SP213 Family Products SP204, SP207, SP208, SP211, SP213, SP238, S
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SP213 Family Products
SP204, SP207, SP208, SP211, SP213, SP238, SP241 Products
Prepared Velvet Doung Greg West Date: August 2006
SP213 Product Family Characterization Report
Table Contents
Section Introduction Characterization Procedure Data Summary Parameters Conclusions Data Histograms Page Appendix
Page 8/23/2006
SP213 Product Family Characterization Report
Introduction: This product family characterization done part qualification Sipex's fabrication site transfer from Sipex's Hillview Milpitas, contract foundry, Episil, Taiwan. This characterization report summarizes data SP213 product family characteristics contains distributions parameters. complete listing product numbers covered characterization report included "Conclusion" section this report. distributions Appendix arranged that Hillview Episil distributions given parameter adjacent. distribution given parameter shows temperature data combined given Vcc. Distributions parameters with 4.5V followed distributions 5.0V which followed distributions 5.5V. Wafer Fab: Episil Location: Taiwan Process: Episil SC2- 1584 Assembly location: Carsem Characterization Procedure: Episil number(s): 24634C Hillview number(s): 213L2 Temperatures: Ambient (25C), 85C, -40C Tester: Test Program: SP213ECH.AT
Page 8/23/2006
SP213 Product Family Characterization Report
Data Summary: Parameter Across Temperature Data Summary
Hillview Distribution Mean Hillview Distribution Variance Hillview (across temp) Episil Distribution Mean Episil Distribution Variance Episil (across temp)
Parameter
Units
Load@ 4.5V 4.004: 4.5V 4.001: 4.5V 50PF 4.5V 11.004 50PF 4.5V Load 4.004: 4.001: 50PF 11.004 50PF Load 5.5V 4.004: 5.5V 4.001: 5.5V 50PF 5.5V 11.004 50PF 5.5V
499.39 5.840
105.099 62.395E-03 74.640E-03 1.776 2.293 108.454 65.816E-03 79.190E-03 1.695 2.472 177.976 99.251E-03 75.952E-03 2.117 2.583
>4.0000 >4.0000 >4.0000 1.3333 1.3333 >4.0000 >4.0000 >4.0000 1.3742 1.2293 >4.0000 >4.0000 >4.0000 1.0258 1.0999
390.665 5.971 -5.985 12.499 13.171 406.655 6.079 -6.096 11.285 11.066 478.247 6.175 -6.045 11.133 11.175
104.879 45.641E-03 60.794E-03 3.156 4.416 81.244 59.760E-03 81.620E-03 2.117 2.909 88.314 62.041E-03 205.408E-03 1.848 2.630
>4.0000 >4.0000 >4.0000 1.8487 1.2704 >4.0000 >4.0000 >4.0000 2.9463 2.1698 >4.0000 >4.0000 >4.0000 3.4037 2.3860
-5.954
13.953
14.083
568.493
5.872
-5.937
13.837
14.028
629.96
5.905
-5.987
13.364
13.433
Page 8/23/2006
SP213 Product Family Characterization Report
Conclusion: Characterization data over temperature range show datasheet parameters meet spec. Cpk's most parameters comparable between Hillview Episil although many show strong temperature dependence that tends produce lower Cpk's this analysis. performance SP213 parts fabricated Episil comparable current SP213 parts built from Hillview fab. This characterization report applies following SP213 family product part numbers:
SP204EP-L SP207EHCA SP207EHCA-L SP207EHEA SP207EHEA-L SP207EHET SP207EHET-L SP207HCP SP207HCP-L SP207HCT SP207HCT-L SP207HEA SP207HEA-L SP207HEP SP207HEP-L SP207HET SP207HET-L SP208CA SP208CA-L SP208CP SP208CP-L SP208CT SP208CT-L SP208EA SP208EA-L SP208ECA SP208ECA-L SP208ECP SP208ECP-L SP208ECT SP208ECT-L SP208EEA SP208EEA-L SP208EEP SP208EEP-L SP208EET SP208EET-L SP208EHCA SP208EHCA-L SP208EHCP SP208EHCP-L SP208EHCT SP208EHCT-L SP208EHEA SP208EHEA-L SP208EHEP SP208EHEP-L SP208EHET SP208EHET-L SP208EP SP208EP-L SP208ET SP208ET-L SP211BCA SP211BCA-L SP211BCT SP211BCT-L SP211BET SP211BET-L SP211CA SP211CA-L SP211CT SP211CT-L SP211EA SP211EA-L SP211ECA SP211ECA-L SP211ECT SP211ECT-L SP211EEA SP211EEA-L SP211EET SP211EET-L SP211EHCA SP211EHCA-L SP211EHCT SP211EHCT-L SP211EHEA SP211EHEA-L SP211EHET SP211EHET-L SP211ET SP211ET-L SP211HCA SP211HCA-L SP211HCT SP211HCT-L SP211HEA SP211HEA-L SP211HET SP211HET-L SP213EHCA SP213EHCA-L SP213EHCT SP213EHCT-L SP213EHEA SP213EHEA-L SP213EHET SP213EHET-L SP238ACS SP238ACS-L SP238ACT SP238ACT-L SP238AES SP238AES-L SP238AET SP238AET-L SP241BCT SP241BCT-L SP241BET SP241BET-L SP241CCT SP241CCT-L SP241MCT SP241MCT-L
Page 8/23/2006
SP213 Product Family Characterization Report
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Page 8/23/2006
SP213 Product Family Characterization Report
Appendix Characterization Data Histograms
Page 8/23/2006
Vcc=4.5V Test alltempHistogram: Test.Number=1.000, Test.Name=ICC LOAD
Section
Test.Number=1.000, Test.Name=ICC LOAD
Statistics:
Mean Range StdDev WpValue Median
652.690E-06 390.665E-06 162.095E-06 490.595E-06 104.879E-06 0.9799 0.1774 527.052E-06 447.746E-06 376.094E-06
Skew Kurtosis
328.458E-06 256.849E-06 >4.0000 >4.0000 0.2816 0.0484
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
6.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=1.000, Test.Name=ICC LOAD
Section
Test.Number=1.000, Test.Name=ICC LOAD
Statistics:
Mean Range StdDev WpValue Median
919.839E-06 499.392E-06 226.879E-06 692.960E-06 105.099E-06 0.9238 0.0001 623.534E-06 551.572E-06 482.638E-06
Skew Kurtosis
438.059E-06 399.080E-06 >4.0000 >4.0000 1.1239 3.6756
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
6.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=1.001, Test.Name=ICC W/3K
Section
Test.Number=1.001, Test.Name=ICC W/3K
Statistics:
Mean Range StdDev WpValue Median
18.834E-03 17.208E-03 15.791E-03 3.043E-03 596.503E-06 0.9885 0.6176 17.914E-03 17.643E-03 17.282E-03
Skew Kurtosis
16.727E-03 16.504E-03 >4.0000 >4.0000 1.5602 1.5602 0.0143 -0.1028
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
20.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=1.001, Test.Name=ICC W/3K
Section
