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BH616UV8011 Wide operation voltage 1.65V 3.6V Ultra power consump
Top Searches for this datasheetUltra Power/High Speed CMOS SRAM 512K BH616UV8011 Wide operation voltage 1.65V 3.6V Ultra power consumption Operation current 12mA (Max.)at 55ns 3.6V (Max.) 1MHz Standby current 15uA (Max.) 3.0V/85 Data retention current (Max.) 1.2V High speed access time -55/-70 55ns (Max.) VCC=3V 70ns (Max.) VCC=1.8V Automatic power down when chip deselected Easy expansion with CE1, options Configuration x8/x16 selectable pin. Three state outputs compatible Fully static operation, clock, refresh Data retention supply voltage 1.0V DESCRIPTION BH616UV8011 high performance, ultra power CMOS Static Random Access Memory organized 524,288 bits operates wide range 1.65V 3.6V supply voltage. Advanced CMOS technology circuit techniques provide both high speed power features with maximum standby current 15uA 3.6V maximum access time 55ns/70ns 3V/1.8V Easy memory expansion provided active chip enable (CE1), active HIGH chip enable (CE2) active output enable (OE) three-state output drivers. BH616UV8011 automatic power down feature, reducing power consumption significantly when chip deselected. BH616UV8011 available DICE form, JEDEC standard 48-pin TSOP-I 48-ball package. POWER CONSUMPTION POWER DISSIPATION PRODUCT FAMILY BH616UV8011DI BH616UV8011AI BH616UV8011TI Industrial 15uA 12uA 12mA 1.5mA OPERATING TEMPERATURE STANDBY (ICCSB1, Max) Operating (ICC, Max) TYPE VCC=1.8V 10MHz fMax. VCC=3.6V VCC=1.8V 1MHz VCC=3.6V 10MHz fMax. 1MHz DICE BGA-48-0608 TSOP I-48 CONFIGURATIONS DQ15 DQ14 DQ13 DQ12 DQ11 DQ10 BLOCK DIAGRAM Address Input Buffer Decoder 1024 Memory Array BH616UV8011TI 1024 8192 8192 DQ15 Data Input Buffer Data Output Buffer Column Decoder Address Input Buffer Control Column Write Driver Sense DQ14 DQ15 DQ10 DQ11 DQ12 DQ13 48-ball view Brilliance Semiconductor, Inc. reserves right change products specifications without notice. Detailed product characteristic test report available upon request being accepted. R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 DESCRIPTIONS Name A0-A18 Address Input Chip Enable Input Chip Enable Input Write Enable Input Function These address inputs select 524,288 active active HIGH. Both chip enables must active when data read from write device. either chip enable active, device deselected standby power mode. pins will high impedance state when device deselected. write enable input active controls read write operations. With chip selected, when HIGH LOW, output data will present pins; when LOW, data present pins will written into selected memory location. Output Enable Input output enable input active LOW. output enable active while chip selected write enable inactive, data will present pins they will enabled. pins will high impendence state when inactive. Data Byte Control Input DQ0-DQ15 Data Input/Output Ports Lower byte upper byte data input/output control pins. bi-directional ports used read data from write data into RAM. Power Supply Ground TRUTH TABLE MODE Chip De-selected (Power Down) DQ0~DQ7 DQ8~DQ15 CURRENT High High High High High DOUT High DOUT High High High High High DOUT DOUT High ICCSB, ICCSB1 ICCSB, ICCSB1 ICCSB, ICCSB1 Output Disabled Read Write NOTES: means VIH; means VIL; means don't care (Must state) R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 ABSOLUTE MAXIMUM RATINGS SYMBOL VTERM TBIAS TSTG IOUT OPERATING RANGE UNITS PARAMETER Terminal Voltage with Respect Temperature Under Bias Storage Temperature Power Dissipation Output Current RATING -0.5 RANG Industrial AMBIENT TEMPERATURE 1.65V 3.6V 4.6V +125 +150 