SP232 Family Products SP202E, SP232A, SP232E Products (Revis
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SP232 Family Products
SP202E, SP232A, SP232E Products
(Revision
Prepared Velvet Doung Greg West Date: 2006
SP232 Product Family Characterization Report
Table Contents
Section Introduction Characterization Procedure Data Summary Parameters Conclusion Data Histograms Page Appendix
Page 8/16/2006
SP232 Product Family Characterization Report
Introduction: This product family characterization done part qualification Sipex's fabrication site transfer from Sipex's Hillview Milpitas, contract foundry, Episil, Taiwan. This characterization report summarizes data SP232 product family characteristics contains distributions parameters. complete listing product numbers covered this characterization report included "Conclusion" section this report. distributions Appendix arranged that Hillview Episil distributions given parameter adjacent. distribution given parameter shows temperature data combined given Vcc. Distributions parameters with Vcc=4.5V followed distributions 5.0V which followed distributions 5.5V. Wafer Fab: Episil Location: Taiwan Process: Episil SC2- 1087 Assembly location: Carsem Characterization Procedure: number(s): B5C14L50A Temperatures: Ambient, 85C, -40C Tester: Test Program: SP232ECH1.AT
Page 8/16/2006
SP232 Product Family Characterization Report
Data Summary:
Parameter Across Temperature Data Summary
Hillview Distribution Mean Hillview Distribution Variance Hillview (across temp) Episil Distribution Mean Episil Distribution Variance Episil (across temp)
Parameter
Units
4.5V 4.5V 5.001: 4.5V 4.5V 23.002 4.5V 35.001: 53.002: 5.5V 65:T1 5.5V 65.001: 5.5V 5.5V 83.002: 5.5V
1.572 5.736 -6.079 9.920 12.442 1.810 6.379 -6.762 12.617
649.237E-03 47.722E-03 63.387E-03 4.011 4.200 497.373E-03 45.302E-03 50.396E-03 4.839
1.7598 >4.0000 >4.00 1.6689 1.3933 2.1376 >4.0000 >4.0000 1.1975
1.489 5.731 -6.090 9.954 17.399 1.841 6.371 -6.778 12.354
508.266E-03 43.204E-03 75.851E-03 3.604 4.132 380.371E-03 55.705E-03 83.892E-03 4.060
2.3024 >4.00 >4.00 1.8540 1.0167 2.7682 >4.0000 >4.0000 1.4488
14.691 2.278 7.026 -7.454 15.780
5.028 599.626E-03 48.163E-03 53.468E-03 5.950
1.0149 1.5130 >4.0000 >4.0000 0.7967
20.751 2.314 7.006 -7.482 14.723
4.540 577.609E-03 59.100E-03 87.328E-03 4.427
0.6791 1.5501 >4.0000 >4.0000 1.1503
17.634
5.509
0.7483
24.271
5.008
0.3813
Page 8/16/2006
SP232 Product Family Characterization Report
Conclusion: Characterization data over temperature range show datasheet parameters meet spec. Most parameters meet greater. cases where parameter's (where strong temperature dependence exists) less, data shows comparable better performance Episil Hillview. performance SP232 parts fabricated Episil compatible current SP232 parts built from Hillview fab. This characterization report applies following SP232 family product part numbers:
SP202ECN SP202ECN-L SP202ECP SP202ECP-L SP202ECT SP202ECT-L SP202EEN SP202EEN-L SP202EEP SP202EEP-L SP202EET SP202EET-L SP232ACN SP232ACN-L SP232ACP SP232ACP-L SP232ACT SP232ACT-L
SP232AEN SP232AEN-L SP232AEP SP232AEP-L SP232AET SP232AET-L SP232ECN SP232ECN-L SP232ECP SP232ECP-L SP232ECT SP232ECT-L SP232EEN SP232EEN-L SP232EEP SP232EEP-L SP232EET SP232EET-L
Page 8/16/2006
SP232 Product Family Characterization Report
Appendix Characterization Data Histograms
Page 8/16/2006
This page intentionally left blank
4.5V tempHistogram: Test.Number=1.000, Test.Name=ICC
Section
2006, 05:07
Test.Number=1.000, Test.Name=ICC
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev Skew StatHigh StatLow NWithinSpec NOutsideSpec Range -375.325E-06 NOutsideSpec
585.981E-06 5.162E-03 1.572E-03 649.237E-06 1.203E-03 3.520E-03
2.4244 2.174E-03 4.576E-03
1.7598
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=1.000, Test.Name=ICC
Section
2006, 05:49
Test.Number=1.000, Test.Name=ICC
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
357.330E-06 3.094E-03 1.489E-03 508.266E-06 1.119E-03 3.014E-03 -35.494E-06 2.3024
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2992 2.223E-03 2.737E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=1.001, Test.Name=ICC W/3K
Section
2006, 05:07
Test.Number=1.001, Test.Name=ICC W/3K
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
8.698E-03 11.584E-03 9.839E-03 612.138E-06 9.333E-03 11.676E-03 8.003E-03
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.6439 10.568E-03 2.886E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=1.001, Test.Name=ICC W/3K
Section
2006, 05:49
Test.Number=1.001, Test.Name=ICC W/3K
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
8.980E-03 10.965E-03 9.901E-03 548.229E-06 9.393E-03 11.545E-03 8.256E-03
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2400 10.710E-03 1.984E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=3.000, Test.Name=R1 V=+-15V
Section
2006, 05:07
Test.Number=3.000, Test.Name=R1 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.637E03 4.400E03 4.025E03 229.994 3.784E03 4.715E03 3.335E03 1.4857
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0336 4.330E03 762.656
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=3.000, Test.Name=R1 V=+-15V
Section
2006, 05:49
Test.Number=3.000, Test.Name=R1 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.938E03 4.681E03 4.326E03 229.543 4.103E03 5.015E03 3.638E03 1.9259
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0321 4.636E03 742.122
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=3.001, Test.Name=R2 V=+-15V
section
2006, 05:26
Test.Number=3.001, Test.Name=R2 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.022E03 4.384E03 3.957E03 315.476 3.695E03 4.904E03 3.011E03 1.0116
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.8076 3.000E03 4.306E03 1.362E03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=3.001, Test.Name=R2 V=+-15V
Section
2006, 05:49
Test.Number=3.001, Test.Name=R2 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.915E03 4.675E03 4.301E03 243.239 4.061E03 5.031E03 3.572E03 1.7834