Test.Number=1.001, Test.Name=ICC W/3K
Statistics:
Mean Range StdDev WpValue Median
29.749E-03 17.460E-03 16.165E-03 13.584E-03 1.475E-03 0.3526 0.0000 18.049E-03 17.672E-03 17.236E-03
Skew Kurtosis
16.970E-03 16.688E-03 2.2601 3.9462 0.5741 0.5741 7.4866 62.7558
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
20.000E-03 98.75 1.25
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=2.000, Test.Name=232
Section
Test.Number=2.000, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.759E03 4.400E03 4.056E03 702.397 241.511 0.8788 0.0000 4.706E03 4.678E03 4.387E03
Skew Kurtosis
4.142E03 4.094E03 2.7604 1.9320 3.5888 1.9320 0.0552 -1.4551
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.000, Test.Name=232
Section
Test.Number=2.000, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.038E03 3.897E03 3.700E03 338.257 101.954 0.8405 0.0000 3.998E03 3.975E03 3.947E03
Skew Kurtosis
3.789E03 3.734E03 >4.0000 2.9313 >4.0000 2.9313 -0.6892 -1.1313
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=2.001, Test.Name=232
Section
Test.Number=2.001, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.755E03 4.409E03 4.077E03 677.741 236.409 0.8681 0.0000 4.712E03 4.681E03 4.393E03
Skew Kurtosis
4.141E03 4.109E03 2.8200 1.9866 3.6534 1.9866 0.0613 -1.4697
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.001, Test.Name=232
Section
Test.Number=2.001, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.059E03 3.915E03 3.718E03 341.033 106.063 0.8537 0.0000 4.018E03 3.994E03 3.966E03
Skew Kurtosis
3.828E03 3.747E03 >4.0000 2.8758 >4.0000 2.8758 -0.6526 -1.1247
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=2.002, Test.Name=232
Section
Test.Number=2.002, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.751E03 4.386E03 4.027E03 724.158 240.992 0.8825 0.0000 4.693E03 4.666E03 4.371E03
Skew Kurtosis
4.121E03 4.082E03 2.7663 1.9177 3.6150 1.9177 0.0554 -1.4471
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.002, Test.Name=232
Section
Test.Number=2.002, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.052E03 3.916E03 3.722E03 329.332 103.521 0.8603 0.0000 4.019E03 3.992E03 3.964E03
Skew Kurtosis
3.823E03 3.749E03 >4.0000 2.9484 >4.0000 2.9484 -0.6428 -1.1127
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=2.003, Test.Name=232
Section
Test.Number=2.003, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.770E03 4.420E03 4.074E03 696.718 234.658 0.8797 0.0000 4.723E03 4.687E03 4.405E03
Skew Kurtosis
4.171E03 4.117E03 2.8410 2.0166 3.6654 2.0166 0.0649 -1.4533
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.003, Test.Name=232
Section
Test.Number=2.003, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.040E03 3.916E03 3.719E03 320.350 101.369 0.8505 0.0000 4.015E03 3.996E03 3.961E03
Skew Kurtosis
3.817E03 3.752E03 >4.0000 3.0121 >4.0000 3.0121 -0.6791 -1.1051
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=2.004, Test.Name=232
Section
Test.Number=2.004, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.769E03 4.414E03 4.060E03 708.770 240.340 0.8781 0.0000 4.721E03 4.692E03 4.400E03
Skew Kurtosis
4.157E03 4.113E03 2.7739 1.9606 3.5871 1.9606 0.0628 -1.4564
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=2.004, Test.Name=232
Section
Test.Number=2.004, Test.Name=232
Statistics: (OHMS)
Mean Range StdDev WpValue Median
4.017E03 3.891E03 3.697E03 319.966 103.379 0.8361 0.0000 3.992E03 3.971E03 3.938E03
Skew Kurtosis
3.791E03 3.725E03 >4.0000 2.8736 >4.0000 2.8736 -0.6895 -1.1468
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
7.000E03 3.000E03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.000, Test.Name=RX1 3.2MA
Section
Test.Number=3.000, Test.Name=RX1 3.2MA
Statistics:
Mean Range StdDev WpValue Median
198.746E-03 169.756E-03 142.796E-03 55.950E-03 21.646E-03 0.8201 0.0000 197.660E-03 196.878E-03 167.371E-03
Skew Kurtosis
145.389E-03 143.768E-03 3.0799 2.6142 3.5457 2.6142 0.1695 -1.5062
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.000, Test.Name=RX1 3.2MA
Section
Test.Number=3.000, Test.Name=RX1 3.2MA
Statistics:
Mean Range StdDev WpValue Median
169.212E-03 156.337E-03 138.188E-03 31.023E-03 8.534E-03 0.8766 0.0000 164.085E-03 162.713E-03 159.379E-03
Skew Kurtosis
149.832E-03 141.656E-03 >4.0000 >4.0000 >4.0000 >4.0000 -0.7986 -0.6535
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.001, Test.Name=RX2 3.2MA
Section
Test.Number=3.001, Test.Name=RX2 3.2MA
Statistics:
Mean Range StdDev WpValue Median
200.271E-03 170.149E-03 142.910E-03 57.361E-03 21.944E-03 0.8240 0.0000 198.727E-03 197.221E-03 167.466E-03
Skew Kurtosis
145.503E-03 143.768E-03 3.0380 2.5846 3.4914 2.5846 0.1734 -1.5028
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.001, Test.Name=RX2 3.2MA
Section
Test.Number=3.001, Test.Name=RX2 3.2MA
Statistics:
Mean Range StdDev WpValue Median
167.877E-03 157.119E-03 139.218E-03 28.660E-03 8.637E-03 0.8582 0.0000 165.344E-03 164.162E-03 160.904E-03
Skew Kurtosis
149.508E-03 143.295E-03 >4.0000 >4.0000 >4.0000 >4.0000 -0.7163 -0.9948
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.002, Test.Name=RX3 3.2MA
Section
Test.Number=3.002, Test.Name=RX3 3.2MA
Statistics:
Mean Range StdDev WpValue Median
209.266E-03 177.260E-03 147.789E-03 61.477E-03 23.435E-03 0.8223 0.0000 207.683E-03 206.330E-03 174.441E-03
Skew Kurtosis
151.526E-03 149.314E-03 2.8448 2.5213 3.1682 2.5213 0.1738 -1.5047
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.002, Test.Name=RX3 3.2MA
Section
Test.Number=3.002, Test.Name=RX3 3.2MA
Statistics:
Mean Range StdDev WpValue Median
177.024E-03 165.254E-03 145.316E-03 31.708E-03 9.682E-03 0.8362 0.0000 174.547E-03 172.623E-03 169.593E-03
Skew Kurtosis
156.292E-03 149.165E-03 >4.0000 >4.0000 >4.0000 >4.0000 -0.7475 -1.0304
