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Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273 D
Top Searches for this datasheetDiodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273 Date: 20/08/2008 Reliability Test Summary Bipolar products SOT223 SOT223 13/08/2007 12/06/2008 1165 Device Family: Package: Date From: Date Environmental Trial Data Trial Type (Cold Store) (Hot Store) PCLV (Pre-conditioned Autoclave) (Pre-conditioned Temperature Cycle Air) PTHB (Pre-conditioned Temperature Humidity Bias) RSHF (Resistance Solder Heat Float) Solderability (Post Store) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours Equivalent Device Hours Lots Devices Tested: Devices Failed: Specification JESD22-A119 JESD22-A103 JESD22-A102 JESD22-A104 JESD22-A101 JESD22-B106 IEC68-2-20 Lots Devices Tested 7490 Devices Failed Cumulative Hours 90720 45360 7392 77616 77616 7490 Failures 0.000 0.000 0.000 0.000 0.000 0.000 0.000 HTRB (High Temperature Reverse Bias JESD22-A108) 213696 2.720E+08 Mean Time Failure (Hours): 2.968E+08 Failure Rate FITs: 3.3688 Failure Rate %/1000 Hours: 3.369E-04 David Fitton Quality Engineer Copyright 2008 Page Other recent searchesNTE3103 - NTE3103 NTE3103 Datasheet LTC1418 - LTC1418 LTC1418 Datasheet LMC6035 - LMC6035 LMC6035 Datasheet LMC6036 - LMC6036 LMC6036 Datasheet K6F4016V6C - K6F4016V6C K6F4016V6C Datasheet K2461 - K2461 K2461 Datasheet ID051610 - ID051610 ID051610 Datasheet
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