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IRF9530NS/L HEXFET® Power MOSFET Advanced Process Technology
Top Searches for this datasheet91523A IRF9530NS/L HEXFET® Power MOSFET Advanced Process Technology Surface Mount (IRF9530NS) Low-profile through-hole (IRF9530NL) 175°C Operating Temperature Fast Switching P-Channel Fully Avalanche Rated Description VDSS -100V RDS(on) 0.20 -14A Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques achieve extremely on-resistance silicon area. This benefit, combined with fast switching speed ruggedized device design that HEXFET Power MOSFETs well known for, provides designer with extremely efficient reliable device wide variety applications. D2Pak surface mount power package capable accommodating sizes HEX-4. provides highest power capability lowest possible onresistance existing surface mount package. D2Pak suitable high current applications because internal connection resistance dissipate 2.0W typical surface mount application. through-hole version (IRF9530NL) available lowprofile applications. Absolute Maximum Ratings Parameter 25°C 100°C 25°C 25°C dv/dt TSTG Continuous Drain Current, -10V Continuous Drain Current, -10V Pulsed Drain Current Power Dissipation Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction Storage Temperature Range Soldering Temperature, seconds Max. 0.53 -8.4 -5.0 (1.6mm from case Units W/°C V/ns Thermal Resistance Parameter Junction-to-Case Junction-to-Ambient Mounted,steady-state)** Typ. Max. Units °C/W 5/13/98 IRF9530NS/L Electrical Characteristics 25°C (unless otherwise specified) Parameter Drain-to-Source Breakdown Voltage V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) Gate Threshold Voltage Forward Transconductance V(BR)DSS IDSS IGSS td(on) td(off) Ciss Coss Crss Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Source Inductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. -100 -2.0 Typ. -0.11 Max. Units Conditions -250µA V/°C Reference 25°C, -1mA 0.20 -10V, -8.4A -4.0 VGS, -250µA -50V, -8.4A -100V, -250 -80V, 150°C -100 -20V -8.4A -80V -10V, Fig. -50V -8.4A 6.2, Fig. Between lead, center contact -25V 1.0MHz, Fig. Source-Drain Ratings Characteristics Notes: Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min. Typ. Max. Units Conditions MOSFET symbol showing integral reverse junction diode. -1.6 25°C, -8.4A, 25°C, -8.4A di/dt -100A/µs Intrinsic turn-on time negligible (turn-on dominated LS+LD) Repetitive rating; pulse width limited max. junction temperature. fig. Pulse width 300µs; duty cycle Uses IRF9530N data test conditions Starting 25°C, =7.0mH -8.4A. (See Figure 175°C When mounted square (FR-4 G-10 Material recommended footprint soldering techniques refer application note #AN-994. -8.4A, di/dt -490A/µs, V(BR)DSS, IRF9530NS/L 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V rain-to-S ource urrent Drain-to-Source Current 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V -4.5V 25°C 175°C rain-to-S ource oltage rain-to-S ource oltage Typical Output Characteristics Typical Output Characteristics DS(on) Drain-to-Source Resistance (Normalized) -14A rain-to urre -10V -to-Source Volta Junction Temperature Typical Transfer Characteristics Normalized On-Resistance Temperature IRF9530NS/L 2000 1600 -VGS Gate-to-Source Voltage 1MHz -8.4A -80V -50V -20V Capacitance (pF) 1200 TEST CIRCUIT FIGURE rain-to-S ourc oltage Total Gate Charge (nC) Typical Capacitance Drain-to-Source Voltage Typical Gate Charge Gate-to-Source Voltage 1000 Reverse rain Current OPERATION THIS AREA LIMITED RDS(on) Drain Current 10us 100us Single Pulse 10ms 1000 ourc e-to-D rain oltage -VDS Drain-to-Source Voltage Typical Source-Drain Diode Forward Voltage Maximum Safe Operating Area IRF9530NS/L D.U.T. Drain Current -10V Pulse Width Duty Factor 10a. Switching Time Test Circuit td(on) d(off) Case Temperature Maximum Drain Current Case Temperature 10b. Switching Time Waveforms herm pons 0.01 0.00001 0.0001 0.001 0.01 ratio Maximum Effective Transient Thermal Impedance, Junction-to-Case IRF9530NS/L Single Pulse Avalanche Energy (mJ) -3.4A -5.9A BOTTOM -8.4A 12a. Unclamped Inductive Test Circuit Starting Junction Temperature 12c. Maximum Avalanche Energy Drain Current (BR)DSS 12b. Unclamped Inductive Waveforms Current Regulator Same Type D.U.T. .2µF .3µF -3mA Charge Current Sampling Resistors 13a. Basic Gate Charge Waveform 13b. Gate Charge Test Circuit D.U.T. -10V IRF9530NS/L Peak Diode Recovery dv/dt Test Circuit D.U.T* Circuit Layout Considerations Stray Inductance Ground Plane Leakage Inductance Current Transformer dv/dt controlled controlled Duty Factor D.U.T. Device Under Test Reverse Polarity D.U.T P-Channel Driver Gate Drive P.W. Period P.W. Period [VGS=10V D.U.T. Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. Waveform Diode Recovery dv/dt [VDD] Re-Applied Voltage Inductor Curent Body Diode Forward Drop Ripple 5.0V Logic Level Drive Devices P-Channel HEXFETS IRF9530NS/L D2Pak Package Outline 0.54 0.29 (.055 4.69 4.20 (.05 (.04 0.16 6.47 6.18 (.20 (.18 (.110 (.090 2.61 2.32 (.07 (.05 1.40 1.14 (.20 (.03 (.02 (.01 (.022 (.018 1.43 FTER 4.5M ATSINK 8.89 (.70 (.15 (.08 (.100 Part Marking Information D2Pak PART F530S DATE CODE IRF9530NS/L Package Outline TO-262 Outline Part Marking Information TO-262 IRF9530NS/L Tape Reel Information D2Pak (.06 (.05 CTIO (.42 (.42 (.06 (.04 (.63 (.62 13.50 (.532 12.80 (.504 (1.079) 0.00 60.00 (2.3 LLIN (1.03 (.961 0.40 (1.1 MAX. 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