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.003, Test.Name=RX4 3.2MA
Section
Test.Number=3.003, Test.Name=RX4 3.2MA
Statistics:
Mean Range StdDev WpValue Median
206.482E-03 175.043E-03 145.999E-03 60.483E-03 23.116E-03 0.8219 0.0000 204.997E-03 203.625E-03 172.460E-03
Skew Kurtosis
148.895E-03 147.181E-03 2.8840 2.5241 3.2438 2.5241 0.1682 -1.5049
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.003, Test.Name=RX4 3.2MA
Section
Test.Number=3.003, Test.Name=RX4 3.2MA
Statistics:
Mean Range StdDev WpValue Median
301.306E-03 164.441E-03 143.105E-03 158.202E-03 18.045E-03 0.5068 0.0000 171.308E-03 170.203E-03 166.524E-03
Skew Kurtosis
154.805E-03 147.182E-03 3.6945 3.0376 >4.0000 3.0376 5.4850 42.2873
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.004, Test.Name=RX5 3.2MA
Section
Test.Number=3.004, Test.Name=RX5 3.2MA
Statistics:
Mean Range StdDev WpValue Median
206.635E-03 174.722E-03 146.037E-03 60.598E-03 23.016E-03 0.8217 0.0000 204.368E-03 203.281E-03 171.926E-03
Skew Kurtosis
148.780E-03 147.162E-03 2.8966 2.5305 3.2627 2.5305 0.1683 -1.5049
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.004, Test.Name=RX5 3.2MA
Section
Test.Number=3.004, Test.Name=RX5 3.2MA
Statistics:
Mean Range StdDev WpValue Median
173.213E-03 161.235E-03 142.266E-03 30.947E-03 9.694E-03 0.8373 0.0000 170.756E-03 168.754E-03 165.896E-03
Skew Kurtosis
152.118E-03 145.639E-03 >4.0000 >4.0000 >4.0000 >4.0000 -0.6930 -1.1345
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
400.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.005, Test.Name=RX1
Section
Test.Number=3.005, Test.Name=RX1
Statistics:
Mean Range StdDev WpValue Median
4.414 4.379 4.346 67.649E-03 19.903E-03 0.9092 0.0000 4.404 4.400 4.380
Skew Kurtosis
4.357 4.353 >4.0000 >4.0000 -0.0601 -1.4207
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.005, Test.Name=RX1
Section
Test.Number=3.005, Test.Name=RX1
Statistics:
Mean Range StdDev WpValue Median
4.654 4.637 4.616 38.569E-03 9.068E-03 0.9789 0.2071 4.649 4.644 4.637
Skew Kurtosis
4.631 4.627 >4.0000 >4.0000 -0.0689 -0.4423
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.006, Test.Name=RX2
Section
Test.Number=3.006, Test.Name=RX2
Statistics:
Mean Range StdDev WpValue Median
4.408 4.378 4.345 63.152E-03 20.807E-03 0.9070 0.0000 4.405 4.399 4.380
Skew Kurtosis
4.355 4.350 >4.0000 >4.0000 -0.0876 -1.4663
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.006, Test.Name=RX2
Section
Test.Number=3.006, Test.Name=RX2
Statistics:
Mean Range StdDev WpValue Median
4.659 4.637 4.622 36.396E-03 9.852E-03 0.9509 0.0039 4.651 4.646 4.635
Skew Kurtosis
4.630 4.625 >4.0000 >4.0000 0.3973 -0.9176
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.007, Test.Name=RX3
Section
Test.Number=3.007, Test.Name=RX3
Statistics:
Mean Range StdDev WpValue Median
4.414 4.375 4.329 85.335E-03 21.414E-03 0.9436 0.0007 4.399 4.393 4.381
Skew Kurtosis
4.354 4.342 >4.0000 >4.0000 -0.4148 -0.9272
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.007, Test.Name=RX3
Section
Test.Number=3.007, Test.Name=RX3
Statistics:
Mean Range StdDev WpValue Median
4.658 4.633 4.611 47.068E-03 11.131E-03 0.9416 0.0012 4.650 4.643 4.630
Skew Kurtosis
4.626 4.620 >4.0000 >4.0000 0.4476 -0.7358
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.008, Test.Name=RX4
Section
Test.Number=3.008, Test.Name=RX4
Statistics:
Mean Range StdDev WpValue Median
4.418 4.377 4.329 89.031E-03 21.996E-03 0.9474 0.0012 4.401 4.396 4.381
Skew Kurtosis
4.356 4.345 >4.0000 >4.0000 -0.2637 -1.0288
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.008, Test.Name=RX4
Section
Test.Number=3.008, Test.Name=RX4
Statistics:
Mean Range StdDev WpValue Median
4.658 4.635 4.621 36.587E-03 9.956E-03 0.9032 0.0000 4.651 4.643 4.632
Skew Kurtosis
4.628 4.625 >4.0000 >4.0000 0.7446 -0.6464
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=3.009, Test.Name=RX5
Section
Test.Number=3.009, Test.Name=RX5
Statistics:
Mean Range StdDev WpValue Median
4.417 4.379 4.331 86.629E-03 21.164E-03 0.9513 0.0020 4.403 4.397 4.381
Skew Kurtosis
4.359 4.350 >4.0000 >4.0000 -0.3603 -0.9265
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=3.009, Test.Name=RX5
Section
Test.Number=3.009, Test.Name=RX5
Statistics:
Mean Range StdDev WpValue Median
4.660 4.636 4.618 41.465E-03 10.409E-03 0.9391 0.0009 4.652 4.646 4.633
Skew Kurtosis
4.629 4.625 >4.0000 >4.0000 0.5052 -0.7554
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
3.500 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.000, Test.Name=TX1 LOAD
Section
Test.Number=4.000, Test.Name=TX1 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.833 -5.985 -6.125 291.410E-03 58.783E-03 0.9936 0.9441 -5.908 -5.947 -5.988
Skew Kurtosis
-6.027 -6.062 >4.0000 >4.0000 0.1674 -0.1297
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.000, Test.Name=TX1 LOAD
Section
Test.Number=4.000, Test.Name=TX1 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.797 -5.952 -6.142 345.342E-03 75.662E-03 0.9869 0.5936 -5.857 -5.897 -5.946
Skew Kurtosis
-6.009 -6.049 >4.0000 >4.0000 -0.2631 -0.4868
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.001, Test.Name=TX2 LOAD
Section
Test.Number=4.001, Test.Name=TX2 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.830 -5.985 -6.120 290.117E-03 60.794E-03 0.9824 0.2647 -5.906 -5.938 -5.993
Skew Kurtosis
-6.032 -6.054 >4.0000 >4.0000 0.2202 -0.5205
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.001, Test.Name=TX2 LOAD
Section
Test.Number=4.001, Test.Name=TX2 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.801 -5.954 -6.100 298.882E-03 74.640E-03 0.9761 0.1381 -5.855 -5.894 -5.956
Skew Kurtosis
-6.014 -6.056 >4.0000 >4.0000 -0.0237 -0.9058
