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SP3485 Family Products (Revision Prepared Velvet Doung Greg


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SP3485 Family Products
(Revision
Prepared Velvet Doung Greg West Date: 2006
SP3485 Product Family Characterization Report
Table Contents
Section Introduction Characterization Procedure Data Summary Parameters Room Temperature Summary High Temperature Summary Temperature Summary Conclusions Data Histograms Page Appendix
Page 8/16/2006
SP3485 Product Family Characterization Report
Introduction: This product family characterization done part qualification Sipex's fabrication site transfer from Sipex's Hillview Milpitas, contract foundry, Episil, Taiwan. This characterization report summarizes data SP3485 product family characteristics contains distributions parameters. complete listing product numbers covered this characterization report included "Conclusion" section this report. Wafer Fab: Episil Location: Taiwan Process: Episil SC2- 1567 Assembly location: Carsem Characterization Procedure: number(s): B283CHC3.1 Temperatures: Ambient, 85C, -40C Tester: Test Program: SP3485CH01.AT
Page 8/16/2006
SP3485 Product Family Characterization Report
Data Summary:
Parameter Data Summary Across Temperature
Parameter 1.000: 3.5V 2.002:VOD 54OHMS 3.1V 2.004:VOD 54OHMS 3.5V 10.000: 12V@ 3.5V 10.004: @3.5V 10.005: 12V@ 3.5V 10.002: 3.5V 3.000: TPHL 3.1V 3.001: TPLH 3.1V 3.002: TPHL 3.1V 3.003: TPLH 3.1V 7.000: INPUT CURRENT V=2V 3.5V 5.000:TPLH 3.1V 5.001: TPHL 3.1V 6.005: 3.5V 6.006: 3.5V
Units Hillview Distribution Mean Hillview Distribution Variance Hillview (across temp) Episil Distribution Mean Episil Distribution Variance Episil (across temp)
1.238E-03
156.669E-06 159.139E-03 163.264E-03 18.304 28.468 17.748 28.437 4.818 4.650 5.271 5.341 19.934 7.075 7.768 6.617 2.064
1.6203 1.1634 1.7820 1.9705 0.9613 2.0004 1.0734 1.4094 1.6976 1.1866 1.2497 >4.00 1.3984 1.2903 2.0995 >4.0000
1.019E-03 1.995 2.298 109.137 -153.243 108.153 -144.149 42.788 39.634 44.707 43.129 109.934 83.903 85.768 20.850 -16.910
90.318E-06 175.263E-03 176.508E-03 22.098 28.797 20.841 26.955 5.425 5.210 5.965 6.003 20.736 7.466 9.418 2.418 2.154
3.6194 0.9418 1.5078 1.6463 1.1200 1.7298 1.3090 1.0576 1.3030 0.8546 0.9368 >4.00 0.7187 0.5037 1.9091 3.6993
2.055
2.373
108.204
-167.897
106.509
-158.427
39.628
36.320
41.236
39.976
-13.351
70.319
69.930
21.467
-18.006
Page 8/16/2006
SP3485 Product Family Characterization Report
Conclusion: Characterization data over temperature range show datasheet parameters meet spec. Cpk's most parameters comparable between Hillview Episil although many show strong temperature dependence that tends produce lower Cpk's this analysis. performance SP3485 parts fabricated Episil comparable current SP3485 parts built from Hillview fab. This characterization report applies following SP3485 family product part numbers:
SP3481CN SP3481CN-L SP3481CP SP3481CP-L SP3481EN SP3481EN-L SP3481EP SP3481EP-L SP3483CN SP3483CN-L SP3483CP SP3483CP-L SP3483EN SP3483EN-L SP3483EP SP3483EP-L SP3485CN SP3485CN-L SP3485CP SP3485CP-L SP3485EN SP3485EN-L SP3485EP-L SP3490CN SP3490CN-L SP3490CP SP3490CP-L SP3490EN SP3490EN-L SP3490EP SP3490EP-L SP3491CN SP3491CN-L SP3491CP SP3491CP-L SP3491EN SP3491EN-L SP3491EP SP3491EP-L SP3493CN SP3493CN-L SP3493CP SP3493CP-L SP3493EN SP3493EN-L SP3493EP SP3493EP-L SP3494CN SP3494CN-L SP3494CP SP3494CP-L SP3494EN SP3494EN-L SP3494EP SP3494EP-L SP3490EN-L
Page 8/16/2006
SP3485 Product Family Characterization Report
Appendix Characterization Data Histograms
Page 8/16/2006
This page intentionally left blank
Vcc=3.1 Test alltempHistogram: Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Section
2006, 05:10
Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
877.001E-06 891.045E-06 734.739E-06 578.432E-06 661.354E-06 215.647E-06 52.102E-06 773.325E-06 726.727E-06 690.151E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Section
2006, 12:08
Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.143E-03 1.193E-03 912.215E-06 631.234E-06 773.130E-06 370.176E-06 93.660E-06 988.642E-06 888.251E-06 831.725E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
3.5590 3.2465 3.8714 3.2465 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Section
2006, 05:10
Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
686.378E-06 721.509E-06 576.909E-06 432.309E-06 512.898E-06 173.480E-06 48.200E-06 620.721E-06 563.845E-06 536.471E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.9897 >4.0000 3.9897 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Section
2006, 12:08
Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
851.501E-06 871.593E-06 695.436E-06 519.279E-06 595.899E-06 255.602E-06 58.719E-06 737.069E-06 683.958E-06 644.019E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.9478 >4.0000 3.9478 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Section
2006, 05:10
Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
622.980E-06 647.590E-06 494.474E-06 341.359E-06 414.009E-06 208.971E-06 51.038E-06 528.457E-06 485.284E-06 453.022E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.2294 >4.0000 3.2294 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Section
2006, 12:08
Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.367E-03 1.158E-03 722.326E-06 286.438E-06 563.631E-06 803.062E-06 145.296E-06 748.467E-06 691.880E-06 638.533E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7206 1.6571 1.7841 1.6571 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.003, Test.Name=ICC,DE=L,^RE=L,DI=L
Section
2006, 05:10
Test.Number=1.003, Test.Name=ICC,DE=L,^RE=L,DI=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
624.981E-06 647.836E-06 493.424E-06 339.013E-06 412.995E-06 211.986E-06 51.471E-06 527.913E-06 484.211E-06 450.538E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.1955 >4.0000 3.1955 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=1.003, Test.Name=ICC,DE=L,^RE=L,DI=L
Section
2006, 12:08
Test.Number=1.003, Test.Name=ICC,DE=L,^RE=L,DI=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.471E-03 1.185E-03 723.972E-06 262.833E-06 563.080E-06 907.455E-06 153.713E-06 749.495E-06 690.470E-06 638.113E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
1.6264 1.5700 1.6829 1.5700 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 05:10
