Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273 D
|
|
|
Top Searches for this datasheet
Diodes Zetex Semiconductors Limited ISO/TS16949:2002 FILE A9273
Date:
20/08/2008
Reliability Test Summary Bipolar products SOT223 SOT223 13/08/2007 12/06/2008
1165
Device Family: Package: Date From: Date
Environmental Trial Data Trial Type (Cold Store) (Hot Store) PCLV (Pre-conditioned Autoclave) (Pre-conditioned Temperature Cycle Air) PTHB (Pre-conditioned Temperature Humidity Bias) RSHF (Resistance Solder Heat Float) Solderability (Post Store) Electrical Stress Trials Electrical Trial Type: Service Temperature (Deg Ambient Temperature (Deg Activation Energy (eV): Confidence Level (%): Actual Device Hours Equivalent Device Hours Lots Devices Tested: Devices Failed: Specification JESD22-A119 JESD22-A103 JESD22-A102 JESD22-A104 JESD22-A101 JESD22-B106 IEC68-2-20 Lots Devices Tested 7490 Devices Failed Cumulative Hours 90720 45360 7392 77616 77616 7490 Failures 0.000 0.000 0.000 0.000 0.000 0.000 0.000
HTRB (High Temperature Reverse Bias JESD22-A108) 213696 2.720E+08
Mean Time Failure (Hours): 2.968E+08 Failure Rate FITs: 3.3688 Failure Rate %/1000 Hours: 3.369E-04
David Fitton Quality Engineer
Copyright 2008
Page
Other recent searches
NTE3103 - NTE3103 NTE3103 Datasheet
LTC1418 - LTC1418 LTC1418 Datasheet
LMC6035 - LMC6035 LMC6035 Datasheet
LMC6036 - LMC6036 LMC6036 Datasheet
K6F4016V6C - K6F4016V6C K6F4016V6C Datasheet
K2461 - K2461 K2461 Datasheet
ID051610 - ID051610 ID051610 Datasheet
Privacy Policy | Disclaimer
© 2012 Datasheet Archive