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.002, Test.Name=TX3 LOAD
Section
Test.Number=4.002, Test.Name=TX3 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.830 -5.987 -6.123 293.162E-03 59.568E-03 0.9885 0.6203 -5.909 -5.945 -5.990
Skew Kurtosis
-6.034 -6.058 >4.0000 >4.0000 0.2070 -0.3565
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.002, Test.Name=TX3 LOAD
Section
Test.Number=4.002, Test.Name=TX3 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.795 -5.956 -6.144 349.455E-03 80.804E-03 0.9880 0.6663 -5.841 -5.902 -5.953
Skew Kurtosis
-6.013 -6.068 >4.0000 >4.0000 -0.0943 -0.5561
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.003, Test.Name=TX4 LOAD
Section
Test.Number=4.003, Test.Name=TX4 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.833 -5.985 -6.108 274.197E-03 58.339E-03 0.9797 0.1732 -5.905 -5.939 -5.992
Skew Kurtosis
-6.033 -6.056 >4.0000 >4.0000 0.3277 -0.5466
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.003, Test.Name=TX4 LOAD
Section
Test.Number=4.003, Test.Name=TX4 LOAD
Statistics:
Mean Range StdDev WpValue Median
-5.803 -5.952 -6.115 311.601E-03 74.425E-03 0.9797 0.2348 -5.848 -5.903 -5.951
Skew Kurtosis
-5.999 -6.064 >4.0000 >4.0000 -0.2237 -0.2697
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.004, Test.Name=TX1 LOAD
Section
Test.Number=4.004, Test.Name=TX1 LOAD
Statistics:
Mean Range StdDev WpValue Median
6.088 5.971 5.871 216.633E-03 45.641E-03 0.9897 0.7117 6.027 6.003 5.969
Skew Kurtosis
5.938 5.906 >4.0000 >4.0000 0.1304 -0.3257
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.004, Test.Name=TX1 LOAD
Section
Test.Number=4.004, Test.Name=TX1 LOAD
Statistics:
Mean Range StdDev WpValue Median
6.009 5.840 5.687 322.033E-03 62.395E-03 0.9878 0.6523 5.912 5.886 5.841
Skew Kurtosis
5.799 5.750 >4.0000 >4.0000 -0.1500 -0.1687
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.005, Test.Name=TX2 LOAD
Section
Test.Number=4.005, Test.Name=TX2 LOAD
Statistics:
Mean Range StdDev WpValue Median
6.078 5.975 5.863 214.499E-03 43.081E-03 0.9956 0.9921 6.026 6.009 5.975
Skew Kurtosis
5.946 5.919 >4.0000 >4.0000 -0.0572 -0.2535
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.005, Test.Name=TX2 LOAD
Section
Test.Number=4.005, Test.Name=TX2 LOAD
Statistics:
Mean Range StdDev WpValue Median
6.012 5.843 5.710 302.765E-03 62.545E-03 0.9912 0.8631 5.912 5.883 5.842
Skew Kurtosis
5.801 5.757 >4.0000 >4.0000 0.0042 -0.1831
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.006, Test.Name=TX3 LOAD
Section
Test.Number=4.006, Test.Name=TX3 LOAD
Statistics:
Mean Range StdDev WpValue Median
6.081 5.969 5.875 205.817E-03 45.236E-03 0.9744 0.0728 6.031 6.001 5.963
Skew Kurtosis
5.934 5.915 >4.0000 >4.0000 0.3838 -0.5010
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.006, Test.Name=TX3 LOAD
Section
Test.Number=4.006, Test.Name=TX3 LOAD
Statistics:
Mean Range StdDev WpValue Median
5.994 5.840 5.691 303.527E-03 62.227E-03 0.9886 0.7030 5.912 5.884 5.841
Skew Kurtosis
5.797 5.748 >4.0000 >4.0000 -0.1083 -0.1516
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=4.007, Test.Name=TX4 LOAD
Section
Test.Number=4.007, Test.Name=TX4 LOAD
Statistics:
Mean Range StdDev WpValue Median
6.091 5.974 5.879 212.369E-03 45.053E-03 0.9915 0.8325 6.032 6.006 5.971
Skew Kurtosis
5.945 5.917 >4.0000 >4.0000 0.1385 -0.2057
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=4.007, Test.Name=TX4 LOAD
Section
Test.Number=4.007, Test.Name=TX4 LOAD
Statistics:
Mean Range StdDev WpValue Median
5.978 5.838 5.687 290.349E-03 60.793E-03 0.9877 0.6452 5.911 5.888 5.848
Skew Kurtosis
5.791 5.755 >4.0000 >4.0000 -0.1787 -0.4452
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
15.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.000, Test.Name=TX1
Section
Test.Number=5.000, Test.Name=TX1
Statistics:
Mean Range StdDev WpValue Median
-33.811E-03 -41.367E-03 -49.904E-03 16.093E-03 6.222E-03 0.8229 0.0000 -34.029E-03 -34.215E-03 -40.816E-03
Skew Kurtosis
-48.943E-03 -49.546E-03 -0.1550 -1.4908
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.000, Test.Name=TX1
Section
Test.Number=5.000, Test.Name=TX1
Statistics:
Mean Range StdDev WpValue Median
-40.611E-03 -42.679E-03 -48.390E-03 7.779E-03 2.370E-03 0.7403 0.0000 -40.840E-03 -41.010E-03 -41.249E-03
Skew Kurtosis
-44.686E-03 -46.804E-03 -1.0095 -0.6541
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.004, Test.Name=TX1
Section
Test.Number=5.004, Test.Name=TX1
Statistics:
Mean Range StdDev WpValue Median
53.062E-03 35.704E-03 23.928E-03 29.134E-03 7.931E-03 0.8831 0.0000 44.303E-03 44.073E-03 34.157E-03
Skew Kurtosis
27.240E-03 25.268E-03 2.7024 2.7024 0.1594 -1.0908
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
72.653E-03
-4.168E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.001, Test.Name=TX1
Section
Test.Number=5.001, Test.Name=TX1
Statistics:
Mean Range StdDev WpValue Median
54.058E-03 46.558E-03 43.086E-03 10.972E-03 2.986E-03 0.8059 0.0000 51.408E-03 48.629E-03 45.020E-03
Skew Kurtosis
44.367E-03 44.012E-03 0.9406 -0.6203
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.005, Test.Name=TX2
Section
Test.Number=5.005, Test.Name=TX2
Statistics:
Mean Range StdDev WpValue Median
53.384E-03 36.510E-03 24.407E-03 28.977E-03 7.773E-03 0.9026 0.0000 44.282E-03 44.065E-03 34.144E-03
Skew Kurtosis
31.923E-03 25.395E-03 2.7227 2.7227 0.1065 -0.9993
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
73.209E-03
-5.459E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.002, Test.Name=TX2
Section
Test.Number=5.002, Test.Name=TX2
Statistics:
Mean Range StdDev WpValue Median
53.996E-03 46.485E-03 43.143E-03 10.853E-03 2.959E-03 0.8050 0.0000 51.382E-03 48.529E-03 44.960E-03