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.135 3.136 3.134 3.131 3.131 3.467E-03 759.114E-06 3.134 3.133 3.133
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 12:08
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.134 3.134 3.133 3.132 3.132 1.820E-03 428.480E-06 3.133 3.133 3.133
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 05:10
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.134 3.135 3.133 3.130 3.130 3.471E-03 715.776E-06 3.133 3.132 3.132
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 12:08
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.133 3.134 3.133 3.131 3.132 1.475E-03 424.727E-06 3.133 3.133 3.132
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 05:10
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.247 2.521 1.995 1.469 1.809 437.640E-03 175.263E-03 2.230 1.930 1.836
StatHigh SpecHigh SpecLow StatLow
1.8686 0.9418 2.7955 0.9418 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 12:08
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.284 2.533 2.055 1.578 1.838 445.321E-03 159.139E-03 2.251 2.034 1.883
Foundry
StatHigh SpecHigh SpecLow StatLow
2.0580 1.1634 2.9525 1.1634 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.003, Test.Name=VOS IN=H
Section
2006, 05:10
Test.Number=2.003, Test.Name=VOS IN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.596 1.581 1.529 1.478 1.491 105.056E-03 17.190E-03 1.537 1.530 1.518
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.000
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.003, Test.Name=VOS IN=H
Section
2006, 12:08
Test.Number=2.003, Test.Name=VOS IN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.547 1.563 1.531 1.498 1.509 38.148E-03 10.973E-03 1.538 1.534 1.519
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.000
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 05:11
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.239 2.490 2.004 1.518 1.828 410.731E-03 161.924E-03 2.218 1.941 1.856
StatHigh SpecHigh SpecLow StatLow
2.0225 1.0375 3.0076 1.0375 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 12:08
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.285 2.523 2.070 1.617 1.861 424.321E-03 151.009E-03 2.252 2.055 1.905
Foundry
StatHigh SpecHigh SpecLow StatLow
2.1687 1.2578 3.0797 1.2578 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 05:11
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.585 1.613 1.540 1.466 1.472 112.450E-03 24.488E-03 1.561 1.543 1.531
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.000
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 12:08
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.572 1.592 1.549 1.506 1.522 49.949E-03 14.412E-03 1.562 1.552 1.535
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.000
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.006, Test.Name=VOD BALANCE
Section
2006, 05:11
Test.Number=2.006, Test.Name=VOD BALANCE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
13.758E-03 33.661E-03 -8.832E-03 -51.324E-03 -42.617E-03 56.375E-03 14.164E-03 8.384E-03 -12.577E-03 -21.341E-03
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 200.000E-03 -200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=2.006, Test.Name=VOD BALANCE
Section
2006, 12:08
Test.Number=2.006, Test.Name=VOD BALANCE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.056E-03 12.115E-03 -14.386E-03 -40.887E-03 -23.859E-03 25.915E-03 8.834E-03 -3.505E-03 -19.510E-03 -21.078E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 200.000E-03 -200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.000, Test.Name=TPHL
Section
2006, 05:11
Test.Number=3.000, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
50.474E-09 59.063E-09 42.788E-09 26.512E-09 35.455E-09 15.019E-09 5.425E-09 48.727E-09 43.051E-09 36.328E-09
StatHigh SpecHigh SpecLow StatLow
1.5360 2.0145 1.0576 1.0576 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.000, Test.Name=TPHL
Section
2006, 12:08
Test.Number=3.000, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
47.330E-09 54.082E-09 39.628E-09 25.173E-09 32.445E-09 14.885E-09 4.818E-09 44.711E-09 39.559E-09 34.218E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7295 2.0497 1.4094 1.4094 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.001, Test.Name=TPLH
Section
2006, 05:11
Test.Number=3.001, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
47.330E-09 55.264E-09 39.634E-09 24.005E-09 32.486E-09 14.844E-09 5.210E-09 45.409E-09 39.821E-09 33.534E-09
StatHigh SpecHigh SpecLow StatLow
1.5995 1.8960 1.3030 1.3030 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.001, Test.Name=TPLH
Section
2006, 12:08
Test.Number=3.001, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
44.012E-09 50.269E-09 36.320E-09 22.371E-09 29.254E-09 14.758E-09 4.650E-09 41.392E-09 36.066E-09 31.204E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7922 1.8868 1.6976 1.6976 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.002, Test.Name=TPHL
Section
2006, 05:11
Test.Number=3.002, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
53.442E-09 62.601E-09 44.707E-09 26.812E-09 36.328E-09 17.115E-09 5.965E-09 50.998E-09 45.147E-09 37.900E-09
StatHigh SpecHigh SpecLow StatLow
1.3971 1.9395 0.8546 0.8546 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.002, Test.Name=TPHL
Section
2006, 12:08
Test.Number=3.002, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
49.775E-09 57.050E-09 41.236E-09 25.422E-09 33.154E-09 16.621E-09 5.271E-09 46.981E-09 41.130E-09 35.282E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.5809 1.9752 1.1866 1.1866 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.003, Test.Name=TPLH
Section
2006, 05:11
Test.Number=3.003, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
51.871E-09 61.138E-09 43.129E-09 25.120E-09 34.582E-09 17.289E-09 6.003E-09 49.600E-09 43.313E-09 36.328E-09
StatHigh SpecHigh SpecLow StatLow
1.3882 1.8396 0.9368 0.9368 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.003, Test.Name=TPLH
Section
2006, 12:08
Test.Number=3.003, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
48.553E-09 55.999E-09 39.976E-09 23.954E-09 32.268E-09 16.285E-09 5.341E-09 45.933E-09 39.646E-09 34.041E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.5603 1.8709 1.2497 1.2497 60.000E-09 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.004, Test.Name=DRIVER SKEW TIME
