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FQT5N20L 200V LOGIC N-Channel MOSFET General Description
Top Searches for this datasheetFQT5N20L FQT5N20L 200V LOGIC N-Channel MOSFET General Description These N-Channel enhancement mode power field effect transistors produced using Fairchild's proprietary, planar stripe, DMOS technology. This advanced technology been especially tailored minimize on-state resistance, provide superior switching performance, withstand high energy pulse avalanche commutation mode. These devices well suited high efficiency switching DC/DC converters, switch mode power supply, motor control. Features 1.0A, 200V, RDS(on) @VGS gate charge typical Crss typical Fast switching Improved dv/dt capability level gate drive requirement allowing direct opration from logic drivers SOT-223 Series Absolute Maximum Ratings Symbol VDSS VGSS dv/dt TSTG 25°C unless otherwise noted Parameter Drain-Source Voltage Continuous 25°C) Drain Current Continuous 70°C) Drain Current Pulsed (Note FQT5N20L (Note (Note (Note (Note Units V/ns W/°C Gate-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation 25°C) 0.25 0.02 +150 Derate above 25°C Operating Storage Temperature Range Maximum lead temperature soldering purposes, 1/8" from case seconds Thermal Characteristics Symbol Parameter Thermal Resistance, Junction-to-Ambient -Max Units °C/W When mounted minimum size recommended (PCB Mount) ©2001 Fairchild Semiconductor Corporation Rev. FQT5N20L Electrical Characteristics Symbol Parameter 25°C unless otherwise noted Test Conditions Units Characteristics BVDSS BVDSS IDSS IGSSF IGSSR Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse Referenced 25°C 125°C -0.18 -100 V/°C Characteristics VGS(th) RDS(on) Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance VGS, (Note -0.94 0.98 1.25 Dynamic Characteristics Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance -250 Switching Characteristics td(on) td(off) Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge (Note (Note Drain-Source Diode Characteristics Maximum Ratings Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge A/µs (Note Notes: Repetitive Rating Pulse width limited maximum junction temperature 90mH, 1.0A, 50V, Starting 25°C 4.5A, di/dt 300A/µs, BVDSS, Starting 25°C Pulse Test Pulse width 300µs, Duty cycle Essentially independent operating temperature ©2001 Fairchild Semiconductor Corporation Rev. FQT5N20L Typical Characteristics Drain Current Drain Current Bottom Notes Pulse Test Notes Pulse Test VDS, Drain-Source Voltage Gate-Source Voltage Figure On-Region Characteristics Figure Transfer Characteristics RDS(ON) Drain-Source On-Resistance Reverse Drain Current Notes Pulse Test Note Drain Current Source-Drain Voltage Figure On-Resistance Variation Drain Current Gate Voltage Figure Body Diode Forward Voltage Variation Source Current Temperature Ciss (Cds shorted) Coss Crss VGS, Gate-Source Voltage 100V 160V Capacitance [pF] Ciss Coss Notes Note Crss VDS, Drain-Source Voltage Total Gate Charge [nC] Figure Capacitance Characteristics Figure Gate Charge Characteristics ©2001 Fairchild Semiconductor Corporation Rev. FQT5N20L Typical Characteristics (Continued) (Normalized) Drain-Source Breakdown Voltage RDS(ON) (Normalized) Drain-Source On-Resistance Notes Notes -100 -100 Junction Temperature Junction Temperature Figure Breakdown Voltage Variation Temperature Figure On-Resistance Variation Temperature Operation This Area Limited DS(on) Drain Current Notes Single Pulse Drain Current VDS, Drain-Source Voltage Case Temperature Figure Maximum Safe Operating Area Figure Maximum Drain Current Case Temperature (t), Figure Transient Thermal Response Curve ©2001 Fairchild Semiconductor Corporation Rev. FQT5N20L Gate Charge Test Circuit Waveform 200nF 300nF Same Type Charge Resistive Switching Test Circuit Waveforms td(on) td(off) Unclamped Inductive Switching Test Circuit Waveforms BVDSS IAS2 BVDSS BVDSS Time ©2001 Fairchild Semiconductor Corporation Rev. FQT5N20L Peak Diode Recovery dv/dt Test Circuit Waveforms Driver Same Type dv/dt controlled controlled pulse period Driver Gate Pulse Width -Gate Pulse Period Body Diode Forward Current di/dt Body Diode Reverse Current Body Diode Recovery dv/dt Body Diode Forward Voltage Drop ©2001 Fairchild Semiconductor Corporation Rev. FQT5N20L Package Dimensions SOT-223 0.08MAX MAX1.80 1.75 ±0.20 3.50 ±0.20 (0.60) 3.00 ±0.10 0.65 ±0.20 +0.04 0.06 -0.02 2.30 (0.95) 4.60 ±0.25 0.70 ±0.10 (0.95) 0.25 -0.05 +0.10 (0.60) 1.60 ±0.20 (0.46) ©2001 Fairchild Semiconductor Corporation (0.89) 6.50 ±0.20 Rev. 7.00 ±0.30 TRADEMARKS following registered unregistered trademarks Fairchild Semiconductor owns authorized intended exhaustive list such trademarks. Quiet SeriesDISCLAIMER FAST QFETQSQT OptoelectronicsQuiet SeriesSILENT SWITCHER SMART START STAR*POWERStealthSuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 VCX STAR*POWER used under license FAIRCHILD SEMICONDUCTOR RESERVES RIGHT MAKE CHANGES WITHOUT FURTHER NOTICE PRODUCTS HEREIN IMPROVE RELIABILITY, FUNCTION DESIGN. FAIRCHILD DOES ASSUME LIABILITY ARISING APPLICATION PRODUCT CIRCUIT DESCRIBED HEREIN; NEITHER DOES CONVEY LICENSE UNDER PATENT RIGHTS, RIGHTS OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL FAIRCHILD SEMICONDUCTOR CORPORATION. used herein: critical component component life Life support devices systems devices support device system whose failure perform systems which, intended surgical implant into reasonably expected cause failure life body, support sustain life, whose support device system, affect safety failure perform when properly used accordance with instructions provided labeling, effectiveness. reasonably expected result significant injury user. PRODUCT STATUS DEFINITIONS Definition Terms Datasheet Identification Advance Information Product Status Formative Design Definition This datasheet contains design specifications product development. Specifications change manner without notice. This datasheet contains preliminary data, supplementary data will published later date. Fairchild Semiconductor reserves right make changes time without notice order improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves right make changes time without notice order improve design. Preliminary First Production Identification Needed Full Production Obsolete Production This datasheet contains specifications product that been discontinued Fairchild semiconductor. datasheet printed reference information only. Rev. Other recent searchesuPD16310 - uPD16310 uPD16310 Datasheet STG5123 - STG5123 STG5123 Datasheet SSM3J130TU - SSM3J130TU SSM3J130TU Datasheet 2SK3690-01 - 2SK3690-01 2SK3690-01 Datasheet
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