev StdDev
19.162E-09 19.791E-09 3.848E-09 >4.0000 >4.0000 3.848E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
28.218E-09 9.400E-09 95.000E-09 -95.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.003, Test.Name=RX -4MA
Section
2006, 05:47
Test.Number=3.003, Test.Name=RX -4MA
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.297 4.542 4.127 3.713 3.946 350.846E-03 138.129E-03 4.287 4.135 3.960
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7496 1.3935 2.1056 1.3935 5.000 3.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.003, Test.Name=RX -4MA
Section
2006, 07:49
Test.Number=3.003, Test.Name=RX -4MA
Statistics:
Mean Median StdDev StdDev
3.980 3.982 182.412E-03 0.7853 1.3248 182.412E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.214 3.695 5.000 3.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.004, Test.Name=RX
Section
2006, 05:47
Test.Number=3.004, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
255.934E-03 321.382E-03 193.124E-03 64.867E-03 138.667E-03 117.267E-03 42.752E-03 245.987E-03 187.620E-03 144.918E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.5399 1.5058 1.5740 1.5058 395.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.004, Test.Name=RX
Section
2006, 07:49
Test.Number=3.004, Test.Name=RX
Statistics:
Mean Median StdDev StdDev
206.548E-03 204.086E-03 45.369E-03 1.3846 1.4511 45.369E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
265.616E-03 146.859E-03 395.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.005, Test.Name=RX
Section
2006, 05:47
Test.Number=3.005, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
33.422E-03 39.221E-03 28.662E-03 18.103E-03 23.527E-03 9.895E-03 3.520E-03 32.798E-03 28.806E-03 24.459E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 2.0515 >4.0000 2.0515 95.000E-03 7.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.005, Test.Name=RX
Section
2006, 07:49
Test.Number=3.005, Test.Name=RX
Statistics:
Mean Median StdDev StdDev
26.959E-03 26.801E-03 3.701E-03 1.7975 3.9626 3.701E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
31.897E-03 22.324E-03 95.000E-03 7.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.006, Test.Name=RX
Section
2006, 05:47
Test.Number=3.006, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-10.877E-03 -7.235E-03 -13.437E-03 -19.638E-03 -16.289E-03 5.413E-03 2.067E-03 -11.111E-03 -13.214E-03 -15.919E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 1.0379 1.0379 -7.000E-03 -95.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=3.006, Test.Name=RX
Section
2006, 07:49
Test.Number=3.006, Test.Name=RX
Statistics:
Mean Median StdDev StdDev
-10.827E-03 -10.599E-03 1.836E-03 0.6950 >4.0000 1.836E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-8.086E-03 -13.509E-03 -7.000E-03 -95.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.000, Test.Name=DI TRIP POINT
Section
2006, 05:47
Test.Number=4.000, Test.Name=DI TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.775 1.852 1.683 1.513 1.525 250.000E-03 56.544E-03 1.725 1.725 1.625
Foundry
StatHigh SpecHigh SpecLow StatLow
3.5370 >4.0000 1.8700 1.8700 2.000 800.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.000, Test.Name=DI TRIP POINT
Section
2006, 07:49
Test.Number=4.000, Test.Name=DI TRIP POINT
Statistics:
Mean Median StdDev StdDev
1.729 1.725 68.959E-03 1.3078 2.9003 68.959E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.825 1.575 2.000 800.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.001, Test.Name=^RE TRIP POINT
Section
2006, 05:47
Test.Number=4.001, Test.Name=^RE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.675 1.729 1.584 1.439 1.525 150.000E-03 48.330E-03 1.625 1.575 1.525
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.8699 2.8699 2.000 800.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.001, Test.Name=^RE TRIP POINT
Section
2006, 07:49
Test.Number=4.001, Test.Name=^RE TRIP POINT
Statistics:
Mean Median StdDev StdDev
1.591 1.575 60.263E-03 2.2647 3.3188 60.263E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.675 1.475 2.000 800.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.002, Test.Name=DE TRIP POINT
Section
2006, 05:47
Test.Number=4.002, Test.Name=DE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.675 1.719 1.570 1.421 1.475 200.000E-03 49.746E-03 1.625 1.575 1.525
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.8813 2.8813 2.000 800.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.002, Test.Name=DE TRIP POINT
Section
2006, 07:49
Test.Number=4.002, Test.Name=DE TRIP POINT
Statistics:
Mean Median StdDev StdDev
