Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273 D

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Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273 D

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Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273
Date:
20/08/2008
Reliability Test Summary REGULATOR SOT23 SOT23, SOT23F, SOT23-5, SOT23-6 SC70 22/02/2008 24/02/2008
1162
Device Family: Package: Date From: Date
Environmental Trial Data Trial Type (Cold Store) (Hot Store) PCLV (Pre-conditioned Autoclave) (Pre-conditioned Temperature Cycle Air) PTHB (Pre-conditioned Temperature Humidity Bias) Solderability (Post Store) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours Equivalent Device Hours Lots Devices Tested: Devices Failed: Specification JESD22-A119 JESD22-A103 JESD22-A102 JESD22-A104 JESD22-A101 IEC68-2-20 Lots Tested Failed Cumulative Hours 45360 90720 7392 77616 77616 Failures 0.000% 0.000% 0.000% 0.000% 0.000% 0.000%
HTOL (High Temperature Operating Life JESD22-A108) 122976 3.321E+07
Mean Time Failure (Hours): 3.624E+07 Failure Rate FITs: 27.5927 Failure Rate %/1000 Hours: 2.759E-03 Testing Human Body Model Machine Model Charged Device Model
2000V 200V >1000V
David Fitton Quality Engineer
Copyright 2008
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Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273 D

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