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0004 4.620E03 760.232
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=4.000, Test.Name=TX TRIP POINT
Section
2006, 05:07
Test.Number=4.000, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.525 1.625 1.574 40.706E-03 1.525 1.697 1.452 3.4848
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0206 1.625 99.999E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=4.000, Test.Name=TX TRIP POINT
Section
2006, 05:49
Test.Number=4.000, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.525 1.625 1.567 39.598E-03 1.525 1.686 1.448 3.6431
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2866 1.625 99.999E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=4.001, Test.Name=TX TRIP POINT
Section
2006, 05:07
Test.Number=4.001, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.525 1.625 1.575 41.053E-03 1.525 1.698 1.452 3.4508
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0000 1.625 99.999E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=4.001, Test.Name=TX TRIP POINT
Section
2006, 05:49
Test.Number=4.001, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.475 1.625 1.563 39.697E-03 1.525 1.682 1.444 3.6667
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3080 1.625 150.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.000, Test.Name=T1
Section
2006, 05:07
Test.Number=5.000, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
5.652 5.828 5.736 47.722E-03 5.702 5.879 5.593 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.2594 5.797 175.803E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.000, Test.Name=T1
Section
2006, 05:49
Test.Number=5.000, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
5.649 5.852 5.731 43.204E-03 5.700 5.860 5.601 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3876 5.789 203.528E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.001, Test.Name=T2
Section
2006, 05:07
Test.Number=5.001, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.206 -5.922 -6.079 63.387E-03 -6.129 -5.889 -6.269 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.5781 -5.992 283.737E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.001, Test.Name=T2
Section
2006, 05:49
Test.Number=5.001, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.271 -5.879 -6.090 75.851E-03 -6.149 -5.863 -6.318 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3971 -5.986 391.747E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.002, Test.Name=T1
Section
2006, 05:07
Test.Number=5.002, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.224 -5.923 -6.089 58.231E-03 -6.133 -5.914 -6.263 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3950 -6.016 300.876E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.002, Test.Name=T1
Section
2006, 05:49
Test.Number=5.002, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.263 -5.878 -6.088 77.878E-03 -6.138 -5.854 -6.321 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4030 -5.982 385.045E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.003, Test.Name=T2
Section
2006, 05:07
Test.Number=5.003, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
5.646 5.849 5.739 51.381E-03 5.703 5.893 5.585 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0939 5.806 202.462E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=5.003, Test.Name=T2
Section
2006, 05:49
Test.Number=5.003, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
5.622 5.840 5.730 43.511E-03 5.702 5.861 5.600 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0773 5.787 217.391E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.000, Test.Name=DX1
Section
2006, 05:07
Test.Number=6.000, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-11.474E-06 22.160E-06 5.728E-06 6.508E-06 3.107E-06 25.250E-06 -13.795E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1659 14.717E-06 33.634E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.000, Test.Name=DX1
Section
2006, 05:49
Test.Number=6.000, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-21.001E-06 13.825E-06 -4.391E-06 7.667E-06 -9.986E-06 18.610E-06 -27.392E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1187 5.489E-06 34.825E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.001, Test.Name=DX2
Section
2006, 05:07
Test.Number=6.001, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-8.795E-06 19.481E-06 5.698E-06 5.782E-06 1.619E-06 23.045E-06 -11.648E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0070 12.783E-06 28.275E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.001, Test.Name=DX2
Section
2006, 05:49
Test.Number=6.001, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-19.512E-06 12.634E-06 -4.142E-06 7.282E-06 -9.093E-06 17.704E-06 -25.988E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0985 6.382E-06 32.146E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.002, Test.Name=DX1
Section
2006, 05:07
Test.Number=6.002, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-12.665E-06 19.480E-06 4.785E-06 5.824E-06 428.590E-09 22.256E-06 -12.685E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.4988 11.145E-06 32.145E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.002, Test.Name=DX1
Section
2006, 05:49
Test.Number=6.002, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-21.001E-06 11.145E-06 -5.049E-06 7.472E-06 -9.986E-06 17.367E-06 -27.465E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0461 5.191E-06 32.146E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.003, Test.Name=DX2
Section
2006, 05:07
Test.Number=6.003, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-8.795E-06 19.481E-06 4.679E-06 6.058E-06 428.590E-09 22.855E-06 -13.496E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1445 12.633E-06 28.275E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=6.003, Test.Name=DX2
Section
2006, 05:49