1.577 1.575 67.003E-03 2.1033 2.9850 67.003E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.675 1.425 2.000 800.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:47
Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-31.651E-09 -24.149E-09 -42.644E-09 -61.138E-09 -57.957E-09 26.306E-09 6.165E-09 -37.497E-09 -41.906E-09 -46.584E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 900.000E-06 -900.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Section
2006, 07:49
Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean Median StdDev StdDev
-48.298E-09 -48.863E-09 5.490E-09 >4.0000 >4.0000 5.490E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-23.228E-09 -57.520E-09 900.000E-06 -900.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:47
Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-51.596E-09 -55.768E-09 -114.910E-09 -174.052E-09 -155.280E-09 103.684E-09 19.714E-09 -104.752E-09 -117.624E-09 -127.964E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 900.000E-06 -900.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Section
2006, 07:49
Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean Median StdDev StdDev
-84.765E-09 -76.877E-09 25.450E-09 >4.0000 >4.0000 25.450E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-57.692E-09 -157.355E-09 900.000E-06 -900.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:47
Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-26.466E-09 -23.205E-09 -42.700E-09 -62.194E-09 -61.740E-09 35.274E-09 6.498E-09 -38.749E-09 -43.244E-09 -46.781E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 900.000E-06 -900.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Section
2006, 07:49
Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean Median StdDev StdDev
-48.359E-09 -48.371E-09 3.968E-09 >4.0000 >4.0000 3.968E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-35.979E-09 -55.850E-09 900.000E-06 -900.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:47
Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
16.127E-09 -7.130E-09 -34.876E-09 -62.623E-09 -53.782E-09 69.909E-09 9.249E-09 -30.619E-09 -34.305E-09 -40.101E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 900.000E-06 -900.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Section
2006, 07:49
Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean Median StdDev StdDev
402.980E-09 533.879E-09 391.216E-09 >4.0000 >4.0000 391.216E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
912.370E-09 -48.139E-09 900.000E-06 -900.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:47
Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-1.976E-09 -17.842E-09 -39.372E-09 -60.902E-09 -54.616E-09 52.640E-09 7.177E-09 -35.778E-09 -40.396E-09 -43.761E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 900.000E-06 -900.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Section
2006, 07:49
Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean Median StdDev StdDev
-48.003E-09 -47.917E-09 8.512E-09 >4.0000 >4.0000 8.512E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-23.646E-09 -111.638E-09 900.000E-06 -900.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:47
Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-35.680E-09 -30.283E-09 -47.054E-09 -63.824E-09 -59.210E-09 23.530E-09 5.590E-09 -43.024E-09 -47.063E-09 -50.808E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 900.000E-06 -900.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Section
2006, 07:49
Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean Median StdDev StdDev
-56.790E-09 -56.280E-09 10.775E-09 >4.0000 >4.0000 10.775E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-47.180E-09 -141.805E-09 900.000E-06 -900.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.000, Test.Name=IA V=-7V
Section
2006, 05:47
Test.Number=5.000, Test.Name=IA V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
480.558E-06 497.915E-06 432.234E-06 366.552E-06 397.903E-06 82.655E-06 21.894E-06 449.750E-06 428.132E-06 414.900E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 795.000E-06 -795.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=5.000, Test.Name=IA V=-7V
Section
2006, 07:49
Test.Number=5.000, Test.Name=IA V=-7V
Statistics:
Mean Median StdDev StdDev
463.974E-06 464.534E-06 21.760E-06 >4.0000 >4.0000 21.760E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
499.813E-06 425.637E-06 795.000E-06 -795.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.002, Test.Name=RA
Section
2006, 05:47
Test.Number=5.002, Test.Name=RA
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
