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25A, 50V, 0.047 Ohm, N-Channel Power MOSFET Title anwer OST) utho eyrd
Top Searches for this datasheetRFP25N05 25A, 50V, 0.047 Ohm, N-Channel Power MOSFET Title anwer OST) utho eyrds terrpoon, anwer OST, DRAIN (FLANGE) Features 25A, rDS(ON) 0.047 Temperature Compensating PSPICE® Model Peak Current Pulse Width Curve Rating Curve 175oC Operating Temperature Related Literature TB334 "Guidelines Soldering Surface Mount Components Boards" RFP25N05 N-channel power MOSFET manufactured using MegaFET process. This process which uses feature sizes approaching those integrated circuits, gives optimum utilization silicon, resulting outstanding performance. designed applications such switching regulators, switching converters, motor drivers, relay drivers. This transistor operated directly from integrated circuits. Formerly developmental type TA09771. Ordering Information PART NUMBER RFP25N05 PACKAGE TO-220AB BRAND RFP25N05 Symbol NOTE: When ordering entire part number. Packaging JEDEC TO-220AB SOURCE DRAIN GATE ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. RFP25N05 Absolute Maximum Ratings 25oC, Unless Otherwise Specified Drain Source Voltage (Note VDSS Drain Gate Voltage VDGR Gate Source Voltage Continuous Drain Current Pulsed Drain Current (Note .IDM Pulsed Avalanche Rating Maximum Power Dissipation Linear Derating Factor Operating Storage Temperature TSTG Maximum Temperature Soldering Leads 0.063in (1.6mm) from Case 10s. Package Body 10s, Techbrief Tpkg RFP25N05 Refer Peak Current Curve Refer Curve 0.48 UNITS W/oC CAUTION: Stresses above those listed "Absolute Maximum Ratings" cause permanent damage device. This stress only rating operation device these other conditions above those indicated operational sections this specification implied. NOTE: 25oC 150oC. Electrical Specifications PARAMETER 25oC, Unless Otherwise Specified SYMBOL BVDSS VGS(TH) IDSS TEST CONDITIONS 250µA, (Figure 250mA (Figure Rated BVDSS, Rated BVDSS,TC 150oC ±20V 25A, (Figure 25V, 12.5A, 10V, (Figure 40V, 25A, Ig(REF) 0.75mA (Figure (Figure 1075 ±100 0.047 2.083 UNITS oC/W oC/W Drain Source Breakdown Voltage Gate Threshold Voltage Zero Gate Voltage Drain Current Gate Source Leakage Current Drain Source Resistance Turn-On Time Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Turn-Off Time Total Gate Charge Gate Charge Threshold Gate Charge Input Capacitance Output Capacitance Reverse Transfer Capacitance Thermal Resistance Junction Case Thermal Resistance Junction Ambient IGSS rDS(ON) td(ON) td(OFF) tOFF QG(TOT) QG(10) QG(TH) CISS COSS CRSS 25V, 1MHz (Figure Source Drain Diode Specifications PARAMETER Source Drain Diode Voltage (Note Reverse Recovery Time NOTES: Pulse test: pulse width 300µs, duty cycle Repetitive rating: pulse width limited maximum junction temperature. Transient Thermal Impedance curve (Figure Peak Current Capability Curve (Figure SYMBOL 25A, dISD/dt 100A/µs TEST CONDITIONS UNITS ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. RFP25N05 Typical Performance Curves POWER DISSIPATION MULTIPLIER CASE TEMPERATURE (oC) DRAIN CURRENT CASE TEMPERATURE FIGURE NORMALIZED