Zetex Semiconductors ISO/TS169949:2002 FILE A9273 Date: 04/0
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Zetex Semiconductors ISO/TS169949:2002 FILE A9273
Date:
04/05/2005
Reliability Test Summary
STD-PRODUCT ASIC 22/05/1998 19/04/2000
Device Family Date From: Date
Environmental Trial Data Trial Type (Autoclave) (Hot Store) (Resistance Solder Heat) (Temperature Cycle Air) (Temperature Humidity Bias) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours: Equivalent Device Hours: Number Devices Tested: Number Devices Failed: Mean Time Failure (Hours): Failure Rate FIT's: Failure Rate %/1000 Hours: HTOL (High Temperature Operating Life) 181440 2.309E+08 2.520E+08 3.9677 3.968E-04 Devices Tested Devices Failed Cumulative Hours 28992 45360 113400 45360 Failures 0.331% 0.000% 0.000% 0.000% 0.000%
Copyright 2005 Zetex Semiconductors
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