16.802E03 18.033E03 15.361E03 12.689E03 13.678E03 3.124E03 890.595 16.123E03 15.486E03 14.565E03
Foundry
StatHigh SpecHigh SpecLow StatLow
3.3685 1.2580 >4.0000 1.2580 30.000E03 12.000E03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=5.002, Test.Name=RA
Section
2006, 07:49
Test.Number=5.002, Test.Name=RA
Statistics: (OHMS)
Mean Median StdDev StdDev
14.424E03 14.396E03 786.996 1.0268 3.8120 786.996
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
15.822E03 13.223E03 30.000E03 12.000E03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.003, Test.Name=IB V=12V
Section
2006, 05:47
Test.Number=5.003, Test.Name=IB V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
784.120E-06 808.613E-06 712.633E-06 616.652E-06 661.707E-06 122.413E-06 31.993E-06 734.614E-06 708.629E-06 690.206E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.4731 2.4731 950.000E-06 -950.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=5.003, Test.Name=IB V=12V
Section
2006, 07:49
Test.Number=5.003, Test.Name=IB V=12V
Statistics:
Mean Median StdDev StdDev
771.240E-06 772.858E-06 31.493E-06 1.8920 >4.0000 31.493E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
825.805E-06 713.447E-06 950.000E-06 -950.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.004, Test.Name=IB V=-7V
Section
2006, 05:47
Test.Number=5.004, Test.Name=IB V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
457.260E-06 471.484E-06 415.457E-06 359.430E-06 385.774E-06 71.486E-06 18.676E-06 428.336E-06 413.088E-06 402.353E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 795.000E-06 -795.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=5.004, Test.Name=IB V=-7V
Section
2006, 07:49
Test.Number=5.004, Test.Name=IB V=-7V
Statistics:
Mean Median StdDev StdDev
450.196E-06 451.101E-06 18.352E-06 >4.0000 >4.0000 18.352E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
481.972E-06 416.644E-06 795.000E-06 -795.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.005, Test.Name=RB
Section
2006, 05:47
Test.Number=5.005, Test.Name=RB
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
18.139E03 19.145E03 16.876E03 14.607E03 15.306E03 2.833E03 756.303 17.390E03 16.938E03 16.336E03
Foundry
StatHigh SpecHigh SpecLow StatLow
3.9667 2.1491 >4.0000 2.1491 30.000E03 12.000E03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=5.005, Test.Name=RB
Section
2006, 07:49
Test.Number=5.005, Test.Name=RB
Statistics: (OHMS)
Mean Median StdDev StdDev
15.581E03 15.523E03 636.565 1.8752 >4.0000 636.565
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
16.813E03 14.528E03 30.000E03 12.000E03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.000, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.000, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
141.379E-03 164.533E-03 115.175E-03 65.817E-03 93.448E-03 47.931E-03 16.453E-03 134.069E-03 114.278E-03 96.564E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
2.5325 2.3335 2.7316 2.3335 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.000, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.000, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
131.000E-03 126.386E-03 36.638E-03 1.0827 1.1373 36.638E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
205.385E-03 89.885E-03 250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.002, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.002, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
143.576E-03 167.571E-03 117.741E-03 67.911E-03 95.584E-03 47.993E-03 16.610E-03 136.812E-03 116.758E-03 99.018E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
2.5085 2.3628 2.6542 2.3628 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.002, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.002, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
148.292E-03 131.779E-03 40.575E-03 0.8356 1.0269 40.575E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
205.390E-03 97.135E-03 250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.003, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.003, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
905.888E-06 950.151E-06 811.027E-06 671.903E-06 738.910E-06 166.978E-06 46.375E-06 855.167E-06 808.347E-06 768.669E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.003, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.003, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
848.430E-06 848.576E-06 48.142E-06 >4.0000 >4.0000 48.142E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
