QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Interface Regis

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Interface Regis

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QS29FCT52T, 53T, 2052T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS 8-Bit Interface Register Transceivers
DESCRIPTION
QS29FCT52T QS29FCT53T QS29FCT2052T
function compatible Am2952/3 29FCT52/53 29FCT52/53T Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, ZIP, SOIC, QSOP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 2952T, 2953T JEDEC-FCT spec compatible speed grades with 5.5ns 64mA Ind., 48mA Mil. FCT-T 2052T Built-in series resistor outputs reduce reflection other system noise speed grades with 5.5ns speed guaranteed with 50pF loads
QS29FCT52/53T 8-bit high-speed CMOS TTL-compatible registered transceivers with three-state outputs that ideal driving high capacitance loads such memory address buses. QS29FCT2052T device resistor output version useful driving transmission lines reducing system noise. FCT2052 series part replace FCT52/FCT53 series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression, will load active when removed from device.
Figure Functional Block Diagram
(FCT2052 Only) Inverting Outputs 29FCT53 Only (Non-inverting Outputs 29FCT52)
REGISTER REGISTER
(FCT2052 Only)
MDSL-00001-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS29FCT52T, 53T, 2052T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name A7-A0 B7-B0
Description
Register Clock Input Register Clock Input
Register Clock Enable Register Clock Enable Output Enable, Reg. Output Enable, Reg.
QUALITY SEMICONDUCTOR, INC.
MDSL-00001-04 DECEMBER 1998
QS29FCT52T, 53T, 2052T Table Function Tables
Inputs Outputs A7-A0 B7-B0 Hi-Z Reg. Hi-Z Reg. Hi-Z Hi-Z
Reg. Reg.
Inputs
Outputs A7-A0 B7-B0 Hold Load Hold Load Hold Hold Load Load
Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage this device resulting functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 1-11, 13-23 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 24-pin package.
MDSL-00001-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS29FCT52T, 53T, 2052T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCTXXX) Current Drive (FCT2XXX Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2XXX Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Max., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min., Min., Min., Min., -12mA (MIL) -15mA (IND) 48mA (MIL) 64mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.55 0.55 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2XXX
QUALITY SEMICONDUCTOR, INC.
MDSL-00001-04 DECEMBER 1998
QS29FCT52T, 53T, 2052T Table Power Supply Characteristics
Symbol QCCD Parameter Quiescent Power Supply Current Supply Current Input HIGH Supply Current Input Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs Open Enabled Toggling Duty Cycle Other Inputs VCC(3,4) 0.25 Unit
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00001-04 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS29FCT52T, 53T, 2052T Table Switching Characteristics Over Operating Range
Industrial -40°C 70°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. Military -55°C 125°C, 5.0V ±10%
52/53A 2052A Symbol tPHL tPLH tPHL tPLH tPZH tPZL tPZH tPZL tPHZ tPLZ tSCE tHCE Description Propagation Delay(1) 52/53 Propagation Delay(1) 2052 Output Enable Time(1) 52/53 Output Enable Time(1) 2052 Output Disable Time(1,2) Data Setup Time Data Hold Time Clock Enable Setup Time, Clock Enable Hold Time, 10.5 10.5
52/53B 2052B
52/53C 2052C Unit
Clock Pulse Width(2) HIGH
Notes: Minimums guaranteed tested. This parameter guaranteed design tested. Test Circuit Waveforms.
QUALITY SEMICONDUCTOR, INC.
MDSL-00001-04 DECEMBER 1998

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Interface Regis

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