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74HC125 identical pinout LS125. device inputs compatible with standard
Top Searches for this datasheet74HC125 Quad 3-State Noninverting Buffers 74HC125 identical pinout LS125. device inputs compatible with standard CMOS outputs; with pullup resistors, they compatible with LSTTL outputs. HC125 noninverting buffer designed used with 3-state memory address drivers, clock drivers, other bus-oriented systems. device four separate output enables that active-low. http://onsemi.com MARKING DIAGRAMS SOIC-14 SUFFIX CASE 751A HC125G AWLYWW Output Drive Capability: LSTTL Loads Outputs Directly Interface CMOS, NMOS, Operating Voltage Range: Input Current: High Noise Immunity Characteristic CMOS Devices Compliance with JEDEC Standard Requirements Performance: 2000 Machine Model Chip Complexity: FETs Equivalent Gates These Pb-Free Devices TSSOP-14 SUFFIX CASE 948G ALYWG Assembly Location Wafer Year Work Week Pb-Free Package (Note: Microdot either location) ORDERING INFORMATION detailed ordering shipping information package dimensions section page this data sheet. Semiconductor Components Industries, LLC, 2007 March, 2007 Rev. Publication Order Number: 74HC125/D 74HC125 ASSIGNMENT LOGIC DIAGRAM HC125 Active-Low Output Enables FUNCTION TABLE HC125 Inputs Output MAXIMUM RATINGS Symbol Iout Tstg Vout Parameter Value Unit Supply Voltage (Referenced GND) Input Voltage (Referenced GND) Input Current, Output Current, Supply Current, Pins Power Dissipation Still Storage Temperature Lead Temperature, from Case Seconds (SOIC TSSOP Package) SOIC Package TSSOP Package Output Voltage (Referenced GND) This device contains protection circuitry guard against damage high static voltages electric fields. However, precautions must taken avoid applications voltage higher than maximum rated voltages this high-impedance circuit. proper operation, Vout should constrained range (Vin Vout) VCC. Unused inputs must always tied appropriate logic voltage level (e.g., either VCC). Unused outputs must left open. Stresses exceeding Maximum Ratings damage device. Maximum Ratings stress ratings only. Functional operation above Recommended Operating Conditions implied. Extended exposure stresses above Recommended Operating Conditions affect device reliability. Derating SOIC Package: mW/_C from 125_C TSSOP Package: mW/_C from 125_C high frequency heavy load considerations, Chapter Semiconductor High-Speed CMOS Data Book (DL129/D). http://onsemi.com 74HC125 RECOMMENDED OPERATING CONDITIONS Symbol Vin, Vout Parameter Supply Voltage (Referenced GND) Input Voltage, Output Voltage (Referenced GND) Operating Temperature, Package Types Input Rise Fall Time (Figure 1000 Unit ELECTRICAL CHARACTERISTICS (Voltages Referenced GND) Guaranteed Limit Symbol Parameter Minimum High-Level Input Voltage Test Conditions Vout |Iout| |Iout| |Iout| |Iout| |Iout| |Iout| |Iout| 25_C 3.15 1.35 2.48 3.98 5.48 0.26 0.26 0.26 ±0.1 ±0.5 85_C 3.15 1.35 2.34 3.84 5.34 0.33 0.33 0.33 ±1.0 ±5.0 125_C 3.15 1.35 ±1.0 Unit Maximum Low-Level Input Voltage Vout |Iout| Minimum High-Level Output Voltage |Iout| Maximum Low-Level Output Voltage |Iout| Maximum Input Leakage Current Maximum Three-State Leakage Current Maximum Quiescent Supply Current (per Package) Output High-Impedance State Vout Iout NOTE: Information typical parametric values found Chapter Semiconductor High-Speed CMOS Data Book (DL129/D). http://onsemi.com 74HC125 ELECTRICAL CHARACTERISTICS Input Guaranteed Limit Symbol tPLH, tPHL Parameter Maximum Propagation Delay, Input Output (Figures 25_C 85_C 125_C Unit