929.040E-06 762.869E-06 250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.004, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.004, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -106.896E-03 -143.529E-03 -124.373E-03 StatHigh SpecHigh 34.744E-03 SpecLow 12.211E-03 -93.347E-03 StatLow
-89.629E-03 -70.263E-03
3.4122 3.9064 2.9180 2.9180 -250.000E-03
-105.767E-03 -121.245E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.004, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.004, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-80.645E-03 -80.345E-03 10.008E-03 2.6861 >4.0000 10.008E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-61.971E-03 -96.818E-03 -250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.005, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.005, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-371.565E-06 -347.588E-06 -410.567E-06 -473.546E-06 -453.279E-06 81.714E-06 20.993E-06 -395.349E-06 -409.633E-06 -427.092E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.005, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.005, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-456.880E-06 -454.374E-06 19.594E-06 >4.0000 >4.0000 19.594E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-413.902E-06 -501.529E-06 -250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.006, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.006, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -106.608E-03 -142.766E-03 -124.960E-03 StatHigh SpecHigh 34.582E-03 SpecLow 12.053E-03 -93.169E-03 StatLow
-90.377E-03 -70.450E-03
3.4570 3.9657 2.9484 2.9484 -250.000E-03
-105.530E-03 -120.762E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.006, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.006, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-80.681E-03 -80.290E-03 9.869E-03 2.7250 >4.0000 9.869E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-62.780E-03 -96.347E-03 -250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.007, Test.Name=ISC
Section
2006, 05:47
Test.Number=7.007, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-383.049E-06 -357.407E-06 -425.658E-06 -493.909E-06 -468.710E-06 85.661E-06 22.750E-06 -409.633E-06 -425.108E-06 -442.566E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=7.007, Test.Name=ISC
Section
2006, 07:49
Test.Number=7.007, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-466.841E-06 -463.480E-06 21.705E-06 >4.0000 >4.0000 21.705E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-425.409E-06 -510.259E-06 -250.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.000, Test.Name=TPHL
Section
2006, 05:47
Test.Number=8.000, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
45.323E-09 53.945E-09 36.761E-09 19.576E-09 30.177E-09 15.146E-09 5.728E-09 44.006E-09 35.351E-09 30.741E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.6585 2.1392 1.1778 1.1778 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.000, Test.Name=TPHL
Section
2006, 07:49
Test.Number=8.000, Test.Name=TPHL
Statistics:
Mean Median StdDev StdDev
37.994E-09 37.447E-09 6.614E-09 0.9579 1.4364 6.614E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
47.950E-09 29.454E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.001, Test.Name=TPLH
Section
2006, 05:47
Test.Number=8.001, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
38.455E-09 44.139E-09 31.856E-09 19.574E-09 26.790E-09 11.665E-09 4.094E-09 36.950E-09 30.741E-09 27.731E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.3204 2.5937 2.0471 2.0471 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.001, Test.Name=TPLH
Section
2006, 07:49
Test.Number=8.001, Test.Name=TPLH
Statistics:
Mean Median StdDev StdDev
32.931E-09 32.661E-09 4.627E-09 1.7338 2.0530 4.627E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
40.143E-09 26.852E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.002, Test.Name=TPHL
Section
2006, 05:47
Test.Number=8.002, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
42.500E-09 48.391E-09 34.866E-09 21.341E-09 29.518E-09 12.982E-09 4.508E-09 40.431E-09 33.563E-09 30.271E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.1072 2.5778 1.6365 1.6365 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.002, Test.Name=TPHL
Section
2006, 07:49
Test.Number=8.002, Test.Name=TPHL
Statistics:
Mean Median StdDev StdDev
34.860E-09 34.566E-09 4.894E-09 1.5078 1.9410 4.894E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
41.816E-09 28.432E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.003, Test.Name=TPLH
Section
2006, 05:47
Test.Number=8.003, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