POWER DISSIPATION CASE TEMPERATURE FIGURE MAXIMUM CONTINUOUS DRAIN CURRENT CASE TEMPERATURE ZJC, NORMALIZED TRANSIENT THERMAL IMPEDANCE 0.05 0.02 0.01 SINGLE PULSE 10-4 10-3 10-2 10-1 NOTES: DUTY FACTOR: t1/t2 PEAK 0.01 10-5 RECTANGULAR PULSE DURATION FIGURE NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE DRAIN CURRENT PEAK CURRENT CAPABILITY 25oC RATED SINGLE PULSE 25oC TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT FOLLOWS: 100µs OPERATION THIS AREA LIMITED rDS(ON) VDS, DRAIN SOURCE VOLTAGE 10ms 100ms TRANSCONDUCTANCE LIMIT CURRENT THIS REGION 10-5 10-4 10-3 10-2 10-1 PULSE WIDTH FIGURE FORWARD BIAS SAFE OPERATING AREA FIGURE PEAK CURRENT CAPABILITY ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. RFP25N05 Typical Performance Curves AVALANCHE CURRENT (Continued) PULSE DURATION 80µs DUTY CYCLE 0.5% 25oC 4.5V STARTING 25oC DRAIN CURRENT STARTING 150oC (L)(IAS)/(1.3*RATED BVDSS VDD) (L/R)ln[(IAS*R)/(1.3*RATED BVDSS-VDD) 0.01 TIME AVALANCHE (ms) DRAIN SOURCE VOLTAGE NOTE: Refer Intersil Application Notes AN9321 AN9322. FIGURE UNCLAMPED INDUCTIVE SWITCHING CAPABILITY FIGURE SATURATION CHARACTERISTICS IDS(ON) DRAIN SOURCE CURRENT NORMALIZED DRAIN SOURCE RESISTANCE PULSE DURATION 80µs DUTY CYCLE 0.5% -55oC 25oC PULSE DURATION 80µs DUTY CYCLE 0.5% 10V, 175oC GATE SOURCE VOLTAGE JUNCTION TEMPERATURE (oC) FIGURE TRANSFER CHARACTERISTICS FIGURE NORMALIZED DRAIN SOURCE RESISTANCE JUNCTION TEMPERATURE 250µA NORMALIZED GATE THRESHOLD VOLTAGE NORMALIZED DRAIN SOURCE BREAKDOWN VOLTAGE 250µA JUNCTION TEMPERATURE (oC) JUNCTION TEMPERATURE (oC) FIGURE NORMALIZED GATE THRESHOLD VOLTAGE JUNCTION TEMPERATURE FIGURE NORMALIZED DRAIN SOURCE BREAKDOWN VOLTAGE JUNCTION TEMPERATURE ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. RFP25N05 Typical Performance Curves 1600 DRAIN SOURCE VOLTAGE 1MHz CISS CRSS COSS CISS (Continued) BVDSS 37.5 BVDSS GATE SOURCE VOLTAGE CAPACITANCE (pF) 1200 COSS CRSS 0.75 BVDSS 0.50 BVDSS 0.25 BVDSS IG(REF) 0.75mA (REF) (ACT) TIME (µs) (REF) (ACT) 12.5 DRAIN SOURCE VOLTAGE NOTE: Refer Intersil Application Notes AN7254 AN7260. FIGURE CAPACITANCE DRAIN SOURCE VOLTAGE FIGURE NORMALIZED SWITCHING WAVEFORMS CONSTANT GATE CURRENT Test Circuits Waveforms BVDSS VARY OBTAIN REQUIRED PEAK 0.01 FIGURE UNCLAMPED ENERGY TEST CIRCUIT FIGURE UNCLAMPED ENERGY WAVEFORMS td(ON) tOFF td(OFF) PULSE WIDTH FIGURE SWITCHING TIME TEST CIRCUIT FIGURE RESISTIVE SWITCHING WAVEFORMS ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. RFP25N05 Test Circuits Waveforms (Continued) Qg(TOT) Qg(10) Qg(TH) Ig(REF) Ig(REF) FIGURE GATE CHARGE TEST CIRCUIT FIGURE GATE CHARGE WAVEFORM ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. RFP25N05 PSPICE Electrical Model .SUBCKT RFP25N05 8/19/94 1.83e-9 1.98e-9 9.7e-10 DPLCAP LDRAIN RSCL1 RSCL2 ESCL MOS1 RSOURCE LSOURCE SOURCE RDRAIN EBREAK MOS2 DBODY DBREAK DBODY DBDMOD DBREAK DBKMOD DPLCAP DPLCAPMOD EBREAK 65.9 EVTO GATE DRAIN EVTO LDRAIN 1e-9 LGATE 4.92e-9 LSOURCE 4.5e-9 MOS1 MOSMOD 0.99 MOS2 MOSMOD 0.01 RBREAK RBKMOD RDRAIN RDSMOD 1.1e-3 RGATE 2.88 RSCL1 RSCLMOD 1e-6 RSCL2 RSOURCE RDSMOD 20.3e-3 RVTO RVTOMOD S1AMOD S1BMOD S2AMOD S2BMOD VBAT 0.764 LGATE RGATE