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March 1992 CD4070BM CD4070BC Quad 2-Input EXCLUSIVE-OR Gate CD407


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CD4070BM CD4070BC CD4077BM CD4077BC
March 1992
CD4070BM CD4070BC Quad 2-Input EXCLUSIVE-OR Gate CD4077BM CD4077BC Quad 2-Input EXCLUSIVE-NOR Gate
Employing complementary (CMOS) transistors achieve wide power supply operating range power consumption high noise margin CD4070BM CD4077BM provide basic functions used implementation digital integrated circuit systems P-channel enhancement mode transistors provide symmetrical circuit with output swing essentially equal supply voltage power other than that caused leakage current consumed during static condition inputs protected from damage static discharge diode clamps
Features
Wide supply voltage range High noise immunity power driving compatibility driving 74LS CD4070B compatible CD4030A Equivalent MM54C86 MM74C86 MC14070B CD4077B Equivalent MC14077B
Connection Diagram
CD4070BM CD4070BC Dual-In-Line Package CD4077BM CD4077BC Dual-In-Line Package
5976-1
5976-5
View
View
Typical Performance Characteristics
Propagation Delay Time Load Capacitance
Truth Tables
CD4070BM CD4070BC Inputs Outputs
CD4077BM CD4077BC Inputs Outputs
5976-2
C1995 National Semiconductor Corporation
5976
RRD-B30M105 Printed
Absolute Maximum Ratings (Notes
Military Aerospace specified devices required please contact National Semiconductor Sales Office Distributors availability specifications Supply Voltage (VDD) Input Voltage (VIN) Storage Temperature Range (TS) Power Dissipation (PD) Dual-In-Line Small Outline Lead Temperature (TL) (Soldering seconds)
Recommended Operating Conditions (Note
Supply Voltage (VDD) Input Voltage (VIN) Operating Temperature Range (TA) CD4070BC CD4077BC CD4070BM CD4077BM
CD4077BM (Note
Electrical Characteristics CD4070BM
Symbol Parameter Quiescent Device Current Conditions
Units
Level Output Voltage
lIOl lIOl lIOl lIOl
High Level Output Voltage
Level Input Voltage
High Level Input Voltage
Level Output Current (Note High Level Output Current (Note Input Current
10b5
Note ``Absolute Maximum Ratings'' those values beyond which safety device cannot guaranteed They meant imply that devices should operated these limits table ``Recommended Operating Conditions'' ``Electrical Characteristics'' provides conditions actual device operation Note unless otherwise specified Note tested output time
Electrical Characteristics CD4070BC
Symbol Parameter Quiescent Device Current Conditions
CD4077BC (Note
Units
Level Output Voltage
lIOl lIOl lIOl lIOl
High Level Output Voltage
Level Input Voltage
High Level Input Voltage
Level Output Current High Level Output Current Input Current
10b5
Electrical Characteristics
Symbol tPHL tPLH tTHL tTLH Parameter Propagation Delay Time from Input Output Transition Time
200k unless otherwise specified Conditions Input Input (Note Units
Average Input Capacitance Power Dissipation Capacitance
Parameters guaranteed correlated testing Note ``Absolute Maximum Ratings'' those values beyond which safety device cannot guaranteed They meant imply that devices should operated these limits table ``Recommended Operating Conditions'' ``Electrical Characteristics'' provides conditions actual device operation Note unless otherwise specified Note tested output time Note determines load power consumption CMOS device complete explanation Family Characteristics Application Note AN-90
Test Circuit Switching Time Waveforms
5976-3
Note Delays measured with input
5976-4
Physical Dimensions inches (millimeters)
Molded Small Outline Package Order Number CD4070BCM CD4077BCM Package Number M14A
CD4070BM CD4070BC CD4077BM CD4077BC
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package Order Number CD4070BCN CD4077BCN Package Number N14A
LIFE SUPPORT POLICY NATIONAL'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL PRESIDENT NATIONAL SEMICONDUCTOR CORPORATION used herein Life support devices systems devices systems which intended surgical implant into body support sustain life whose failure perform when properly used accordance with instructions provided labeling reasonably expected result significant injury user
National Semiconductor Corporation 1111 West Bardin Road Arlington 76017 1(800) 272-9959 1(800) 737-7018
critical component component life support device system whose failure perform reasonably expected cause failure life support device system affect safety effectiveness
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National Semiconductor Japan 81-043-299-2309 81-043-299-2408
National does assume responsibility circuitry described circuit patent licenses implied National reserves right time without notice change said circuitry specifications

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