Section
2006, 05:11
Test.Number=3.004, Test.Name=DRIVER SKEW TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median 787.814E-12 -106.780E-12 StatHigh SpecHigh 1.834E-09 298.198E-12 SpecLow 960.513E-12 StatLow
1.834E-09 1.682E-09
>4.0000 0.8806 >4.0000 0.8806 10.000E-09
785.874E-12 611.236E-12
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=3.004, Test.Name=DRIVER SKEW TIME
Section
2006, 12:08
Test.Number=3.004, Test.Name=DRIVER SKEW TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.659E-09 1.850E-09 1.024E-09 198.598E-12 354.563E-12 1.305E-09 275.152E-12 1.222E-09 1.048E-09 873.193E-12
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.2406 >4.0000 1.2406 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.000, Test.Name=RISE TIME
Section
2006, 05:11
Test.Number=4.000, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
5.763E-09 5.973E-09 4.754E-09 3.535E-09 3.667E-09 2.096E-09 406.227E-12 5.065E-09 4.715E-09 4.541E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.9010 >4.0000 3.9010 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.000, Test.Name=RISE TIME
Section
2006, 12:08
Test.Number=4.000, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
5.496E-09 5.667E-09 4.722E-09 3.776E-09 4.017E-09 1.479E-09 315.296E-12 4.890E-09 4.715E-09 4.541E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.001, Test.Name=FALL TIME
Section
2006, 05:11
Test.Number=4.001, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
9.954E-09 11.490E-09 7.288E-09 3.086E-09 4.890E-09 5.065E-09 1.401E-09 8.732E-09 6.986E-09 6.112E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.7344 >4.0000 1.7344 1.800E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.001, Test.Name=FALL TIME
Section
2006, 12:08
Test.Number=4.001, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
8.732E-09 9.541E-09 6.169E-09 2.797E-09 4.609E-09 4.123E-09 1.124E-09 7.335E-09 5.763E-09 5.318E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.8293 >4.0000 1.8293 1.800E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.002, Test.Name=RISE TIME
Section
2006, 05:11
Test.Number=4.002, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.715E-09 4.923E-09 4.003E-09 3.083E-09 3.493E-09 1.222E-09 306.677E-12 4.191E-09 4.017E-09 3.667E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.002, Test.Name=RISE TIME
Section
2006, 12:08
Test.Number=4.002, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
5.414E-09 5.141E-09 4.277E-09 3.413E-09 3.723E-09 1.691E-09 287.997E-12 4.366E-09 4.255E-09 4.017E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.003, Test.Name=FALL TIME
Section
2006, 05:11
Test.Number=4.003, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
9.081E-09 10.707E-09 6.008E-09 1.309E-09 3.493E-09 5.588E-09 1.566E-09 7.509E-09 6.112E-09 4.366E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.2785 >4.0000 1.2785 1.500E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.003, Test.Name=FALL TIME
Section
2006, 12:08
Test.Number=4.003, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median 6.429E-09 -501.171E-12 StatHigh 3.368E-09 SpecHigh 6.935E-09 SpecLow 2.310E-09 StatLow 9.081E-09
10.304E-09 13.360E-09
>4.0000 0.9277 >4.0000 0.9277 1.500E-06
5.938E-09 4.077E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.004, Test.Name=DIFF RISE TIME
Section
2006, 05:11
Test.Number=4.004, Test.Name=DIFF RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
7.335E-09 7.778E-09 5.646E-09 3.513E-09 4.541E-09 2.794E-09 710.853E-12 6.374E-09 5.414E-09 5.065E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 2.6474 >4.0000 2.6474 20.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.004, Test.Name=DIFF RISE TIME
Section
2006, 12:08
Test.Number=4.004, Test.Name=DIFF RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
6.287E-09 6.883E-09 5.223E-09 3.562E-09 4.343E-09 1.944E-09 553.471E-12 5.850E-09 5.021E-09 4.787E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.1455 >4.0000 3.1455 20.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.005, Test.Name=DIFF FALL TIME
Section
2006, 05:11
Test.Number=4.005, Test.Name=DIFF FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
6.986E-09 8.022E-09 5.381E-09 2.740E-09 4.104E-09 2.882E-09 880.286E-12 6.200E-09 5.370E-09 4.453E-09
StatHigh SpecHigh SpecLow StatLow
3.7866 2.0375 >4.0000 2.0375 20.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=4.005, Test.Name=DIFF FALL TIME
Section
2006, 12:08
Test.Number=4.005, Test.Name=DIFF FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
7.597E-09 9.099E-09 5.575E-09 2.052E-09 3.812E-09 3.785E-09 1.174E-09 6.898E-09 5.239E-09 4.609E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.8382 1.5824 >4.0000 1.5824 20.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=5.000, Test.Name=TPLH
Section
2006, 05:11
Test.Number=5.000, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
99.502E-09 106.301E-09 83.903E-09 61.505E-09 70.677E-09 28.825E-09 7.466E-09 90.007E-09 83.225E-09 78.477E-09
StatHigh SpecHigh SpecLow StatLow
2.2324 3.7461 0.7187 0.7187 100.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=5.000, Test.Name=TPLH
Section
2006, 12:08
Test.Number=5.000, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
81.868E-09 91.544E-09 70.319E-09 49.095E-09 55.966E-09 25.902E-09 7.075E-09 76.103E-09 70.379E-09 63.881E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.3558 3.3131 1.3984 1.3984 100.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=5.001, Test.Name=TPHL
Section
2006, 05:11
Test.Number=5.001, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
101.198E-09 114.023E-09 85.768E-09 57.513E-09 68.304E-09 32.894E-09 9.418E-09 95.772E-09 85.090E-09 78.138E-09
StatHigh SpecHigh SpecLow StatLow
1.7696 3.0355 0.5037 0.5037 100.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=5.001, Test.Name=TPHL
Section
2006, 12:08
Test.Number=5.001, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
84.920E-09 93.235E-09 69.930E-09 46.626E-09 50.115E-09 34.805E-09 7.768E-09 76.781E-09 69.660E-09 62.849E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.1455 3.0007 1.2903 1.2903 100.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.000, Test.Name=VOUT FAIL SAFE
Section
2006, 05:11
