SP485E Family Products SP1481E SP481E SP1485E SP485E SP1490E SP49
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Product Characterization
SP485E Family Products
SP1481E SP481E SP1485E SP485E SP1490E SP490E SP1491E SP491E
(Revision
Prepared Velvet Doung Greg West Date: 2006
SP485E Product Family Characterization Report
Table Contents
Section Introduction Characterization Procedure Data Summary Parameters Conclusions Data Histograms Page Appendix
Page 8/16/2006
SP485E Product Family Characterization Report
Introduction: This product family characterization done part qualification Sipex's fabrication site transfer from Sipex's Hillview Milpitas, contract foundry, Episil, Taiwan. This characterization report summarizes compares data SP485E product characteristics contains distributions parameters characterized Vcc's 4.75V, 5.0V, 5.25V temperatures -40C, both Hillview Episil Fabs. complete listing product numbers covered this characterization report included "Conclusion" section this report. Transfer Target Wafer Fab: Episil Transfer Target Location: Taiwan Transfer Target Process: Episil CMOS Transfer Target 1586 Assembly location: Carsem Characterization Procedure: number(s): A049 (Episil), A374 (Hillview) Temperatures: Ambient, 85C, -40C Tester: Test Program: SP485ECH01.AT
Page 8/16/2006
SP485E Product Family Characterization Report
Data Summary:
Parameter Data Summary Across Temperature
Parameter 1.000: 5.25V 2.002:VOD 54OHMS 4.75V 2.004:VOD 54OHMS 4.75V 3.005: Vcc@ 5.25 3.006: @5.25 7.000: 12V@ 5.25V 7.004: 5.25V 8.000: TPHL 4.75V 8.001: TPLH 4.75V 8.002: TPHL 4.75V 003: TPLH 4.75V 4.003: INPUT CURRENT V=2V 5.25V
Units
Hillview Distribution Mean
Hillview Distribution Variance
Hillview (across temp)
Episil Distribution Mean
Episil Distribution Variance
Episil (across temp)
934.497 1.925 1.931 30.725 -28.125 0.783 -100.545 21.318 18.014 19.278 19.701 -14.678
28.673 594.467E 216.939E 3.662 2.808 .03996 14.702 2.980 1.854 1.957 2.835E 0.0199
>4.0000
951.881
89.684 199.861E
2.0372 0.5972 0.6092 2.2043 3.7440 >4.0000 >4.0000 2.4684 3.6869 3.3840 2.5363 >4.0000
0.5765 0.5852 2.1594 >4.0000 >4.0000 3.2752 2.3848 3.2386 3.2829 2.3164 >4.00
1.908 1.915 33.773 -31.491 0.722 -117.648 18.982 15.471 16.539 16.767 -15.253
199.925E 4.049 3.427 .0474 19.848 2.563 1.399 1.629 2.204 0.04008
Page 8/16/2006
SP485E Product Family Characterization Report
Conclusion: Characterization data over temperature range show datasheet parameters meet spec. Cpk's most parameters comparable between Hillview Episil although many show strong temperature dependence that tends produce lower Cpk's this analysis.
performance SP485 parts fabricated Episil comparable current SP485 parts uilt from Hillview fab. This characterization reports applies following SP485E family product part numbers:
SP1485ECN SP1485ECN-L SP1485ECP SP1485ECP-L SP1485EEN SP1485EEN-L SP1485EEP SP1485EEP-L SP1485EMN SP1485EMN-L SP485ECN SP485ECN-L SP485ECP SP485ECP-L SP485EEN SP485EEN-L SP485EEP SP485EEP-L SP485EMN SP485EMN-L SP1481ECN SP1481ECN-L SP1481ECP
SP1481ECP-L SP1481EEN SP1481EEN-L SP1481EEP SP1481EEP-L SP481ECN SP481ECN-L SP481ECP SP481ECP-L SP481EEN SP481EEN-L SP481EEP SP481EEP-L SP1490ECN SP1490ECN-L SP1490ECP SP1490ECP-L SP1490EEN SP1490EEN-L SP1490EEP SP1490EEP-L SP1491ECN
SP1491ECN-L SP1491ECP SP1491ECP-L SP1491EEN SP1491EEN-L SP1491EEP SP1491EEP-L SP490ECN SP490ECN-L SP490ECP SP490ECP-L SP490EEN SP490EEN-L SP490EEP SP490EEP-L SP491ECN SP491ECN-L SP491ECP SP491ECP-L SP491EEN SP491EEN-L SP491EEP SP491EEP-L
Page 8/16/2006
Vcc=4.5V test tempHistogramHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 03:30
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
697.388E-06 699.329E-06 21.407E-06 >4.0000 >4.0000 21.407E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
739.425E-06 620.025E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 05:31
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
830.744E-06 843.290E-06 781.356E-06 719.422E-06 742.199E-06 88.545E-06 20.645E-06 796.092E-06 779.938E-06 768.117E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 03:30
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
500.000E-06 501.186E-06 12.049E-06 >4.0000 >4.0000 12.049E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
524.159E-06 457.342E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 05:31
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
600.736E-06 608.545E-06 568.479E-06 528.413E-06 542.163E-06 58.573E-06 13.355E-06 578.093E-06 567.635E-06 559.485E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 03:30
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
261.641E-06 262.903E-06 12.762E-06 >4.0000 >4.0000 12.762E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
283.136E-06 224.634E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 05:31
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
302.583E-06 305.648E-06 286.345E-06 267.043E-06 272.623E-06 29.959E-06 6.434E-06 290.722E-06 286.289E-06 281.332E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 03:30
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
261.836E-06 263.235E-06 12.935E-06 >4.0000 >4.0000 12.935E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
284.162E-06 224.703E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 05:31
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
302.276E-06 305.546E-06 286.314E-06 267.081E-06 272.895E-06 29.381E-06 6.411E-06 290.509E-06 286.313E-06 281.106E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 03:30
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean Median StdDev StdDev
-4.490 -4.490 2.085E-03 >4.0000 >4.0000 2.085E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-4.478 -4.492 -1.550 -5.100
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 05:31
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-4.737 -4.735 -4.740 -4.745 -4.742 5.562E-03 1.582E-03 -4.738 -4.740 -4.742
