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DESCRIPTION BH62UV1600 Wide operation voltage 1.65V 3.6V Ult
Top Searches for this datasheetUltra Power/High Speed CMOS SRAM DESCRIPTION BH62UV1600 Wide operation voltage 1.65V 3.6V Ultra power consumption 3.0V Operation current 5.0mA 70ns 25OC 1.5mA 1MHz 25OC Standby current 25OC 2.0V Data retention current 25OC High speed access time 70ns 1.8V 85OC Automatic power down when chip deselected Easy expansion with CE1, options Three state outputs compatible Fully static operation, clock, refreash Data retention supply voltage 1.0V BH62UV1600 high performance, ultra power CMOS Static Random Access Memory organized 2,048K bits operates wide range 1.65V 3.6V supply voltage. Advanced CMOS technology circuit techniques provide both high speed power features with typical operating current 1.5mA 1MHz 3.6V/25OC maximum access time 70ns 1.8V/85OC. Easy memory expansion provided active chip enable (CE1), active HIGH chip enable (CE2) active output enable (OE) three-state output drivers. BH62UV1600 automatic power down feature, reducing power consumption significantly when chip deselected. BH62UV1600 made with chips 8Mbit SRAM stacked multi-chip-package. BH62UV1600 available 48-ball package. PRODUCT FAMILY PRODUCT FAMILY OPERATING TEMPERATURE +0OC +70OC BH62UV1600AI -25OC +85OC 1.65V 3.6V 25uA 20uA 10mA RANGE SPEED (ns) VCC=1.8~3.6V POWER CONSUMPTION STANDBY (ICCSB1, Max) Operating (ICC, Max) TYPE VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V 20uA 15uA 10mA BGA-48-0608 CONFIGURATIONS BLOCK DIAGRAM Address Input Buffer Decoder 1024 Memory Array 1024 16384 16384 Data Input Buffer 2048 Column Decoder Control Address Input Buffer Column Write Driver Sense Data Output Buffer 48-ball view Brilliance Semiconductor, Inc. reserves right modify document contents without notice. Detailed product characteristic test report available upon request being accepted. R0201-BH62UV1600 Revision Jul. 2005 DESCRIPTIONS BH62UV1600 Function These address inputs select 2,048K Name A0-A20 Address Input Chip Enable Input Chip Enable Input active active HIGH. Both chip enables must active when data read from write device. either chip enable active, device deselected standby power mode. pins will high impedance state when device deselected. write enable input active controls read write operations. With chip selected, when HIGH LOW, output data will present pins; when LOW, data present pins will written into selected memory location. output enable input active LOW. output enable active while chip selected write enable inactive, data will present pins they will enabled. pins will high impendence state when inactive. bi-directional ports used read data from write data into RAM. Write Enable Input Output Enable Input DQ0-DQ7 Data Input/Output Ports Power Supply Ground TRUTH TABLE MODE Chip De-selected (Power Down) Output Disabled Read Write OPERATION High CURRENT ICCSB, ICCSB1 High DOUT NOTES: means VIH; means VIL; means don't care (Must state) ABSOLUTE MAXIMUM RATINGS SYMBOL VTERM TBIAS TSTG IOUT OPERATING RANGE UNITS PARAMETER Terminal Voltage with Respect Temperature Under Bias Storage Temperature Power Dissipation Output Current RATING -0.5 RANG Commercial Industrial AMBIENT TEMPERATURE 