Test.Number=6.000, Test.Name=VOUT FAIL SAFE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.135 3.136 3.134 3.132 3.133 1.983E-03 561.696E-06 3.135 3.134 3.133
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.000, Test.Name=VOUT FAIL SAFE
Section
2006, 12:08
Test.Number=6.000, Test.Name=VOUT FAIL SAFE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.134 3.241 3.129 3.017 2.779 355.104E-03 37.358E-03 3.134 3.133 3.133
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.9971 2.9971 3.465 1.500
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.001, Test.Name=RX ^RE=VCC V=VCC
Section
2006, 05:11
Test.Number=6.001, Test.Name=RX ^RE=VCC V=VCC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
126.500E-09 135.463E-09 116.040E-09 96.617E-09 101.965E-09 24.535E-09 6.474E-09 120.825E-09 117.674E-09 111.788E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.001, Test.Name=RX ^RE=VCC V=VCC
Section
2006, 12:08
Test.Number=6.001, Test.Name=RX ^RE=VCC V=VCC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
150.510E-09 161.625E-09 137.822E-09 114.018E-09 113.927E-09 36.584E-09 7.935E-09 144.326E-09 138.680E-09 133.223E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.002, Test.Name=RX ^RE=H V=0.4V
Section
2006, 05:11
Test.Number=6.002, Test.Name=RX ^RE=H V=0.4V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
41.767E-09 47.788E-09 33.995E-09 20.203E-09 19.973E-09 21.793E-09 4.598E-09 37.935E-09 33.327E-09 30.868E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 2.4648 >4.0000 2.4648 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.002, Test.Name=RX ^RE=H V=0.4V
Section
2006, 12:08
Test.Number=6.002, Test.Name=RX ^RE=H V=0.4V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
67.992E-09 80.269E-09 54.170E-09 28.070E-09 33.067E-09 34.925E-09 8.700E-09 60.629E-09 56.649E-09 48.675E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 2.0755 >4.0000 2.0755 1000.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.003, Test.Name=RX -1.5MA
Section
2006, 05:11
Test.Number=6.003, Test.Name=RX -1.5MA
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.053 3.094 3.020 2.946 2.986 66.925E-03 24.738E-03 3.049 3.019 2.993
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.400
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.003, Test.Name=RX -1.5MA
Section
2006, 12:08
Test.Number=6.003, Test.Name=RX -1.5MA
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
3.061 3.095 3.028 2.961 2.993 67.670E-03 22.376E-03 3.054 3.027 3.005
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 3.300
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.004, Test.Name=RX 2.5MA
Section
2006, 05:11
Test.Number=6.004, Test.Name=RX 2.5MA
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
155.008E-03 196.595E-03 117.971E-03 39.347E-03 83.317E-03 71.691E-03 26.208E-03 147.689E-03 118.667E-03 87.282E-03
StatHigh SpecHigh SpecLow StatLow
2.5438 1.5005 3.5871 1.5005 400.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.004, Test.Name=RX 2.5MA
Section
2006, 12:08
Test.Number=6.004, Test.Name=RX 2.5MA
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
154.841E-03 191.869E-03 115.892E-03 39.915E-03 82.987E-03 71.855E-03 25.326E-03 144.971E-03 114.482E-03 86.952E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
2.6324 1.5253 3.7394 1.5253 400.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.005, Test.Name=RX
Section
2006, 05:11
Test.Number=6.005, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
20.623E-03 24.285E-03 17.377E-03 10.470E-03 14.161E-03 6.462E-03 2.303E-03 20.082E-03 17.166E-03 14.865E-03
StatHigh SpecHigh SpecLow StatLow
3.8364 1.5023 >4.0000 1.5023 60.000E-03 7.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.005, Test.Name=RX
Section
2006, 12:08
Test.Number=6.005, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
21.218E-03 24.659E-03 18.163E-03 11.667E-03 14.784E-03 6.435E-03 2.165E-03 20.672E-03 18.097E-03 15.828E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.7184 >4.0000 1.7184 60.000E-03 7.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.006, Test.Name=RX
Section
2006, 05:11
Test.Number=6.006, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-11.405E-03 -8.113E-03 -13.944E-03 -19.775E-03 -16.829E-03 5.424E-03 1.944E-03 -11.908E-03 -13.610E-03 -16.262E-03
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 3.5918 3.5918 7.000E-03 -60.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.006, Test.Name=RX
Section
2006, 12:08
Test.Number=6.006, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-12.307E-03 -9.488E-03 -15.020E-03 -20.551E-03 -18.133E-03 5.826E-03 1.844E-03 -13.174E-03 -14.763E-03 -17.092E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 3.9808 3.9808 7.000E-03 -60.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.007, Test.Name=RX FUNCTIONAL TEST
Section
2006, 05:11
Test.Number=6.007, Test.Name=RX FUNCTIONAL TEST
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
7.377E-06 8.051E-06 4.845E-06 1.640E-06 2.682E-06 4.695E-06 1.069E-06 5.525E-06 4.866E-06 4.003E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 12.000E-03 -12.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=6.007, Test.Name=RX FUNCTIONAL TEST
Section
2006, 12:08
Test.Number=6.007, Test.Name=RX FUNCTIONAL TEST
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.997E-06 4.099E-06 -2.053E-06 -8.205E-06 -4.935E-06 7.931E-06 2.051E-06 -21.597E-09 -2.560E-06 -3.766E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 12.000E-03 -12.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.000, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:11
Test.Number=7.000, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
163.880E-09 185.166E-09 113.796E-09 42.426E-09 69.245E-09 94.634E-09 23.790E-09 130.992E-09 115.374E-09 93.812E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.000, Test.Name=INPUT CURRENT V=2V
Section
2006, 12:08
Test.Number=7.000, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
40.582E-09 60.939E-09 -9.164E-09 -79.267E-09 -56.617E-09 97.199E-09 23.368E-09 6.155E-09 -9.868E-09 -26.904E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.001, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:11
Test.Number=7.001, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
139.313E-09 149.496E-09 88.729E-09 27.962E-09 49.830E-09 89.482E-09 20.256E-09 101.342E-09 85.690E-09 72.812E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.001, Test.Name=INPUT CURRENT V=.8V
