IRG4PH40KD INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT
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91577B
IRG4PH40KD
INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE
High short circuit rating optimized motor control, =10µs, 720V 125°C, Combines conduction losses with high switching speed Tighter parameter distribution higher efficiency than previous generations IGBT co-packaged with HEXFREDultrafast, ultrasoft recovery antiparallel diodes
Short Circuit Rated UltraFast IGBT
VCES 1200V
VCE(on) typ. 2.74V
@VGE 15V,
n-ch
Benefits
Latest generation IGBT's offer highest power density motor controls possible HEXFREDdiodes optimized performance with IGBTs. Minimized recovery characteristics reduce noise, switching losses This part replaces IRGPH40KD2 IRGPH40MD2 products hints design 97003
TO-247AC
Absolute Maximum Ratings
Parameter
VCES 25°C 100°C 100°C 25°C 100°C TSTG Collector-to-Emitter Voltage Continuous Collector Current Continuous Collector Current Pulsed Collector Current Clamped Inductive Load Current Diode Continuous Forward Current Diode Maximum Forward Current Short Circuit Withstand Time Gate-to-Emitter Voltage Maximum Power Dissipation Maximum Power Dissipation Operating Junction Storage Temperature Range Soldering Temperature, sec. Mounting Torque, 6-32 Screw.
Max.
1200 +150 (0.063 (1.6mm) from case) (1.1
Units
Thermal Resistance
Parameter
Junction-to-Case IGBT Junction-to-Case Diode Case-to-Sink, flat, greased surface Junction-to-Ambient, typical socket mount Weight
Min.
Typ.
0.24 (0.21)
Max.
0.77
Units
°C/W
(oz)
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2/7/2000
IRG4PH40KD
Electrical Characteristics 25°C (unless otherwise specified)
V(BR)CES
V(BR)CES/TJ
VCE(on)
VGE(th) VGE(th)/TJ ICES IGES
Parameter Min. Typ. Max. Units Collector-to-Emitter Breakdown VoltageS 1200 Temperature Coeff. Breakdown Voltage 0.37 V/°C Collector-to-Emitter Saturation Voltage 2.74 3.29 2.53 Gate Threshold Voltage Temperature Coeff. Threshold Voltage -3.3 mV/°C Forward Transconductance Zero Gate Voltage Collector Current 3000 Diode Forward Voltage Drop Gate-to-Emitter Leakage Current ±100
Conditions 250µA 1.0mA Fig. 15A, 150°C VGE, 250µA VGE, 250µA 100V, 1200V 1200V, 150°C 8.0A Fig. 8.0A, 125°C ±20V
Switching Characteristics 25°C (unless otherwise specified)
td(on) td(off) Eoff td(on) td(off) Cies Coes Cres di(rec)M/dt Parameter Total Gate Charge (turn-on) Gate Emitter Charge (turn-on) Gate Collector Charge (turn-on) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Turn-On Switching Loss Turn-Off Switching Loss Total Switching Loss Short Circuit Withstand Time Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Switching Loss Internal Emitter Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Diode Reverse Recovery Time Diode Peak Reverse Recovery Current Diode Reverse Recovery Charge Diode Peak Rate Fall Recovery During Min. Typ. Max. Units Conditions 400V Fig.8 25°C 15A, 800V 15V, 1.31 Energy losses include "tail" 1.12 diode reverse recovery 2.43 Fig. 9,10,18 720V, 125°C 15V, VCPK 500V 150°C, Fig. 10,11,18 15A, 800V 15V, Energy losses include "tail" diode reverse recovery Measured from package 1600 Fig. 1.0MHz 25°C Fig. 125°C 8.0A 25°C Fig. 125°C 200V 25°C Fig. 125°C di/dt 200Aµs A/µs 25°C Fig. 125°C
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IRG4PH40KD
both:
LOAD CURRENT
cle: 125°C 90°C drive specified ation
rate volta
Frequency (KHz)
Fig. Typical Load Current Frequency
(Load Current IRMS fundamental)
Collector-to-Emitter Current
Collector-to-Emitter Current
PULSE WIDTH
20µs PULSE WIDTH
Collector-to-Emitter Voltage
Gate-to-Emitter Voltage
Fig. Typical Output Characteristics
Fig. Typical Transfer Characteristics
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IRG4PH40KD
Collector-to-Emitter Voltage(V)
PULSE WIDTH
Maximum Collector Current(A)
Case Temperature
Junction Temperature
Fig. Maximum Collector Current Case Temperature
Fig. Typical Collector-to-Emitter Voltage Junction Temperature
Thermal Response thJC
0.50
0.20
0.10 0.05 0.02 0.01
SINGLE PULSE (THERMAL RESPONSE)
0.01 0.00001
Notes: Duty factor Peak thJC 0.001 0.01
0.0001
Rectangular Pulse Duration (sec)
Fig. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRG4PH40KD
2500
2000
Gate-to-Emitter Voltage
1MHz Cies SHORTED Cres Coes
400V
Capacitance (pF)
Cies
1500
1000
Collector-to-Emitter Voltage
Total Gate Charge (nC)
Fig. Typical Capacitance Collector-to-Emitter Voltage
Fig. Typical Gate Charge Gate-to-Emitter Voltage
Total Switching Losses (mJ)
Total Switching Losses (mJ)
800V 480V
800V 480V
RGRGGate Resistance (Ohm) Gate Resistance
Junction Temperature
Fig. Typical Switching Losses Gate Resistance
Fig. Typical Switching Losses Junction Temperature
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IRG4PH40KD
Collector-to-Emitter Current
Total Switching Losses (mJ)
800V 480V
SAFE OPERATING AREA
1000 10000
Collector-to-emitter Current
Collector-to-Emitter Voltage
Fig. Typical Switching Losses Collector-to-Emitter Current
Fig. Turn-Off
Insta ntaneo rrent
oltage
Fig. Maximum Forward Voltage Drop Instantaneous Forward Current
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IRG4PH40KD
(ns)
8.0A
1000
1000
/µs)
Fig. Typical Reverse Recovery dif/dt
Fig. Typical Recovery Current dif/dt
1000
i(re /µs)
1000
1000
/µs)
Fig. Typical Stored Charge dif/dt
Fig. Typical di(rec)M/dt dif/dt
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IRG4PH40KD
Same device .U.T. +Vge
430µF
Eoff
Fig. Test Circuit Measurement ILM, Eon, Eoff(diode), trr, Qrr, Irr, td(on), td(off),
Fig. Test Waveforms Circuit Fig. 18a, Defining
Eoff, td(off),
LTAG
ieIc OVERY ENER
Fig. Test Waveforms Circuit Fig. 18a,
Defining Eon, td(on),
Fig. Test Waveforms Circuit Fig. 18a,
Defining Erec, trr, Qrr,
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IRG4PH40KD
Figure 18e. Macro Waveforms Figure 18a's Test Circuit
1000V 6000µ
D.U.T.
800V
800V @25°C
Figure Clamped Inductive Load Test Circuit
Figure Pulsed Collector Current Test Circuit
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IRG4PH40KD
Notes:
Repetitive rating: VGE=20V; pulse width limited maximum junction temperature (figure VCC=80%(VCES), VGE=20V, L=10µH, (figure Pulse width 80µs; duty factor 0.1%. Pulse width 5.0µs, single shot.
Case Outline TO-247AC
NOTE
LEAD 1234-
COLLECTO COLLECTO
EDEC 47AC -3P)
illim
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