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 -1.550 -5.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 03:30
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean Median StdDev StdDev
4.491 4.491 998.514E-06 >4.0000 >4.0000 998.514E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.492 4.489 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 05:31
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.742 4.744 4.739 4.735 4.737 5.181E-03 1.520E-03 4.741 4.739 4.738
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 5.500 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 03:30
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean Median StdDev StdDev
1.908 1.899 199.861E-03 0.5972 2.9604 199.861E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.192 1.656 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 05:31
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.238 2.576 1.925 1.274 1.643 594.467E-03 216.875E-03 2.188 1.913 1.680
StatHigh SpecHigh SpecLow StatLow
2.7282 0.5765 >4.0000 0.5765 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 03:30
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean Median StdDev StdDev
1.915 1.907 199.925E-03 0.6092 2.9594 199.925E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.195 1.664 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Section
2006, 05:31
Test.Number=2.004, Test.Name=VOD IN=L 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.244 2.582 1.931 1.280 1.649 594.583E-03 216.939E-03 2.192 1.919 1.686
StatHigh SpecHigh SpecLow StatLow
2.7273 0.5852 >4.0000 0.5852 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 03:30
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean Median StdDev StdDev
2.205 2.197 18.958E-03 >4.0000 18.958E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.237 2.179 3.000
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=2.005, Test.Name=VOS IN=L
Section
2006, 05:31
Test.Number=2.005, Test.Name=VOS IN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.347 2.364 2.307 2.250 2.249 97.801E-03 18.986E-03 2.324 2.303 2.294
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 3.000
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=2.006, Test.Name=VOD BALANCE
Section
2006, 03:30
Test.Number=2.006, Test.Name=VOD BALANCE
Statistics:
Mean Median StdDev StdDev
9.503E-03 9.509E-03 5.658E-03 >4.0000 >4.0000 5.658E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
21.077E-03 -2.186E-03 195.000E-03 -1.195
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=2.006, Test.Name=VOD BALANCE
Section
2006, 05:31
Test.Number=2.006, Test.Name=VOD BALANCE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
16.194E-03 20.088E-03 8.698E-03 -2.693E-03 -3.602E-03 19.796E-03 3.797E-03 11.109E-03 8.928E-03 6.477E-03
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 195.000E-03 -1.195
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Section
2006, 03:30
Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Statistics:
Mean Median StdDev StdDev
4.497 4.498 550.914E-06 >4.0000 >4.0000 550.914E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.498 4.496 5.000 3.500
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Section
2006, 05:31
Test.Number=3.000, Test.Name=VOUT FAIL SAFE
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.749 4.750 4.748 4.746 4.747 2.212E-03 667.463E-06 4.749 4.748 4.748
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 5.500 3.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Section
2006, 03:30
Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Statistics:
Mean Median StdDev StdDev
101.796E-09 40.192E-09 203.028E-09 >4.0000 >4.0000 203.028E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
978.980E-09 15.018E-09 950.000E-03 -950.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Section
2006, 05:31
Test.Number=3.001, Test.Name=IO ^RE=5V V=2.4V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
121.043E-09 126.683E-09 110.439E-09 94.195E-09 99.244E-09 21.799E-09 5.415E-09 114.509E-09 110.507E-09 106.564E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 950.000E-03 -950.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Section
2006, 03:30
Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Statistics:
Mean Median StdDev StdDev
26.511E-09 24.255E-09 13.270E-09 >4.0000 >4.0000 13.270E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
93.762E-09 9.275E-09 950.000E-03 -950.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Section
2006, 05:31
Test.Number=3.002, Test.Name=IO ^RE=5V V=0.4V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
28.414E-09 30.753E-09 12.919E-09 -4.915E-09 1.893E-09 26.521E-09 5.945E-09 17.216E-09 13.260E-09 8.275E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 950.000E-03 -950.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.003, Test.Name=RX -4MA
Section
2006, 03:30
Test.Number=3.003, Test.Name=RX -4MA
Statistics:
Mean Median StdDev StdDev
4.256 4.258 45.337E-03 >4.0000 >4.0000 45.337E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.319 4.185 5.400 3.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.003, Test.Name=RX -4MA
Section
2006, 05:31
Test.Number=3.003, Test.Name=RX -4MA
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.552 4.638 4.476 4.315 4.390 162.314E-03 53.762E-03 4.536 4.479 4.419
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 5.400 3.550
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.004, Test.Name=RX
Section
2006, 03:30
Test.Number=3.004, Test.Name=RX
Statistics:
Mean Median StdDev StdDev
188.340E-03 183.751E-03 42.180E-03 1.4884 1.5608 42.180E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
259.803E-03 132.547E-03 395.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.004, Test.Name=RX
Section
2006, 05:31
Test.Number=3.004, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
266.872E-03 340.818E-03 202.457E-03 64.095E-03 142.173E-03 124.699E-03 46.120E-03 258.183E-03 198.254E-03 150.366E-03
StatHigh SpecHigh SpecLow StatLow