Section
2006, 12:08
Test.Number=7.001, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -28.327E-09 -106.370E-09 -76.822E-09 StatHigh 118.571E-09 SpecHigh SpecLow 26.014E-09 -11.472E-09 StatLow
41.749E-09 49.717E-09
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
-27.696E-09 -50.278E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.002, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:11
Test.Number=7.002, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
165.464E-09 172.192E-09 113.658E-09 55.125E-09 68.849E-09 96.615E-09 19.511E-09 126.281E-09 114.768E-09 98.941E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.002, Test.Name=INPUT CURRENT V=.8V
Section
2006, 12:08
Test.Number=7.002, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
49.898E-09 67.973E-09 -4.193E-09 -76.359E-09 -62.560E-09 112.458E-09 24.055E-09 11.488E-09 -3.162E-09 -24.527E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.003, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:11
Test.Number=7.003, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
161.106E-09 174.954E-09 109.024E-09 43.094E-09 70.830E-09 90.275E-09 21.977E-09 125.048E-09 107.087E-09 93.417E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.003, Test.Name=INPUT CURRENT V=2V
Section
2006, 12:08
Test.Number=7.003, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
39.371E-09 62.328E-09 -11.031E-09 -84.390E-09 -66.125E-09 105.496E-09 24.453E-09 4.375E-09 -10.574E-09 -29.678E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.004, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:11
Test.Number=7.004, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
157.540E-09 167.383E-09 108.276E-09 49.169E-09 70.831E-09 86.709E-09 19.702E-09 122.694E-09 110.421E-09 93.812E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.004, Test.Name=INPUT CURRENT V=2V
Section
2006, 12:08
Test.Number=7.004, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
35.409E-09 52.446E-09 -11.028E-09 -74.503E-09 -53.052E-09 88.461E-09 21.158E-09 1.620E-09 -9.472E-09 -30.470E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.005, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:11
Test.Number=7.005, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
132.181E-09 149.599E-09 86.068E-09 22.537E-09 15.754E-09 116.427E-09 21.177E-09 102.133E-09 86.284E-09 72.812E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=7.005, Test.Name=INPUT CURRENT V=.8V
Section
2006, 12:08
Test.Number=7.005, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -25.461E-09 -157.168E-09 -117.864E-09 StatHigh 344.798E-09 SpecHigh SpecLow 43.902E-09 -14.449E-09 StatLow
226.933E-09 106.246E-09
>4.0000 >4.0000 >4.0000 >4.0000 10.000E-06 -80.000E-06
-27.498E-09 -45.524E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.000, Test.Name=IA V=-7V
Section
2006, 05:11
Test.Number=8.000, Test.Name=IA V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
499.203E-06 512.170E-06 450.322E-06 388.474E-06 416.327E-06 82.876E-06 20.616E-06 466.529E-06 450.146E-06 433.205E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 800.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.000, Test.Name=IA V=-7V
Section
2006, 12:08
Test.Number=8.000, Test.Name=IA V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
466.922E-06 488.743E-06 433.025E-06 377.308E-06 397.986E-06 68.937E-06 18.573E-06 449.293E-06 433.184E-06 415.941E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 800.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.001, Test.Name=IA V=12V
Section
2006, 05:11
Test.Number=8.001, Test.Name=IA V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
953.822E-06 999.211E-06 847.921E-06 696.631E-06 771.522E-06 182.300E-06 50.430E-06 892.992E-06 842.743E-06 800.491E-06
StatHigh SpecHigh SpecLow StatLow
3.3049 >4.0000 1.0052 1.0052 1.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.001, Test.Name=IA V=12V
Section
2006, 12:08
Test.Number=8.001, Test.Name=IA V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
899.687E-06 963.833E-06 819.239E-06 674.645E-06 740.469E-06 159.218E-06 48.198E-06 868.929E-06 815.269E-06 772.655E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
3.4580 >4.0000 1.2501 1.2501 1.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.002, Test.Name=RA
Section
2006, 05:11
Test.Number=8.002, Test.Name=RA
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
15.995E03 17.071E03 14.678E03 12.286E03 13.076E03 2.919E03 797.528 15.398E03 14.702E03 13.976E03
StatHigh SpecHigh SpecLow StatLow
3.7616 1.1194 >4.0000 1.1194 30.000E03 12.000E03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.002, Test.Name=RA
Section
2006, 12:08
Test.Number=8.002, Test.Name=RA
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
16.689E03 17.634E03 15.215E03 12.795E03 13.903E03 2.786E03 806.489 15.985E03 15.221E03 14.413E03
Foundry
StatHigh SpecHigh SpecLow StatLow
3.7198 1.3288 >4.0000 1.3288 30.000E03 12.000E03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.003, Test.Name=IB V=-7V
Section
2006, 05:11
Test.Number=8.003, Test.Name=IB V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
490.566E-06 501.453E-06 442.602E-06 383.752E-06 409.793E-06 80.773E-06 19.617E-06 457.698E-06 442.974E-06 426.008E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 800.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.003, Test.Name=IB V=-7V
Section
2006, 12:08
Test.Number=8.003, Test.Name=IB V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
460.237E-06 482.663E-06 428.969E-06 375.275E-06 394.271E-06 65.967E-06 17.898E-06 444.738E-06 429.629E-06 412.701E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 800.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.004, Test.Name=IB V=12V
Section
2006, 05:11
Test.Number=8.004, Test.Name=IB V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
840.174E-06 859.910E-06 757.931E-06 655.951E-06 701.091E-06 139.083E-06 33.993E-06 784.544E-06 758.443E-06 729.607E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.3737 2.3737 1.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.004, Test.Name=IB V=12V
Section
2006, 12:08
Test.Number=8.004, Test.Name=IB V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
