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µPD78P018F 8-BIT SINGLE-CHIP MICROCONTROLLER DESCRIPTION


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INTEGRATED CIRCUIT
µPD78P018F
8-BIT SINGLE-CHIP MICROCONTROLLER
DESCRIPTION
µPD78P018F member µPD78018F Subseries within 78K/0 Series. internal mask µPD78018F replaced with one-time PROM EPROM. Because µPD78P018F programmed users, suited applications involving evaluation systems development stages, small-scale production many different products, rapid development timeto-market products. Caution PD78P018FDW 78P018FKK-S guaranteed maintain reliability level required mass production customer's devices. purposes during trial manufacture. Detailed function descriptions provided following user's manuals. sure read them before designing. only experimentally evaluation
µPD78018F, 78018FY Subseries User's Manual: U10659E
78K/0 Series User's Manual-Instructions: U12326E
FEATURES
compatible with mask version (except pin) Internal PROM: Kbytes Note
µPD78P018FDW, 78P018FKK-S: Re-programmable (suited system evaluation) µPD78P018FCW, 78P018FGC-AB8, 78P018FGK-8A8: Programmable only once (suited small-scale production)
Internal high-speed RAM: 1024 bytes Note Internal expansion RAM: 1024 bytes Note Internal buffer RAM: bytes Operable over same supply voltage range mask version: (except converter) QTOPmicrocontroller supported Notes capacities internal PROM internal high-speed changed means internal memory size switching register (IMS). capacity internal expansion changed means internal expansion size switching register (IXS). Remarks QTOP Microcontroller general term microcontrollers that incorporate one-time PROM totally supported NEC's programming service (from programming marking, screening verification). differences between PROM version mask versions, refer DIFFERENCES BETWEEN µPD78P018F MASK VERSIONS. this document, term PROM used parts common one-time PROM versions EPROM versions.
information this document subject change without notice. Document U10955EJ3V0DS00 (3rd edition) Date Published November 1998 CP(K) Printed Japan
mark
shows major revised points.
1994
µPD78P018F
ORDERING INFORMATION
Part Number Package 64-pin plastic shrink (750 mils) 64-pin ceramic shrink (with window) (750 mils) 64-pin plastic 64-pin plastic LQFP 64-pin ceramic WQFN Internal One-time PROM EPROM One-time PROM One-time PROM EPROM
PD78P018FCW PD78P018FDW PD78P018FGC-AB8 PD78P018FGK-8A8 PD78P018FKK-S
QUALITY GRADE
Part Number Package 64-pin plastic shrink (750 mils) 64-pin ceramic shrink (with window) (750 mils) 64-pin plastic 64-pin plastic LQFP 64-pin ceramic WQFN Quality Grade Standard applicable Standard Standard applicable
PD78P018FCW PD78P018FDW PD78P018FGC-AB8 PD78P018FGK-8A8 PD78P018FKK-S
Please refer "Quality grade Semiconductor Devices" (Document number C11531E) published Corporation know specification quality grade devices recommended applications.
µPD78P018F
78K/0 SERIES LINEUP
products 78K/0 Series listed below. names enclosed boxes subseries names.
Control 100-pin 100-pin 100-pin 100-pin 80-pin 80-pin 80-pin 80-pin 64-pin 64-pin 64-pin 64-pin 42/44-pin
Products mass production Products under development subseries products compatible with bus. EMI-noise reduced version µPD78078
µPD78075B µPD78078 PD78070A PD780058 PD78058F PD78054 PD780065 PD780034 PD780024 PD78014H µPD78018F µPD78083
Inverter control
µPD78078Y µPD78070AY PD780018AY PD780058YNote PD78058FY PD78054Y PD780034Y µPD780024Y PD78018FY
Timer added µPD78054 external interface enhanced ROM-less version µPD78078 Serial µPD78078Y enhanced function limited Serial µPD78054 enhanced EMI-noise reduced EMI-noise reduced version µPD78054 UART converter were added µPD78018F enhanced capacity µPD780024 expanded converter µPD780024 enhanced Serial µPD78018F enhanced EMI-noise reduced version µPD78018F Basic subseries control On-chip UART, capable operating voltage (1.8
64-pin 78K/0 Series 100-pin 100-pin 80-pin 80-pin 80-pin
PD780988
FIPdrive
On-chip inverter control circuit UART. EMI-noise reduced
µPD780208 PD780228 PD780232 µPD78044H µPD78044F
drive
µPD78044F were enhanced, Display output total: µPD78044H were enhanced, Display output total: panel control. On-chip C/D. Display output total: N-ch open drain added µPD78044F, Display output total: Basic subseries driving FIP, Display output total:
100-pin 100-pin 100-pin
PD780308 PD78064B µPD78064
µPD780308Y PD78064Y
µPD78064 enhanced ROM, capacity expanded EMI-noise reduced version µPD78064 Basic subseries driving LCDs, On-chip UART
interface supported 80-pin 80-pin 80-pin 80-pin
µPD78098B PD780948 PD780701Y PD780833Y
Meter control
IEBuscontroller added µPD78054. EMI-noise reduced. On-chip DCAN controller On-chip DCAN/IEBus controller On-chip J1850 (CLASS2) controller
80-pin 80-pin 100-pin
PD780973 µPD780955 µPD780958
On-chip controller/driver automotive meter drive Ultra-low power consumption on-chip UART industrial meter control
Note Under planning
µPD78P018F
major functional differences among subseries shown below.