42.406E-09 50.304E-09 34.278E-09 18.252E-09 28.107E-09 14.299E-09 5.342E-09 41.089E-09 32.999E-09 28.672E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7784 2.1389 1.4178 1.4178 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.003, Test.Name=TPLH
Section
2006, 07:49
Test.Number=8.003, Test.Name=TPLH
Statistics:
Mean Median StdDev StdDev
34.468E-09 34.148E-09 5.605E-09 1.3401 1.6950 5.605E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
42.745E-09 27.038E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Section
2006, 05:47
Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.186E-09 5.999E-09 2.158E-09 -1.682E-09 235.184E-12 3.951E-09 1.280E-09 3.575E-09 2.023E-09 893.699E-12
Foundry
StatHigh SpecHigh SpecLow StatLow
1.3019 0.5620 2.0419 0.5620 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Section
2006, 07:49
Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Statistics:
Mean Median StdDev StdDev
2.335E-09 2.254E-09 1.382E-09 0.5632 1.2060 1.382E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.926E-09 278.835E-12 10.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.005, Test.Name=RISE TIME
Section
2006, 05:47
Test.Number=8.005, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median 13.172E-09 -535.113E-12 StatHigh 8.634E-09 SpecHigh 11.759E-09 SpecLow 4.569E-09 StatLow 18.982E-09
20.393E-09 26.878E-09
1.1673 0.7421 1.5925 0.7421 35.000E-09 3.000E-09
10.186E-09 9.293E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.005, Test.Name=RISE TIME
Section
2006, 07:49
Test.Number=8.005, Test.Name=RISE TIME
Statistics:
Mean Median StdDev StdDev
26.127E-09 24.868E-09 3.700E-09 0.7994 1.4414 3.700E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
32.118E-09 21.615E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.006, Test.Name=FALL TIME
Section
2006, 05:47
Test.Number=8.006, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
18.456E-09 18.665E-09 17.183E-09 15.701E-09 16.293E-09 2.164E-09 494.021E-12 17.610E-09 17.045E-09 16.857E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.006, Test.Name=FALL TIME
Section
2006, 07:49
Test.Number=8.006, Test.Name=FALL TIME
Statistics:
Mean Median StdDev StdDev
29.856E-09 29.637E-09 798.843E-12 2.1464 >4.0000 798.843E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
31.310E-09 28.615E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.007, Test.Name=FALL TIME
Section
2006, 05:47
Test.Number=8.007, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
17.139E-09 17.386E-09 16.356E-09 15.327E-09 15.634E-09 1.505E-09 343.072E-12 16.575E-09 16.293E-09 16.104E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.007, Test.Name=FALL TIME
Section
2006, 07:49
Test.Number=8.007, Test.Name=FALL TIME
Statistics:
Mean Median StdDev StdDev
15.706E-09 15.695E-09 366.904E-12 >4.0000 >4.0000 366.904E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
16.625E-09 15.045E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.008, Test.Name=RISE TIME
Section
2006, 05:47
Test.Number=8.008, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
18.442E-09 23.263E-09 13.373E-09 3.483E-09 10.164E-09 8.278E-09 3.297E-09 17.784E-09 11.481E-09 10.822E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.6178 1.0488 2.1868 1.0488 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=8.008, Test.Name=RISE TIME
Section
2006, 07:49
Test.Number=8.008, Test.Name=RISE TIME
Statistics:
Mean Median StdDev StdDev
11.218E-09 10.881E-09 814.885E-12 3.3616 >4.0000 814.885E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
13.856E-09 9.859E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.000, Test.Name=TPLH
Section
2006, 05:47
Test.Number=9.000, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
89.707E-09 98.872E-09 79.048E-09 59.224E-09 66.660E-09 23.046E-09 6.608E-09 85.098E-09 80.311E-09 71.979E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.9875 >4.0000 3.9875 2.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=9.000, Test.Name=TPLH
Section
2006, 07:49
Test.Number=9.000, Test.Name=TPLH
Statistics:
Mean Median StdDev StdDev
138.909E-09 128.886E-09 30.639E-09 1.5113 >4.0000 30.639E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
289.729E-09 114.915E-09 2.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.001, Test.Name=TPHL
Section
2006, 05:47
Test.Number=9.001, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
86.870E-09 95.738E-09 73.494E-09 51.250E-09 61.342E-09 25.528E-09 7.415E-09 80.666E-09 73.840E-09 65.597E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.3040 >4.0000 3.3040 2.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=9.001, Test.Name=TPHL
Section
2006, 07:49
Test.Number=9.001, Test.Name=TPHL
