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SURFACE ACOUSTIC WAVE FILTER for TV
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P06E3.pdf 01.10.24
SURFACE ACOUSTIC WAVE FILTER for TV
APPLICATION MANUAL
Murata Manufacturing Co., Ltd.
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Introduction
Murata has continued research on surface acoustic wave filters since 1970. In 1976 we offered for sale our first surface acoustic wave filter to be used in the IF of highfidelity FM tuners. This product attracted the attention of the world, because our surface acoustic wave filter was applied in electronic equipment for consumer use for the first time in the world. Then, we successfully developed and offered for sale the surface acoustic wave filter for the video IF of color television sets. New developments in technology made the television sets smaller in size, which improving their performance year after year. With the discrete circuit integrated to IC, the age has come when most of the circuitry of a television set, with the exception of the power supply and the tuner, is composed of just 4 LSI and a few transistors. Our surface acoustic wave filter for video IF circuits of television succeeded in making the LC filter block into a solid state device previously left behind integration. Murata has recently developed compact, high performance resin mold SIP type package for surface acoustic wave filters.
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P06E3.pdf 01.10.24
CONTENTS
1 Terms for Surface Acoustic Wave Filters YYYYY02 2 Features YYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYY03 3 Fundamentals YYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYY04
3-1. Electrode Pattern Design .............................04 3-2. Substrate ..........................................05 3-3. Photolithography ...................................05 3-4. Sputter ............................................06 3-5. Assembly ..........................................06 3-6. Electrical Characteristics .............................07 3-6-1. Amplitude characteristics...........................07 3-6-2. Phase Characteristics..............................07 3-6-3. Insertion Loss ....................................08 3-6-4. Measurement Circuit ..............................09 3-6-5. Measurement Method..............................10
Terms for Surface Acoustic Wave Filters Features
Fundamentals
Application
Appendix
4 Application YYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYY11
4-1. Connection of the Surface Acoustic Wave Filter with Other Blocks ..11 4-1-1. Input / Output Impedances of the Respective Blocks .......11 4-1-2. Connection of the Tuner and the VIF Stage .............12 4-2. Application Circuit ..................................14 4-2-1. Preamplifier System ...............................14 4-2-2. Postamplifier System ..............................17 4-2-3. Method for the Compensation of the Insertion Loss without Amplifier ....19
5 Appendix
YYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYYY20
5-1. Two Detection Methods and the Specification of the Surface Acoustic Wave Filter ....................20 5-2. TTE and Direct Breakthrough .........................20 5-3. Impedance of the Surface Acoustic Wave Filter ..........22 5-4. Reliability Test .....................................24 5-5. Notice (handling) ...................................25
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P06E3.pdf 01.10.24
1 Terms for Surface Acoustic Wave Filters
Input mark
(in mm)
Fig.1 Dimensions
10max.
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2 Features
(1) Provides the same characteristics as conventional LC filter block with no adjustment. (2) Labor saving for color television VIF circuit assembly line. (3) Make the VIF circuit to be compact and integrated. (4) Extremely beautiful television pictures possible. (5) Temperature coefficient of the trap frequency is small. (6) Resin molded type available at low prices. (7) Shares very small space on a P.C.B.
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3 Fundamentals
3-1. Electrode Pattern Design
Bus bar
Finger
Impulse
Fig.2 IDT and the corresponding impulse
Attenuation (dB)
Frequencies (MHz)
Fig.3 Frequency characteristics of the normal IDT
Fig.4 Weighted impulse
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Fundamentals
3-2. Substrate
ZnO, and single crystal are usually used as substrate materials for the surface acoustic wave filters. Substrates specifically available for the surface acoustic wave filter for color television sets should satisfy the following conditions: (1) The surface acoustic wave electromechanical coupling coefficient ks is large. (2) The effective dielectric constant is proper. (3) Propagation velocity has a small temperature coefficient. (4) Propagation loss of the surface wave is small. (5) Stable against heat and little change by aging. (6) Cost of producing the substrate is low. (7) The material constants in / between substrates have little dispersion. The characteristics (1) through (4) refer to the electric properties of the surface acoustic wave filter, (5) refer to the reliability, and (6) and (7) refer to the price of the product. The larger the electromechanical coupling coefficient ks mentioned in (1), the smaller the insertion loss of the surface acoustic wave filter. On the other hand, the dielectric constant of the substrate is related to the impedance of the surface acoustic wave filter. The temperature coefficient of the propagation velocity mentioned in (3) determines the temperature coefficient of the center frequency of the filter. Presently, there is no substrate fulfilling all the requirements listed above, and the available materials have both advantages and disadvantages. Since surface acoustic wave filter for color television needs a relatively large substrate size, substrate material cost should be as low as possible. Using well established ZnO sputter techniques, Murata provides high performance substrates at very low cost. Single crystal substrates are relatively expensive despite good reproducibility and stability.