Function Subseries Name Control Timer 8-bit 16-bit Watch External MIN. Expansion Value Available
Capacity
8-bit 10-bit 8-bit
Serial Interface
µPD78075B µPD78078 µPD78070A
(UART:
(time-division UART: (UART:
µPD780058 µPD78058F µPD78054
µPD780065 µPD780034 µPD780024 µPD78014H µPD78018F µPD78083
Inverter control drive
(UART: division 3-wire:
(UART: time-
(UART: (UART: (time-division UART: (UART:
Available
µPD780988 Note
µPD780208 µPD780228 µPD780232 µPD78044H µPD78044F
drive µPD780308
µPD78064B µPD78064
interface µPD78098B supported µPD780948 Meter control
(UART: (UART: (UART: (UART:
µPD780973 µPD780955
µPD780958
Note 16-bit timer: channels 10-bit timer: channel
µPD78P018F
FUNCTION OVERVIEW
Item Internal memory PROM High-speed Expansion Buffer Memory space General-purpose registers Minimum instruction execution time When main system clock selected When subsystem clock selected Instruction 16-bit operation Multiply/divide bits bits, bits bits) manipulate (set, reset, test, Boolean operation) adjust, etc. (@32.768-kHz operation) Kbytes
Note Note Note
Function
1024 bytes 1024 bytes bytes Kbytes
bits registers bits registers banks) Minimum instruction execution time cycle modification function provided. µs/0.8 µs/1.6 µs/3.2 µs/6.4 (@10.0-MHz operation)
ports
Total: CMOS input: CMOS I/O: N-channel open-drain (15-V withstand voltage):
converter Serial interface Timer
8-bit resolution channels Operable over wide power supply voltage range: 3-wire serial I/O/SBI/2-wire serial mode selectable: channel 3-wire serial mode (on-chip max. bytes automatic data transmit/receive function): channel 16-bit timer/event counter: 8-bit timer/event counter: Watch timer: Watchdog timer: channel channels channel channel
Timer output Clock output Buzzer output Vectored interrupt source Test input Supply voltage Maskable Non-maskable Software
(14-bit output 39.1 kHz, 78.1 kHz, kHz, kHz, kHz, 1.25 (@10.0-MHz operation with main system clock), 32.768 (@32.768-kHz operation with subsystem clock) kHz, kHz, (@10.0-MHz operation with main system clock) Internal: External: Internal: Internal: External:
Operating ambient temperature +85°C Package 64-pin 64-pin 64-pin 64-pin 64-pin plastic shrink (750 mils) ceramic shrink (with window) (750 mils) plastic plastic LQFP ceramic WQFN
Notes internal PROM internal high-speed capacities changed with internal memory size switching register (IMS). internal expansion capacity changed with internal expansion size switching register (IXS).
µPD78P018F
CONFIGURATION (Top View)
Normal operating mode 64-pin Plastic Shrink (750 mils)
µPD78P018FCW
64-pin Ceramic Shrink (with window) (750 mils)
µPD78P018FDW
P20/SI1 P21/SO1 P22/SCK1 P23/STB P24/BUSY P25/SI0/SB0 P26/SO0/SB1 P27/SCK0 P30/TO0 P31/TO1 P32/TO2 P33/TI1 P34/TI2 P35/PCL P36/BUZ P40/AD0 P41/AD1 P42/AD2 P43/AD3 P44/AD4 P45/AD5 P46/AD6 P47/AD7 P50/A8 P51/A9 P52/A10 P53/A11 P54/A12 P55/A13 P17/ANI7 P16/ANI6 P15/ANI5 P14/ANI4 P13/ANI3 P12/ANI2 P11/ANI1 P10/ANI0 P04/XT1 P03/INTP3 P02/INTP2 P01/INTP1 P00/INTP0/TI0 RESET P67/ASTB P66/WAIT P65/WR P64/RD P57/A15 P56/A14
Cautions Connect directly VSS. Connect AVDD VDD. Connect AVSS VSS.