1.4274 1.4632 1.3916 1.3916 395.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.005, Test.Name=RX
Section
2006, 03:30
Test.Number=3.005, Test.Name=RX
Statistics:
Mean Median StdDev StdDev
26.659E-03 26.719E-03 2.958E-03 2.2150 >4.0000 2.958E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
30.872E-03 22.700E-03 95.000E-03 7.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.005, Test.Name=RX
Section
2006, 05:31
Test.Number=3.005, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
31.068E-03 36.539E-03 26.316E-03 16.093E-03 21.769E-03 9.299E-03 3.408E-03 30.289E-03 26.309E-03 22.331E-03
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.8895 >4.0000 1.8895 95.000E-03 7.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=3.006, Test.Name=RX
Section
2006, 03:30
Test.Number=3.006, Test.Name=RX
Statistics:
Mean Median StdDev StdDev
-24.705E-03 -24.639E-03 2.273E-03 >4.0000 >4.0000 2.273E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-21.582E-03 -28.103E-03 7.000E-03 -95.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=3.006, Test.Name=RX
Section
2006, 05:31
Test.Number=3.006, Test.Name=RX
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-19.876E-03 -16.325E-03 -24.081E-03 -31.837E-03 -28.112E-03 8.236E-03 2.585E-03 -21.412E-03 -23.984E-03 -26.934E-03
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 7.000E-03 -95.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.000, Test.Name=DI TRIP POINT
Section
2006, 03:30
Test.Number=4.000, Test.Name=DI TRIP POINT
Statistics:
Mean Median StdDev StdDev
1.434 1.425 92.680E-03 2.0341 2.1580 92.680E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.575 1.325 2.000 800.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.000, Test.Name=DI TRIP POINT
Section
2006, 05:31
Test.Number=4.000, Test.Name=DI TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.725 1.821 1.546 1.270 1.375 350.000E-03 91.766E-03 1.625 1.525 1.475
StatHigh SpecHigh SpecLow StatLow
2.1795 2.7082 1.6507 1.6507 2.000 800.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.001, Test.Name=^RE TRIP POINT
Section
2006, 03:30
Test.Number=4.001, Test.Name=^RE TRIP POINT
Statistics:
Mean Median StdDev StdDev
1.579 1.575 36.893E-03 3.8048 >4.0000 36.893E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.625 1.525 2.000 800.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.001, Test.Name=^RE TRIP POINT
Section
2006, 05:31
Test.Number=4.001, Test.Name=^RE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.775 1.800 1.681 1.562 1.575 200.000E-03 39.539E-03 1.725 1.675 1.675
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.6884 2.6884 2.000 800.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.002, Test.Name=DE TRIP POINT
Section
2006, 03:30
Test.Number=4.002, Test.Name=DE TRIP POINT
Statistics:
Mean Median StdDev StdDev
1.539 1.525 31.125E-03 >4.0000 >4.0000 31.125E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.575 1.475 2.000 800.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.002, Test.Name=DE TRIP POINT
Section
2006, 05:31
Test.Number=4.002, Test.Name=DE TRIP POINT
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
1.725 1.780 1.656 1.532 1.525 200.000E-03 41.447E-03 1.675 1.675 1.625
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.7657 2.7657 2.000 800.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Section
2006, 03:30
Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean Median StdDev StdDev
121.246E-09 -42.745E-09 438.380E-09 >4.0000 >4.0000 438.380E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.089E-06 -63.981E-09 9.000E-06 -9.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:31
Test.Number=4.003, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-1.781E-09 6.219E-09 -28.331E-09 -62.880E-09 -46.829E-09 45.048E-09 11.517E-09 -21.652E-09 -32.413E-09 -36.245E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 9.000E-06 -9.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Section
2006, 03:30
Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean Median StdDev StdDev
-99.664E-09 -105.191E-09 48.130E-09 >4.0000 >4.0000 48.130E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
240.343E-09 -148.170E-09 9.000E-06 -9.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:31
Test.Number=4.004, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -61.786E-09 -159.644E-09 -103.376E-09 StatHigh SpecHigh 91.941E-09 SpecLow 32.619E-09 -25.409E-09 StatLow
-11.435E-09 36.071E-09
>4.0000 >4.0000 >4.0000 >4.0000 9.000E-06 -9.000E-06
-78.395E-09 -90.089E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Section
2006, 03:30
Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean Median StdDev StdDev
-1.210E-06 -1.088E-06 491.805E-09 >4.0000 >4.0000 491.805E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-522.919E-09 -3.352E-06 9.000E-06 -9.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:31
Test.Number=4.005, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-846.232E-09 -676.577E-09
StatHigh -1.454E-06 607.954E-09 SpecHigh 133.538E-09 SpecLow -983.471E-09 StatLow
-1.077E-06 -1.478E-06
>4.0000 >4.0000 >4.0000 >4.0000 9.000E-06 -9.000E-06
-1.043E-06 -1.170E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Section
2006, 03:30
Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean Median StdDev StdDev
-1.050E-06 -966.345E-09 373.694E-09 >4.0000 >4.0000 373.694E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-444.062E-09 -2.482E-06 9.000E-06 -9.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:31
Test.Number=4.006, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-812.040E-09 -287.514E-09 -1.342E-06 -2.397E-06 -2.472E-06 1.660E-06 351.582E-09 -1.020E-06 -1.360E-06 -1.549E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 9.000E-06 -9.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Section
2006, 03:30
Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean Median StdDev StdDev
857.466E-09 667.986E-09 632.348E-09 >4.0000 >4.0000 632.348E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