Statistics:
Mean Median StdDev StdDev
181.658E-09 113.605E-09 131.203E-09 0.4615 2.5406 131.203E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
449.348E-09 104.961E-09 2.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.002, Test.Name=REC SKEW TIME
Section
2006, 05:47
Test.Number=9.002, Test.Name=REC SKEW TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
8.687E-09 11.037E-09 5.574E-09 112.134E-12 354.532E-12 8.332E-09 1.821E-09 6.914E-09 5.850E-09 4.609E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.0205 >4.0000 1.0205 2.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=9.002, Test.Name=REC SKEW TIME
Section
2006, 07:49
Test.Number=9.002, Test.Name=REC SKEW TIME
Statistics:
Mean Median StdDev StdDev
79.466E-09 23.489E-09 118.912E-09 0.2228 2.8032 118.912E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
329.369E-09 5.239E-09 2.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.003, Test.Name=REC TPLH+TPHL
Section
2006, 05:47
Test.Number=9.003, Test.Name=REC TPLH+TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
176.577E-09 194.300E-09 152.542E-09 110.784E-09 128.002E-09 48.575E-09 13.919E-09 166.118E-09 154.506E-09 137.221E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=9.003, Test.Name=REC TPLH+TPHL
Section
2006, 07:49
Test.Number=9.003, Test.Name=REC TPLH+TPHL
Statistics:
Mean Median StdDev StdDev
320.567E-09 249.914E-09 132.771E-09 132.771E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
584.696E-09 223.194E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=10.000, Test.Name=TZH
Section
2006, 05:47
Test.Number=10.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
35.727E-09 42.179E-09 29.334E-09 16.490E-09 24.062E-09 11.665E-09 4.281E-09 34.692E-09 28.389E-09 24.909E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.5303 2.2838 2.7768 2.2838 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=10.000, Test.Name=TZH
Section
2006, 07:49
Test.Number=10.000, Test.Name=TZH
Statistics:
Mean Median StdDev StdDev
34.278E-09 33.683E-09 5.110E-09 2.0040 2.1200 5.110E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
43.303E-09 27.502E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=10.001, Test.Name=TZL
Section
2006, 05:47
Test.Number=10.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
34.786E-09 40.543E-09 28.009E-09 15.474E-09 22.839E-09 11.947E-09 4.178E-09 33.187E-09 26.884E-09 23.780E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.5928 2.2345 2.9511 2.2345 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=10.001, Test.Name=TZL
Section
2006, 07:49
Test.Number=10.001, Test.Name=TZL
Statistics:
Mean Median StdDev StdDev
31.448E-09 31.127E-09 4.699E-09 2.2309 2.3055 4.699E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
38.470E-09 25.179E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=10.002, Test.Name=TLZ
Section
2006, 05:47
Test.Number=10.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
36.197E-09 42.104E-09 30.577E-09 19.050E-09 26.037E-09 10.160E-09 3.842E-09 35.445E-09 29.612E-09 26.508E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.8195 2.6526 2.9863 2.6526 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=10.002, Test.Name=TLZ
Section
2006, 07:49
Test.Number=10.002, Test.Name=TLZ
Statistics:
Mean Median StdDev StdDev
31.736E-09 31.592E-09 4.108E-09 2.5753 2.6372 4.108E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
38.098E-09 25.829E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=10.003, Test.Name=THZ
Section
2006, 05:47
Test.Number=10.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
39.960E-09 46.989E-09 33.649E-09 20.309E-09 28.295E-09 11.665E-09 4.447E-09 39.208E-09 32.764E-09 28.860E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.4363 2.5224 2.3501 2.3501 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=10.003, Test.Name=THZ
Section
2006, 07:49
Test.Number=10.003, Test.Name=THZ
Statistics:
Mean Median StdDev StdDev
35.007E-09 34.938E-09 4.973E-09 2.0104 2.1785 4.973E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
42.466E-09 28.246E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=11.000, Test.Name=TZH
Section
2006, 05:47
Test.Number=11.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
33.375E-09 41.918E-09 26.981E-09 12.045E-09 20.205E-09 13.170E-09 4.979E-09 32.623E-09 27.449E-09 20.958E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.1759 1.8064 2.5454 1.8064 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=11.000, Test.Name=TZH
Section
2006, 07:49
Test.Number=11.000, Test.Name=TZH
Statistics:
Mean Median StdDev StdDev