70OC 1.65V 3.6V 1.65V 3.6V 4.6V +125 +150 CAPACITANCE 1.0MHz) Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage device. This stress rating only functional operation device these other conditions above those indicated operational sections this specification implied. Exposure absolute maximum rating conditions extended periods affect reliability. -2.0V case pulse width less than R0201-BH62UV1600 SYMBOL PAMAMETER CONDITIONS MAX. UNITS Input Capacitance Input/Output VI/O Capacitance This parameter guaranteed 100% tested. Revision Jul. 2005 ELECTRICAL CHARACTERISTICS PARAMETER NAME ICC1 ICCSB ICCSB1 BH62UV1600 PARAMETER Power Supply Input Voltage Input High Voltage Input Leakage Current Output Leakage Current Output Voltage Output High Voltage Operating Current Power Supply TEST CONDITIONS MIN. 1.65 VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V TYP.(1) -4.5 -3.0 MAX. VCC+0.3(3) UNITS -0.3(2) VCC, VI/O Max, 0.1mA Max, 2.0mA Min, -0.1mA Min, -1.0mA VIL, VIH, 0mA, FMAX(4) VIH, 0mA, 1MHz VIH, VIL, CE1VCC-0.2V CE20.2V, VINV CC-0.2V VIN0.2V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V -VCC-0.2 Operating Power Supply Current Standby Current Standby Current CMOS Typical characteristics TA=25OC. Undershoot: -1.0V case pulse width less than Overshoot: VCC+1.0V case pulse width less than FMAX=1/tRC. ICCSB1(MAX.) 15uA/20uA VCC=1.8V/3.6V TA=0OC 70OC. DATA RETENTION CHARACTERISTICS SYMBOL ICCDR PARAMETER Data Retention Data Retention Current Chip Deselect Data Retention Time Operation Recovery Time TEST CONDITIONS CE1VCC-0.2V CE20.2V, VINVCC-0.2V VIN0.2V CE1VCC-0.2V CE20.2V, VINVCC-0.2V VIN0.2V VCC=1.0V VCC=2.0V MIN. TYP. -1.0 MAX. -7.0 UNITS tCDR Retention Waveform TA=25 Read Cycle Time. ICCDR(MAX.) 6.0uA/15uA VCC=1.0V/2.0V TA=0OC 70OC. DATA RETENTION WAVEFORM (CE1 Controlled) Data Retention Mode VDR1.0V tCDR CE1VCC 0.2V R0201-BH62UV1600 Revision Jul. 2005 DATA RETENTION WAVEFORM (CE2 Controlled) Data Retention Mode VDR1.0V BH62UV1600 tCDR CE20.2V TEST CONDITIONS (Test Load Input/Output Reference) Input Pulse Levels Input Rise Fall Times Input Output Timing Reference Level tCLZ1, tCLZ2, tOLZ, tCHZ1, tCHZ2, tOHZ, tWHZ, Output Load Others 1V/ns 0.5Vcc 5pF+1TTL 30pF+1TTL SWITCHING WAVEFORMS WAVEFORM INPUTS MUST STEADY CHANGE FROM CHANGE FROM INPUT PULSES OUTPUTS MUST STEADY WILL CHANGE FROM WILL CHANGE FROM CHANGE STATE UNKNOW CENTER LINE HIGH INPEDANCE "OFF" STATE Output CL(1) DON'T CARE CHANGE PERMITTED DOES APPLY Rise Time: 1V/ns Fall Time: 1V/ns Including scope capacitance. ELECTRICAL CHARACTERISTICS READ CYCLE JEDEC PARAMETER NAME PARANETER NAME CYCLE TIME 70ns DESCRIPTION Read Cycle Time Address Access Time Chip Select Access Time Chip Select Access Time Output Enable Output Valid Chip Select Output Chip Select Output Output Enable Output Chip Select Output High Chip Select Output High Output Enable Output High Data Hold from Address Change (CE1) (CE2) (CE1) (CE2) (CE1) (CE2) MIN. TYP. -MAX. -UNITS tAVAX tAVQX tE1LQV tE2LQV tGLQV tE1LQX tE2LQX tGLQX tE1HQZ tE2HQZ tGHQZ tAVQX tACS1 tACS2 tCLZ1 tCLZ2 tOLZ tCHZ1 tCHZ2 tOHZ R0201-BH62UV1600 Revision Jul. 2005 SWITCHING WAVEFORMS (READ CYCLE) READ CYCLE (1,2,4) BH62UV1600 ADDRESS DOUT (1,3,4) READ CYCLE tACS1 tCLZ DOUT tACS2 tCHZ1, tCHZ2 READ CYCLE ADDRESS tCLZ1 tCLZ2 DOUT NOTES: high read Cycle. Device continuously selected when CE2= VIH. Address valid prior coincident with transition and/or transition high. VIL. Transition measured 500mV from steady state with 5pF. parameter guaranteed 100% tested. tOLZ tACS1 tOHZ tCHZ1 (1,5) tACS2 tCHZ2 (2,5) R0201-BH62UV1600 Revision Jul. 2005 ELECTRICAL CHARACTERISTICS WRITE CYCLE JEDEC PARAMETER NAME PARANETER NAME DESCRIPTION Write Cycle Time Address Time Address Valid Write Chip Select Write Write Pulse Width Write Recovery Time Write Recovery Time Write Output High Data Write Time Overlap Data Hold from Write Time Output Disable Output High Write Output Active (CE1, (CE2) BH62UV1600 CYCLE TIME 70ns MIN. TYP. -MAX. UNITS tAVAX tAVWL tAVWH tELWH tWLWH tWHAX tE2LAX tWLQZ tDVWH tWHDX tGHQZ tWHQX tWR1 tWR2 tWHZ tOHZ SWITCHING WAVEFORMS (WRITE CYCLE) WRITE CYCLE ADDRESS tWR1 (11) tOHZ DOUT (4,10) (11) tWR2 R0201-BH62UV1600 Revision Jul. 2005 WRITE CYCLE (1,6) BH62UV1600 ADDRESS (11) tWHZ DOUT (4,10) (11) tWR2 (8,9) NOTES: must high during address transitions. internal write time memory defined overlap active low. signals must active initiate write signal terminate write going inactive. data input setup hold timing should referenced second transition edge signal that terminates write. measured from earlier going high going write cycle. During this period, pins output state that input signals opposite phase outputs must applied. transition high transition occurs simultaneously with transitions after transition, output remain high impedance state. continuously VIL). DOUT same phase write data this write cycle. DOUT read data next address. high during this period, pins output state. Then data input signals opposite phase outputs must applied them. Transition measured 500mV from steady state with 5pF. parameter guaranteed 100% tested. measured from later going going high write. R0201-BH62UV1600 Revision Jul. 2005 ORDERING INFORMATION BH62UV1600 SPEED 70ns BH62UV1600 MATERIAL Normal Green GRADE -25oC +85oC PACKAGE BGA-48-0608 Note: Brilliance Semiconductor Inc. (BSI) assumes responsibility application product circuit described herein. does authorize products critical components application which failure product expected result significant injury death, including life-support systems critical medical instruments. PACKAGE DIMENSIONS NOTES: CONTROLLING DIMENSIONS MILLIMETERS. PIN#1 MARKING LASER PRINT. SYMBOL NUMBER SOLDER BALLS. Max. BALL PITCH 0.75 5.25 3.75 VIEW mini-BGA R0201-BH62UV1600 Revision Jul. 2005 Revision History Revision History Initial Production Version BH62UV1600 Draft Date July 15,2005 Remark Initial R0201-BH62UV1600 Revision Jul. 2005 Other recent searchesTCA6416A - TCA6416A TCA6416A Datasheet STM32F103ZE - STM32F103ZE STM32F103ZE Datasheet PIC0602H - PIC0602H PIC0602H Datasheet PIC0602H-R20YF - PIC0602H-R20YF PIC0602H-R20YF Datasheet NDR3025 - NDR3025 NDR3025 Datasheet NCP1378 - NCP1378 NCP1378 Datasheet MC14049B - MC14049B MC14049B Datasheet MC14050B - MC14050B MC14050B Datasheet IA82050 - IA82050 IA82050 Datasheet HMC907LP5E - HMC907LP5E HMC907LP5E Datasheet EPD-440-0-0 - EPD-440-0-0 EPD-440-0-0 Datasheet ASI2003 - ASI2003 ASI2003 Datasheet
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