Test.Number=6.003, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-22.786E-06 38.528E-06 -4.364E-06 8.256E-06 -8.796E-06 20.402E-06 -29.131E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
1.5250 5.191E-06 61.313E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=7.000, Test.Name=T1 VIN=0V
Section
2006, 05:07
Test.Number=7.000, Test.Name=T1 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-9.908E-06 -5.316E-06 -7.144E-06 1.562E-06 -9.037E-06 -2.458E-06 -11.830E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.3761 -5.421E-06 4.592E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=7.000, Test.Name=T1 VIN=0V
Section
2006, 05:49
Test.Number=7.000, Test.Name=T1 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-9.203E-06 -5.256E-06 -7.045E-06 1.423E-06 -8.775E-06 -2.777E-06 -11.314E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.2950 -5.444E-06 3.947E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=7.001, Test.Name=T2 VIN=0V
Section
2006, 05:07
Test.Number=7.001, Test.Name=T2 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-10.066E-06 -5.275E-06 -7.100E-06 1.553E-06 -9.023E-06 -2.441E-06 -11.758E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.3696 -5.355E-06 4.791E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=7.001, Test.Name=T2 VIN=0V
Section
2006, 05:49
Test.Number=7.001, Test.Name=T2 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-9.356E-06 -5.304E-06 -7.089E-06 1.474E-06 -8.905E-06 -2.667E-06 -11.511E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.3180 -5.443E-06 4.052E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.000, Test.Name=R1 VIN=15V
Section
2006, 05:07
Test.Number=8.000, Test.Name=R1 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev Skew StatHigh StatLow NWithinSpec NOutsideSpec Range -111.733E-03 NOutsideSpec
1.286E-03 378.037E-03 6.971E-03 39.568E-03 1.896E-03 125.675E-03
9.4760 3.878E-03 376.752E-03
3.3110
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.000, Test.Name=R1 VIN=15V
Section
2006, 05:49
Test.Number=8.000, Test.Name=R1 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.172E-03 26.631E-03 8.143E-03 6.891E-03 2.582E-03 28.816E-03 -12.531E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
1.0401 19.390E-03 25.459E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.001, Test.Name=R2 VIN=15V
Section
2006, 05:07
Test.Number=8.001, Test.Name=R2 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-1.725E-03 10.472E-03 2.702E-03 1.468E-03 1.781E-03 7.105E-03 -1.702E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
1.6167 3.782E-03 12.197E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.001, Test.Name=R2 VIN=15V
Section
2006, 05:49
Test.Number=8.001, Test.Name=R2 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
752.689E-06 24.764E-03 7.948E-03 6.526E-03 2.658E-03 27.526E-03 -11.630E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.9287 18.932E-03 24.011E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=8.002, Test.Name=R1 VIN=-15V
section
2006, 05:26
Test.Number=8.002, Test.Name=R1 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.443 4.527 4.502 12.365E-03 4.494 4.539 4.464 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-1.4298 3.000 4.515 84.764E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.002, Test.Name=R1 VIN=-15V
Section
2006, 05:49
Test.Number=8.002, Test.Name=R1 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.458 4.530 4.502 14.521E-03 4.493 4.545 4.458 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.4318 4.520 72.606E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.003, Test.Name=R2 VIN=-15V
Section
2006, 05:10
Test.Number=8.003, Test.Name=R2 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.464 4.526 4.502 10.734E-03 4.495 4.534 4.470 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.5212 4.515 61.515E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=8.003, Test.Name=R2 VIN=-15V
Section
2006, 05:49
Test.Number=8.003, Test.Name=R2 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.469 4.531 4.502 12.902E-03 4.493 4.540 4.463 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0965 4.519 61.401E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=9.000, Test.Name=RX
section
2006, 05:26
Test.Number=9.000, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.800 1.950 1.855 43.331E-03 1.800 1.985 1.725 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0918 3.800 1.900 150.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.000, Test.Name=RX
Section
2006, 05:49
Test.Number=9.000, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.750 1.950 1.844 44.624E-03 1.800 1.978 1.711 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1656 1.900 200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=9.001, Test.Name=RX
section
2006, 05:26
Test.Number=9.001, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-59.605E-09 1.350 1.236 150.139E-03 1.200 1.686 785.137E-03 0.9670
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-6.3359 1.350 1.350
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.001, Test.Name=RX
Section
2006, 05:49
Test.Number=9.001, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.150 1.400 1.243 63.406E-03 1.200 1.433 1.053 2.3277
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4130 1.300 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=9.002, Test.Name=RX HYSTERESIS
section
2006, 05:26
Test.Number=9.002, Test.Name=RX HYSTERESIS
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
550.001E-03 650.001E-03 605.619E-03 37.263E-03 600.000E-03 717.407E-03 493.830E-03 3.5279
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1854 2.000 650.001E-03 99.999E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.002, Test.Name=RX HYSTERESIS
Section
2006, 05:49
Test.Number=9.002, Test.Name=RX HYSTERESIS
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
450.001E-03 650.001E-03 601.667E-03 39.270E-03 600.000E-03 719.477E-03 483.857E-03 3.3811