Substrate materials LiNbO3 LiTaO3 ZnO / glass
Non-alkaline glass
Table 1 Properties of substrate materials for surface acoustic wave filters
3-3. Photolithography
This is a technique for forming fine electrodes on the substrate. Process is producing photomasks based on the designed data, coating resist onto the aluminum evaporated substrate, on which the photomask is set and radiating ultraviolet rays onto the photomask and forming IDT by etching unwanted aluminum. Surface acoustic wave filter treating 58MHz of the television VIF frequency has more than 100 fine finger electrodes, of which width is about 6 micrometers. Surface acoustic wave filters are being manufactured by fully automated production line at strictly environmental controlled room, for fear of disconnection and shorting by dust.
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Fundamentals
3-4. Sputter
For the purpose of getting piezoelectric thin film on glass, ZnO must be deposited on glass substrate by sputtering. A simplified sputtering apparatus is shown in Fig.5. First, berzia is pumped to high vacuum, then low pressure argon and oxygen gas flow. Then, a high frequency voltage is fed to ZnO ceramic target (cathode) so that the argon gas is ionized. Ionized argon goes to target, makes the target composing element of ZnO sputtered out. These are eventually coated onto the IDT portions of the glass substrate. Murata has established a stable technique that can produce high performance ZnO thin film with high deposition rate and low variation of C axis orientation.
Berzia
Glass Plate
Shutter
ZnO Target
Vaccum Pump
Magnet O2+Ar Gas RF Voltage Supply
Fig.5 Sputtering apparatus
3-5. Assembly
Resin mold
Absorber
Lead Glass
ZnO thin film
Fig.6 Construction of the SAW filter (SAFGH Type)
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P06E3.pdf 01.10.24
Fundamentals
3-6. Electrical Characteristics
3-6-1. Amplitude characteristics
Fig.7 shows the characteristics of the surface acoustic wave filter for the television VIF circuit. Being remarkably different from conventional LC filters, the SAW filter has a response of many peaks and bottoms outside the pass band. It is necessary to add the items of spurious attenuation of upper side and lower side.
0 10 20 Attenuation (dB) 30 40 50 60 70 52 54 56 58 60 1800 1600 1400 1200 1000 800 600 400 62 Group Delay Time (nsec.)
3-6-2. Phase Characteristics
In the case of surface acoustic wave filters, the output signal has a delay with regard to the input signal, corresponding to the time of propagation from input IDT to output IDT of the surface acoustic wave. For example, when a thin film of ZnO sputtered on glass is used as piezoelectric substrate, the propagation velocity of the surface acoustic wave is approximately 2600m / sec. If the distance between the input and output IDT is 3mm, the propagation time of the surface acoustic wave will be approximately 1.2µ sec. Since the delay time of the surface acoustic wave filter is relatively large as shown above, the gradient of the phase with regard to the frequency is large, and as a result, it is hard to observe the phase linearity by measuring its phase characteristic. In view of these facts, it is more convenient to observe the variations of the group delay time. SAFGN58M7VH0Z00B03 (shown in Fig.7) is designed by properly compensating for the group delay time via the chroma bands. Since the short cycle ripple of the group delay time critically affect the performance of these filters, it is sometimes included in the specifications of the filter. In this case, ripple is defined as the maximum value of the difference between neighbouring peak and valley. The ripple is chiefly caused by the TTE (Triple Transit Echo) in most cases, but it may also be caused by the direct breakthrough.
Frequency (MHz)
Fig.7 Frequency characteristics of SAFGN58M7VH0Z00B03
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P06E3.pdf 01.10.24
Fundamentals
3-6-3. Insertion Loss
Fig.8 Effect of power dissipation by incorrect insertion of SAW filter
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P06E3.pdf 01.10.24
Fundamentals
3-6-4. Measurement Circuit
Fig.9 shows measuring circuit of SAFGN58M7VH0Z00B03. To reduce the power loss, parallel tuning coil is used. Since the insertion loss of SAW filters is large, output signal becomes low. And feed through signals make the accurate measurement difficult, requiring attention to the shielding of the test fixture.