µPD78P018F
64-pin Plastic
µPD78P018FGC-AB8
64-pin Plastic LQFP
µPD78P018FGK-8A8
64-pin Ceramic WQFN
µPD78P018FKK-S
P26/SO0/SB1
P25/SI0/SB0
P24/BUSY
P27/SCK0
P22/SCK1
P17/ANI7
P16/ANI6
P15/ANI5
P14/ANI4
P13/ANI3
P30/TO0 P31/TO1 P32/TO2 P33/TI1 P34/TI2 P35/PCL P36/BUZ P40/AD0 P41/AD1 P42/AD2 P43/AD3 P44/AD4 P45/AD5 P46/AD6
P12/ANI2
P21/SO1
P23/STB
P20/SI1
P11/ANI1 P10/ANI0 P04/XT1 P03/INTP3 P02/INTP2 P01/INTP1 P00/INTP0/TI0 RESET P67/ASTB P66/WAIT
P47/AD7
P52/A10
P53/A11
P54/A12
P55/A13
P56/A14
P57/A15
Cautions Connect directly VSS. Connect AVDD VDD. Connect AVSS VSS.
P65/WR
P64/RD
P50/A8
P51/A9
µPD78P018F
A15: AD7: ANI0 ANI7: ASTB: AVDD: AVREF: AVSS: BUSY: BUZ: INTP0 INTP3: P04: P17: P27: P37: P47: P57: P67: Address Address/Data Analog Input Address Strobe Analog Power Supply Analog Reference Voltage Analog Ground Busy Buzzer Clock Interrupt from Peripherals Port Port Port Port Port Port Port PCL: RESET: SB0, SB1: SCK0, SCK1: SI0, SI1: SO0, SO1: STB: TI2: TO2: VDD: VPP: VSS: WAIT: XT1, XT2: Programmable Clock Reset Read Strobe Serial Serial Clock Serial Input Serial Output Strobe Timer Input Timer Output Power Supply Programming Power Supply Ground Wait Write Strobe Crystal (Main System Clock) Crystal (Subsystem Clock)
µPD78P018F
PROM programming mode 64-pin Plastic Shrink (750 mils)
µPD78P018FCW
64-pin Ceramic Shrink (with window) (750 mils)
µPD78P018FDW
Open Open RESET
Cautions (L): VSS: Open:
Independently connect pull-down resistor. Connect GND. Leave open.
RESET: level.
µPD78P018F
64-pin Plastic
µPD78P018FGC-AB8
64-pin Plastic LQFP
µPD78P018FGK-8A8
64-pin Ceramic WQFN
µPD78P018FKK-S
Open Open RESET
Cautions (L): VSS: Open: A16: PGM:
Independently connect pull-down resistor. Connect GND. Leave open. Address Chip Enable Data Output Enable Program RESET: VDD: VPP: Reset Power Supply Programming Power Supply Ground
RESET: level.
µPD78P018F
BLOCK DIAGRAM
TO0/P30 TI0/INTP0/P00 TO1/P31 TI1/P33 TO2/P32 TI2/P34
16-bit TIMER/ EVENT COUNTER
PORT0 P01-P03
8-bit TIMER/ EVENT COUNTER
PORT1
P10-P17
8-bit TIMER/ EVENT COUNTER
PORT2
P20-P27
WATCHDOG TIMER
PORT3
P30-P37
WATCH TIMER 78K/0 CORE SERIAL INTERFACE PROM Kbytes)
PORT4
P40-P47
SI0/SB0/P25 SO0/SB1/P26 SCK0/P27 SI1/P20 SO1/P21 SCK1/P22 STB/P23 BUSY/P24 ANI0/P10ANI7/P17 AVDD AVSS AVREF SERIAL INTERFACE
PORT5
P50-P57
PORT6
P60-P67 AD0/P40AD7/P47 A8/P50A15/P57
(2048 bytes)
EXTERNAL ACCESS
RD/P64 WR/P65 WAIT/P66 ASTB/P67 RESET
CONVERTER
INTP0/P00INTP3/P03
INTERRUPT CONTROL
SYSTEM CONTROL XT1/P04
BUZ/P36
BUZZER OUTPUT
PCL/P35
CLOCK OUTPUT CONTROL
µPD78P018F
CONTENTS DIFFERENCES BETWEEN µPD78P018F MASK VERSIONS FUNCTIONS
Pins During Normal Operating Mode Pins During PROM Programming Mode Circuits Recommended Connection Unused Pins
INTERNAL MEMORY SIZE SWITCHING REGISTER (IMS) INTERNAL EXPANSION SIZE SWITCHING REGISTER (IXS) PROM PROGRAMMING
Operating Modes PROM Write Procedure PROM Read Procedure
PROGRAM ERASURE (FOR µPD78P018FDW, 78P018FKK-S) OPAQUE FILM ERASURE WINDOW (FOR µPD78P018FDW, 78P018FKK-S) ONE-TIME PROM VERSION SCREENING ELECTRICAL SPECIFICATIONS
CHARACTERISTIC CURVE (REFERENCE VALUE) PACKAGE DRAWINGS RECOMMENDED SOLDERING CONDITIONS APPENDIX DEVELOPMENT TOOLS APPENDIX RELATED DOCUMENTS
µPD78P018F
DIFFERENCES BETWEEN µPD78P018F MASK VERSIONS