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.9130 650.001E-03 200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.003, Test.Name=RX
Section
2006, 05:07
Test.Number=9.003, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.800 1.900 1.835 27.489E-03 1.800 1.917 1.753 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0249 1.850 100.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.003, Test.Name=RX
Section
2006, 05:49
Test.Number=9.003, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.750 1.900 1.822 34.439E-03 1.800 1.926 1.719 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.2180 1.850 150.001E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.004, Test.Name=RX
Section
2006, 05:07
Test.Number=9.004, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.150 1.350 1.260 71.579E-03 1.200 1.475 1.045 2.1421
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0620 1.350 200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.004, Test.Name=RX
Section
2006, 05:49
Test.Number=9.004, Test.Name=RX
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.150 1.400 1.257 68.925E-03 1.200 1.464 1.050 2.2112
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2608 1.350 250.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.005, Test.Name=RX HYSTERESIS
Section
2006, 05:07
Test.Number=9.005, Test.Name=RX HYSTERESIS
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
500.001E-03 650.001E-03 575.001E-03 52.601E-03 500.001E-03 732.803E-03 417.199E-03 2.3764
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.4145 650.001E-03 150.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=9.005, Test.Name=RX HYSTERESIS
Section
2006, 05:49
Test.Number=9.005, Test.Name=RX HYSTERESIS
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
450.001E-03 650.001E-03 565.000E-03 49.972E-03 550.000E-03 714.916E-03 415.085E-03 2.4347
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1547 625.000E-03 200.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.000, Test.Name=R1 IO=-1MA
Section
2006, 05:07
Test.Number=10.000, Test.Name=R1 IO=-1MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.227 4.380 4.295 38.660E-03 4.260 4.411 4.179 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0344 4.345 153.368E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.000, Test.Name=R1 IO=-1MA
Section
2006, 05:49
Test.Number=10.000, Test.Name=R1 IO=-1MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.237 4.369 4.297 34.288E-03 4.269 4.400 4.194 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1449 4.342 131.396E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.001, Test.Name=R2 IO=-1MA
Section
2006, 05:07
Test.Number=10.001, Test.Name=R2 IO=-1MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.228 4.361 4.294 35.221E-03 4.264 4.400 4.188 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1486 4.343 133.322E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.001, Test.Name=R2 IO=-1MA
Section
2006, 05:49
Test.Number=10.001, Test.Name=R2 IO=-1MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.228 4.356 4.293 34.658E-03 4.265 4.397 4.189 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2168 4.342 128.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.002, Test.Name=R1 IO=3.2MA
Section
2006, 05:07
Test.Number=10.002, Test.Name=R1 IO=3.2MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
219.536E-03 325.511E-03 271.682E-03 38.189E-03 228.989E-03 386.249E-03 157.115E-03 1.1200
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0918 322.663E-03 105.975E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.002, Test.Name=R1 IO=3.2MA
Section
2006, 05:49
Test.Number=10.002, Test.Name=R1 IO=3.2MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
225.616E-03 344.416E-03 278.617E-03 38.797E-03 236.974E-03 395.009E-03 162.225E-03 1.0429
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1647 330.619E-03 118.800E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.003, Test.Name=R2 IO=3.2MA
Section
2006, 05:07
Test.Number=10.003, Test.Name=R2 IO=3.2MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
233.868E-03 352.876E-03 288.405E-03 40.999E-03 245.244E-03 411.401E-03 165.410E-03 0.9073
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2012 344.025E-03 119.009E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=10.003, Test.Name=R2 IO=3.2MA
Section
2006, 05:49
Test.Number=10.003, Test.Name=R2 IO=3.2MA
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
239.204E-03 354.611E-03 297.440E-03 39.618E-03 252.371E-03 416.293E-03 178.587E-03 0.8629
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1141 348.751E-03 115.407E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=12.000, Test.Name=T1 VO=2V
Section
2006, 05:07
Test.Number=12.000, Test.Name=T1 VO=2V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
655.714E03 711.235E06 42.804E06 159.926E06 1.416E06 522.583E06 -436.975E06 0.0892
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
3.9390 10.507E06 710.579E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=12.000, Test.Name=T1 VO=2V
Section
2006, 05:49
Test.Number=12.000, Test.Name=T1 VO=2V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
529.960E03 25.290E06 1.875E06 2.857E06 806.859E03 10.447E06 -6.698E06 0.2186
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
6.5068 4.182E06 24.760E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=12.003, Test.Name=T1 VO=-2V
Section
2006, 05:07
Test.Number=12.003, Test.Name=T1 VO=-2V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
2.149E03 17.948E06 2.497E06 3.194E06 794.648E03 12.078E06 -7.083E06 0.2606
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
2.5568 6.503E06 17.946E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=12.003, Test.Name=T1 VO=-2V
Section
2006, 05:49
Test.Number=12.003, Test.Name=T1 VO=-2V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.853E03 6.504E06 786.929E03 1.010E06 23.686E03 3.818E06 -2.244E06 0.2596
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
