QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffer/Line Dri

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QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffer/Line Dri

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QS54/74FCT540T, 541T, 2540T, 2541T
QUALITY SEMICONDUCTOR, INC.
High-Speed CMOS 8-Bit Buffer/Line Drivers
DESCRIPTION
QS54/74FCT540T QS54/74FCT541T QS54/74FCT2540T QS54/75FCT2541T
function compatible 74F540/541 74FCT540/541 74ABT540/541 Industrial temperature -40°C 85°C CMOS power levels: <7.5mW static Available DIP, SOIC, QSOP, ZIP, HQSOP Undershoot clamp diodes inputs TTL-compatible input output levels Ground bounce controlled outputs Reduced output swing 0-3.5V Military product compliant MIL-STD-883, Class FCT-T 540T, 541T JEDEC-FCT spec compatible Std. thru speed grades with 4.1ns 64mA Ind., 48mA Mil. FCT-T 2540T, 2541T Built-in series resistor outputs reduce reflection other system noise Std. thru speed grades with 4.1ns 12mA Ind.
FCT540T FCT541T 8-bit buffer/line drivers with three-state outputs that ideal driving high-capacitance loads memory address data buses. FCT2540 FCT2541 resistor output versions useful driving transmission lines reducing system noise. 2540 series parts replace series reduce noise existing design. inputs have clamp diodes undershoot noise suppression. outputs have ground bounce suppression (see Application Note AN-001), outputs will load active when removed from device.
Figure Functional Block Diagram
FCT540/2540
FCT541/2541
A0(2) A1(3) A2(4) A3(5)
Y0(18) Y1(17) Y2(16) Y3(15)
A4(6) A5(7) A6(8) A7(9)
Y4(14) Y5(13) Y6(12) Y7(11)
A0(2) A1(3) A2(4) A3(5)
Y0(18) Y1(17) Y2(16) Y3(15)
A4(6) A5(7) A6(8) A7(9)
Y4(14) Y5(13) Y6(12) Y7(11)
MDSL-00020-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT540T, 541T, 2540T, 2541T Figure Configurations (All Pins View)
PDIP, SOIC, QSOP, HQSOP
Table Description
Name A7-A0 Y7-Y0 OE1, Description Data Inputs Data Outputs Output Enable
Table Function Table
Input Output Hi-Z Hi-Z Output Hi-Z Hi-Z Function Disable Outputs Enable Outputs
QUALITY SEMICONDUCTOR, INC.
MDSL-00020-05 DECEMBER 1998
QS54/74FCT540T, 541T, 2540T, 2541T Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V 7.0V Output Voltage VOUT -0.5V 7.0V Input Voltage -0.5V 7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Diode Current with VOUT -50mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° 150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance(1)
25°C, 1MHz, VOUT Pins(2) 2-9, 11-18 SOIC QSOP PDIP Unit
Notes: Capacitance characterized tested. reference 20-pin package.
Table Power Supply Characteristics
Symbol
Parameter
Quiescent Power Supply Current
Test Conditions(1) Max., freq 0.2V VCC-0.2V Max., 3.4V, freq 0(2) Max., Outputs open enabled toggling duty cycle Other inputs VCC(3,4)
0.25
Unit
QCCD
Supply Current Input HIGH Supply Current Input
Notes: conditions shown Min. Max., appropriate values specified under specifications. driven input (VIN 3.4V). flip-flops, QCCD measured switching data input pins that output changes every clock cycle. This measurement device power consumption only does include power drive load capacitance tester capacitance. This parameter guaranteed design tested. computed using above parameters explained Technical Overview section.
MDSL-00020-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.
QS54/74FCT540T, 541T, 2540T, 2541T Table Electrical Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Input Hysteresis Input Current Input HIGH Off-State Output Current (Hi-Z) Short Circuit Current (FCTXXX) Current Drive (FCT2XXX Input Clamp Voltage Output HIGH Voltage Output Voltage (FCTXXX) Output Voltage (FCT2XXX Test Conditions Logic HIGH Inputs Logic Inputs VTLH VTHL Inputs Max., Max., Max., VOUT GND(2,3) Min., VOUT 2.0V(3) Min., -18mA, 25°C(3) Min. Min. Min. Min. -12mA (MIL) -15mA (IND) 48mA (MIL) 64mA (IND) 12mA (MIL) 12mA (IND) 12mA (MIL) 12mA (IND) Military -55°C 125°C, 5.0V ±10% Typ(1) -0.7 -1.2 Unit
0.55 0.55 0.50 0.50
Notes: Typical values indicate 5.0V 25°C. more than output should shorted duration second. These parameters guaranteed design tested.
Output Resistance (FCT2XXX
QUALITY SEMICONDUCTOR, INC.
MDSL-00020-05 DECEMBER 1998
QS54/74FCT540T, 541T, 2540T, 2541T Table Switching Characteristics Over Operating Range
Industrial -40°C 85°C, 5.0V CLOAD 50pF, RLOAD unless otherwise noted. QSFCT540/2540 540A 2540A Symbol tPLH tPHL tPZH tPZL tPLZ tPHZ Description(1) Propagation Delay Output Enable Disable Time IND(2) MIL(2) Military -55°C 125°C, 5.0V ±10%
540C Unit
Notes: Minimum propagation delay values guaranteed tested. This parameter guaranteed tested.
QSFCT541/2541 2541 Symbol tPLH tPHL tPZH tPZL tPLZ tPHZ Description(1) Propagation Delay Output Enable Disable Time IND(2) MIL(2) 10.5 12.5
541A 2541A
541C 2541C
Unit
Notes: Minimums guaranteed tested. This parameter guaranteed design tested. Test Circuit Waveforms.
MDSL-00020-05 DECEMBER 1998
QUALITY SEMICONDUCTOR, INC.

QUALITY SEMICONDUCTOR, INC. High-Speed CMOS 8-Bit Buffer/Line Dri

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