787.358E-06 827.241E-06 732.836E-06 638.430E-06 672.729E-06 114.629E-06 31.468E-06 760.889E-06 733.526E-06 705.263E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.8300 2.8300 1.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.005, Test.Name=RB
Section
2006, 05:11
Test.Number=8.005, Test.Name=RB
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
17.103E03 17.975E03 15.857E03 13.739E03 14.278E03 2.826E03 706.009 16.442E03 15.814E03 15.295E03
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.8212 >4.0000 1.8212 30.000E03 12.000E03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=8.005, Test.Name=RB
Section
2006, 12:08
Test.Number=8.005, Test.Name=RB
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
17.807E03 18.471E03 16.383E03 14.295E03 15.229E03 2.578E03 695.994 16.995E03 16.335E03 15.759E03
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 2.0992 >4.0000 2.0992 30.000E03 12.000E03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.000, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.000, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
120.593E-03 146.861E-03 89.990E-03 33.118E-03 68.600E-03 51.993E-03 18.957E-03 114.050E-03 83.218E-03 72.514E-03
StatHigh SpecHigh SpecLow StatLow
2.1979 1.5823 2.8135 1.5823 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.000, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.000, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
111.151E-03 133.573E-03 88.877E-03 44.180E-03 68.090E-03 43.061E-03 14.899E-03 106.703E-03 86.848E-03 73.139E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
2.7966 1.9885 3.6048 1.9885 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.001, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.001, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -138.329E-03 -269.160E-03 -204.732E-03 StatHigh 110.856E-03 SpecHigh SpecLow 43.610E-03 -99.335E-03 StatLow
-93.876E-03 -7.498E-03
0.9554 0.8536 1.0573 0.8536 -250.000E-03
-119.352E-03 -204.707E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.001, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.001, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-90.381E-03 -39.747E-03 -132.195E-03 -224.643E-03 -185.262E-03 94.881E-03 30.816E-03 -100.396E-03 -126.585E-03 -168.460E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.3521 1.2743 1.4299 1.2743 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.002, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.002, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -119.593E-03 -189.856E-03 -154.325E-03 StatHigh SpecHigh 63.966E-03 SpecLow 23.421E-03 -95.669E-03 StatLow
-90.359E-03 -49.330E-03
1.7790 1.8560 1.7021 1.7021 -250.000E-03
-114.149E-03 -148.343E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.002, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.002, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-99.069E-03 -59.343E-03 -131.788E-03 -204.233E-03 -175.111E-03 76.043E-03 24.148E-03 -107.093E-03 -126.791E-03 -159.577E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7254 1.6317 1.8191 1.6317 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.003, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.003, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -136.314E-03 -278.597E-03 -204.732E-03 StatHigh 114.545E-03 SpecHigh SpecLow 47.428E-03 -95.500E-03 StatLow
-90.187E-03 5.969E-03
0.8785 0.7990 0.9580 0.7990 -250.000E-03
-113.764E-03 -204.712E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.003, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.003, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-98.846E-03 -59.493E-03 -131.350E-03 -203.208E-03 -174.325E-03 75.479E-03 23.953E-03 -106.852E-03 -126.469E-03 -158.908E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.7396 1.6512 1.8279 1.6512 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.004, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.004, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-96.009E-03 -51.853E-03 -126.707E-03 -201.560E-03 -164.291E-03 68.282E-03 24.951E-03 -101.516E-03 -120.920E-03 -157.109E-03
StatHigh SpecHigh SpecLow StatLow
1.6699 1.6471 1.6927 1.6471 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.004, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.004, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-104.971E-03 -63.451E-03
-140.394E-03 -217.338E-03 -186.975E-03 82.004E-03 25.648E-03 -114.350E-03 -135.302E-03 -170.004E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.6246 1.4245 1.8246 1.4245 -250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.005, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.005, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
118.300E-03 143.284E-03 89.515E-03 35.745E-03 68.463E-03 49.837E-03 17.923E-03 111.926E-03 83.749E-03 72.176E-03
StatHigh SpecHigh SpecLow StatLow
2.3247 1.6648 2.9847 1.6648 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.005, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.005, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
108.991E-03 130.665E-03 87.633E-03 44.601E-03 67.763E-03 41.228E-03 14.344E-03 104.730E-03 85.590E-03 72.470E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
2.9048 2.0365 3.7732 2.0365 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.006, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.006, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
205.403E-03 302.649E-03 117.359E-03 -67.930E-03 1.667E-03 203.736E-03 61.763E-03 205.377E-03 82.895E-03 71.472E-03
StatHigh SpecHigh SpecLow StatLow
0.6746 0.6334 0.7159 0.6334 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.006, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.006, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
205.462E-03 275.264E-03 111.603E-03 -52.057E-03 67.173E-03 138.289E-03 54.553E-03 107.720E-03 85.119E-03 72.107E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
0.7638 0.6819 0.8456 0.6819 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.007, Test.Name=ISC
Section
2006, 05:11
Test.Number=10.007, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
116.671E-03 141.254E-03 88.348E-03 35.441E-03 67.828E-03 48.843E-03 17.636E-03 110.467E-03 82.624E-03 71.457E-03
StatHigh SpecHigh SpecLow StatLow
2.3626 1.6699 3.0554 1.6699 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=10.007, Test.Name=ISC
Section
2006, 12:08
