Zetex Semiconductors ISO/TS169949:2002 FILE A9273 Date: 04/05/200
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Zetex Semiconductors ISO/TS169949:2002 FILE A9273
Date: 04/05/2005
Reliability Test Summary
REFERENCE SOT223 06/04/1998 10/09/1999
Device Family Date From: Date
Environmental Trial Data
Trial Type (Autoclave) (Hot Store) (Resistance Solder Heat) (Temperature Cycle Air) (Temperature Humidity Bias) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours: Equivalent Device Hours: Number Devices Tested: Number Devices Failed: Mean Time Failure (Hours): Failure Rate FIT's: Failure Rate %/1000 Hours:
Devices Tested
Devices Failed
Cumulative Hours 8640 136080 136080 136080
Failures 0.000% 0.000% 0.000% 0.000% 0.000%
HTOL (High Temperature Operating Life) 226800 2.887E+08 1.427E+08 7.0055 7.005E-04
Copyright 2005 Zetex Semiconductors
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