Author: Wayne Austin SP720, SP721, SP723, SP724 protection with array
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1000-4-2 Immunity Transient Current Capability SP72X Series Protection Arrays
Author: Wayne Austin SP720, SP721, SP723, SP724 protection with array SCR/Diode bipolar structures over-voltage protection sensitive input circuits. They have protection SCR/Diode device structures input. SP720 supplied lead SOIC packages total available inputs that used protect external signal lines. SP721 SP723 devices with same protection structures have same package options. SP723 dual cell structures each input achieve substantially improved Transient Current capability. SP724 four section array 6-lead SOT-23. cell structure been redesigned improved immunity. structures designed fast triggering threshold +VBE diode threshold above (positive supply terminal) -VBE diode threshold below V(negative ground). clamp activated each protection input transient pulse causes input increased voltage level greater than above similar clamp activated negative pulse, less than applied input. Various standards testing capability semiconductor products have been developed recent years. Each standard generated with regard specific need related electromagnetic compatibility system environment. They include Human Body Model (HBM), Machine Model (MM) Charged Device Model (CDM). Each such standard relates nature electrostatic discharge generated within system application potential damage these better known standards, actual results tests SP720 SP721 follows: Human Body Model using modified version MIL-STD-883, Method 3015.7; with grounded discharge applied each individual Passed test levels from ±9kV ±16kV (1kV steps). Human Body Model using MIL-STD-883, Method 3015.7 (with only grounded) discharge applied each individual Passed test levels ±6kV, failed ±7kV (1kV steps). Machine Model using EIAJ IC121 discharge applied pins with others grounded Passed test levels ±1kV, failed ±1.2kV; (200V steps). Human Body Model using 1000-4-2 standard with grounded discharge applied each individual Passed test Level SP723 capability surpasses those SP720 SP721 meets Level requirements 1000-4-2 standard.
1000-4-2 Standard
more recent standards developed (International Electrotechnical Commission) 1000-4-2. document relates encompasses range normal environmental conditions. Testing immunity more broadly defined include device, equipment system. Both direct contact discharge methods testing used with four discrete steps severity level ranging 15kV respectively. simplest form, Figure test circuit provides means charging 150pF capacitor, through charge switch discharging pulses through resistor, discharge switch Equipment Device Under Test (EUT, DUT) under test.
/Title (AN96 /Subject (IEC 10004-2 Immunity Transient Current Capability SP72X Series Protection Arrays /Autho /Keywords (IEC 10004-2 Immunity Transient
CHARGE SWITCH 50-100M
DISCHARGE SWITCH 150pF
FIGURE SIMPLIFIED 1000-4-2 TEST ENERGY SOURCE
test equipment 1000-4-2 standard constructed provide equivalent actual human body discharge waveform shown Figure
CURRENT 100% 30ns 60ns 30ns 60ns
IPEAK
TIME
FIGURE TYPICAL WAVEFORM OUTPUT CURRENT GENERATOR SPECIFIED 1000-4-2 STANDARD
1-800-999-9445 1-847-824-1188 Copyright
10-61
Littelfuse, Inc. 1999
Application Note 9612
1000-4-2 severity level testing defined stepping High Voltage rather than changing discharge components. severity levels separately defined plus minus polarity direct contact discharge (preferred) discharge shown Table Other voltage levels specified 1000-4-2 test equipment conditions.
TABLE 1000-4-2 SEVERITY LEVELS LEVEL TEST VOLTAGE, CONTACT DISCHARGE TEST VOLTAGE, DISCHARGE STRESS LEVELS
general, SP720 SP721 have capability withstand Level direct contact discharge test conditions defined 1000-4-2 standard. Table pins SP720 four SP721 devices were tested Discharge Capability passed without failures 16.5kV. This better than 1000-4-2 standard Level severity requirements. SP723 tested using same conditions given SP720 SP721.
TABLE SP720 TESTS 1000-4-2 STRESS LEVELS USING DIRECT CONTACT DIRECT CONTACT DISCHARGE VOLTAGE LEVELS EACH DIRECT CONTACT DISCHARGE VOLTAGE LEVELS EACH
Devices Tested Pass Pass Pass Fail
subsystem component, SP720, SP721 SP723 used board module interface protection. typical application, Protection Arrays would used protect more sensitive circuits line interface input terminals board module. Normally, circuit configuration Figure recommended protect sensitive inputs which relates 1000-4-2 definitions equipment, systems, subsystems peripherals. determine capability Protection Arrays protect active circuit, Protection Arrays were tested single devices. Following conditions 1000-4-2 specification, both direct contact discharge tests were performed.
