Zetex Semiconductors ISO/TS169949:2002 FILE A9273 Date: 18/04/200
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Zetex Semiconductors ISO/TS169949:2002 FILE A9273
Date: 18/04/2005
Reliability Test Summary
REGULATOR TO92 20/01/2005 20/01/2005
Device Family Date From: Date
Environmental Trial Data
Trial Type (Autoclave) (Hot Store) (Resistance Solder Heat) (Temperature Humidity Bias)
Devices Tested
Devices Failed
Cumulative Hours 7392 77616 77616
Failures 0.000% 0.000% 0.000% 0.000%
Electrical Stress Trials
Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours: Equivalent Device Hours: Number Devices Tested: Number Devices Failed: Mean Time Failure (Hours): Failure Rate FIT's: Failure Rate %/1000 Hours: HTOL (High Temperature Operating Life) 232848 2.964E+08 3.234E+08 3.0917 3.092E-04
Copyright 2005 Zetex Semiconductors
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