TA7124P 1
75 255 15pF 100
0.75µH
1.1µH
SAFGN58M7VH0Z00B03
Fig.9 Measuring Circuit
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P06E3.pdf 01.10.24
Fundamentals
3-6-5. Measurement Method
Input ch1 Main Signal Edge Reflection, Bulk Wave Direct Breakthrough ch2 VM TTE VT Time Time
Fig11 Typical Pulse Response Waveform
Annstu MG411B
Pulse Generator
Amp.2
Attenuator
Amp.3
ch1 Oscilloscope
National VP-5520A Amp.1 Amp.2 Amp.3 : HP 8447A(20dB Gain)
Fig.10 Block Diagram of Pulse Response Measurement System
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4 Application
4-1. Connection of the Surface Acoustic Wave Filter with Other Blocks
4-1-1. Input / Output Impedances of the Respective Blocks
Rpi Cpi Input Rsi Csi Rpo Cpo Output Rso Cso 110 6.6pF 130 5.2pF 150 3.4pF 57 8.4pF 1.7k 6.2pF 58 6.9pF 4.0k 5.0pF 53 4.7pF 11k 3.3pF SAFGN58M7 VH0Z00B03 2.1k 8.1pF SAFGN45M7 VA0Z00B03 4.9k 6.8pF SAFGN38M9 VZ0Z00B03 17k 4.7pF
Table 2 Equivalent Circuit Constants of SAW filters
Rpo Rpi
(a) Parallel expression
(b) Series expression
Fig.12 Equivalent Circuits of the Surface Acoustic Wave Filter
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P06E3.pdf 01.10.24
Application
and if it is a large value, the output impedance of the transistor itself will be upper limit. Thus, it is of the order of 100 to 1 k is useful. (4) One chip IC for VIF The input impedance of the one chip IC for television VIF is of the order of 1k to 3k.
47 IF OUT 39 +B 1000 1000
2200 IF OUT 22 +B
4-1-2. Connection of the Tuner and the VIF Stage
OSC IF OUT 22 56 IF OUT 22 1000 +B (b) (C) +B 10 1000 1000 68
OSC IF OUT
4 20 IF OUT 1000 +B 1000 (d) (e) 1000
Fig.13 Various Types of IF Output Circuit of the Tuner
Tuner Coaxial Cable
VIF Stage
Fig.14
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P06E3.pdf 01.10.24
Application
fp 0 0.2 0.5
Fig.15 (a) IF Output Impedance of the Tuner
Fig.15 (b) IF Output Impedance of the Tuner
Fig.15 (c) IF Output Impedance of the Tuner
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P06E3.pdf 01.10.24
Application
4-2. Application Circuit
4-2-1. Preamplifier System
Group Delay Time
100nsec.
1.1µH
0.75µH
Fig.17 Relation between the Terminating Impedance and the Ripple of the Group Delay Time Characteristic (Parallel tuning)
Group Delay Time 100nsec.
Tuner VIF 1 chip IC
Fig.16 Preamplifier System
0.68µH
Fig.18 Relation between the Terminating Impedance and the Ripple of the Group Delay Time Characteristic (Series Tuning) 14
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P06E3.pdf 01.10.24
Application
SAW Filter
VIF IC
Fig.19
eigm Rc R1
SAW Filter R2 Rin
Where Rc : Output resistance of Q Rin : Input resistance of VIF IC
Rs eigmRs SAW Filter RL V
Fig.20
20log(gm
23dB 20dB
Fig.21 Relation between the Total Voltage Gain and RL / RS
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P06E3.pdf 01.10.24
Application
Transformation Ratio n1:n2
Transformation Ratio(C1+C2):C1 C1
n1 n2 (a) (b) C2
Fig.23 Transformation Circuits
Tuner
Fig.22 A Circuit Using a Low-impedance SAW Filter in the Preamplifier System
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Application
4-2-2. Postamplifier System
Tuner
VIF 1chip IC
Fig.24
Tuner Noise Figure Ft Gain Gt
SAW Filter Ff Gf
Post Amplifier Fa Ga
VIF IC Fv
Fig.25
0 2 Noise Figure of System F(dB) 4 6 8 10 12 14
Tuner Gf Ff
SAW Filter
Constant 2 4 6 8 10 12 14 16 18 20 22 24
Power Loss of SAW Filter (dB)
Fig.26 shows the relation between the power loss of the SAW filter and the noise figure of the total system, with
Fig.26
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Application
Noise Figure of System F(dB)
Power Loss of SAW Filter (dB)
Fig.27
3 Curves Superposed
Power Loss of SAW Filter (dB)
Fig.28
Tuner
VIF 1 chip IC
Fig.29 Use of a High Impedance Type SAW Filter in the Postamplifier System
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Application
4-2-3. Method for the Compensation of the Insertion Loss without Amplifier
Tuner
SAW Filter
High Gain VIF 1 chip IC
Fig.30 Configuration without Amplifier for Compensation of Insertion Loss
Tuner
SAW Filter