3.5807 1.588E06 6.498E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.000, Test.Name=T1 2500PF
Section
2006, 05:07
Test.Number=23.000, Test.Name=T1 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.455E06 16.216E06 9.920E06 4.011E06 5.941E06 21.952E06 -2.112E06 1.6689
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4242 15.789E06 10.762E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.000, Test.Name=T1 2500PF
Section
2006, 05:49
Test.Number=23.000, Test.Name=T1 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.357E06 15.000E06 9.954E06 3.604E06 6.000E06 20.766E06 -858.390E03 1.8540
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2479 14.817E06 9.643E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.001, Test.Name=T2 2500PF
Section
2006, 05:07
Test.Number=23.001, Test.Name=T2 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.825E06 16.667E06 9.969E06 3.732E06 6.186E06 21.166E06 -1.228E06 1.7889
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4283 15.385E06 10.841E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.001, Test.Name=T2 2500PF
Section
2006, 05:49
Test.Number=23.001, Test.Name=T2 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.825E06 15.385E06 10.362E06 3.394E06 6.667E06 20.545E06 180.131E03 1.9286
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1712 15.000E06 9.559E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.002, Test.Name=T1 2500PF
Section
2006, 05:07
Test.Number=23.002, Test.Name=T1 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
6.522E06 22.222E06 12.442E06 4.200E06 8.000E06 25.044E06 -159.234E03 1.3933
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3754 17.647E06 15.701E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.002, Test.Name=T1 2500PF
Section
2006, 05:49
Test.Number=23.002, Test.Name=T1 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
12.000E06 24.000E06 17.399E06 4.132E06 12.500E06 29.793E06 5.004E06 1.0167
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0849 23.077E06 12.000E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.003, Test.Name=T2 2500PF
Section
2006, 05:07
Test.Number=23.003, Test.Name=T2 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
6.897E06 21.429E06 12.096E06 3.872E06 8.571E06 23.713E06 478.358E03 1.5412
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4121 17.143E06 14.532E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=23.003, Test.Name=T2 2500PF
Section
2006, 05:49
Test.Number=23.003, Test.Name=T2 2500PF
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
10.170E06 23.077E06 17.317E06 4.089E06 12.766E06 29.585E06 5.049E06 1.0338
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0401 22.222E06 12.907E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.000, Test.Name=T1
Section
2006, 05:07
Test.Number=24.000, Test.Name=T1
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
6.667E06 18.750E06 11.611E06 4.305E06 7.317E06 24.527E06 -1.305E06 1.4238
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4167 17.647E06 12.083E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.000, Test.Name=T1
Section
2006, 05:49
Test.Number=24.000, Test.Name=T1
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.825E06 16.216E06 10.424E06 3.823E06 6.452E06 21.893E06 -1.046E06 1.7069
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3321 15.789E06 10.391E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.001, Test.Name=T2
Section
2006, 05:07
Test.Number=24.001, Test.Name=T2
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
6.818E06 18.182E06 11.354E06 4.084E06 7.317E06 23.606E06 -897.814E03 1.5219
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4434 17.143E06 11.364E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.001, Test.Name=T2
Section
2006, 05:49
Test.Number=24.001, Test.Name=T2
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.825E06 16.216E06 10.425E06 3.774E06 6.522E06 21.748E06 -897.357E03 1.7288
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3540 15.789E06 10.391E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.002, Test.Name=T1
Section
2006, 05:07
Test.Number=24.002, Test.Name=T1
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.505E06 15.789E06 9.718E06 3.902E06 5.769E06 21.423E06 -1.988E06 1.7327
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3996 15.385E06 10.285E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.002, Test.Name=T1
Section
2006, 05:49
Test.Number=24.002, Test.Name=T1
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.217E06 15.000E06 9.431E06 3.588E06 5.660E06 20.194E06 -1.333E06 1.9110
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3518 14.460E06 9.783E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.003, Test.Name=T2
Section
2006, 05:07
Test.Number=24.003, Test.Name=T2
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.455E06 16.216E06 9.761E06 3.872E06 5.769E06 21.376E06 -1.854E06 1.7424
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3937 15.000E06 10.762E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=24.003, Test.Name=T2
Section
2006, 05:49
Test.Number=24.003, Test.Name=T2
Statistics: (V/US)
Mean StdDev Mean+3*StdD Mean3*StdDev
5.128E06 14.634E06 9.313E06 3.524E06 5.607E06 19.885E06 -1.259E06 1.9568
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3478 14.286E06 9.506E06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.000, Test.Name=T1 TPLH
Section
2006, 05:07
Test.Number=25.000, Test.Name=T1 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
869.999E-09 1.630E-06 1.277E-06 271.386E-09 959.999E-09 2.091E-06 462.841E-09 2.1163
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1355 1.600E-06 759.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.000, Test.Name=T1 TPLH
Section
2006, 05:49
Test.Number=25.000, Test.Name=T1 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
989.999E-09 1.760E-06 1.343E-06 266.761E-09 1.040E-06 2.143E-06 542.383E-09 2.0709
