Reliability Test Summary VIDEO PRODUCT SO14 09/09/2004 25/04/2005
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Date: 04/09/2006 Zetex Semiconductors ISO/TS16949:2002 FILE A9273
Reliability Test Summary
VIDEO PRODUCT SO14 09/09/2004 25/04/2005
0966
Device Family Package: Date From: Date
Environmental Trial Data Trial Type (Autoclave) (Hot Store) RSHF (Resistance Solder Heat Float) (Temperature Cycle Air) (Temperature Humidity Bias) Devices Tested 1200 Devices Failed Cumulative Hours 21600 189000 1233600 202536 Failures 0.000% 0.000% 0.000% 0.083% 0.000%
Electrical Stress Trials
Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours: Equivalent Device Hours: Number Devices Tested: Number Devices Failed: Mean Time Failure (Hours): Failure Rate FIT's: Failure Rate %/1000 Hours: HTOL (High Temperature Operating Life) 376056 1.015E+08 1.108E+08 9.0232 9.023E-04
David Fitton Quality Engineer
Copyright 2006 Zetex Semiconductors
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