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Zetex Semiconductors ISO/TS169949:2002 FILE A9273 Date: 04/05/200


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Zetex Semiconductors ISO/TS169949:2002 FILE A9273
Date: 04/05/2005
Reliability Test Summary
MAGNETIC SENSOR 14/07/2003 18/12/2003
Device Family Date From: Date
Environmental Trial Data
Trial Type (Autoclave) (Hot Store) (Resistance Solder Heat) SOLDERABILITY (Solderability) (Temperature Cycle Air) (Temperature Humidity Bias) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours: Equivalent Device Hours: Number Devices Tested: Number Devices Failed: Mean Time Failure (Hours): Failure Rate FIT's: Failure Rate %/1000 Hours:
Devices Tested
Devices Failed
Cumulative Hours 12960 226800 136080 136080
Failures 0.000% 0.000% 0.000% 0.000% 0.000% 0.000%
HTOL (High Temperature Operating Life) 136080 1.732E+08 8.565E+07 11.6758 1.168E-03
Copyright 2005 Zetex Semiconductors
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