Fast Read Access Time Power CMOS Operation max. Standby max. Active JE

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Fast Read Access Time Power CMOS Operation max. Standby max. Active JE

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AT27C040
Fast Read Access Time Power CMOS Operation max. Standby max. Active JEDEC Standard Packages 32-Lead 600-mil PDIP 32-Lead 450-mil SOIC (SOP) 32-Lead PLCC 32-Lead TSOP Supply High Reliability CMOS Technology 2000V Protection Latchup Immunity RapidProgramming Algorithm µs/byte (typical) CMOS Compatible Inputs Outputs Integrated Product Identification Code Commercial Industrial Temperature Ranges
Megabit (512K CMOS EPROM
Description
AT27C040 chip low-power, high-performance 4,194,304 one-time programmable read only memory (OTP EPROM) organized 512K bits. AT27C040 requires only power supply normal read mode operation. byte accessed less than eliminating need speed reducing WAIT states high-performance microprocessor systems. Atmel's scaled CMOS technology provides active power consumption, fast programming. Power consumption typically active mode less than standby mode. (continued)
PDIP, SOIC View
Configurations
Name Function Addresses Outputs Chip Enable Output Enable
AT27C040
PLCC View TSOP View Type
0189D
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Description (Continued)
AT27C040 available choice industry standard JEDEC-approved one-time programmable (OTP) plastic PDIP, PLCC, SOIC (SOP), TSOP packages. device features two-line control (CE, eliminate contention high-speed systems. Atmel's AT27C040 additional features ensure high quality efficient production use. RapidProgramming Algorithm reduces time required program part guarantees reliable programming. Programming time typically only µs/byte. Integrated Product Identification Code electronically identifies device manufacturer. This feature used industry standard programming equipment select proper programming algorithms voltages.
System Considerations
Switching between active standby conditions Chip Enable produce transient voltage excursions. Unless accommodated system design, these transients exceed data sheet limits, resulting device non-conformance. minimum, high frequency, inherent inductance, ceramic capacitor should utilized each device. This capacitor should connected between Ground terminals device, close device possible. Additionally, stabilize supply voltage level printed circuit boards with large EPROM arrays, bulk electrolytic capacitor should utilized, again connected between Ground terminals. This capacitor should positioned close possible point where power supply connected array.
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AT27C040
AT27C040
Block Diagram Absolute Maximum Ratings*
Temperature Under Bias -55°C +125°C Storage Temperature. -65°C +150°C Voltage with Respect Ground. -2.0V +7.0V Voltage with Respect Ground -2.0V +14.0V Supply Voltage with Respect Ground. -2.0V +14.0V
*NOTICE: Stresses beyond those listed under "Absolute Maximum Ratings" cause permanent damage device. This stress rating only functional operation device these other conditions beyond those indicated operational sections this specification implied. Exposure absolute maximum rating conditions extended periods affect device reliability. Note: Minimum voltage -0.6V which undershoot 2.0V pulses less than Maximum output voltage 0.75V which overshoot +7.0V pulses less than
Operating Modes
Mode Read Output Disable Standby Rapid Program Verify Inhibit Product Identification
Outputs DOUT High High DOUT High Identification Code
Notes: VIH. Refer Programming characteristics. 12.0 0.5V.
identifier bytes selected. inputs held (VIL), except which which toggled (VIL) select Manufacturer's Identification byte high (VIH) select Device Code byte.
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Operating Conditions Read Operation
AT27C040 Com. Operating Temperature (Case) Ind. Power Supply 70°C -40°C 85°C 70°C -40°C 85°C 70°C -40°C 85°C 70°C -40°C 85°C
Operating Characteristics Read Operation
Symbol IPP1
Parameter Input Load Current Output Leakage Current
Condition VOUT ISB1 (CMOS), 0.3V ISB2 (TTL), 0.5V MHz, IOUT
Units
Read/Standby Current