High Gain VIF 1 chip IC
(a) High impedance type
Tuner
SAW Filter
High Gain VIF 1 chip IC
(b) Low impedance type
Fig.31
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5 Appendix
5-1. Two Detection Methods and the Specification of the Surface Acoustic Wave Filter
There are two detection methods for the 1 chip IC of the VIF, which are shown in Fig.32 (a) and (b). Both methods adopt the LLD (Low Level Detector), of a synchronous detection method. In (a) the intercarrier type sound IF detection and video detection are performed by the same detector, but in (b) they are separated. In (b) the signal is divided in two, one is supplied to the sound IF detector and another is supplied to the video detector through the sound carrier trap. In (a) there is the problem of the 920kHz beat (c-s). we can not increase excessively the level of the sound carrier, so that sound carrier attenuation of the SAW filter should be required of the order of 18dB to 24dB from the peak. On the other hand, in the method (b), since a sound carrier trap is inserted before the video detector, there is no problem of 920kHz beat. In this case, in order to increase the output of the sound IF, sound carrier attenuation of the SAW filter should be required to have the order of l0dB to 18dB from the peak. As a result there are two required frequency characteristics of SAW filter (especially the attenuation at the sound carrier frequency) depending upon the type of IC used (detection method used).
VIF IC Detector stage Amplifier Input Synchronous Detector Video Output Sound IF Output Carrier Limit
(a) Sound Carrer Trap
VIF IC Detector stage Synchronous Detector Video Output Carrier Limit Sound IF Output Synchronous Detector
Input
Fig.32 Two Detection Methods
5-2. TTE and Direct Breakthrough
Suppose the TTE and the direct breakthrough are not sufficiently suppressed, there will be a superposition of signals with time delay (or advance) upon the main signal, producing as a result ghost troubles upon the picture of the television set. For the TTE, since its delay is 2 sec. with regard to the main signal, the ghost will appear at the right side, and for the direct breakthrough, the ghost will appear at the left side due to its sec. advance(). Whether TTE and direct breakthrough are suppressed sufficiently can be observed by the amplitude characteristics and the group delay time characteristics of the VIF stage. In other words, as TTE or direct breakthrough interferences with the main signal, to result in periodic ripples in the amplitude characteristics and group delay time characteristics, the suppression of the TTE and direct breakthrough can be inferred from magnitude of the ripples. The ripple period is 1 / 2 Hz when caused by the TTE, and 1 / Hz when caused by the direct breakthrough. Thus, we can imagine roots of ripple by seeing the period of ripples. For example, in case of SAFGN58M7VH0Z00B03 is approximately 1.0µsec., and thus the period of the ripples due to TTE is
See Fig.12
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Appendix
approximately 500kHz. High level of direct breakthrough makes not only the ripples in the group delay time and amplitude but also the trap depths reduction as shown in Fig.33, with deterioration in the attenuation level outside the pass band. As described previously TTE level can be suppressed to less than -40dB by increasing the power loss to a value larger than 18dB, by means of the mismatching. On the other hand, the level of the direct breakthrough is influenced by the printed circuit layout. The causes of the direct breakthrough can be classified in 3 items: - Electrostatic causes like stray capacitance, etc. - Electromagnetic inductions due to the currents passing through the printed pattern - Due to the residual resistance of the common ground.
0 10 20 Attenuation (dB) 30 40 50 60 70 47.0 52.0 57.0 Frequency (MHz) (a) Frequency characteristics when the direct breakthrough is sufficiently suppressed 62.0
1800 1600 1400 1200 1000 800 600 400 67.0 Group delay time (nsec.) Group delay time (nsec.)