3.548E-06 -334.374E-09 9.000E-06 -9.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Section
2006, 05:31
Test.Number=4.007, Test.Name=INPUT CURRENT V=2V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
864.659E-09 914.627E-09 712.840E-09 511.052E-09 556.950E-09 307.709E-09 67.263E-09 751.713E-09 722.605E-09 661.075E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 9.000E-06 -9.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Section
2006, 03:30
Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean Median StdDev StdDev
784.684E-09 620.635E-09 618.059E-09 >4.0000 >4.0000 618.059E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
3.349E-06 -629.927E-09 9.000E-06 -9.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Section
2006, 05:31
Test.Number=4.008, Test.Name=INPUT CURRENT V=.8V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
843.436E-09 882.146E-09 689.988E-09 497.829E-09 542.825E-09 300.611E-09 64.053E-09 726.217E-09 700.020E-09 638.944E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 9.000E-06 -9.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=5.000, Test.Name=IA V=-7V
Section
2006, 03:30
Test.Number=5.000, Test.Name=IA V=-7V
Statistics:
Mean Median StdDev StdDev
412.511E-06 413.224E-06 14.540E-06 >4.0000 >4.0000 14.540E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
439.581E-06 387.637E-06 950.000E-06 -950.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=5.000, Test.Name=IA V=-7V
Section
2006, 05:31
Test.Number=5.000, Test.Name=IA V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
492.362E-06 511.296E-06 455.681E-06 400.065E-06 420.425E-06 71.937E-06 18.538E-06 468.599E-06 456.700E-06 441.096E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 950.000E-06 -950.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=5.001, Test.Name=IA V=12V
Section
2006, 03:30
Test.Number=5.001, Test.Name=IA V=12V
Statistics:
Mean Median StdDev StdDev
680.590E-06 681.318E-06 24.395E-06 3.6812 >4.0000 24.395E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
723.036E-06 638.768E-06 950.000E-06 -950.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=5.001, Test.Name=IA V=12V
Section
2006, 05:31
Test.Number=5.001, Test.Name=IA V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
816.755E-06 848.841E-06 754.564E-06 660.288E-06 695.031E-06 121.724E-06 31.426E-06 776.729E-06 756.492E-06 730.001E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.0730 2.0730 950.000E-06 -950.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=5.002, Test.Name=RA
Section
2006, 03:30
Test.Number=5.002, Test.Name=RA
Statistics: (OHMS)
Mean Median StdDev StdDev
17.404E03 17.359E03 620.434 2.8762 >4.0000 620.434
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
18.511E03 16.342E03 30.000E03 12.050E03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=5.002, Test.Name=RA
Section
2006, 05:31
Test.Number=5.002, Test.Name=RA
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
17.033E03 17.673E03 15.726E03 13.778E03 14.514E03 2.520E03 649.138 16.226E03 15.661E03 15.266E03
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.8875 >4.0000 1.8875 30.000E03 12.050E03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=5.003, Test.Name=IB V=12V
Section
2006, 03:30
Test.Number=5.003, Test.Name=IB V=12V
Statistics:
Mean Median StdDev StdDev
685.055E-06 681.515E-06 30.332E-06 2.9116 >4.0000 30.332E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
760.392E-06 639.055E-06 950.000E-06 -950.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=5.003, Test.Name=IB V=12V
Section
2006, 05:31
Test.Number=5.003, Test.Name=IB V=12V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
817.782E-06 849.386E-06 754.641E-06 659.896E-06 696.051E-06 121.731E-06 31.582E-06 777.293E-06 755.575E-06 729.582E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 2.0619 2.0619 950.000E-06 -950.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=5.004, Test.Name=IB V=-7V
Section
2006, 03:30
Test.Number=5.004, Test.Name=IB V=-7V
Statistics:
Mean Median StdDev StdDev
399.932E-06 397.356E-06 18.686E-06 >4.0000 >4.0000 18.686E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
448.486E-06 372.235E-06 950.000E-06 -950.000E-06
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=5.004, Test.Name=IB V=-7V
Section
2006, 05:31
Test.Number=5.004, Test.Name=IB V=-7V
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
476.685E-06 495.371E-06 440.049E-06 384.727E-06 405.739E-06 70.946E-06 18.441E-06 453.218E-06 440.858E-06 425.106E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 950.000E-06 -950.000E-06
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=5.005, Test.Name=RB
Section
2006, 03:30
Test.Number=5.005, Test.Name=RB
Statistics: (OHMS)
Mean Median StdDev StdDev
17.546E03 17.611E03 776.157 2.3605 3.8545 776.157
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
18.788E03 15.717E03 30.000E03 12.050E03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=5.005, Test.Name=RB
Section
2006, 05:31
Test.Number=5.005, Test.Name=RB
Statistics: (OHMS)
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
17.241E03 17.932E03 15.931E03 13.931E03 14.678E03 2.563E03 666.865 16.455E03 15.881E03 15.441E03
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.9401 >4.0000 1.9401 30.000E03 12.050E03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.000, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.000, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
729.474E-06 728.503E-06 32.494E-06 >4.0000 >4.0000 32.494E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
813.191E-06 672.779E-06 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.000, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.000, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
865.880E-06 910.298E-06 781.869E-06 653.440E-06 702.826E-06 163.055E-06 42.810E-06 815.886E-06 773.430E-06 749.624E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.001, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.001, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
728.577E-06 722.955E-06 30.648E-06 >4.0000 >4.0000 30.648E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
808.430E-06 673.176E-06 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.001, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.001, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
846.834E-06 877.002E-06 773.277E-06 669.552E-06 708.754E-06 138.080E-06 34.575E-06 798.427E-06 772.835E-06 746.846E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.002, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.002, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
722.766E-06 722.765E-06 26.749E-06 >4.0000 >4.0000 26.749E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
770.736E-06 673.969E-06 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.002, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.002, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
847.231E-06 871.793E-06 772.488E-06 673.183E-06 702.428E-06 144.803E-06 33.102E-06 795.253E-06 771.446E-06 750.020E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.003, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.003, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
724.524E-06 722.772E-06 26.247E-06 >4.0000 >4.0000 26.247E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
772.721E-06 666.431E-06 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.003, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.003, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
851.596E-06 874.064E-06 772.792E-06 671.520E-06 709.174E-06 142.422E-06 33.757E-06 798.427E-06 771.050E-06 746.846E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.004, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.004, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-88.476E-03 -87.157E-03 12.241E-03 >4.0000 >4.0000 12.241E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-72.869E-03 -108.526E-03 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.004, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.004, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -84.290E-03 -122.096E-03 -105.253E-03 StatHigh SpecHigh 40.895E-03 SpecLow 12.602E-03 -71.216E-03 StatLow
-64.358E-03 -46.484E-03
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
-83.077E-03 -98.673E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.005, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.005, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-373.125E-06 -370.021E-06 21.766E-06 >4.0000 >4.0000 21.766E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-337.530E-06 -427.126E-06 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.005, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.005, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-393.366E-06 -372.548E-06 -433.795E-06 -495.042E-06 -480.591E-06 87.225E-06 20.416E-06 -416.378E-06 -435.226E-06 -448.495E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.006, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.006, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-88.726E-03 -87.504E-03 12.232E-03 >4.0000 >4.0000 12.232E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-72.801E-03 -108.886E-03 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.006, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.006, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -84.419E-03 -122.089E-03 -105.127E-03 StatHigh SpecHigh 40.497E-03 SpecLow 12.557E-03 -71.336E-03 StatLow
-64.631E-03 -46.749E-03
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
-83.343E-03 -98.752E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=7.007, Test.Name=ISC
Section
2006, 03:30
Test.Number=7.007, Test.Name=ISC
Statistics:
Mean Median StdDev StdDev
-384.729E-06 -383.511E-06 17.955E-06 >4.0000 >4.0000 17.955E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-348.625E-06 -427.950E-06 245.000E-03 -245.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=7.007, Test.Name=ISC
Section
2006, 05:31
Test.Number=7.007, Test.Name=ISC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-404.872E-06 -393.228E-06 -450.150E-06 -507.072E-06 -489.320E-06 84.448E-06 18.974E-06 -437.804E-06 -450.292E-06 -464.741E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 245.000E-03 -245.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.000, Test.Name=TPHL
Section
2006, 03:30
Test.Number=8.000, Test.Name=TPHL
Statistics:
Mean Median StdDev StdDev
18.982E-09 18.671E-09 2.563E-09 2.4684 3.7060 2.563E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
22.669E-09 15.417E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.000, Test.Name=TPHL
Section
2006, 05:31
Test.Number=8.000, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
26.790E-09 30.257E-09 21.318E-09 12.379E-09 17.477E-09 9.313E-09 2.980E-09 24.815E-09 20.487E-09 18.512E-09
StatHigh SpecHigh SpecLow StatLow
3.1882 2.3848 3.9916 2.3848 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.001, Test.Name=TPLH
Section
2006, 03:30
Test.Number=8.001, Test.Name=TPLH
Statistics:
Mean Median StdDev StdDev
15.471E-09 15.231E-09 1.399E-09 3.6869 >4.0000 1.399E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
17.742E-09 13.465E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.001, Test.Name=TPLH
Section
2006, 05:31
Test.Number=8.001, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
21.240E-09 23.576E-09 18.014E-09 12.452E-09 15.783E-09 5.456E-09 1.854E-09 20.299E-09 17.383E-09 16.442E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.2386 >4.0000 3.2386 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.002, Test.Name=TPHL
Section
2006, 03:30
Test.Number=8.002, Test.Name=TPHL
Statistics:
Mean Median StdDev StdDev
16.539E-09 16.440E-09 1.629E-09 3.3840 >4.0000 1.629E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
19.043E-09 14.023E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.002, Test.Name=TPHL