Skew Kurtosis
44.339E-03 43.936E-03 0.9691 -0.5476
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.001, Test.Name=TX2
Section
Test.Number=5.001, Test.Name=TX2
Statistics:
Mean Range StdDev WpValue Median
-33.841E-03 -41.397E-03 -49.947E-03 16.106E-03 6.206E-03 0.8247 0.0000 -34.058E-03 -34.265E-03 -40.858E-03
Skew Kurtosis
-48.900E-03 -49.521E-03 3.1477 3.1477 -0.1512 -1.4895
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
-13.508E-03
-81.745E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.003, Test.Name=TX2
Section
Test.Number=5.003, Test.Name=TX2
Statistics:
Mean Range StdDev WpValue Median
-39.930E-03 -42.688E-03 -48.450E-03 8.520E-03 2.352E-03 0.7507 0.0000 -40.901E-03 -41.073E-03 -41.344E-03
Skew Kurtosis
-44.859E-03 -46.693E-03 -1.0351 -0.5786
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.002, Test.Name=TX3
Section
Test.Number=5.002, Test.Name=TX3
Statistics:
Mean Range StdDev WpValue Median
-33.621E-03 -41.252E-03 -49.781E-03 16.160E-03 6.197E-03 0.8243 0.0000 -33.938E-03 -34.118E-03 -40.714E-03
Skew Kurtosis
-48.837E-03 -49.399E-03 3.1598 3.1598 -0.1539 -1.4903
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
-13.410E-03
-81.501E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.004, Test.Name=TX3
Section
Test.Number=5.004, Test.Name=TX3
Statistics:
Mean Range StdDev WpValue Median
-39.575E-03 -42.495E-03 -48.279E-03 8.704E-03 2.377E-03 0.7481 0.0000 -40.713E-03 -40.868E-03 -41.107E-03
Skew Kurtosis
-44.462E-03 -46.697E-03 -1.0392 -0.5620
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.006, Test.Name=TX3
Section
Test.Number=5.006, Test.Name=TX3
Statistics:
Mean Range StdDev WpValue Median
53.103E-03 36.035E-03 22.276E-03 30.827E-03 7.778E-03 0.9001 0.0000 44.332E-03 44.089E-03 34.104E-03
Skew Kurtosis
29.263E-03 25.553E-03 2.7415 2.7415 0.1420 -1.0365
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
71.642E-03
-2.152E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.005, Test.Name=TX3
Section
Test.Number=5.005, Test.Name=TX3
Statistics:
Mean Range StdDev WpValue Median
53.912E-03 46.479E-03 43.130E-03 10.782E-03 2.979E-03 0.8005 0.0000 51.364E-03 48.310E-03 44.993E-03
Skew Kurtosis
44.311E-03 43.986E-03 0.9729 -0.5693
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.007, Test.Name=TX4
Section
Test.Number=5.007, Test.Name=TX4
Statistics:
Mean Range StdDev WpValue Median
53.564E-03 36.571E-03 23.038E-03 30.526E-03 8.045E-03 0.9086 0.0000 44.431E-03 44.232E-03 34.208E-03
Skew Kurtosis
31.183E-03 25.803E-03 2.6280 2.6280 0.1826 -0.8822
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
73.968E-03
-1.677E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.006, Test.Name=TX4
Section
Test.Number=5.006, Test.Name=TX4
Statistics:
Mean Range StdDev WpValue Median
54.006E-03 46.527E-03 43.181E-03 10.825E-03 2.991E-03 0.7975 0.0000 51.344E-03 48.627E-03 44.955E-03
Skew Kurtosis
44.354E-03 44.023E-03 0.9663 -0.5906
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=5.003, Test.Name=TX4
Section
Test.Number=5.003, Test.Name=TX4
Statistics:
Mean Range StdDev WpValue Median
-33.643E-03 -41.200E-03 -49.711E-03 16.068E-03 6.202E-03 0.8238 0.0000 -33.910E-03 -34.070E-03 -40.631E-03
Skew Kurtosis
-48.862E-03 -49.369E-03 3.1600 3.1600 -0.1582 -1.4904
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
-100.000E-03 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
-13.378E-03
-81.390E-03
100.00
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=5.007, Test.Name=TX4
Section
Test.Number=5.007, Test.Name=TX4
Statistics:
Mean Range StdDev WpValue Median
-39.365E-03 -42.419E-03 -48.145E-03 8.780E-03 2.389E-03 0.7451 0.0000 -40.646E-03 -40.813E-03 -41.004E-03
Skew Kurtosis
-44.539E-03 -46.651E-03 -1.0196 -0.6180
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=6.000, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.000, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-528.001E-09 -1.418E-06 -2.992E-06 2.464E-06 511.247E-09 0.9534 0.0027 -826.556E-09 -1.045E-06 -1.300E-06
Skew Kurtosis
-1.683E-06 -2.023E-06 -0.8261 0.5724
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=6.000, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.000, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-1.065E-06 -2.063E-06 -4.154E-06 3.089E-06 586.664E-09 0.9421 0.0012 -1.428E-06 -1.675E-06 -1.925E-06
Skew Kurtosis
-2.326E-06 -2.891E-06 -1.0278 1.5329
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=6.001, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.001, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-511.383E-09 -1.399E-06 -2.951E-06 2.440E-06 515.915E-09 0.9548 0.0034 -813.308E-09 -1.035E-06 -1.300E-06
Skew Kurtosis
-1.675E-06 -2.180E-06 -0.7588 0.1924
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=6.001, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.001, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-955.162E-09 -1.991E-06 -4.314E-06 3.359E-06 603.305E-09 0.9308 0.0003 -1.286E-06 -1.625E-06 -1.900E-06
Skew Kurtosis
-2.264E-06 -2.866E-06 -1.1348 2.0672
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=6.002, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.002, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-583.305E-09 -1.363E-06 -2.588E-06 2.004E-06 428.561E-09 0.9634 0.0124 -825.796E-09 -1.052E-06 -1.266E-06
Skew Kurtosis
-1.636E-06 -1.983E-06 -0.6680 0.1701
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=6.002, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.002, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-1.016E-06 -1.968E-06 -4.099E-06 3.082E-06 532.021E-09 0.9348 0.0005 -1.471E-06 -1.625E-06 -1.873E-06
Skew Kurtosis
-2.225E-06 -2.645E-06 -1.1645 2.6857