CAPACITANCE 25OC, 1.0MHz) SYMBOL PAMAMETER CONDITIONS MAX. UNITS Input Capacitance Input/Output Capacitance VI/O Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage device. This stress rating only functional operation device these other conditions above those indicated operational sections this specification implied. Exposure absolute maximum rating conditions extended periods affect reliability. -2.0V case pulse width less than This parameter guaranteed 100% tested. ELECTRICAL CHARACTERISTICS -40OC +85OC) PARAMETER NAME ICC1 ICCSB ICCSB1 PARAMETER Power Supply VCC=1.8V VCC=3.6V TEST CONDITIONS MIN. 1.65 TYP.(1) MAX. VCC+0.3 UNITS Input Voltage -0.3 Input High Voltage VCC, VI/O VCC, Output Leakage Current VCC=1.8V VCC=3.6V Input Leakage Current Max, 0.2mA Max, 2.0mA Min, -0.1mA Min, -1.0mA VIH, 0mA, FMAX Output Voltage VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V VCC=1.8V VCC=3.6V -VCC-0.2 Output High Voltage Operating Power Supply Current Operating Power Supply Current Standby Current -2.0 VIH, 0mA, 1MHz VIH, VIL, CE1VCC-0.2V CE20.2V, VCC-0.2V 0.2V Standby Current CMOS Typical characteristics TA=25 100% tested. Undershoot: -1.0V case pulse width less than Overshoot: VCC+1.0V case pulse width less than FMAX=1/tRC. VCC=3.0V R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 DATA RETENTION CHARACTERISTICS -40OC +85OC) SYMBOL ICCDR tCDR PARAMETER Data Retention Data Retention Current Chip Deselect Data Retention Time Operation Recovery Time TEST CONDITIONS CE1VCC-0.2V CE20.2V, VINVCC-0.2V VIN0.2V CE1VCC-0.2V CE20.2V, VINVCC-0.2V VIN0.2V VCC=1.2V MIN. TYP. -1.2 MAX. -7.0 UNITS Retention Waveform Typical characteristics TA=25 100% tested. Read Cycle Time. DATA RETENTION WAVEFORM (CE1 Controlled) Data Retention Mode VDR1.0V tCDR CE1VCC 0.2V DATA RETENTION WAVEFORM (CE2 Controlled) Data Retention Mode VDR1.0V tCDR CE20.2V TEST CONDITIONS (Test Load Input/Output Reference) Input Pulse Levels Input Rise Fall Times Input Output Timing Reference Level tCLZ1, tCLZ2, tBE, tOLZ, tCHZ1, tCHZ2, tBDO, tOHZ, tWHZ, Output Load Others 1V/ns 0.5Vcc 5pF+1TTL 30pF+1TTL INPUT PULSES Output SWITCHING WAVEFORMS WAVEFORM INPUTS MUST STEADY CHANGE FROM CHANGE FROM DON'T CARE CHANGE PERMITTED DOES APPLY OUTPUTS MUST STEADY WILL CHANGE FROM WILL CHANGE FROM CHANGE STATE UNKNOW CENTER LINE HIGH INPEDANCE "OFF" STATE Rise Time: 1V/ns Fall Time: 1V/ns Including scope capacitance. R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 ELECTRICAL CHARACTERISTICS -40OC +85OC) READ CYCLE JEDEC PARANETER PARAMETER NAME NAME CYCLE TIME 55ns (Vcc=3.0V) MIN. -(CE1) (CE2) (LB, -(CE1) (CE2) (LB, (CE1) (CE2) TYP. -MAX. -CYCLE TIME 70ns (Vcc=1.8V) MIN. TYP. -MAX. DESCRIPTION Read Cycle Time Address Access Time Chip Select Access Time Chip Select Access Time Data Byte Control Access Time Output Enable Output Valid Chip Select Output Chip Select Output Data Byte Control Output Output Enable Output Chip Select Output High Chip Select Output High UNITS tAVAX tAVQX tE1LQV tE2LQV tBLQV tGLQV tE1LQX tE2LQX tBLQX tGLQX tE1HQZ tE2HQZ tBHQZ tGHQZ tAVQX tACS1 tACS2 tCLZ1 tCLZ2 tOLZ tCHZ1 tCHZ2 tBDO tOHZ Data Byte Control Output High (LB, Output Enable Output High Data Hold from Address Change SWITCHING WAVEFORMS (READ CYCLE) READ CYCLE (1,2,4) ADDRESS DOUT R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 READ CYCLE (1,3,4) tACS1 tCLZ tACS2(6) (5,6) tCHZ(5, DOUT READ CYCLE ADDRESS tOLZ tACS1 tCLZ1(5) tCLZ2(5) tCHZ(1,5) tOHZ(5) tACS2 tCHZ2(2,5) tBDO DOUT NOTES: high read Cycle. Device continuously selected when CE2= VIH. Address valid prior coincident with transition and/or transition high. VIL. Transition measured 500mV from steady