Section
2006, 05:31
Test.Number=8.002, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
22.463E-09 25.150E-09 19.278E-09 13.406E-09 16.818E-09 5.644E-09 1.957E-09 21.710E-09 18.559E-09 17.571E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.2829 >4.0000 3.2829 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.003, Test.Name=TPLH
Section
2006, 03:30
Test.Number=8.003, Test.Name=TPLH
Statistics:
Mean Median StdDev StdDev
16.767E-09 16.626E-09 2.204E-09 2.5363 >4.0000 2.204E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
19.973E-09 13.744E-09 57.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.003, Test.Name=TPLH
Section
2006, 05:31
Test.Number=8.003, Test.Name=TPLH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
24.815E-09 28.206E-09 19.701E-09 11.196E-09 15.783E-09 9.031E-09 2.835E-09 23.121E-09 19.029E-09 17.100E-09
StatHigh SpecHigh SpecLow StatLow
3.3509 2.3164 >4.0000 2.3164 57.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Section
2006, 03:30
Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Statistics:
Mean Median StdDev StdDev
1.870E-09 1.813E-09 889.965E-12 0.7003 1.8727 889.965E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
3.347E-09 557.858E-12 10.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Section
2006, 05:31
Test.Number=8.004, Test.Name=DRIVER SKEW TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.327E-09 5.012E-09 1.864E-09 -1.285E-09 188.146E-12 4.139E-09 1.049E-09 2.869E-09 1.787E-09 940.735E-12
StatHigh SpecHigh SpecLow StatLow
1.5881 0.5919 2.5842 0.5919 10.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.005, Test.Name=RISE TIME
Section
2006, 03:30
Test.Number=8.005, Test.Name=RISE TIME
Statistics:
Mean Median StdDev StdDev
6.886E-09 6.767E-09 388.572E-12 3.3339 >4.0000 388.572E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
7.696E-09 6.209E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.005, Test.Name=RISE TIME
Section
2006, 05:31
Test.Number=8.005, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
7.446E-09 7.586E-09 6.713E-09 5.841E-09 6.129E-09 1.317E-09 290.894E-12 6.881E-09 6.693E-09 6.505E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.006, Test.Name=FALL TIME
Section
2006, 03:30
Test.Number=8.006, Test.Name=FALL TIME
Statistics:
Mean Median StdDev StdDev
16.969E-09 20.992E-09 5.946E-09 0.7831 0.8970 5.946E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
22.015E-09 8.161E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.006, Test.Name=FALL TIME
Section
2006, 05:31
Test.Number=8.006, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
8.199E-09 8.386E-09 7.571E-09 6.756E-09 7.070E-09 1.129E-09 271.628E-12 7.822E-09 7.540E-09 7.352E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.007, Test.Name=FALL TIME
Section
2006, 03:30
Test.Number=8.007, Test.Name=FALL TIME
Statistics:
Mean Median StdDev StdDev
7.282E-09 7.231E-09 337.443E-12 >4.0000 >4.0000 337.443E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
7.975E-09 6.674E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.007, Test.Name=FALL TIME
Section
2006, 05:31
Test.Number=8.007, Test.Name=FALL TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
8.199E-09 8.323E-09 7.343E-09 6.364E-09 6.411E-09 1.787E-09 326.382E-12 7.540E-09 7.352E-09 7.164E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=8.008, Test.Name=RISE TIME
Section
2006, 03:30
Test.Number=8.008, Test.Name=RISE TIME
Statistics:
Mean Median StdDev StdDev
6.389E-09 6.395E-09 261.258E-12 >4.0000 >4.0000 261.258E-12
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
6.953E-09 5.744E-09 35.000E-09 3.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=8.008, Test.Name=RISE TIME
Section
2006, 05:31
Test.Number=8.008, Test.Name=RISE TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
7.164E-09 7.399E-09 6.470E-09 5.540E-09 5.847E-09 1.317E-09 309.793E-12 6.693E-09 6.411E-09 6.223E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 3.7333 >4.0000 3.7333 35.000E-09 3.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=9.001, Test.Name=TPHL
Section
2006, 03:30
Test.Number=9.001, Test.Name=TPHL
Statistics:
Mean Median StdDev StdDev
39.907E-09 38.405E-09 5.837E-09 2.2790 2.8554 5.837E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
50.659E-09 31.928E-09 100.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=9.001, Test.Name=TPHL
Section
2006, 05:31
Test.Number=9.001, Test.Name=TPHL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
48.755E-09 58.200E-09 38.680E-09 19.160E-09 29.254E-09 19.501E-09 6.507E-09 45.741E-09 39.005E-09 31.027E-09
StatHigh SpecHigh SpecLow StatLow
2.5615 1.9815 3.1414 1.9815 100.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=9.002, Test.Name=REC SKEW TIME
Section
2006, 03:30
Test.Number=9.002, Test.Name=REC SKEW TIME
Statistics:
Mean Median StdDev StdDev
66.569E-09 3.151E-09 142.899E-09 0.1553 0.4665 142.899E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
385.982E-09 525.148E-12 400.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=9.002, Test.Name=REC SKEW TIME
Section
2006, 05:31
Test.Number=9.002, Test.Name=REC SKEW TIME
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
9.928E-09 14.103E-09 6.416E-09 -1.272E-09 2.305E-09 7.623E-09 2.562E-09 8.509E-09 7.446E-09 3.191E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 0.8346 >4.0000 0.8346 400.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=10.000, Test.Name=TZH
Section
2006, 03:30
Test.Number=10.000, Test.Name=TZH
Statistics:
Mean Median StdDev StdDev
19.741E-09 19.741E-09 2.698E-09 2.4390 >4.0000 2.698E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
23.599E-09 13.093E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=10.000, Test.Name=TZH
Section
2006, 05:31
Test.Number=10.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
26.602E-09 30.543E-09 21.393E-09 12.243E-09 17.383E-09 9.219E-09 3.050E-09 25.097E-09 20.581E-09 18.418E-09
StatHigh SpecHigh SpecLow StatLow
