State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Diss

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State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Diss

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SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Dissipation Protection Exceeds 2000 MIL-STD-883, Method 3015; Exceeds Using Machine Model Typical VOLP (Output Ground Bounce) 25°C High-Drive Outputs (-32-mA IOH, 64-mA IOL) Package Options Include Plastic Small-Outline (DW), Shrink Small-Outline (DB), Thin Shrink Small-Outline (PW) Packages, Ceramic Chip Carriers (FK), Ceramic Flat Package, Plastic (NT) Ceramic (JT) DIPs
SN54ABT543A PACKAGE SN74ABT543A PACKAGE (TOP VIEW)
LEBA OEBA CEAB
CEBA LEAB OEAB
description
'ABT543A octal transceivers contain sets D-type latches temporary storage data flowing either direction. Separate latch-enable (LEAB LEBA) output-enable (OEAB OEBA) inputs provided each register permit independent control either direction data flow. A-to-B enable (CEAB) input must enter data from output data from CEAB LEAB low, A-to-B latches transparent; subsequent low-to-high transition LEAB puts latches storage mode. With CEAB OEAB both low, 3-state outputs active reflect data present output latches. Data flow from similar, requires using CEBA, LEBA, OEBA inputs. ensure high-impedance state during power power down, should tied through pullup resistor; minimum value resistor determined current-sinking capability driver. SN54ABT543A characterized operation over full military temperature range -55°C 125°C. SN74ABT543A characterized operation from -40°C 85°C.
SN54ABT543A PACKAGE (TOP VIEW)
OEBA LEBA
CEBA
internal connection
Please aware that important notice concerning availability, standard warranty, critical applications Texas Instruments semiconductor products disclaimers thereto appears this data sheet. EPIC-B trademark Texas Instruments Incorporated.
PRODUCTION DATA information current publication date. Products conform specifications terms Texas Instruments standard warranty. Production processing does necessarily include testing parameters.
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CEAB OEAB LEAB
Copyright 1997, Texas Instruments Incorporated
SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
FUNCTION TABLE INPUTS CEAB LEAB OEAB OUTPUT
A-to-B data flow shown; B-to-A flow control same except that uses CEBA, LEBA, OEBA. Output level before indicated steady-state input conditions were established
logic
OEBA CEBA LEBA OEAB CEAB LEAB 1EN3 2EN4
This symbol accordance with ANSI/IEEE 91-1984 Publication 617-12. numbers shown packages.
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SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
logic diagram (positive logic)
OEBA CEBA LEBA OEAB CEAB LEAB
Seven Other Channels numbers shown packages.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, -0.5 Input voltage range, (except ports) (see Note -0.5 Voltage range applied output high power-off state, -0.5 Current into output state, SN54ABT543A SN74ABT543A Input clamp current, Output clamp current, Package thermal impedance, (see Note package 104°C/W package 81°C/W package 67°C/W package 120°C/W Storage temperature range, Tstg -65°C 150°C
Stresses beyond those listed under "absolute maximum ratings" cause permanent damage device. These stress ratings only, functional operation device these other conditions beyond those indicated under "recommended operating conditions" implied. Exposure absolute-maximum-rated conditions extended periods affect device reliability. NOTES: input output negative-voltage ratings exceeded input output clamp-current ratings observed. package thermal impedance calculated accordance with EIA/JEDEC JESD51, except through-hole packages, which trace length zero.
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SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
recommended operating conditions (see Note
SN54ABT543A Supply voltage High-level input voltage Low-level input voltage Input voltage High-level output current Low-level output current Input transition rise fall rate Outputs enabled SN74ABT543A UNIT ns/V
Operating free-air temperature NOTE Unused pins (input I/O) must held high prevent them from floating.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS Vhys IOZH IOZL Ioff ICEX ports Control inputs ports Outputs high Outputs high Outputs Outputs disabled -50* -100 ±100 ±100 -180* 250* 250* -200 ±100 ±100 ±100 -180 0.55 0.55* 0.55 0.55 25°C -1.2 SN54ABT543A -1.2 SN74ABT543A -1.2 UNIT
ICC# Control inputs ports
input Other inputs