tPLZ, tPHZ Maximum Propagation Delay, Output Enable (Figures tPZL, tPZH Maximum Propagation Delay, Output Enable (Figures tTLH, tTHL Maximum Output Transition Time, Output (Figures Cout Maximum Input Capacitance Maximum 3-State Output Capacitance (Output High-Impedance State) NOTE: propagation delays with loads other than information typical parametric values, Chapter Semiconductor High-Speed CMOS Data Book (DL129/D). Typical 25°C, Power Dissipation Capacitance (Per Buffer)* Used determine no-load dynamic power consumption: VCC2 load considerations, Chapter Semiconductor High-Speed CMOS Data Book (DL129/D). ORDERING INFORMATION Device 74HC125DR2G 74HC125DTR2G Package SOIC-14 (Pb-Free) TSSOP-14* Shipping 2500 Tape Reel 2500 Tape Reel information tape reel specifications, including part orientation tape sizes, please refer Tape Reel Packaging Specifications Brochure, BRD8011/D. *This package inherently Pb-Free. http://onsemi.com 74HC125 SWITCHING WAVEFORMS (HC126A) tPZL OUTPUT tTHL tPZH OUTPUT tPHZ tPLZ HIGH IMPEDANCE HIGH IMPEDANCE INPUT tPLH tPHL tTLH (HC125A) OUTPUT Figure Figure TEST POINT OUTPUT DEVICE UNDER TEST DEVICE UNDER TEST TEST POINT OUTPUT CONNECT WHEN TESTING tPLZ tPZL. CONNECT WHEN TESTING tPHZ tPZH. *Includes probe capacitance *Includes probe capacitance Figure Test Circuit Figure Test Circuit HC125 (1/4 DEVICE) http://onsemi.com 74HC125 PACKAGE DIMENSIONS SOIC-14 CASE 751A-03 ISSUE 0.25 (0.010) NOTES: DIMENSIONING TOLERANCING ANSI Y14.5M, 1982. CONTROLLING DIMENSION: MILLIMETER. DIMENSIONS INCLUDE MOLD PROTRUSION. MAXIMUM MOLD PROTRUSION 0.15 (0.006) SIDE. DIMENSION DOES INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL 0.127 (0.005) TOTAL EXCESS DIMENSION MAXIMUM MATERIAL CONDITION. SEATING PLANE 0.25 (0.010) MILLIMETERS 8.55 8.75 3.80 4.00 1.35 1.75 0.35 0.49 0.40 1.25 1.27 0.19 0.25 0.10 0.25 5.80 6.20 0.25 0.50 INCHES 0.337 0.344 0.150 0.157 0.054 0.068 0.014 0.019 0.016 0.049 0.050 0.008 0.009 0.004 0.009 0.228 0.244 0.010 0.019 SOLDERING FOOTPRINT* 7.04 0.58 1.52 1.27 PITCH DIMENSIONS: MILLIMETERS *For additional information Pb-Free strategy soldering details, please download Semiconductor Soldering Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 74HC125 PACKAGE DIMENSIONS TSSOP-14 CASE 948G-01 ISSUE 0.10 (0.004) 0.15 (0.006) 0.25 (0.010) IDENT. DETAIL 0.15 (0.006) SECTION 0.10 (0.004) SEATING PLANE DETAIL SOLDERING FOOTPRINT* 7.06 0.36 1.26 *For additional information Pb-Free strategy soldering details, please download Semiconductor Soldering Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com NOTES: DIMENSIONING TOLERANCING ANSI Y14.5M, 1982. CONTROLLING DIMENSION: MILLIMETER. DIMENSION DOES INCLUDE MOLD FLASH, PROTRUSIONS GATE BURRS. MOLD FLASH GATE BURRS SHALL EXCEED 0.15 (0.006) SIDE. DIMENSION DOES INCLUDE INTERLEAD FLASH PROTRUSION. INTERLEAD FLASH PROTRUSION SHALL EXCEED 0.25 (0.010) SIDE. DIMENSION DOES INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL 0.08 (0.003) TOTAL EXCESS DIMENSION MAXIMUM MATERIAL CONDITION. TERMINAL NUMBERS SHOWN REFERENCE ONLY. DIMENSION DETERMINED DATUM PLANE -W-. MILLIMETERS 4.90 5.10 4.30 4.50 1.20 0.05 0.15 0.50 0.75 0.65 0.50 0.60 0.09 0.20 0.09 0.16 0.19 0.30 0.19 0.25 6.40 INCHES 0.193 0.200 0.169 0.177 0.047 0.002 0.006 0.020 0.030 0.026 0.020 0.024 0.004 0.008 0.004 0.006 0.007 0.012 0.007 0.010 0.252 0.65 PITCH DIMENSIONS: MILLIMETERS 74HC125 Semiconductor registered trademarks Semiconductor Components Industries, (SCILLC). SCILLC reserves right make changes without further notice products herein. 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