3.5519 2.3381 >4.0000 2.3381 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=10.001, Test.Name=TZL
Section
2006, 03:30
Test.Number=10.001, Test.Name=TZL
Statistics:
Mean Median StdDev StdDev
40.685E-09 39.266E-09 7.749E-09 1.0459 1.3980 7.749E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
52.050E-09 30.479E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=10.001, Test.Name=TZL
Section
2006, 05:31
Test.Number=10.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
61.033E-09 73.704E-09 46.255E-09 18.806E-09 34.692E-09 26.341E-09 9.150E-09 57.270E-09 44.476E-09 36.668E-09
StatHigh SpecHigh SpecLow StatLow
1.1840 1.6852 0.6829 0.6829 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=10.002, Test.Name=TLZ
Section
2006, 03:30
Test.Number=10.002, Test.Name=TLZ
Statistics:
Mean Median StdDev StdDev
40.828E-09 40.800E-09 4.934E-09 1.6331 2.1957 4.934E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
48.052E-09 33.362E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=10.002, Test.Name=TLZ
Section
2006, 05:31
Test.Number=10.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
50.403E-09 58.250E-09 41.463E-09 24.677E-09 33.281E-09 17.121E-09 5.596E-09 47.957E-09 40.948E-09 35.445E-09
StatHigh SpecHigh SpecLow StatLow
1.9361 2.4700 1.4021 1.4021 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=10.003, Test.Name=THZ
Section
2006, 03:30
Test.Number=10.003, Test.Name=THZ
Statistics:
Mean Median StdDev StdDev
24.795E-09 24.715E-09 2.333E-09 3.5430 >4.0000 2.333E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
28.248E-09 20.903E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=10.003, Test.Name=THZ
Section
2006, 05:31
Test.Number=10.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
30.459E-09 34.026E-09 25.734E-09 17.442E-09 21.992E-09 8.467E-09 2.764E-09 29.048E-09 25.003E-09 23.121E-09
StatHigh SpecHigh SpecLow StatLow
3.9194 3.1035 >4.0000 3.1035 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=11.000, Test.Name=TZH
Section
2006, 03:30
Test.Number=11.000, Test.Name=TZH
Statistics:
Mean Median StdDev StdDev
16.830E-09 16.486E-09 2.211E-09 2.5369 >4.0000 2.211E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
20.345E-09 14.023E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=11.000, Test.Name=TZH
Section
2006, 05:31
Test.Number=11.000, Test.Name=TZH
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
20.205E-09 23.669E-09 15.650E-09 7.630E-09 11.174E-09 9.031E-09 2.673E-09 18.041E-09 16.160E-09 12.585E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 1.9514 >4.0000 1.9514 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=11.001, Test.Name=TZL
Section
2006, 03:30
Test.Number=11.001, Test.Name=TZL
Statistics:
Mean Median StdDev StdDev
18.962E-09 18.764E-09 2.610E-09 2.4212 >4.0000 2.610E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
22.762E-09 15.324E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=11.001, Test.Name=TZL
Section
2006, 05:31
Test.Number=11.001, Test.Name=TZL
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
24.438E-09 29.474E-09 19.211E-09 8.948E-09 14.184E-09 10.254E-09 3.421E-09 22.745E-09 19.593E-09 15.031E-09
StatHigh SpecHigh SpecLow StatLow
3.1668 1.8719 >4.0000 1.8719 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=11.002, Test.Name=TLZ
Section
2006, 03:30
Test.Number=11.002, Test.Name=TLZ
Statistics:
Mean Median StdDev StdDev
21.020E-09 20.903E-09 1.220E-09 >4.0000 >4.0000 1.220E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
22.855E-09 19.136E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=11.002, Test.Name=TLZ
Section
2006, 05:31
Test.Number=11.002, Test.Name=TLZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
22.839E-09 25.507E-09 20.721E-09 15.936E-09 18.229E-09 4.610E-09 1.595E-09 22.086E-09 21.287E-09 18.794E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=11.003, Test.Name=THZ
Section
2006, 03:30
Test.Number=11.003, Test.Name=THZ
Statistics:
Mean Median StdDev StdDev
22.054E-09 21.740E-09 1.394E-09 >4.0000 >4.0000 1.394E-09
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
24.343E-09 20.066E-09 65.000E-09
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=11.003, Test.Name=THZ
Section
2006, 05:31
Test.Number=11.003, Test.Name=THZ
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
22.369E-09 24.802E-09 20.628E-09 16.454E-09 18.323E-09 4.045E-09 1.391E-09 21.710E-09 21.287E-09 18.982E-09
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 65.000E-09
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=21.000, Test.Name=VCC
Section
2006, 03:30
Test.Number=21.000, Test.Name=VCC
Statistics:
Mean Median StdDev StdDev
4.500 4.500
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.500 4.500 5.500 4.500
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=21.000, Test.Name=VCC
Section
2006, 05:31
Test.Number=21.000, Test.Name=VCC
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.750 4.750 4.750 4.750 4.750 4.750 4.750 4.750
StatHigh SpecHigh SpecLow StatLow
5.500 4.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=21.001, Test.Name=TEMP
Section
2006, 03:30
Test.Number=21.001, Test.Name=TEMP
Statistics
Mean Median StdDev StdDev
23.333 25.000 51.331 0.4005 0.4059 51.331
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
85.000 -40.000 85.000 -40.000
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=21.001, Test.Name=TEMP
Section
2006, 05:31
Test.Number=21.001, Test.Name=TEMP
Statistics
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
85.000 177.325 23.333 -130.658 -40.000 125.000 51.331 85.000 25.000 -40.000
StatHigh SpecHigh SpecLow StatLow
0.4059 0.4113 0.4005 0.4005 85.000 -40.000
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.5V test tempHistogramHistogram: Test.Number=100.001, Test.Name=VOS
Section
2006, 03:30
Test.Number=100.001, Test.Name=VOS
Statistics:
Mean Median StdDev StdDev
-9.843E-03 -2.001E-03 71.915E-03 0.8814 0.9270 71.915E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