RBREAK RVTO VBAT ESCL VALUE .MODEL DBDMOD 2.32e-13 5.72e-3 TRS1 2.56e-3 TRS2 -5.13e-6 1.18e-9 5.62e-8) .MODEL DBKMOD 2.00e-1 TRS1 3.33e-4 TRS2 2.68e-6) .MODEL DPLCAPMOD (CJO 6.55e-10 1e-30 .MODEL MOSMOD NMOS (VTO 3.89 15.03 1e-30 .MODEL RBKMOD (TC1 1.04e-3 -1.04e-6) .MODEL RDSMOD (TC1 5.85e-3 1.77e-5) .MODEL RSCLMOD (TC1 2.0e-3 1.5e-6) .MODEL RVTOMOD (TC1 -5.35e-3 -3.77e-6) .MODEL S1AMOD VSWITCH (RON 1e-5 ROFF -5.04 VOFF= -3.04) .MODEL S1BMOD VSWITCH (RON 1e-5 ROFF -3.04 VOFF= -5.04) .MODEL S2AMOD VSWITCH (RON 1e-5 ROFF -3.02 VOFF= 1.98) .MODEL S2BMOD VSWITCH (RON 1e-5 ROFF 1.98 VOFF= -3.02) .ENDS NOTE: further discussion PSPICE model consult PSPICE Sub-Circuit Power MOSFET Featuring Global Temperature Options; written William Hepp Frank Wheatley. ©2001 Fairchild Semiconductor Corporation RFP25N05 Rev. TRADEMARKS following registered unregistered trademarks Fairchild Semiconductor owns authorized intended exhaustive list such trademarks. Quiet SeriesDISCLAIMER FAST PACMANPOPPowerTrench QFETQSQT OptoelectronicsQuiet SeriesSILENT SWITCHER SMART STARTStar* PowerStealth SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 FAIRCHILD SEMICONDUCTOR RESERVES RIGHT MAKE CHANGES WITHOUT FURTHER NOTICE PRODUCTS HEREIN IMPROVE RELIABILITY, FUNCTION DESIGN. FAIRCHILD DOES ASSUME LIABILITY ARISING APPLICATION PRODUCT CIRCUIT DESCRIBED HEREIN; NEITHER DOES CONVEY LICENSE UNDER PATENT RIGHTS, RIGHTS OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS AUTHORIZED CRITICAL COMPONENTS LIFE SUPPORT DEVICES SYSTEMS WITHOUT EXPRESS WRITTEN APPROVAL FAIRCHILD SEMICONDUCTOR CORPORATION. used herein: Life support devices systems devices critical component component life support device system whose failure perform systems which, intended surgical implant into reasonably expected cause failure life body, support sustain life, whose support device system, affect safety failure perform when properly used accordance with instructions provided labeling, effectiveness. reasonably expected result significant injury user. PRODUCT STATUS DEFINITIONS Definition Terms Datasheet Identification Advance Information Product Status Formative Design Definition This datasheet contains design specifications product development. Specifications change manner without notice. This datasheet contains preliminary data, supplementary data will published later date. Fairchild Semiconductor reserves right make changes time without notice order improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves right make changes time without notice order improve design. Preliminary First Production Identification Needed Full Production Obsolete Production This datasheet contains specifications product that been discontinued Fairchild semiconductor. datasheet printed reference information only. Rev. Other recent searchesTS13C - TS13C TS13C Datasheet TA053-059-41-38 - TA053-059-41-38 TA053-059-41-38 Datasheet SY100EP111U - SY100EP111U SY100EP111U Datasheet SEMiX754GB128Ds - SEMiX754GB128Ds SEMiX754GB128Ds Datasheet PIC12CXXX - PIC12CXXX PIC12CXXX Datasheet DS06-20208-3E - DS06-20208-3E DS06-20208-3E Datasheet
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