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AF01N60C 0.3A 600V N-Channel Power Field Effect Transistor designed hi
Top Searches for this datasheetPreliminary Datasheet 600V N-CHANNEL MOSFET General Description AF01N60C 0.3A 600V N-Channel Power Field Effect Transistor designed high voltage switching applications. AF01N60C available TO-92 package. AF01N60C Features 0.3A, 600V, RDS(on)=12 Typical Gate Charge 4.4nC Typical CRSS: 2.8pF Typical Fast Switching Junction Operating Temperature Range: -55oC 150oC Applications Switching Mode Power Supply (SMPS) High Voltage Power Supply High Speed Power Switching Inverter TO-92 TO-92 Ammo packing Figure Package Types AF01N60C Configuration Package (TO-92) SOURCE DRAIN GATE Figure Configuration AF01N60C (Top View) Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Functional Block Diagram DRAIN AF01N60C GATE SOURCE Figure Functional Block Diagram AF01N60C Ordering Information AF01N60C Circuit Type Package TO-92 Lead Free Ammo Blank: Bulk Package Junction Operating Temperature Range Part Number Lead Free Marking Lead Free Packing Type TO-92 -55oC AF01N60CZ-E1 AF01N60CZTR-E1 AF01N60CZ-E1 AF01N60CZ-E1 Bulk Ammo listed part numbers used during transition lead-free products. After transition completed, lead-free products will considered "standard" will resume original part numbers. Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Absolute Maximum Ratings (Note Parameter Drain-to-Source Voltage Continuous Drain Current Pulsed Drain Current (Note Gate Source Voltage Single Pulsed Avalanche Energy (Note Avalanche Current (Note2) Repetitive Avalanche Energy (Note Peak Diode Recovery dv/dt (Note Power Dissipation TA=25oC Power Dissipation TL=25oC Power Dissipation Derating above 25oC Operating Storage Temperature Range Maximum Lead Temperature Soldering Purposes, 1/8" from case 5-seconds ,TSTG TC=25oC TC=100oC VGSS dv/dt Symbol VDSS 0.18 Value Unit AF01N60C V/ns W/oC 0.02 Note Stresses greater than those listed under "Absolute Maximum Ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "Recommended Operating Conditions" implied. Exposure "Absolute Maximum Ratings" extended periods affect device reliability. Note Repetitive Rating: Pulse width limited maximum junction temperature Note L=59mH, IAS=1.1A, VDD=50V, RG=25, Starting TJ=25oC. Note 0.3A, di/dt 200A/s, BVDSS, Starting TJ=25oC. Thermal Characteristics Parameter Thermal Resistance, Junction-to-Lead (Note Thermal Resistance, Junction-to-Ambient (Note Symbol Unit oC/W Note Reference point drain lead. When mounted 3"x4.5" FR-4 without copper still environment. (RJA junction-to-case case-to-ambient thermal resistance. determined user's board design) Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Electrical Characteristics (TC= 25oC, unless otherwise specified.) Parameter On/Off Characteristics Drain-to-Source Breakdown Voltage Zero Gate Voltage Drain Current Gate-to-Body Forward Leakage Gate-to-Body Reverse Leakage Gate Threshold Voltage Static Drain-to-Source On-Resistance Dynamic Characteristics Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain Charge Turn-on Delay Time Turn-on Rise Time Turn-off Delay Time Turn-off Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Effective (Note Output Capacitance tD(on) tD(off) CISS COSS CRSS COSS eff. VGS=0V, VDS=0V 480V VDS=25V, VGS=0V, f=1MHz VDD=300V, ID=1.1A, RG=25 (Note VDS=40V, ID=0.3A (Note VDS=480V, ID=1.1A, VGS=10V, (Note 0.52 13.5 V(BR)DSS IDSS IGSSF IGSSR VGS(th) RDS(on) VGS=0V, ID=250A VDS=600V, VGS=0V VDS=480V, VGS=0V, TJ=125oC VGS=30V, VDS=0V