1800 1600 1400 1200 1000 800 600 400 52.0 57.0 Frequency (MHz) (b) Frequency characteristics when the direct breakthrough is not suppressed 62.0 67.0
With regard to the electrostatic causes, the printed Input / Output patterns should be made sufficiently small and short, VIF stage including VIF IC, SAW filter etc. should be shielded from other stage, In many cases, the design of the earth pattern has an important influence upon the direct breakthrough level. In conventional LC filters, every free space on the printed circuit board is filled as much as possible with earth pattern, which is mutually connected wherever possible. However, this configuration is not suited for the case of the SAW filter. This configuration creates many earth path loops, and the currents passing through these loops often make the coupling between the input and output. Due to same reasons, the earth position of the bypass capacitor of the amplifier for insertion loss compensation must be selected with special care. When designing the pattern of the printed circuit, it is recommendable to prepare initially a provisional pattern, and then cut some of the many earth path by means of the cut and try method, until minimizing the bottom level outside the pass band. Fig.34 shows the frequency characteristic of the video detector output when the direct breakthrough is sufficiently suppressed, and when the suppression is not sufficient, respectively. In Fig.34 (a) , since the direct breakthrough is sufficiently suppressed, only the small TTE ripple with 1 / 2 period exists. In Fig.34 (b) there is a superposition of the double period ripple caused by the direct breakthrough upon the TTE ripple, and as result large ripple and small ripple appear alternatively.
10 20 Attenuation (dB) 30 40 50 60 70 47.0
Fig.33
Detector Output (DC)
Frequency (a)
Detector Output (DC)
Frequency (b)
Fig.34 21
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Appendix
5-3. Impedance of the Surface Acoustic Wave Filter
So far, the discussions related to the impedance of the SAW filter refer to the equivalent circuit of Fig.12 with the value of the resistor and the capacitor considered as constant value. However, the values of both capacitor and resistor present a frequency dependence. For example, Fig.35 and 36 present the frequency characteristics of Rpi, Cpi and Rpo and Cpo of SAFGN58M7VH0Z00B03. The input side (Rpi, Cpi) and the output side (Rpo, Cpo) present different frequency characteristics due to the difference of the IDT. While output the IDT is of normal electrode of the constant overlap and constant pitch, the input IDT is of the apodized (weighted) one. The measurement result of the input impedance of SAFGN58M7VH0Z00B03 including the series tuning coil plotted in a Smith chart is shown in the dotted line of Fig.37 (Since SAFGN58M7VH0Z00B03 is a high impedance type filter, it is tuned in series in order to lower its impedance to around 75). For the purpose of reducing the return loss of mismatching and the remarkable change in the frequency characteristic by the direct connection of the tuner output and the SAW filter, it is necessary to minimize the variation of the impedance of SAW filter including matching network from 75. One action is adding a resistor as shown in Fig.38 which is effective to adjust input impedance of SAW filter constant. Solid line of Fig.37 shows the impedance characteristic when the resistor is added and we can see variation from 75 become small. However, In this case, the power consumed by the attached resistor increases the loss. We have said at 4-1-2 that it is a problem that tuner output impedance varies much with frequencies in case of the direct connection of tuner and SAW filter. The connection can be easily made if impedance of SAW filter is adjusted constant by means of this method.
15.0 Rpi Cpi 15.0
10.0 Rpi (k)
10.0 Cpi (pF) Cpi
5.0 Rpi
Frequency (MHz)
Fig.35
15.0 Rpo Cpo
10.0 Rpo (k)
10.0 Cpo (pF)
5.0 Cpo Rpo
Frequency (MHz)
Fig.36
Fig.37 22
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Appendix
Fig.38 Impedance Adjustment by Means of the Resistor R
Fig.39
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Appendix
5-4. Reliability Test
Surface acoustic wave filter should be used carefully not to exceed the maximum rating shown in Table 3 below. Murata performs periodic reliability tests for the SAW filter. The conditions of them are shown in Table 4. The data of SAFGN58M7VH0Z00B03 are shown in Fig.40, which shows that the variation is small enough compared to the limit. (Table 5).
Items DC Voltage Pulse Voltage Input Signal Voltage Operating Temperature Storage Temperature Maximum Rating 10V 150V / 200pF 5Vp-p -20 - +60°C. -40 - +85°C.
High Temperature Test Low Temperature Test
Table 4 Reliability Test Conditions
Table 3 Maximum Ratings
Table 5 Limit
High Temperature Test 85°C
Pressure Cooker Test 120°C 2 atm
Thermal Stress Test -55°C +85°C
1000 (hrs.)
48 (hrs.)
100 (cycle)
+0.5 fp (dB) fc (dB) fs (dB)
Fig.40 Reliability Test Result of SAFGN58M7VH0Z00B03
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Appendix
5-5. Notice (handling)
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Note:
1. Export Control For customers outside Japan Murata products should not be used or sold for use in the development, production, stockpiling or utilization of any conventional weapons or mass-destructive weapons (nuclear weapons, chemical or biological weapons, or missiles), or any other weapons. For customers in Japan For products which are controlled items subject to the "Foreign Exchange and Foreign Trade Law" of Japan, the export license specified by the law is required for export.
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Cat. No. P06E-3
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