state with 5pF. parameter guaranteed 100% tested. R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 ELECTRICAL CHARACTERISTICS -40OC +85OC) WRITE CYCLE JEDEC PARANETER PARAMETER NAME NAME DESCRIPTION Write Cycle Time Address Time Address Valid Write Chip Select Write Data Byte Control Write Write Pulse Width Write Recovery Time Write Recovery Time Write Output High Data Write Time Overlap Data Hold from Write Time Output Disable Output High Write Output Active (CE1, (CE2) (LB, CYCLE TIME 55ns (Vcc=3.0V) MIN. TYP. -MAX. -CYCLE TIME 70ns (Vcc=1.8V) MIN. TYP. -MAX. UNITS tAVAX tAVWL tAVWH tELWH tBLWH tWLWH tWHAX tE2LAX tWLQZ tDVWH tWHDX tGHQZ tWHQX tWR1 tWR2 tWHZ tOHZ SWITCHING WAVEFORMS (WRITE CYCLE) WRITE CYCLE ADDRESS (11) tWR1(3) tCW(11) tWR2(3) tOHZ(4,10) DOUT R0201-BH616UV8011 tWP(2) Revision Oct. 2008 BH616UV8011 WRITE CYCLE (1,6) ADDRESS tCW(11) tCW(11) (12) tWR(3) tWP(2) (8,9) tWHZ(4,10) DOUT NOTES: must high during address transitions. internal write time memory defined overlap active low. signals must active initiate write signal terminate write going inactive. data input setup hold timing should referenced second transition edge signal that terminates write. measured from earlier going high going write cycle. During this period, pins output state that input signals opposite phase outputs must applied. transition high transition occurs simultaneously with transitions after transition, output remain high impedance state. continuously VIL). DOUT same phase write data this write cycle. DOUT read data next address. high during this period, pins output state. Then data input signals opposite phase outputs must applied them. 10.Transition measured 500mV from steady state with 5pF. parameter guaranteed 100% tested. 11.tCW measured from later going going high write. R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 ORDERING INFORMATION BH616UV8011 SPEED -55: 55ns -70: 70ns MATERIAL Green, RoHS Compliant free, RoHS Compliant GRADE PACKAGE BGA-48-0608 TSOP I-48 Note: Brilliance Semiconductor Inc. (BSI) assumes responsibility application product circuit described herein. does authorize products critical components application which failure product expected result significant injury death, including life-support systems critical medical instruments. PACKAGE DIMENSIONS NOTES: CONTROLLING DIMENSIONS MILLIMETERS. PIN#1 MARKING LASER PRINT. SYMBOL NUMBER SOLDER BALLS. Max. BALL PITCH 0.75 5.25 3.75 VIEW mini-BGA R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 PACKAGE DIMENSIONS TSOP I-48 (12mm 20mm) R0201-BH616UV8011 Revision Oct. 2008 BH616UV8011 Revision History Revision History Initial Production Version Change I-grade operation temperature range from -25OC -40OC Change 55ns(Max.) VCC=1.65~3.6V 55ns(Max.) VCC=3V, 70ns(Max.) VCC=1.8V Typical value standby current replaced maximum value Featues Description section Remove Normal" (Leaded) Material ordering information TSOP1-48 package Draft Date 10,2006 May. 2006 Oct. 2008 Remark Initial R0201-BH616UV8011 Revision Oct. 2008 Other recent searchesSMA31-1 - SMA31-1 SMA31-1 Datasheet M3541 - M3541 M3541 Datasheet LH4630-PF - LH4630-PF LH4630-PF Datasheet ICS180-02 - ICS180-02 ICS180-02 Datasheet HSR-502 - HSR-502 HSR-502 Datasheet F-51852GNFQJ-LG-ACN - F-51852GNFQJ-LG-ACN F-51852GNFQJ-LG-ACN Datasheet F-51852GNFQH-LW-AFN - F-51852GNFQH-LW-AFN F-51852GNFQH-LW-AFN Datasheet F-51852GNFQJ-LB-ABN - F-51852GNFQJ-LB-ABN F-51852GNFQJ-LB-ABN Datasheet ELLM-2001WB - ELLM-2001WB ELLM-2001WB Datasheet SDRC - SDRC SDRC Datasheet S400 - S400 S400 Datasheet 2N3421ASMD - 2N3421ASMD 2N3421ASMD Datasheet
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