VGS=-30V, VDS=0V VDS=VGS, ID=250A VGS=10V, ID=0.15A -100 Symbol Conditions Unit AF01N60C Source-to-Drain Diode Characteristics Continuous Source-to-Drain Current (Body Diode) Pulsed Source-to-Drain Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS=0V, IS=0.3A VGS=0V, IS=1.1A di/dt=100A/s (Note 0.53 Note COSS eff. constant effective capacitance that gives same charging time COSS while rising from VDSS Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Typical Performance Characteristics AF01N60C RDS(ON),() Drain-Source On-Resistance Drain Current TOP: Bottom: VGS=10V VGS=20V Notes: TJ=25 250s Pulse Test TC=25 10.0 15.0 20.0 25.0 30.0 200.0m 400.0m 600.0m 800.0m VDS, Drain-Source Voltage Drain Current Figure Typical Output Characteristics Figure On-Resistance Drain Current VGS, Gate-to-Source Voltage Capacitance (pF) VGS=0V, f=1MHz COSS=CGS+CGD CISS=CGS+CGD, Shorted CRSS=CGD ID=1.1A VDS=120V VDS=300V VDS=480V VDS, Drain Source Voltage Total Gate Charge (nC) Figure Typical Capacitance Drain-to-Source Voltage Figure Typical Gate Charge vs.Gate-to-Source Voltage Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Typical Performance Characteristics (Continued) AF01N60C BVDSS, (Normalized) Drain-Source Breakdown Voltage RDS(ON), (Normalized) Drain-Source On-Resistance Notes: VGS=0V ID=250A Notes: VGS=10V ID=0.15A -50.0 50.0 100.0 -100.0 -50.0 50.0 100.0 150.0 200.0 -100.0 150.0 200.0 Junction Temperature Junction Temperature Figure Normalized Breakdown Voltage Temperature Figure Normalized On-Resistance Temperature ISD, Reverse DrainCurrent TJ=25 Notes: VGS=0V 250s Pulse Test 200.0m 400.0m 600.0m 800.0m VSD, Source-to-Drain Voltage Figure Typical Source-Drain Diode Forward Voltage Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Typical Test Circuit Waveform AF01N60C 200nF Same Type 300nF Charge Figure Gate Charge Test Circuit Waveforms tD(on) tD(off) tOFF Figure Resistive Switching Test Circuit Waveforms BVDSS BVDSS BVDSS-VDD ID(t) VDS(t) Time Figure Unclamped Inductive Switching Test Circuit Waveforms Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Typical Test Circuit Waveforms (Continued) Driver Same Type dv/dt controlled controlled pulse period AF01N60C (Driver) Gate Pulse Width Gate Pulse Period IFM, Body Diode Forward Current (DUT) di/dt Body Diode Reverse Current (DUT) Body Diode Recovery dv/dt Body Diode Forward Voltage Drop Figure Peak Diode Recovery dv/dt Test Circuit Waveforms Mar. 2007 Rev. Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Mechanical Dimensions AF01N60C TO-92 Unit: 1.100(0.043) 1.400(0.055) 3.430(0.135) 0.360(0.014) 0.510(0.020) 3.300(0.130) 3.700(0.146) 0.000(0.000) 0.380(0.015) 1.600(0.063) 4.400(0.173) 4.700(0.185) 4.300(0.169) 4.700(0.185) 0.380(0.015) 0.550(0.022) 1.270(0.050) 2.440(0.096) 2.640(0.104) Mar. 2007 Rev. 14.100(0.555) 14.500(0.571) Semiconductor Manufacturing Limited Preliminary Datasheet 600V N-CHANNEL MOSFET Mechanical Dimensions TO-92 Ammo Packing Unit: mm(inch) AF01N60C 12.400(0.488) 13.000(0.512) ±1.000(0.039) 4.400(0.173) 4.600(0.181) ±1.000(0.039) 3.400(0.134) 3.600(0.142) 4.400(0.173) 4.600(0.181) 19.000(0.748) 21.000(0.827) 0.380(0.015) 0.550(0.022) 1.000 (0.039) 5.500(0.217) 6.500(0.256) 6.050(0.238) 6.650(0.262) 2.200(0.087) 2.800(0.110) 2.200(0.087) 2.800(0.110) 15.500(0.610) 16.500(0.650) 2.500(0.098) 8.500(0.335) 9.500(0.374) 3.550(0.140) 4.150(0.163) 3.800(0.150) 4.200(0.165) 17.500(0.689) 19.000(0.748) 12.500(0.492) 12.900(0.508) 0.150(0.006) 0.250(0.010) 0.350(0.014) 0.450(0.018) Mar. 2007 Rev. 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