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=6.003, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.003, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-549.409E-09 -1.332E-06 -2.812E-06 2.262E-06 436.240E-09 0.9602 0.0075 -851.367E-09 -1.040E-06 -1.227E-06
Skew Kurtosis
-1.585E-06 -1.877E-06 -0.8066 0.7984
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=6.003, Test.Name=TX ILPU VIN=0
Section
Test.Number=6.003, Test.Name=TX ILPU VIN=0
Statistics:
Mean Range StdDev WpValue Median
-910.568E-09 -3.678E-06 -15.749E-06 14.839E-06 3.522E-06 0.6841 0.0000 -1.443E-06 -1.630E-06 -2.005E-06
Skew Kurtosis
-5.088E-06 -8.106E-06 -2.0792 3.7888
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.000, Test.Name=RX V=0V
Section
Test.Number=7.000, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
32.307E-09 -70.786E-09 -645.852E-09 678.159E-09 147.649E-09 0.6271 0.0000 13.501E-09 8.380E-09 -3.463E-09
Skew Kurtosis
-64.424E-09 -290.989E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.1965 4.1683
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.000, Test.Name=RX V=0V
Section
Test.Number=7.000, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
-77.513E-09 -185.684E-09 -583.481E-09 505.969E-09 114.149E-09 0.6336 0.0000 -116.636E-09 -130.194E-09 -141.872E-09
Skew Kurtosis
-174.220E-09 -413.351E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.1591 3.6188
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.001, Test.Name=RX V=0V
Section
Test.Number=7.001, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
38.794E-09 -46.821E-09 -542.546E-09 581.340E-09 108.773E-09 0.6485 0.0000 18.509E-09 13.540E-09 -4.384E-09
Skew Kurtosis
-31.927E-09 -231.019E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.2441 5.0720
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.001, Test.Name=RX V=0V
Section
Test.Number=7.001, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
-51.725E-09 -176.443E-09 -867.012E-09 815.288E-09 182.237E-09 0.6817 0.0000 -62.739E-09 -68.155E-09 -81.381E-09
Skew Kurtosis
-258.804E-09 -437.334E-09 >4.0000 >4.0000 >4.0000 >4.0000 -1.9596 3.6445
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.002, Test.Name=RX V=0V
Section
Test.Number=7.002, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
296.995E-09 -33.235E-09 -646.456E-09 943.451E-09 108.561E-09 0.6325 0.0000 19.392E-09 15.235E-09 -3.721E-09
Skew Kurtosis
-23.892E-09 -143.190E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.7678 13.2961
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.002, Test.Name=RX V=0V
Section
Test.Number=7.002, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
-22.107E-09 -120.301E-09 -887.202E-09 865.095E-09 148.803E-09 0.6543 0.0000 -29.582E-09 -34.665E-09 -42.919E-09
Skew Kurtosis
-172.526E-09 -352.268E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.4384 8.0348
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.003, Test.Name=RX V=0V
Section
Test.Number=7.003, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
23.557E-09 -26.587E-09 -410.946E-09 434.503E-09 76.492E-09 0.6361 0.0000 21.163E-09 17.516E-09 -38.528E-12
Skew Kurtosis
-25.735E-09 -132.871E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.7719 8.7666
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.003, Test.Name=RX V=0V
Section
Test.Number=7.003, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
-50.469E-09 -593.963E-09 -3.959E-06 3.909E-06 949.883E-09 0.6283 0.0000 -64.212E-09 -71.507E-09 -81.897E-09
Skew Kurtosis
-888.157E-09 -2.106E-06 3.5092 3.3008 3.7176 3.3008 -2.0021 3.2508
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.004, Test.Name=RX V=0V
Section
Test.Number=7.004, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
47.060E-09 -17.883E-09 -264.611E-09 311.671E-09 47.242E-09 0.7341 0.0000 17.740E-09 14.793E-09 -9.433E-09
Skew Kurtosis
-26.619E-09 -61.551E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.7209 9.9974
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.004, Test.Name=RX V=0V
Section
Test.Number=7.004, Test.Name=RX V=0V
Statistics:
Mean Range StdDev WpValue Median
-14.147E-09 -67.827E-09 -332.153E-09 318.006E-09 54.565E-09 0.7742 0.0000 -23.911E-09 -33.855E-09 -44.722E-09
Skew Kurtosis
-85.140E-09 -150.860E-09 >4.0000 >4.0000 >4.0000 >4.0000 -2.1205 6.1287
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.005, Test.Name=RX V=VCC
Section
Test.Number=7.005, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
943.726E-09 89.091E-09 -18.419E-09 962.145E-09 153.265E-09 0.6480 0.0000 311.258E-09 133.345E-09 17.739E-09
Skew Kurtosis
6.263E-09 -6.486E-09 >4.0000 >4.0000 >4.0000 >4.0000 2.7311 10.3196
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.005, Test.Name=RX V=VCC
Section
Test.Number=7.005, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
1.624E-06 604.929E-09 285.296E-09 1.339E-06 254.249E-09 0.7352 0.0000 939.558E-09 625.157E-09 528.374E-09
Skew Kurtosis
492.456E-09 389.927E-09 >4.0000 >4.0000 >4.0000 >4.0000 2.1901 5.0188
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.006, Test.Name=RX V=VCC
Section
Test.Number=7.006, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
1.342E-06 210.472E-09 -5.529E-09 1.348E-06 339.773E-09 0.6568 0.0000 740.204E-09 364.864E-09 22.525E-09
Skew Kurtosis
13.114E-09 5.230E-09 >4.0000 >4.0000 >4.0000 >4.0000 1.6160 1.5438
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.006, Test.Name=RX V=VCC
Section
Test.Number=7.006, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
2.372E-06 546.461E-09 228.711E-09 2.143E-06 507.678E-09 0.6554 0.0000 1.389E-06 716.044E-09 265.221E-09
Skew Kurtosis
251.552E-09 249.674E-09 >4.0000 >4.0000 >4.0000 >4.0000 1.7995 2.4522
