Description Semicoa Semiconductors offers: Screening processing MIL-PR
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2N6193
Description Semicoa Semiconductors offers: Screening processing MIL-PRF-19500 Appendix level (2N6193J) JANTX level (2N6193JX) JANTXV level (2N6193JV) applicable level 100% visual inspection MIL-STD-750 method 2072 JANTXV Radiation testing (total dose) upon request
Applications
General purpose switching transistor power silicon transistor
Features
Hermetically sealed TO-39 metal Also available chip configuration Chip geometry 9700 Reference document: MIL-PRF-19500/561
Benefits
Please contact Semicoa special configurations www.SEMICOA.com (714) 979-1900 Qualification Levels: JAN, JANTX, JANTXV Radiation testing available
25°C unless otherwise specified
Absolute Maximum Ratings Parameter Collector-Emitter Voltage Collector-Base Voltage Emitter-Base Voltage Collector Current, Continuous Power Dissipation, 25°C Derate linearly above 25°C Thermal Resistance Operating Junction Temperature Storage Temperature Symbol VCEO VCBO VEBO
Rating 5.71 17.5 +200
Unit Volts Volts Volts mW/°C °C/W
TSTG
Copyright 2002 Rev.
Semicoa Semiconductors, Inc.
McCormick Avenue, Costa Mesa, California 92626 714.979.1900, 714.557.4541 Page
www.SEMICOA.com
2N6193
ELECTRICAL CHARACTERISTICS
characteristics specified 25°C
Characteristics Parameter Collector-Emitter Breakdown Voltage Collector-Base Cutoff Current Collector-Emitter Cutoff Current Collector-Emitter Cutoff Current Emitter-Base Cutoff Current Characteristics Parameter Symbol hFE1 hFE2 hFE3 hFE4 VBEsat1 VBEsat2 VCEsat1 VCEsat2 Test Conditions Volts Volts Volts Volts -55°C Symbol V(BR)CEO ICBO1 ICEO ICEX1 ICEX2 IEBO1 Test Conditions Volts Volts 90Volts, 1.5Volts =90Volts, 1.5Volts, 150°C Volts Units Volts
Pulse Test: Pulse Width Duty Cycle 2.0%
Current Gain
Units
Base-Emitter Saturation Voltage Collector-Emitter Saturation Voltage Dynamic Characteristics Parameter Magnitude Common Emitter, Short Circuit Forward Current Transfer Ratio Open Circuit Output Capacitance Open Circuit Input Capacitance Switching Characteristics Delay Time Rise Time Storage Time Fall Time
Volts Volts
Symbol |hFE| COBO CIBO
Test Conditions Volts, Volts, Volts,
1,250
Units
IB1=IB2
Copyright 2002 Rev.
Semicoa Semiconductors, Inc.
McCormick Avenue, Costa Mesa, California 92626 714.979.1900, 714.557.4541 Page
www.SEMICOA.com
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