ensure traceability specific assembly test operations, clearly brands

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Brand traceability
ensure traceability specific assembly test operations, clearly brands date code every device, well encapsulation code CAPHATproducts. STMicroelectronics implementing marking traceability scheme sizes packages well increases number fabrication, assembly, test sites. devices marked with trace code which provides tracking exact versions. current device marking formats package options shown Figure Table Current packages marking information
Package type 8-lead SOIC TSSOP 16-lead SOIC 24-/28-pin CAPHATTM, 24-/44pin SOIC, 18-/28-pin SOX, 32-/36-pin hybrid CAPHATencapsulation SNAPHAT® Figure Marking information 1-digit year, 2-digit work week 1-character assembly site, 1-digit year, 2-digit work week 2-digit assembly site, 1-digit year, 2-digit work week 3-digit part number, 1-digit work week 2-digit assembly site, 3-digit number, 2-digit wafer site 3-character country origin, 2-digit test site, 1-digit year, 2-digit work week Assembly process, days, 1-digit year, working shift 2-digit assembly site, 3-digit number 3-character country origin, 2-digit test site, 1-digit year, 2-digit work week 2-digit assembly site, 1-digit year, 2-digit work week, 3digit number
Shipping traceability
February 2008
www.st.com
marking illustrations
AN926
marking illustrations
Figure QFN16 package date code
1-digit Year 2004). 2-digit Work Week 52).
Figure
AI02442b
8-lead SOIC, QFN16 DFN16 TSSOP date assembly site code
Assembly site Muar, Bouskoura, Amkor, UTAC, CARSEM). 1-digit Year 2004). 2-digit Work Week 52).
AI02442c
Figure
16-lead SOIC date assembly site code
Assembly site Muar). 1-digit Year 2004). 2-digit Work Week 52).
AI02442d
Figure
date part number code
3-digit Part Number. 1-digit Work Week WW01 WW03 04).
Figure
AI02442e
24-/28-pin CAPHATTM, 28-/44-pin SOIC, 18-/28-pin SOX, 32-/36-pin hybrid code
Assembly site Muar, Cirtek, Bouskoura-SPG, Bouskoura 2000). 3-digit Number. 2-digit Wafer Site Carrollton, Phoenix).
Country Origin (MYS Malaysia, Morocco, Philippines). 2-digit Test Site Muar, Bouskoura-SPG). 1-digit Year 2004); 2-digit Work Week 01).
AI02442f
AN926 Figure Encapsulation code (CAPHATonly)
marking illustrations
welded process number days year 1-digit year 2004) working shift
Note:
AI02443a
6-character encapsulation code (CAPHATonly; Figure positioned device placed perpendicularly date code. summarizes details encapsulation process SNAPHAT®
Figure
Assembly site Muar). 3-digit Number.
Country Origin (MYS Malaysia). 2-digit Test Site Muar). 1-digit Year 2004); 2-digit Work Week 01).
AI09666
Figure
Shipping traceability date code format
2-digit Assembly site Muar, Cirtek, Amkor ATP, Carsem, Bouskoura-SPG, Bouskoura 2000, UTAC). 1-digit Year 2004). 2-digit Work Week 52). 3-digit Number.
AI09647
Previous (obsolete) marking information
AN926
Previous (obsolete) marking information
9-character date code (Figure positioned label, beside logo. This presents complete facility identification, well final-test time-line device's manufacturing process. 7-character code (SOIC only; Figure positioned bottom line closest device. represents lots' overall fabrication history. Figure Date code
Wafer Work Week Started Assembly Assembly Site Year Started Assembly double digit: single digit: Test Site Designator
AI02442
Figure number
Wafer
Individual Numbers
Year Start Fabrication last digit year, single digit:
Work Week Started Fabrication double digits:
AI06379
AN926 Figure SNAPHAT®
Previous (obsolete) marking information
Manufacturer Site Work Week Started Assembly Assembly Site Year Started Assembly double digit: single digit: Test Site Designator
AI09667
Figure Encapsulation code (CAPHATonly)
1117
Assembly Automatic (machine) Welded process blank: Manual process
Test Temperature blank: Standard test temp.
Julian Date (when underwent Encapsulation process) e.g. 1117 111th 1997
Sequential Product Type
AI02443
Contact information
AN926
Contact information
have questions concerning matters raised this document, please contact STMicroelectronics following address:
AN926
Revision history
Revision history
Table
Date Feb- 2002 26-Jul-2002 03-Feb-2003 14-Mar-2003 02-Jul-2004 26-Aug-2004 06-Jan-2004 15-Feb-2008
Document revision history
Revision First issue. Updated date code (Figure Updated date code, number (Figure 10). Clarify number terminology (Figure Reformatted; marking formats updated (Figure Updated (Figure Table Corrected figure title (Figure Reformatted document; updated title, Table Figure technical support URL; moved Figure Previous (obsolete) marking information. Changes
AN926
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