products compliant MIL-PRF-38535, this parameter does apply. typical values parameters IOZH IOZL include input leakage current. This data sheet limit vary among suppliers. more than output should tested time, duration test should exceed second. This increase supply current each input that specified voltage level rather than GND.
POST OFFICE 655303
DALLAS, TEXAS 75265
SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
timing requirements over recommended ranges supply voltage operating free-air temperature (unless otherwise noted) (see Figure
SN54ABT543A 25°C Pulse duration, LEAB LEBA High Data before LEAB LEBA Setup time Data before CEAB CEBA Hold time Data after LEAB LEBA Data after CEAB CEBA High UNIT
timing requirements over recommended ranges supply voltage operating free-air temperature (unless otherwise noted) (see Figure
SN74ABT543A 25°C Pulse duration, LEAB LEBA High Data before LEAB LEBA Setup time Data before CEAB CEBA Hold time Data after LEAB LEBA Data after CEAB CEBA High UNIT
POST OFFICE 655303
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SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
switching characteristics over recommended ranges supply voltage operating free-air temperature, (unless otherwise noted) (see Figure
SN54ABT543A PARAMETER FROM (INPUT) (OUTPUT) 25°C UNIT
tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPZH tPZL tPHZ tPLZ
LEBA LEAB OEBA OEAB OEBA OEAB CEBA CEAB CEBA CEAB
This data sheet limit vary among suppliers.
switching characteristics over recommended ranges supply voltage operating free-air temperature, (unless otherwise noted) (see Figure
SN74ABT543A PARAMETER FROM (INPUT) (OUTPUT) 25°C UNIT
tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPZH tPZL tPHZ tPLZ
LEBA LEAB OEBA OEAB OEBA OEAB CEBA CEAB CEBA CEAB
This data sheet limit vary among suppliers.
POST OFFICE 655303
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SN54ABT543A, SN74ABT543A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
PARAMETER MEASUREMENT INFORMATION
From Output Under Test (see Note Open TEST tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open Open
LOAD CIRCUIT Timing Input Input VOLTAGE WAVEFORMS PULSE DURATION Input tPLH Output tPHL tPHL Output tPLH VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING NONINVERTING OUTPUTS Output Waveform Open (see Note Output Waveform (see Note tPZH VOLTAGE WAVEFORMS SETUP HOLD TIMES Data Input
Output Control tPZL
tPLZ tPHZ VOLTAGE WAVEFORMS ENABLE DISABLE TIMES LOW- HIGH-LEVEL ENABLING
NOTES: includes probe capacitance. Waveform output with internal conditions such that output except when disabled output control. Waveform output with internal conditions such that output high except when disabled output control. input pulses supplied generators having following characteristics: MHz, outputs measured time with transition measurement.
Figure Load Circuit Voltage Waveforms
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DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments subsidiaries (TI) reserve right make changes their products discontinue product service without notice, advise customers obtain latest version relevant information verify, before placing orders, that information being relied current complete. products sold subject terms conditions sale supplied time order acknowledgement, including those pertaining warranty, patent infringement, limitation liability. warrants performance semiconductor products specifications applicable time sale accordance with TI's standard warranty. Testing other quality control techniques utilized extent deems necessary support this warranty. Specific testing parameters each device necessarily performed, except those mandated government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS INVOLVE POTENTIAL RISKS DEATH, PERSONAL INJURY, SEVERE PROPERTY ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). SEMICONDUCTOR PRODUCTS DESIGNED, AUTHORIZED, WARRANTED SUITABLE LIFE-SUPPORT DEVICES SYSTEMS OTHER CRITICAL APPLICATIONS. INCLUSION PRODUCTS SUCH APPLICATIONS UNDERSTOOD FULLY CUSTOMER'S RISK. order minimize risks associated with customer's applications, adequate design operating safeguards must provided customer minimize inherent procedural hazards. assumes liability applications assistance customer product design. does warrant represent that license, either express implied, granted under patent right, copyright, mask work right, other intellectual property right covering relating combination, machine, process which such semiconductor products services might used. TI's publication information regarding third party's products services does constitute TI's approval, warranty endorsement thereof.
Copyright 1998, Texas Instruments Incorporated

State-of-the-Art EPIC-B BiCMOS Design Significantly Reduces Power Diss

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