5.5V, Devices Tested Pass Pass Pass Pass Fail Remaining Fail
15V, Devices Tested Pass Pass Pass Pass Fail Remaining Fail
TABLE SP721 TESTS 1000-4-2 STRESS LEVELS USING DIRECT CONTACT STRESS LEVELS DIRECT CONTACT DISCHARGE VOLTAGE LEVELS EACH DIRECT CONTACT DISCHARGE VOLTAGE LEVELS EACH
SYSTEM SUBCIRCUIT MODULE SUPPLY
5.5V, Devices Tested
SIGNAL INPUT ACTIVE CIRCUIT
Pass Pass Pass
Pass Fail Remaining Fail
SP720
SUPPLY
CELLS
TABLE SP720 SP721 TESTS 1000-4-2 STRESS LEVELS USING DISCHARGE STRESS LEVELS DISCHARGE VOLTAGE LEVELS EACH DISCHARGE VOLTAGE LEVELS EACH
FIGURE PROTECTION CELL SP720 SHOWN PROTECTION INTERFACE CIRCUIT
15V, SP720, SP721 Devices Tested Pass Pass Pass Pass Pass Pass Pass Pass
1000-4-2 Test Evaluation
Direct Contact Discharge Capability
Ground, (varied) 25oC, single pulse testing done each SP720 SP721. results shown Tables
SP723 tested using same conditions given SP720 SP721.
10-62
Application Note 9612
Table shows results direct contact discharge Table show SP723 capability discharge. Where each SP723 input dual input structure equal SP720 SP721 which pass Level discharge conditions, capability SP723 will exceed that wide margin testing done test equipment limitations.
TABLE SP723 TESTS 1000-4-2 STRESS LEVELS USING DIRECT DISCHARGE STRESS LEVELS DIRECT DISCHARGE DIRECT DISCHARGE VOLTAGE LEVELS VOLTAGE LEVELS EACH EACH
Multiple Input Test Evaluation
While SP723 would preferred choice extend range protection, using more input pins SP720 SP721 also increases range immunity. example, connecting adjacent SP720 pins parallel using dual combinations 1+2, 3+4, 5+6, 7+9, 10+11, 12+13 14+15, 1000-4-2 voltage capability increased better than ±9kV. (The ±9kV level equipment limited maximum voltage.)
Peak Current Capability
While primary purpose SP720, SP721 SP723 protection, there implied need surge current immunity some circuit applications. noted high peak currents recorded during testing (Table expected that peak transient current capability rises sharply width current pulse narrows. Destructive testing done fully evaluate device ability withstand wide range peak current pulses time. circuit used generate current pulses shown Figure test circuit Figure shown with positive pulse input would apply SP720. negative pulse input, current pulse input goes SP720 `IN' input current pulse input goes SP720 pin. Vsupply SP720 must allowed float. (i.e., tied ground reference current pulse generator.)
VARIABLE TIME DURATION CURRENT PULSE GENERATOR CURRENT SENSE SP720 VOLTAGE PROBE TYPICAL ADJ. 10V/A TYPICAL 100µF
15V, Devices Tested Pass Pass
TABLE SP723 1000-4-2 STRESS LEVEL CAPABILITY USING DISCHARGE STRESS LEVELS DISCHARGE VOLTAGE LEVELS EACH DISCHARGE VOLTAGE LEVELS EACH
Results based SP720, SP721 Data Pass Pass
Measured Peak Current Direct Discharge Testing
Verification peak current calibration during testing direct contact discharge done Tests Table measured peak currents occurs discharge occurs 30ns shown Figure verified results shown below Table These test levels conform 1000-4-2 standard requirement peak current within ±10%.
TABLE SP720 TESTS 1000-4-2 VOLTAGE LEVELS PEAK CURRENT 0.7ns RISE TIME, MEASURED +7.5A +15A -16A +22A -22A +34A -34A PEAK CURRENT 0.7ns RISE TIME, STANDARD ±7.5A ±15A ±22.5A ±30A
LEVEL Level Level Level Level Level plus
VOLTAGE +2kV -2kV +4kV -4kV +6kV -6kV +8kV -8kV +9kV -9kV
FIGURE TYPICAL SP720 PEAK CURRENT TEST CIRCUIT WITH VARIABLE PULSE WIDTH INPUT
level measured (instead 8kV) verify extended range level performance, which limit test equipment. linear increase beyond specified standard would equivalent 33.75A 9kV. 10-63
Figure shows connected curve each point overstress defined increased leakage SP720 well over published limits data sheet. Using similar connection test circuit configuration, SP723 capability shown same curve. SP723 curve supply shows capability peak current 10µs pulse peak current pulse. complete curve single pulse time second shown.