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0524 1.680E-06 769.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.001, Test.Name=T2 TPLH
Section
2006, 05:07
Test.Number=25.001, Test.Name=T2 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
929.999E-09 1.660E-06 1.301E-06 257.124E-09 999.999E-09 2.073E-06 529.960E-09 2.2021
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1603 1.590E-06 729.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.001, Test.Name=T2 TPLH
Section
2006, 05:49
Test.Number=25.001, Test.Name=T2 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
979.999E-09 1.780E-06 1.344E-06 260.689E-09 1.050E-06 2.126E-06 561.820E-09 2.1176
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0652 1.670E-06 799.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.002, Test.Name=T1 TPHL
Section
2006, 05:07
Test.Number=25.002, Test.Name=T1 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.080E-06 2.030E-06 1.549E-06 317.626E-09 1.200E-06 2.502E-06 596.009E-09 1.5229
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0368 1.950E-06 949.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.002, Test.Name=T1 TPHL
Section
2006, 05:49
Test.Number=25.002, Test.Name=T1 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.100E-06 1.990E-06 1.502E-06 293.580E-09 1.180E-06 2.383E-06 621.259E-09 1.7008
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1257 1.890E-06 889.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.003, Test.Name=T2 TPHL
Section
2006, 05:07
Test.Number=25.003, Test.Name=T2 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.020E-06 2.010E-06 1.542E-06 332.303E-09 1.180E-06 2.539E-06 544.757E-09 1.4629
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0143 1.960E-06 990.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=25.003, Test.Name=T2 TPHL
Section
2006, 05:49
Test.Number=25.003, Test.Name=T2 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.070E-06 2.020E-06 1.517E-06 300.973E-09 1.190E-06 2.419E-06 613.636E-09 1.6429
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0927 1.915E-06 949.999E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.000, Test.Name=R1 TPHL
Section
2006, 05:07
Test.Number=26.000, Test.Name=R1 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
110.000E-09 200.000E-09 152.111E-09 30.995E-09 120.000E-09 245.094E-09 59.127E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0666 190.000E-09 90.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.000, Test.Name=R1 TPHL
Section
2006, 05:49
Test.Number=26.000, Test.Name=R1 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
110.000E-09 190.000E-09 147.444E-09 29.965E-09 110.000E-09 237.339E-09 57.550E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0987 190.000E-09 80.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.001, Test.Name=R2 TPHL
Section
2006, 05:07
Test.Number=26.001, Test.Name=R2 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
100.000E-09 180.000E-09 141.666E-09 28.767E-09 110.000E-09 227.967E-09 55.366E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0813 180.000E-09 80.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.001, Test.Name=R2 TPHL
Section
2006, 05:49
Test.Number=26.001, Test.Name=R2 TPHL
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
90.000E-09 180.000E-09 137.555E-09 28.494E-09 110.000E-09 223.039E-09 52.072E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0443 170.000E-09 90.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.002, Test.Name=R1 TPLH
Section
2006, 05:07
Test.Number=26.002, Test.Name=R1 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
60.000E-09 120.000E-09 87.000E-09 21.901E-09 60.000E-09 152.703E-09 21.296E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0587 120.000E-09 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.002, Test.Name=R1 TPLH
Section
2006, 05:49
Test.Number=26.002, Test.Name=R1 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
50.000E-09 110.000E-09 81.555E-09 20.928E-09 60.000E-09 144.341E-09 18.770E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0599 110.000E-09 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.003, Test.Name=R2 TPLH
Section
2006, 05:07
Test.Number=26.003, Test.Name=R2 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
50.000E-09 110.000E-09 81.222E-09 21.084E-09 60.000E-09 144.476E-09 17.969E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0340 110.000E-09 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
4.5V tempHistogram: Test.Number=26.003, Test.Name=R2 TPLH
Section
2006, 05:49
Test.Number=26.003, Test.Name=R2 TPLH
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
50.000E-09 110.000E-09 76.222E-09 19.976E-09 60.000E-09 136.151E-09 16.293E-09 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1231 100.000E-09 60.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=31.000, Test.Name=ICC
Section
2006, 05:54
Test.Number=31.000, Test.Name=ICC
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.169E-03 4.023E-03 1.810E-03 497.373E-06 1.486E-03 3.303E-03 318.280E-06 2.1376
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
2.0342 2.199E-03 2.854E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=31.000, Test.Name=ICC
Section
2006, 06:31
Test.Number=31.000, Test.Name=ICC
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
806.643E-06 3.039E-03 1.841E-03 380.371E-06 1.599E-03 2.982E-03 700.069E-06 2.7682
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.3098 2.250E-03 2.232E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=31.001, Test.Name=ICC W/3K
Section
2006, 05:54
Test.Number=31.001, Test.Name=ICC W/3K
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
10.241E-03 13.271E-03 11.295E-03 728.487E-06 10.574E-03 13.480E-03 9.109E-03
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4878 12.186E-03 3.031E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=31.001, Test.Name=ICC W/3K
Section
2006, 06:31
Test.Number=31.001, Test.Name=ICC W/3K