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.007, Test.Name=RX V=VCC
Section
Test.Number=7.007, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
7.066E-06 384.992E-09 -15.918E-09 7.082E-06 984.587E-09 0.4424 0.0000 1.410E-06 176.752E-09 23.667E-09
Skew Kurtosis
10.830E-09 -5.455E-09 3.3855 3.5159 3.2552 3.2552 4.4007 24.5838
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.007, Test.Name=RX V=VCC
Section
Test.Number=7.007, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
2.028E-06 507.057E-09 192.236E-09 1.836E-06 480.390E-09 0.6770 0.0000 1.265E-06 627.182E-09 228.083E-09
Skew Kurtosis
217.030E-09 210.437E-09 >4.0000 >4.0000 >4.0000 >4.0000 1.6217 1.5578
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.008, Test.Name=RX V=VCC
Section
Test.Number=7.008, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
811.614E-09 67.012E-09 -12.749E-09 824.363E-09 118.495E-09 0.5784 0.0000 194.756E-09 69.245E-09 26.764E-09
Skew Kurtosis
13.925E-09 -3.463E-09 >4.0000 >4.0000 >4.0000 >4.0000 3.6509 17.7034
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.008, Test.Name=RX V=VCC
Section
Test.Number=7.008, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
9.855E-06 1.894E-06 334.000E-09 9.521E-06 2.639E-06 0.6478 0.0000 6.204E-06 3.216E-06 373.976E-09
Skew Kurtosis
355.960E-09 344.244E-09 1.2631 1.5023 1.0239 1.0239 1.8015 2.3047
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=7.009, Test.Name=RX V=VCC
Section
Test.Number=7.009, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
949.900E-09 81.921E-09 -11.128E-09 961.028E-09 153.635E-09 0.5573 0.0000 270.216E-09 80.884E-09 24.663E-09
Skew Kurtosis
14.129E-09 -2.950E-09 >4.0000 >4.0000 >4.0000 >4.0000 3.2486 12.5296
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=7.009, Test.Name=RX V=VCC
Section
Test.Number=7.009, Test.Name=RX V=VCC
Statistics:
Mean Range StdDev WpValue Median
1.682E-06 537.277E-09 330.097E-09 1.352E-06 285.013E-09 0.6226 0.0000 1.012E-06 527.418E-09 407.574E-09
Skew Kurtosis
388.601E-09 379.574E-09 >4.0000 >4.0000 >4.0000 >4.0000 2.1640 4.1921
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
10.000E-06 -10.000E-06 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=8.000, Test.Name=TX1 VCC=0 V=+2V
Section
Test.Number=8.000, Test.Name=TX1 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
1.609E06 528.219E03 294.444E03 1.315E06 232.946E03 0.7791 0.0000 857.563E03 592.370E03 467.059E03
Skew Kurtosis
363.550E03 331.417E03 0.7554 0.7554 2.1471 5.7225
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.000, Test.Name=TX1 VCC=0 V=+2V
Section
Test.Number=8.000, Test.Name=TX1 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
42.899E06 4.476E06 489.933E03 42.409E06 8.248E06 0.4505 0.0000 8.656E06 4.110E06 1.688E06
Skew Kurtosis
945.027E03 783.972E03 0.1809 0.1809 3.9679 16.2061
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=8.003, Test.Name=TX2 VCC=0 V=+2V
Section
Test.Number=8.003, Test.Name=TX2 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
2.819E06 612.679E03 188.637E03 2.630E06 501.391E03 0.6723 0.0000 1.103E06 703.498E03 408.855E03
Skew Kurtosis
331.417E03 292.789E03 0.4071 0.4071 2.6126 7.8191
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.003, Test.Name=TX2 VCC=0 V=+2V
Section
Test.Number=8.003, Test.Name=TX2 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
18.932E06 2.535E06 120.663E03 18.811E06 3.918E06 0.5618 0.0000 4.677E06 2.527E06 1.026E06
Skew Kurtosis
616.497E03 321.769E03 0.2157 0.2157 3.0824 9.6392
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=8.004, Test.Name=TX3 VCC=0 V=+2V
Section
Test.Number=8.004, Test.Name=TX3 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
2.818E06 546.671E03 64.484E03 2.754E06 427.474E03 0.6158 0.0000 857.554E03 620.381E03 408.855E03
Skew Kurtosis
349.046E03 301.008E03 0.4260 0.4260 3.4070 13.7639
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.004, Test.Name=TX3 VCC=0 V=+2V
Section
Test.Number=8.004, Test.Name=TX3 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
18.932E06 3.260E06 162.490E03 18.769E06 4.146E06 0.6496 0.0000 10.050E06 4.109E06 1.413E06
Skew Kurtosis
863.848E03 781.718E03 0.2621 0.2621 2.2223 4.7285
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=8.007, Test.Name=TX4 VCC=0 V=+2V
Section
Test.Number=8.007, Test.Name=TX4 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
2.132E06 523.320E03 216.666E03 1.915E06 316.730E03 0.7724 0.0000 1.017E06 635.397E03 408.850E03
Skew Kurtosis
311.736E03 262.102E03 0.5504 0.5504 2.2933 7.5084
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=8.007, Test.Name=TX4 VCC=0 V=+2V
Section
Test.Number=8.007, Test.Name=TX4 VCC=0 V=+2V
Statistics: (OHMS)
Mean Range StdDev WpValue Median
42.899E06 4.240E06 101.136E03 42.797E06 8.742E06 0.4597 0.0000 13.159E06 2.504E06 1.410E06
Skew Kurtosis
590.025E03 385.763E03 0.1617 0.1617 3.5502 12.8826
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
300.000 100.00
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.000, Test.Name=T1 TPHL
Section
Test.Number=9.000, Test.Name=T1 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.720E-06 1.332E-06 1.020E-06 700.000E-09 218.168E-09 0.8995 0.0000 1.610E-06 1.570E-06 1.310E-06
Skew Kurtosis
1.090E-06 1.060E-06 0.1184 -1.4277
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.000, Test.Name=T1 TPHL
Section
Test.Number=9.000, Test.Name=T1 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.260E-06 1.154E-06 979.999E-09 280.000E-09 91.329E-09 0.8569 0.0000 1.250E-06 1.230E-06 1.190E-06
Skew Kurtosis
1.055E-06 1.015E-06 -0.6035 -1.2163
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.001, Test.Name=T2 TPHL
Section