Test.Number=10.007, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
205.460E-03 166.458E-03 89.910E-03 13.363E-03 67.139E-03 138.321E-03 25.516E-03 103.291E-03 84.466E-03 71.755E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.6330 1.1746 2.0914 1.1746 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.000, Test.Name=TZH
Section
2006, 05:11
Test.Number=11.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
81.868E-09 95.910E-09 67.686E-09 39.461E-09 55.078E-09 26.790E-09 9.408E-09 78.138E-09 67.625E-09 57.113E-09
StatHigh SpecHigh SpecLow StatLow
2.1258 2.3981 1.8535 1.8535 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.000, Test.Name=TZH
Section
2006, 12:08
Test.Number=11.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
76.442E-09 86.483E-09 61.882E-09 37.281E-09 50.804E-09 25.639E-09 8.200E-09 71.016E-09 61.352E-09 52.869E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.4389 2.5154 2.3624 2.3624 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.001, Test.Name=TZL
Section
2006, 05:11
Test.Number=11.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
94.076E-09 111.390E-09 76.623E-09 41.857E-09 61.182E-09 32.894E-09 11.589E-09 89.668E-09 76.442E-09 63.217E-09
StatHigh SpecHigh SpecLow StatLow
1.7258 2.2039 1.2477 1.2477 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.001, Test.Name=TZL
Section
2006, 12:08
Test.Number=11.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
86.277E-09 99.100E-09 69.536E-09 39.971E-09 55.622E-09 30.655E-09 9.855E-09 80.512E-09 68.982E-09 58.375E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.0294 2.3520 1.7069 1.7069 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.002, Test.Name=TLZ
Section
2006, 05:11
Test.Number=11.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
84.242E-09 97.398E-09 70.881E-09 44.363E-09 58.808E-09 25.434E-09 8.839E-09 80.512E-09 71.016E-09 60.504E-09
StatHigh SpecHigh SpecLow StatLow
2.2626 2.6730 1.8523 1.8523 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.002, Test.Name=TLZ
Section
2006, 12:08
Test.Number=11.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
79.833E-09 90.738E-09 66.168E-09 41.598E-09 54.245E-09 25.588E-09 8.190E-09 75.425E-09 65.760E-09 56.999E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.4420 2.6930 2.1910 2.1910 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.003, Test.Name=THZ
Section
2006, 05:11
Test.Number=11.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
88.311E-09 105.011E-09 71.295E-09 37.580E-09 57.113E-09 31.199E-09 11.238E-09 84.920E-09 69.321E-09 59.147E-09
StatHigh SpecHigh SpecLow StatLow
1.7796 2.1146 1.4446 1.4446 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=11.003, Test.Name=THZ
Section
2006, 12:08
Test.Number=11.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
80.512E-09 92.233E-09 65.969E-09 39.705E-09 53.557E-09 26.955E-09 8.755E-09 75.764E-09 64.743E-09 56.310E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.2845 2.5118 2.0573 2.0573 120.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.000, Test.Name=TZH
Section
2006, 05:11
Test.Number=12.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
59.382E-09 73.768E-09 43.922E-09 14.075E-09 30.384E-09 28.999E-09 9.949E-09 55.293E-09 42.652E-09 33.451E-09
StatHigh SpecHigh SpecLow StatLow
1.0052 1.4716 0.5387 0.5387 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.000, Test.Name=TZH
Section
2006, 12:08
Test.Number=12.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
53.248E-09 60.789E-09 39.801E-09 18.813E-09 29.330E-09 23.918E-09 6.996E-09 46.835E-09 39.492E-09 32.529E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.4294 1.8964 0.9624 0.9624 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.001, Test.Name=TZL
Section
2006, 05:11
Test.Number=12.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
49.344E-09 60.631E-09 38.068E-09 15.506E-09 28.246E-09 21.099E-09 7.521E-09 46.463E-09 37.494E-09 29.733E-09
StatHigh SpecHigh SpecLow StatLow
1.3296 1.6872 0.9720 0.9720 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.001, Test.Name=TZL
Section
2006, 12:08
Test.Number=12.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
45.998E-09 53.411E-09 35.222E-09 17.033E-09 27.166E-09 18.832E-09 6.063E-09 42.188E-09 33.916E-09 28.860E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
1.6494 1.9365 1.3623 1.3623 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.002, Test.Name=TLZ
Section
2006, 05:11
Test.Number=12.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
44.110E-09 50.662E-09 37.012E-09 23.362E-09 31.191E-09 12.919E-09 4.550E-09 42.159E-09 36.628E-09 32.120E-09
StatHigh SpecHigh SpecLow StatLow
2.1978 2.7115 1.6841 1.6841 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.002, Test.Name=TLZ
Section
2006, 12:08
Test.Number=12.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
41.322E-09 45.311E-09 35.372E-09 25.433E-09 30.891E-09 10.431E-09 3.313E-09 38.905E-09 34.537E-09 32.114E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
3.0185 3.5590 2.4780 2.4780 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.003, Test.Name=THZ
Section
2006, 05:11
Test.Number=12.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
35.553E-09 41.778E-09 29.135E-09 16.493E-09 23.563E-09 11.990E-09 4.214E-09 33.880E-09 28.768E-09 24.771E-09
StatHigh SpecHigh SpecLow StatLow
2.3730 2.3046 2.4414 2.3046 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=12.003, Test.Name=THZ
Section
2006, 12:08
Test.Number=12.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
34.159E-09 38.104E-09 27.777E-09 17.451E-09 23.173E-09 10.986E-09 3.442E-09 31.649E-09 27.188E-09 24.114E-09
Foundry
StatHigh SpecHigh SpecLow StatLow
2.9052 2.6899 3.1204 2.6899 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=90.000, Test.Name=DI TRIP POINT
Section
2006, 05:11
Test.Number=90.000, Test.Name=DI TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.525 1.601 1.441 1.281 1.325 200.000E-03 53.340E-03 1.475 1.425 1.425
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=90.000, Test.Name=DI TRIP POINT
Section
2006, 12:08
Test.Number=90.000, Test.Name=DI TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.575 1.669 1.442 1.215 1.325 250.000E-03 75.699E-03 1.525 1.425 1.375
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=90.001, Test.Name=^RE TRIP POINT