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
10.123E-03 12.534E-03 11.362E-03 607.231E-06 10.813E-03 13.184E-03 9.540E-03
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1484 12.234E-03 2.411E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=33.000, Test.Name=R1 V=+-15V
Section
2006, 05:54
Test.Number=33.000, Test.Name=R1 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.648E03 4.406E03 4.034E03 228.095 3.795E03 4.719E03 3.350E03 1.5116
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0388 4.339E03 757.583
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=33.000, Test.Name=R1 V=+-15V
Section
2006, 06:31
Test.Number=33.000, Test.Name=R1 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.952E03 4.686E03 4.337E03 227.390 4.114E03 5.019E03 3.654E03 1.9593
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0347 4.644E03 734.393
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=33.001, Test.Name=R2 V=+-15V
section
2006, 05:29
Test.Number=33.001, Test.Name=R2 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.007E03 4.388E03 3.969E03 309.311 3.723E03 4.897E03 3.041E03 1.0444
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.8394 3.000E03 4.313E03 1.381E03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=33.001, Test.Name=R2 V=+-15V
Section
2006, 06:31
Test.Number=33.001, Test.Name=R2 V=+-15V
Statistics: (OHMS)
Mean StdDev Mean+3*StdD Mean3*StdDev
3.941E03 4.683E03 4.320E03 234.221 4.096E03 5.022E03 3.617E03 1.8782
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0079 4.629E03 742.510
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=34.000, Test.Name=TX TRIP POINT
Section
2006, 05:54
Test.Number=34.000, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.625 1.725 1.674 40.706E-03 1.625 1.797 1.552 2.6659
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0206 1.725 100.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=34.000, Test.Name=TX TRIP POINT
Section
2006, 06:31
Test.Number=34.000, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.625 1.725 1.660 37.062E-03 1.625 1.771 1.549 3.0579
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.5485 1.725 100.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=34.001, Test.Name=TX TRIP POINT
Section
2006, 05:54
Test.Number=34.001, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.625 1.725 1.673 40.993E-03 1.625 1.796 1.550 2.6608
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0831 1.725 100.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=34.001, Test.Name=TX TRIP POINT
Section
2006, 06:31
Test.Number=34.001, Test.Name=TX TRIP POINT
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.625 1.725 1.658 35.946E-03 1.625 1.766 1.550 3.1683
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.5979 1.725 100.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.000, Test.Name=T1
Section
2006, 05:54
Test.Number=35.000, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
6.292 6.511 6.379 45.302E-03 6.344 6.515 6.243 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.6118 6.442 219.372E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.000, Test.Name=T1
Section
2006, 06:31
Test.Number=35.000, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
6.268 6.497 6.371 55.705E-03 6.336 6.539 6.204 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1346 6.453 228.437E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.001, Test.Name=T2
Section
2006, 05:54
Test.Number=35.001, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.886 -6.659 -6.762 50.396E-03 -6.796 -6.611 -6.913 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.1154 -6.695 226.533E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.001, Test.Name=T2
Section
2006, 06:31
Test.Number=35.001, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.930 -6.545 -6.778 83.892E-03 -6.829 -6.526 -7.030 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.5865 -6.653 384.436E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.002, Test.Name=T1
Section
2006, 05:54
Test.Number=35.002, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.916 -6.660 -6.770 55.011E-03 -6.807 -6.605 -6.935 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.2573 -6.701 255.935E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.002, Test.Name=T1
Section
2006, 06:31
Test.Number=35.002, Test.Name=T1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-6.923 -6.543 -6.776 80.375E-03 -6.830 -6.535 -7.017 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.7205 -6.650 379.407E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.003, Test.Name=T2
Section
2006, 05:54
Test.Number=35.003, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
6.293 6.516 6.379 45.011E-03 6.345 6.514 6.244 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.7716 6.444 222.953E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=35.003, Test.Name=T2
Section
2006, 06:31
Test.Number=35.003, Test.Name=T2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
6.268 6.499 6.371 53.753E-03 6.329 6.532 6.210 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1357 6.446 230.949E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.000, Test.Name=DX1
Section
2006, 05:54
Test.Number=36.000, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-15.940E-06 34.063E-06 5.011E-06 9.108E-06 428.125E-09 32.333E-06 -22.312E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.0847 17.099E-06 50.003E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.000, Test.Name=DX1
Section
2006, 06:31
Test.Number=36.000, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-27.847E-06 14.717E-06 -6.524E-06 8.876E-06 -13.558E-06 20.106E-06 -33.153E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0564 5.191E-06 42.564E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.001, Test.Name=DX2
Section
2006, 05:54
Test.Number=36.001, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-15.939E-06 29.304E-06 6.178E-06 9.533E-06 428.125E-09 34.776E-06 -22.419E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2537 18.587E-06 45.243E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.001, Test.Name=DX2