Test.Number=9.001, Test.Name=T2 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.730E-06 1.338E-06 999.999E-09 730.000E-09 219.046E-09 0.9111 0.0000 1.620E-06 1.560E-06 1.340E-06
Skew Kurtosis
1.100E-06 1.070E-06 0.0749 -1.3875
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.001, Test.Name=T2 TPHL
Section
Test.Number=9.001, Test.Name=T2 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.270E-06 1.160E-06 979.999E-09 290.000E-09 91.934E-09 0.8556 0.0000 1.260E-06 1.235E-06 1.200E-06
Skew Kurtosis
1.065E-06 1.020E-06 -0.5841 -1.2627
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.002, Test.Name=T3 TPHL
Section
Test.Number=9.002, Test.Name=T3 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.700E-06 1.320E-06 989.999E-09 710.000E-09 218.413E-09 0.9212 0.0000 1.600E-06 1.550E-06 1.315E-06
Skew Kurtosis
1.090E-06 1.050E-06 0.1136 -1.3444
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.002, Test.Name=T3 TPHL
Section
Test.Number=9.002, Test.Name=T3 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.300E-06 1.160E-06 979.999E-09 320.000E-09 92.415E-09 0.8596 0.0000 1.250E-06 1.230E-06 1.205E-06
Skew Kurtosis
1.075E-06 1.020E-06 -0.6072 -1.1938
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.003, Test.Name=T4 TPHL
Section
Test.Number=9.003, Test.Name=T4 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.700E-06 1.338E-06 989.999E-09 710.000E-09 221.791E-09 0.9000 0.0000 1.635E-06 1.580E-06 1.310E-06
Skew Kurtosis
1.100E-06 1.070E-06 0.1533 -1.4127
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.003, Test.Name=T4 TPHL
Section
Test.Number=9.003, Test.Name=T4 TPHL
Statistics:
Mean Range StdDev WpValue Median
1.280E-06 1.160E-06 979.999E-09 300.000E-09 92.195E-09 0.8771 0.0000 1.260E-06 1.230E-06 1.200E-06
Skew Kurtosis
1.075E-06 1.020E-06 -0.5656 -1.1974
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.004, Test.Name=T4 TPLH
Section
Test.Number=9.004, Test.Name=T4 TPLH
Statistics:
Mean Range StdDev WpValue Median
1.490E-06 1.086E-06 769.999E-09 719.999E-09 237.207E-09 0.8848 0.0000 1.405E-06 1.350E-06 1.060E-06
Skew Kurtosis
829.999E-09 799.999E-09 0.1848 -1.3933
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.004, Test.Name=T4 TPLH
Section
Test.Number=9.004, Test.Name=T4 TPLH
Statistics:
Mean Range StdDev WpValue Median
1.150E-06 1.016E-06 819.999E-09 329.999E-09 108.100E-09 0.8159 0.0000 1.120E-06 1.100E-06 1.080E-06
Skew Kurtosis
889.999E-09 849.999E-09 -0.6176 -1.3507
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.005, Test.Name=T4 SKEW
Section
Test.Number=9.005, Test.Name=T4 SKEW
Statistics:
Mean Range StdDev WpValue Median
380.000E-09 251.777E-09 100.000E-09 280.000E-09 57.408E-09 0.9759 0.0927 319.999E-09 290.000E-09 255.000E-09
Skew Kurtosis
220.000E-09 170.000E-09 -0.4166 0.1725
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.005, Test.Name=T4 SKEW
Section
Test.Number=9.005, Test.Name=T4 SKEW
Statistics:
Mean Range StdDev WpValue Median
239.999E-09 144.250E-09 59.999E-09 180.000E-09 40.214E-09 0.9741 0.1044 190.000E-09 170.000E-09 145.000E-09
Skew Kurtosis
120.000E-09 85.000E-09 -0.2597 -0.4174
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.006, Test.Name=T4 TPLH+TPHL
Section
Test.Number=9.006, Test.Name=T4 TPLH+TPHL
Statistics:
Mean Range StdDev WpValue Median
3.120E-06 2.424E-06 1.810E-06 1.310E-06 455.654E-09 0.8644 0.0000 3.020E-06 2.960E-06 2.375E-06
Skew Kurtosis
1.910E-06 1.860E-06 0.1504 -1.4648
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.006, Test.Name=T4 TPLH+TPHL
Section
Test.Number=9.006, Test.Name=T4 TPLH+TPHL
Statistics:
Mean Range StdDev WpValue Median
2.400E-06 2.175E-06 1.810E-06 589.999E-09 196.860E-09 0.8028 0.0000 2.355E-06 2.330E-06 2.280E-06
Skew Kurtosis
1.965E-06 1.870E-06 -0.6349 -1.3591
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.007, Test.Name=T3 TPLH
Section
Test.Number=9.007, Test.Name=T3 TPLH
Statistics:
Mean Range StdDev WpValue Median
1.490E-06 1.076E-06 769.999E-09 719.999E-09 238.087E-09 0.8825 0.0000 1.405E-06 1.340E-06 1.045E-06
Skew Kurtosis
819.999E-09 779.999E-09 0.2014 -1.4161
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.007, Test.Name=T3 TPLH
Section
Test.Number=9.007, Test.Name=T3 TPLH
Statistics:
Mean Range StdDev WpValue Median
1.150E-06 1.017E-06 829.999E-09 319.999E-09 103.064E-09 0.8412 0.0000 1.130E-06 1.090E-06 1.070E-06
Skew Kurtosis
899.999E-09 859.999E-09 -0.5754 -1.3041
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
213L2475C: SYN440 213L2475R: SYN440
SP230E SP230E
HillView HillView
10-MAR2036 05-MAR2036
SP213ECH. SP213ECH.
Data: Data
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.5V Test alltempHistogram: Test.Number=9.008, Test.Name=T3 SKEW
Section
Test.Number=9.008, Test.Name=T3 SKEW
Statistics:
Mean Range StdDev WpValue Median
380.000E-09 244.444E-09 100.000E-09 280.000E-09 64.653E-09 0.9828 0.2801 320.000E-09 290.000E-09 249.999E-09
Skew Kurtosis
200.001E-09 145.000E-09 -0.2320 -0.3777
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
24634C45C: SYN1035 SP213
07-APR2006
SP213ECH0 1.AT
Conditions
Temp
-40C Data: Data
4.5V
Stat limits applied
StatHigh StatLow PctWithinStat PctDefStat NWithinStat NOutsideStat
Plot limits applied
NOutsidePlot
Report generated
Vcc=4.75V Test alltempHistogram: Test.Number=9.008, Test.Name=T3 SKEW
Section
Test.Number=9.008, Test.Name=T3 SKEW
Statistics:
Mean Range StdDev WpValue Median
240.000E-09 143.375E-09 40.000E-09 200.001E-09 36.697E-09 0.9905 0.8256 190.000E-09 170.000E-09 149.999E-09
Skew Kurtosis
120.000E-09 95.000E-09 -0.1664 0.3075
SpecHigh SpecLow PctWithinSpe PctDefSpec NWithinSpec NOutsideSpec
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
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