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Zetex Semiconductors ISO/TS169949:2002 FILE A9273 Date: 04/0


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Zetex Semiconductors ISO/TS169949:2002 FILE A9273
Date:
04/05/2005
Reliability Test Summary
SUPPLY MONITOR SOT223 05/11/1997 07/10/1999
Device Family Date From: Date
Environmental Trial Data
Trial Type (Autoclave) (Hot Store) (Resistance Solder Heat) (Temperature Cycle Air) (Temperature Humidity Bias) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours: Equivalent Device Hours: Number Devices Tested: Number Devices Failed: Mean Time Failure (Hours): Failure Rate FIT's: Failure Rate %/1000 Hours:
Devices Tested
Devices Faiuled
Cumulative Hours 35640 241920 219240 272160
Failures 0.000% 0.000% 0.000% 0.000% 0.370%
HTOL (High Temperature Operating Life) 272160 3.464E+08 3.781E+08 2.6451 2.645E-04
Copyright 2005 Zetex Semiconductors
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