Section
2006, 05:11
Test.Number=90.001, Test.Name=^RE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.525 1.592 1.445 1.298 1.375 150.001E-03 49.036E-03 1.475 1.425 1.425
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=90.001, Test.Name=^RE TRIP POINT
Section
2006, 12:08
Test.Number=90.001, Test.Name=^RE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.475 1.528 1.409 1.291 1.325 150.000E-03 39.409E-03 1.425 1.425 1.375
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=90.002, Test.Name=DE TRIP POINT
Section
2006, 05:11
Test.Number=90.002, Test.Name=DE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.475 1.552 1.407 1.263 1.325 150.000E-03 48.175E-03 1.425 1.425 1.375
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=90.002, Test.Name=DE TRIP POINT
Section
2006, 12:08
Test.Number=90.002, Test.Name=DE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.425 1.482 1.361 1.239 1.275 150.000E-03 40.533E-03 1.375 1.375 1.325
Foundry
StatHigh SpecHigh SpecLow StatLow
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=100.000, Test.Name=VOS
Section
2006, 05:11
Test.Number=100.000, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -69.734E-03 -190.068E-03 -152.001E-03 StatHigh 168.000E-03 SpecHigh SpecLow 40.111E-03 -36.000E-03 StatLow
16.000E-03 50.600E-03
1.6620 1.0825 2.2415 1.0825 200.000E-03 -200.000E-03
-68.000E-03 -102.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=100.000, Test.Name=VOS
Section
2006, 12:08
Test.Number=100.000, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
198.000E-03 243.531E-03 86.466E-03 -70.598E-03 -60.001E-03 258.000E-03 52.355E-03 132.000E-03 89.000E-03 47.999E-03
Foundry
StatHigh SpecHigh SpecLow StatLow
1.2734 1.8239 0.7228 0.7228 200.000E-03 -200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=100.001, Test.Name=VOS
Section
2006, 05:11
Test.Number=100.001, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median 31.800E-03 -148.275E-03 -118.000E-03 StatHigh 271.999E-03 SpecHigh SpecLow 60.025E-03 StatLow 73.999E-03
153.999E-03 211.874E-03
1.1107 1.2872 0.9341 0.9341 200.000E-03 -200.000E-03
28.000E-03 -6.001E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.1: SYN1067 B283CHH3.1: SYN1067 B283CHR3.1: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
10-APR2006 10-APR2006 06-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.1 Test alltempHistogram: Test.Number=100.001, Test.Name=VOS
Section
2006, 12:08
Test.Number=100.001, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -27.423E-03 -235.905E-03 -214.001E-03 StatHigh 344.000E-03 SpecHigh SpecLow 69.494E-03 StatLow 23.999E-03
129.999E-03 181.059E-03
0.9593 0.8278 1.0909 0.8278 200.000E-03 -200.000E-03
-24.000E-03 -84.001E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A732CHC31: A732CHH31: A732CHR31:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-MAY2006 19-MAY2006 19-MAY2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.3 Test alltempHistogram: Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Section
2006, 05:17
Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.061E-03 1.081E-03 870.696E-06 660.774E-06 773.944E-06 286.941E-06 69.974E-06 914.468E-06 845.142E-06 814.246E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.3: SYN1067 B283CHH3.3: SYN1067 B283CHR3.3: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
07-APR2006 07-APR2006 04-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.3 Test alltempHistogram: Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Section
2006, 12:13
Test.Number=1.000, Test.Name=ICC,DE=VCC,^RE=L,DI=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.347E-03 1.413E-03 1.065E-03 716.967E-06 891.252E-06 456.053E-06 116.039E-06 1.173E-03 1.041E-03 958.368E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
2.8726 3.0596 2.6856 2.6856 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC33: A732CHH33: A732CHR33:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-APR2006 18-APR2006 18-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.3 Test alltempHistogram: Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Section
2006, 05:17
Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
798.193E-06 831.784E-06 668.132E-06 504.479E-06 589.072E-06 209.121E-06 54.551E-06 713.842E-06 649.564E-06 624.305E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.3: SYN1067 B283CHH3.3: SYN1067 B283CHR3.3: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
07-APR2006 07-APR2006 04-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.3 Test alltempHistogram: Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Section
2006, 12:13
Test.Number=1.001, Test.Name=ICC,DE=VCC,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.012E-03 1.048E-03 813.032E-06 577.971E-06 687.035E-06 324.928E-06 78.354E-06 876.650E-06 795.231E-06 747.925E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.4588 >4.0000 3.4588 2.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC33: A732CHH33: A732CHR33:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485
CHAR CHAR CHAR
19-APR2006 18-APR2006 18-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.3 Test alltempHistogram: Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Section
2006, 05:17
Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
767.025E-06 765.612E-06 600.275E-06 434.939E-06 509.702E-06 257.323E-06 55.112E-06 631.906E-06 589.382E-06 554.282E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.6306 >4.0000 3.6306 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
B283CHC3.3: SYN1067 B283CHH3.3: SYN1067 B283CHR3.3: SYN1067
SP3485_Epi SP3485_Epi SP3485_Epi
CHAR CHAR CHAR
07-APR2006 07-APR2006 04-APR2006
SP3485CH01. SP3485CH01. SP3485CH01.
Data: Data
Report generated
Vcc=3.3 Test alltempHistogram: Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Section
2006, 12:13
Test.Number=1.002, Test.Name=ICC,DE=L,^RE=L,DI=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.319E-03 1.220E-03 857.558E-06 495.311E-06 677.745E-06 640.970E-06 120.749E-06 933.212E-06 828.272E-06 780.076E-06
Foundry
StatHigh SpecHigh SpecLow StatLow
2.0704 2.3673 1.7735 1.7735 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Process Date Tested Tester Test Program Sequence Retest
A732CHC33: A732CHH33: A732CHR33:
SYN27 SYN27 SYN27
SP3485 SP3485 SP3485<br

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