Section
2006, 06:31
Test.Number=36.001, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-23.085E-06 14.718E-06 -5.214E-06 8.636E-06 -11.474E-06 20.695E-06 -31.123E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.0352 5.787E-06 37.802E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.002, Test.Name=DX1
Section
2006, 05:54
Test.Number=36.002, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-11.475E-06 30.197E-06 5.490E-06 9.322E-06 -464.488E-09 33.457E-06 -22.476E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.2876 17.843E-06 41.672E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.002, Test.Name=DX1
Section
2006, 06:31
Test.Number=36.002, Test.Name=DX1
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-27.847E-06 19.481E-06 -6.362E-06 10.035E-06 -13.558E-06 23.744E-06 -36.467E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.4440 6.977E-06 47.328E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.003, Test.Name=DX2
Section
2006, 05:54
Test.Number=36.003, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-13.559E-06 24.541E-06 4.908E-06 8.793E-06 -1.948E-06 31.286E-06 -21.470E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.2461 17.099E-06 38.099E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=36.003, Test.Name=DX2
Section
2006, 06:31
Test.Number=36.003, Test.Name=DX2
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-27.847E-06 14.718E-06 -5.945E-06 9.590E-06 -12.665E-06 22.825E-06 -34.715E-06
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.1735 5.490E-06 42.565E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=37.000, Test.Name=T1 VIN=0V
Section
2006, 05:54
Test.Number=37.000, Test.Name=T1 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-13.160E-06 -6.739E-06 -9.069E-06 2.028E-06 -11.471E-06 -2.985E-06 -15.153E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.4150 -6.850E-06 6.420E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=37.000, Test.Name=T1 VIN=0V
Section
2006, 06:31
Test.Number=37.000, Test.Name=T1 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-11.809E-06 -6.708E-06 -8.970E-06 1.838E-06 -11.261E-06 -3.456E-06 -14.483E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.2984 -6.895E-06 5.100E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=37.001, Test.Name=T2 VIN=0V
Section
2006, 05:54
Test.Number=37.001, Test.Name=T2 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-12.781E-06 -6.682E-06 -9.033E-06 2.003E-06 -11.532E-06 -3.023E-06 -15.043E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.3617 -6.793E-06 6.099E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=37.001, Test.Name=T2 VIN=0V
Section
2006, 06:31
Test.Number=37.001, Test.Name=T2 VIN=0V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
-11.888E-06 -6.734E-06 -9.048E-06 1.914E-06 -11.459E-06 -3.306E-06 -14.789E-06 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.3156 -6.889E-06 5.154E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.000, Test.Name=R1 VIN=15V
Section
2006, 05:54
Test.Number=38.000, Test.Name=R1 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.286E-03 11.691E-03 3.031E-03 1.480E-03 1.896E-03 7.470E-03 -1.408E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
2.4977 4.316E-03 10.406E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.000, Test.Name=R1 VIN=15V
Section
2006, 06:31
Test.Number=38.000, Test.Name=R1 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.324E-03 22.668E-03 8.345E-03 6.711E-03 2.810E-03 28.478E-03 -11.787E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.8530 20.056E-03 21.343E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.001, Test.Name=R2 VIN=15V
Section
2006, 05:54
Test.Number=38.001, Test.Name=R2 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
371.499E-06 11.043E-03 2.749E-03 1.397E-03 1.781E-03 6.941E-03 -1.442E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
2.5918 3.763E-03 10.671E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.001, Test.Name=R2 VIN=15V
Section
2006, 06:31
Test.Number=38.001, Test.Name=R2 VIN=15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
1.020E-03 22.096E-03 7.888E-03 6.242E-03 2.658E-03 26.614E-03 -10.838E-03 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
0.8384 18.094E-03 21.076E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.002, Test.Name=R1 VIN=-15V
Section
2006, 05:54
Test.Number=38.002, Test.Name=R1 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.960 5.026 5.000 11.766E-03 4.993 5.035 4.964 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.9557 5.011 65.326E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
1280451: MS1313BZ SP232EEN 1280451: 1280451: MS1313BZ SP232EEN MS1313BZ SP232EEN
charcold-40 Hillview charhot85 Hillview
charroom25 Hillview
2umCmos 01-FEB2006 2umCmos 01-FEB2006 2umCmos 01-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.002, Test.Name=R1 VIN=-15V
Section
2006, 06:31
Test.Number=38.002, Test.Name=R1 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.963 5.022 4.998 13.065E-03 4.989 5.037 4.959 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.4376 5.014 59.495E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
C14L50: C14L50: C14L50:
MS1087DZ SP232CE MS1087DZ SP232CE MS1087DZ SP232CE
cold_40oC Episil hot85oC Episil
room25oC Episil
2umCmos 21-FEB2006 2umCmos 21-FEB2006 2umCmos 17-FEB2006
SP232ECH1. SP232ECH1. SP232ECH1.
Data: Data
Report generated
tempHistogram: Test.Number=38.003, Test.Name=R2 VIN=-15V
Section
2006, 05:54
Test.Number=38.003, Test.Name=R2 VIN=-15V
Statistics:
Mean StdDev Mean+3*StdD Mean3*StdDev
4.975 5.020 5.000 9.513E-03 4.993 5.028 4.971 >4.0000
Skew StatHigh StatLow NWithinSpec NOutsideSpec Range NOutsideSpec
-0.3810 5.010 44.555E-03
Attributes
Lot: Wafers Maskset Device Device Operation Fou
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