170.000E-03 -174.001E-03 200.000E-03 -200.000E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC45: A049CHH45: A049CHR45:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=4.75 Test alltempHistogram: Test.Number=100.001, Test.Name=VOS
Section
2006, 05:31
Test.Number=100.001, Test.Name=VOS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median -20.090E-03 -252.955E-03 -166.000E-03 StatHigh 316.000E-03 SpecHigh SpecLow 77.621E-03 StatLow 40.000E-03
150.000E-03 212.774E-03
0.8589 0.7726 0.9451 0.7726 200.000E-03 -200.000E-03
-30.001E-03 -74.000E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC47: SYN1069 A374CHH47: SYN1069 A374CHR47: SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
24-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 03:45
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
847.882E-06 845.021E-06 38.134E-06 >4.0000 >4.0000 38.134E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
1.003E-03 754.428E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Section
2006, 05:37
Test.Number=1.000, Test.Name=ICC1 DE=H,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
913.816E-06 930.898E-06 857.288E-06 783.678E-06 811.457E-06 102.359E-06 24.537E-06 874.955E-06 855.173E-06 838.839E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 03:45
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
593.513E-06 591.277E-06 19.125E-06 >4.0000 >4.0000 19.125E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
636.701E-06 537.255E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Section
2006, 05:37
Test.Number=1.001, Test.Name=ICC2 DE=H,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
652.206E-06 661.557E-06 615.978E-06 570.399E-06 586.492E-06 65.714E-06 15.193E-06 626.344E-06 614.230E-06 604.855E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 03:45
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean Median StdDev StdDev
325.930E-06 330.052E-06 14.706E-06 >4.0000 >4.0000 14.706E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
347.693E-06 262.327E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Section
2006, 05:37
Test.Number=1.002, Test.Name=ICC3 DE=L,^RE=L,DIN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
333.574E-06 338.975E-06 319.805E-06 300.635E-06 307.512E-06 26.062E-06 6.390E-06 324.447E-06 319.646E-06 314.331E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 03:45
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean Median StdDev StdDev
326.192E-06 329.935E-06 14.880E-06 >4.0000 >4.0000 14.880E-06
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
348.698E-06 262.024E-06 1.500E-03
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Section
2006, 05:37
Test.Number=1.003, Test.Name=ICC4 DE=L,^RE=L,DIN=L
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
333.299E-06 338.873E-06 319.753E-06 300.633E-06 307.540E-06 25.758E-06 6.373E-06 324.347E-06 319.561E-06 314.006E-06
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 1.500E-03
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 03:45
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean Median StdDev StdDev
-4.990 -4.989 1.522E-03 >4.0000 >4.0000 1.522E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
-4.987 -4.992 -1.550 -5.100
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=2.000, Test.Name=VOD IN=L LOAD
Section
2006, 05:37
Test.Number=2.000, Test.Name=VOD IN=L LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
-4.988 -4.986 -4.991 -4.996 -4.993 5.181E-03 1.579E-03 -4.989 -4.991 -4.992
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 -1.550 -5.500
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 03:45
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean Median StdDev StdDev
4.988 4.989 4.628E-03 >4.0000 >4.0000 4.628E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
4.992 4.973 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=2.001, Test.Name=VOD IN=H LOAD
Section
2006, 05:37
Test.Number=2.001, Test.Name=VOD IN=H LOAD
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
4.993 4.995 4.990 4.986 4.987 5.558E-03 1.454E-03 4.992 4.990 4.989
StatHigh SpecHigh SpecLow StatLow
>4.0000 >4.0000 >4.0000 >4.0000 5.500 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 03:45
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean Median StdDev StdDev
2.205 2.198 228.449E-03 0.9560 2.5899 228.449E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.514 1.918 5.100 1.550
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Section
2006, 05:37
Test.Number=2.002, Test.Name=VOD IN=H 54OHMS
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.377 2.744 2.069 1.394 1.775 601.823E-03 225.052E-03 2.336 2.062 1.806
StatHigh SpecHigh SpecLow StatLow
2.6290 0.7683 >4.0000 0.7683 5.100 1.550
Attributes
Lot: Wafers Maskset Device Device Operation Foundry Process Date Tested Tester Test Program Sequence Retest
A374CHC5: A374CHH5: A374CHR5:
SYN1069 SYN1069 SYN1069
SP485E_Hill view SP485E_Hill view SP485E_Hill view
CHAR CHAR CHAR
26-MAY2006 24-MAY2006 23-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5V test alltempHistogramHistogram: Test.Number=2.003, Test.Name=VOS IN=H
Section
2006, 03:45
Test.Number=2.003, Test.Name=VOS IN=H
Statistics:
Mean Median StdDev StdDev
2.427 2.432 97.974E-03 1.9486 97.974E-03
Operation Foundry
SpecHigh SpecLow NWithinSpec NOutsideSpec
2.478 1.766 3.000
Tester Test Program Sequence Retest
Attributes
Lot: Wafers Maskset Device Device Process Date Tested
A049CHC5: A049CHH5: A049CHR5:
SYN73 SYN73 SYN73
SP485E SP485E SP485E
CHAR CHAR CHAR
09-MAY2006 10-MAY2006 09-MAY2006
SP485ECH01. SP485ECH01. SP485ECH01.
Data: Data
Report generated
Vcc=5 Test alltempHistogram: Test.Number=2.003, Test.Name=VOS IN=H
Section
2006, 05:37
Test.Number=2.003, Test.Name=VOS IN=H
Statistics:
Mean+3*StdD Mean Mean3*StdDev Range StdDev Median
2.498 2.503 2.421 2.340 2.294 203.585E-03 27.151E-03 2.443 2.418 2.411
StatHigh SpecHigh SpecLow
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