Standby Current Active Current Input Voltage Input High Voltage Output Voltage Output High Voltage
-0.6 -400
Notes: must applied simultaneously before VPP, removed simultaneously after VPP.
connected directly VCC, except during programming. supply current would then IPP.
Characteristics Read Operation
AT27C040 Symbol tACC
Parameter
Address Output Delay Output Delay Output Delay
Condition
Units
Notes:
High Output Float, whichever occurred first Output Hold from Address, whichever occurred first Waveforms Read Operation.
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AT27C040
AT27C040
Waveforms Read Operation
Notes: Timing measurement references 0.8V 2.0V. Input drive levels 0.45V 2.4V, unless otherwise specified. delayed after falling edge without impact delayed tACC after address valid without impact tACC
This parameter only sampled 100% tested. Output float defined point when data longer driven.
Input Test Waveforms Measurement Levels
Output Test Load
(10% 90%)
Note: including capacitance.
Capacitance MHz, 25°C)
COUT
Note:
Units
Conditions VOUT
Typical values nominal supply voltage. This parameter only sampled 100% tested.
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Programming Waveforms
Notes: Input Timing Reference 0.8V 2.0V VIH. tDFP characteristics device must accommodated programmer.
When programming AT27C040 capacitor required across ground suppress spurious voltage transients.
Programming Characteristics
5°C, 0.25V, 13.0 0.25V Test Conditions VIL, -0.6 -400 11.5 12.5 Limits
Symbol
Parameter Input Load Current Input Level Input High Level Output Voltage Output High Voltage Supply Current (Program Verify) Supply Current Product Identification Voltage
Units
ICC2 IPP2
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AT27C040
AT27C040
Programming Characteristics
5°C, 0.25V, 13.0 0.25V Symbol Parameter Test Conditions* Limits
Units
Rapid Programming Algorithm
pulse width used program. address first location. raised 6.5V raised 13.0V. Each address first programmed with pulse without verification. Then verification/reprogramming loop executed each address. event byte fails pass verification, successive pulses applied with verification after each pulse. byte fails verify after pulses have been applied, part considered failed. After byte verifies properly, next address selected until have been checked. then lowered 5.0V 5.0V. bytes read again compared with original data determine device passes fails.
tDFP tVPS tVCS tPRT
Address Setup Time
tOES Setup Time
Data Setup Time Address Hold Time Data Hold Time High Output Float Delay Setup Time Setup Time Program Pulse Width Data Valid from
Pulse Rise Time During Programming
Conditions Test:
Input Rise Fall Times (10% 90%).20 Input Pulse Levels.0.45V 2.4V Input Timing Reference Level.0.8V 2.0V Output Timing Reference Level.0.8V 2.0V Notes: must applied simultaneously before removed simultaneously after VPP. This parameter only sampled 100% tested. Output Float defined point where data longer driven -see timing diagram. Program Pulse width tolerance µsec
Atmel's 27C040 Integrated Product Identification Code
Pins Codes Manufacturer Device Type
Data
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Ordering Information
tACC (ns) (mA)
Active Standby
Ordering Code AT27C040-80JC AT27C040-80PC AT27C040-80RC AT27C040-80TC AT27C040-80JI AT27C040-80PI AT27C040-80RI AT27C040-80TI AT27C040-10JC AT27C040-10PC AT27C040-10RC AT27C040-10TC AT27C040-10JI AT27C040-10PI AT27C040-10RI AT27C040-10TI AT27C040-12JC AT27C040-12PC AT27C040-12RC AT27C040-12TC AT27C040-12JI AT27C040-12PI AT27C040-12RI AT27C040-12TI AT27C040-15JC AT27C040-15PC AT27C040-15RC AT27C040-15TC AT27C040-15JI AT27C040-15PI AT27C040-15RI AT27C040-15TI
Package 32P6 32P6 32P6 32P6 32P6 32P6 32P6 32P6
Operation Range Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Package Type
32P6
Lead, Plastic J-Leaded Chip Carrier (PLCC) Lead, 0.600" Wide, Plastic Dual Inline Package (PDIP) Lead, 0.450" Wide, Plastic Gull Wing Small Outline (SOIC) Lead, Plastic Thin Small Outline Package (TSOP)
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AT27C040

Fast Read Access Time Power CMOS Operation max. Standby max. Active JE

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