Application Note 9612
PEAK CURRENT 0.001 0.01 PULSE WIDTH TIME (ms) 1000
CAUTION: SAFE OPERATING CONDITIONS LIMIT MAXIMUM PEAK CURRENT GIVEN PULSE WIDTH GREATER THAN VALUES SHOWN EACH CURVE. SP720 STRESS CURVES SP723 STRESS CURVE
SUPPLY
FIGURE SP720 SP723 TYPICAL SINGLE PULSE PEAK CURRENT CURVES SHOWING MEASURED POINT OVERSTRESS AMPERES PULSE WIDTH TIME MILLISECONDS 25oC)
PEAK CURRENT 0.001 0.01 PULSE WIDTH TIME (ms) 1000 105o 25oC 25oC CAUTION: SAFE OPERATING CONDITIONS LIMIT MAXIMUM PEAK CURRENT GIVEN PULSE WIDTH GREATER THAN VALUES SHOWN EACH CURVE. SUPPLY SP721 STRESS CURVES SP723 STRESS CURVE
FIGURE SP721 SP723 TYPICAL SINGLE PULSE PEAK CURRENT CURVES SHOWING MEASURED POINT OVERSTRESS AMPERES PULSE WIDTH TIME MILLISECONDS
10-64
Application Note 9612
Figure shows single pulse peak current capability SP721 105oC ambient temperature conditions. SP721 package version SP720 otherwise same short pulse width peak current capability. SP721 curve 25oC shown comparison. reduction maximum peak current attributed increase ambient temperature from 25oC 105oC typically 10%. overall effect increased chip temperature, whether ambient temperature increase current induced dissipation, reduce peak current ratings. maximum rated operating ambient temperature both SP720 SP721 105oC.
Other Transient Conditions
Conducted Susceptibility Transients
Conducted Susceptibility Transients test defined automotive J1113 standard. waveform used test devices simulates transient caused parallel series inductive load when supply current switched off. Figure illustrates pulse waveforms generated Schaffner 5000 Transient Pulse Test Generator used test SP720. purposes this test, Test Pulse were applied while voltage SP720 ground. Destructive level testing room temperature conducted with single 200µs pulse while applying transient signal each input pin. should noted that width 200µs pulse defined turn-on levels. sourced voltage from generator, varied while peak current monitored.
Multiple Input Peak Current Test Evaluation
Uniformity design processing SP720 provides capability multiple pins added input protection. very short pulse test capability dual pins approximately twice peak current single pin. However, 100ms 1000ms pulses, dual peak current stress capability decreases, approaching that single level. longer pulse condition limited heat capacity chip eventually forces more rapid increase chip temperature.
Test Results Single Testing
consecutive pulses were applied second rate verify transient capability each input. determined that levels +5.5A were sufficient damage inputs. Peak current levels (+6.5V)
V(GND) PEAK; REF. PEAK; REF. V(GND) SP720 TEST CONDITIONS: TRANSIENT PEAK VOLTAGE, VARIED TRANSIENT SOURCE IMPEDANCE 200µs 80V/µs 0.5s TIME BETWEEN SUPPLY SWITCH PULSE (TYPICALLY 100µs)
FIGURE TRANSIENT INDUCTIVE DISCHARGE VOLTAGE TIME WAVEFORMS APPLIED SP720 INPUT `IN' PINS. WAVEFORM APPLIED PARALLEL WITH INDUCTIVE LOAD BOTTOM WAVEFORM APPLIED SERIES CONNECTED POWER TURN-OFF (REF. J1113 STANDARD)
10-65
Application Note 9612
(-6V) were found marginal safe level single pulses applied inputs. SP723 Test Results: short circuit current marginal point overstress room temperature determined Positive Surge Polarity (upper unit): Typically greater than 9.8A Typically greater than 9.5A Typically greater than Negative Surge Polarity (lower unit): Typically greater than 11.7A Typically greater than 11.1A Typically greater than 10.6A previously noted, sustained safe peak current levels should more than point overstress. higher ambient temperature maximum rated conditions 105oC, allowed maximum peak current should further reduced least 10%.
CHARGING RESISTOR ENERGY STORAGE CAPACITOR RS1, PULSE SHAPING RESISTORS RISETIME SHAPING INDUCTOR
Test Results Double Testing
determined that paralleling input pins will permit twice single current capability. Sustained testing rate done after paralleling pins 1+2, 6+7. results +10A, 200µs positive transient current pulse were:
PINS PARALLEL Device Failed Device Failed 1150 3500 5600 Pulses Pulses
Sustained safe peak current levels should more than point overstress. higher ambient temperature maximum rated conditions 105oC, allowed maximum peak current should further reduced least 10%.
SP720 SP723 Surge Immunity Test Capability 8/20µs Short Circuit Conditions 1000-4-5
While 1000-4-5 standard that generally implies higher levels power than recommended SP720 SP723, testing done determine comparable level capability. test circuit conditions 8/20µs short circuit current pulse shown Figures should noted that 8/20µs pulse defined 20µs wide from delayed turn-on turn-off. SP720 Test Results: short circuit current marginal point overstress room temperature determined Positive Surge Polarity (upper unit): Typically greater than Typically greater than 4.8A Typically greater than 4.2A Negative Surge Polarity (lower unit): Typically greater than 5.8A Typically greater than 5.8A previously noted, paralleling pins SP720 will increase current capability approximately twice that single pin.
HIGH VOLTAGE
FIGURE CIRCUIT DIAGRAM GENERATOR 8/20µs PULSE WAVEFORM
CURRENT
FRONT TIME: 1.25xt ±20% TIME HALF VALUE: 20µs ±20%
TIME
<30%
FIGURE WAVE SHAPE 8/20µs SHORT CIRCUIT CURRENT PULSE 60-1
10-66
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