33.013E-09 32.335E-09 7.069E-09 1.5084 1.5326 7.069E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
44.511E-09 23.784E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=11.001, Test.Name=TZL
Section
2006, 07:49
Test.Number=11.001, Test.Name=TZL
Statistics:
Mean Median StdDev StdDev
31.475E-09 30.885E-09 9.093E-09 1.1538 1.1914 9.093E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
45.524E-09 19.778E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=11.001, Test.Name=TZL
Section
2006, 05:47
Test.Number=11.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
36.615E-09 48.515E-09 25.716E-09 2.918E-09 16.013E-09 20.602E-09 7.599E-09 34.640E-09 25.514E-09 16.672E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.4255 1.1280 1.7231 1.1280 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=11.002, Test.Name=TLZ
Section
2006, 05:47
Test.Number=11.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
26.696E-09 29.643E-09 23.537E-09 17.431E-09 20.393E-09 6.303E-09 2.035E-09 25.661E-09 23.780E-09 21.146E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.8548 >4.0000 3.8548 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=11.002, Test.Name=TLZ
Section
2006, 07:49
Test.Number=11.002, Test.Name=TLZ
Statistics:
Mean Median StdDev StdDev
26.704E-09 26.387E-09 2.291E-09 3.8846 >4.0000 2.291E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
30.105E-09 23.599E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=11.003, Test.Name=THZ
Section
2006, 05:47
Test.Number=11.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
29.612E-09 32.999E-09 26.136E-09 19.273E-09 22.463E-09 7.150E-09 2.288E-09 28.577E-09 26.414E-09 23.403E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.8082 >4.0000 3.8082 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=11.003, Test.Name=THZ
Section
2006, 07:49
Test.Number=11.003, Test.Name=THZ
Statistics:
Mean Median StdDev StdDev
30.217E-09 29.919E-09 2.661E-09 3.7850 >4.0000 2.661E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
34.194E-09 26.573E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=21.000, Test.Name=VCC
Section
2006, 05:47
Test.Number=21.000, Test.Name=VCC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.750 4.750 4.750 4.750 4.750 4.750 4.750 4.750
Foundry
StatHigh SpecHigh SpecLow StatLow
5.200 4.700
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=21.000, Test.Name=VCC
Section
2006, 07:49
Test.Number=21.000, Test.Name=VCC
Statistics:
Mean Median StdDev StdDev
4.750 4.750
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.750 4.750 5.200 4.700
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=100.000, Test.Name=VOS
Section
2006, 05:47
Test.Number=100.000, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -12.689E-03 -222.012E-03 -196.000E-03 StatHigh 309.999E-03 SpecHigh SpecLow 69.774E-03 StatLow 46.000E-03
113.999E-03 196.633E-03
0.9555 0.8948 1.0161 0.8948 200.000E-03 -200.000E-03
-4.001E-03 -62.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=100.000, Test.Name=VOS
Section
2006, 07:49
Test.Number=100.000, Test.Name=VOS
Statistics:
Mean Median StdDev StdDev
9.555E-03 7.999E-03 72.027E-03 0.8814 0.9256 72.027E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
138.000E-03 -120.001E-03 200.000E-03 -200.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=100.001, Test.Name=VOS
Section
2006, 05:47
Test.Number=100.001, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median 12.200E-03 -180.097E-03 -154.001E-03 StatHigh 280.000E-03 SpecHigh SpecLow 64.099E-03 StatLow 59.999E-03
125.999E-03 204.496E-03
1.0401 1.1035 0.9766 0.9766 200.000E-03 -200.000E-03
21.999E-03 -24.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A192CHC47: A192CHH47: A192CHR47:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
22-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=4.7V test tempHistogramHistogram: Test.Number=100.001, Test.Name=VOS
Section
2006, 07:49
Test.Number=100.001, Test.Name=VOS
Statistics:
Mean Median StdDev StdDev
-18.289E-03 -16.000E-03 57.963E-03 1.0450 1.1502 57.963E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
104.000E-03 -134.000E-03 200.000E-03 -200.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC47: A951CHH47: A951CHR47:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
02-MAY2006 02-MAY2006 03-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 05:52
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
617.508E-06 638.269E-06 565.637E-06 493.005E-06 527.355E-06 90.153E-06 24.211E-06 585.184E-06 559.951E-06 547.092E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 12:49
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
457.035E-06 466.792E-06 21.965E-06 >4.0000 >4.0000 21.965E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
473.433E-06 382.602E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 05:52
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
773.895E-06 811.364E-06 686.099E-06 560.834E-06 628.023E-06 145.871E-06 41.755E-06 723.953E-06 675.543E-06 648.161E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 12:49
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
506.080E-06 519.303E-06 32.911E-06 >4.0000 >4.0000 32.911E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
534.961E-06 390.325E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 05:52
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
485.153E-06 509.510E-06 414.806E-06 320.102E-06 370.602E-06 114.551E-06 31.568E-06 442.175E-06 406.539E-06 390.890E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 12:49
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
208.182E-06 217.243E-06 28.532E-06 2.4321 >4.0000 28.532E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
239.221E-06 107.507E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 05:52
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
485.391E-06 509.535E-06 414.756E-06 319.977E-06 370.834E-06 114.557E-06 31.593E-06 442.150E-06 406.417E-06 390.652E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 12:49
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
208.104E-06 216.993E-06 28.530E-06 2.4314 >4.0000 28.530E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
239.130E-06 107.623E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 05:52
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-3.972 -3.741 -4.197 -4.653 -4.441 468.939E-03 152.064E-03 -4.019 -4.195 -4.368
Foundry
StatHigh SpecHigh SpecLow StatLow
3.8909 1.9795 >4.0000 1.9795 -1.550 -5.100
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 12:49
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean Median StdDev StdDev
-4.338 -4.345 112.878E-03 2.2488 >4.0000 112.878E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-4.164 -4.487 -1.550 -5.100
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 05:52
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.602 4.770 4.468 4.166 4.323 279.138E-03 100.765E-03 4.590 4.459 4.351
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.0911 2.0911 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 12:49
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean Median StdDev StdDev
4.543 4.543 72.910E-03 2.5465 >4.0000 72.910E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.643 4.385 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 05:52
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.175 2.335 2.042 1.749 1.915 259.879E-03 97.637E-03 2.160 2.043 1.929
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.6798 >4.0000 1.6798 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 12:49
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean Median StdDev StdDev
1.911 1.910 103.825E-03 1.1584 >4.0000 103.825E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.055 1.746 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 05:52
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.183 2.343 2.054 1.764 1.929 254.122E-03 96.529E-03 2.171 2.054 1.941
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.7390 >4.0000 1.7390 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 12:49
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean Median StdDev StdDev
1.922 1.920 102.559E-03 1.2084 >4.0000 102.559E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.064 1.770 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A951CHC5: A951CHH5: A951CHR5:
MS1566 MS1566 MS1566
SP485 SP485 SP485
CHAR CHAR CHAR
01-MAY2006 01-MAY2006 01-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test alltempHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 05:52
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.458 2.484 2.425 2.366 2.381 76.488E-03 19.700E-03 2.445 2.425 2.407
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A192CHC5: A192CHH5: A192CHR5:
SYN208 SYN208 SYN208
SP485 SP485 SP485
CHAR CHAR CHAR
23-MAY2006 22-MAY2006 19-MAY2006
SP485CH01. SP485CH01. SP485CH01.
Data: Data
Report generated
Vcc=5V Test tempHistogramHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 12:49
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean Median StdDev StdDev
2.350 2.349 30.102E-03 30.102E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.392 2.278
Tester Test Program Se

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