µPD78P018F single-chip microcontroller with on-chip one-time PROM EPROM that program write, erase, rewrite capability. possible make functions except PROM specification mask option pins, same those mask versions (µPD78011F, 78012F, 78013F, 78014F, 78015F, 78016F, 78018F) setting internal memory size switching register (IMS) internal expansion size switching register (IXS). Differences between µPD78P018F mask versions shown Table 1-1. Table 1-1. Differences between µPD78P018F Mask Versions
Parameter Internal type Internal capacity
µPD78P018F
One-time PROM EPROM Kbytes
Mask Versions Mask
µPD78011F: µPD78012F: µPD78013F: µPD78014F: µPD78015F: µPD78016F: µPD78018F: µPD78011F: µPD78012F: µPD78013F: µPD78014F: µPD78015F: µPD78016F: µPD78018F: µPD78011F: µPD78012F: µPD78013F: µPD78014F: µPD78015F: µPD78016F: µPD78018F:
Kbytes Kbytes Kbytes Kbytes Kbytes Kbytes Kbytes bytes bytes 1024 bytes 1024 bytes 1024 bytes 1024 bytes 1024 bytes bytes bytes 1024 bytes
Internal high-speed capacity
1024 bytes
Internal expansion capacity
1024 bytes
Internal ROM, internal high-speed capacity changeable with internal memory size switching register (IMS) Internal expansion capacity changeable with internal expansion size switching register (IXS) Mask option pins Electrical specifications, recommended soldering conditions
Note Note Pull-up resistor incorporated.
Pull-up resistor incorporated mask option.
respective data sheet individual products.
Notes internal PROM capacity becomes Kbytes internal high-speed capacity becomes 1024 bytes input RESET. internal expansion capacity becomes 1024 bytes input RESET. Caution There differences noise immunity noise radiation between PROM mask versions. When pre-producing application with PROM version then mass-producing with mask version, sure conduct sufficient evaluations commercial samples (not engineering samples) mask version.
µPD78P018F
FUNCTIONS
Pins During Normal Operating Mode Port Pins (1/2)
Name
Note
Input Port Input only
Function
After Reset Input Input
Alternate Function INTP0/TI0 INTP1 INTP2 INTP3
Input/ 5-bit port output
Input/output specified 1-bit units. When used input port, on-chip pull-up resistor connected software.
Input
Input only
Input Input
ANI0 ANI7
Input/ Port output 8-bit input/output port. Input/output specified 1-bit units. When used input port, on-chip pull-up resistor connected software. Note Input/ Port output 8-bit input/output port. Input/output specified 1-bit units. When used input port, on-chip pull-up resistor connected software.
Input
SCK1 BUSY SI0/SB0 SO0/SB1 SCK0
Input/ Port output 8-bit input/output port. Input/output specified 1-bit units. When used input port, on-chip pull-up resistor connected software.
Input
Input/ Port output 8-bit input/output port. Input/output specified 8-bit units. When used input port, on-chip pull-up resistor connected software. Test input flag (KRIF) falling edge detection.
Input
Notes When using P04/XT1 input port, (FRC) processor clock control register (PCC) internal feedback resistor subsystem clock oscillator. When using P10/ANI0 P17/ANI7 pins converter analog input, port input mode. This causes internal pull-up resistor automatically disabled.
µPD78P018F
Port Pins (2/2)
Name Function After Reset Input Alternate Function
Input/ Port output 8-bit input/output port. LEDs driven directly. Input/output specified 1-bit units. When used input port, on-chip pull-up resistor connected software. Input/ Port output 8-bit input/output port. Input/output specified 1-bit units. When used input port, on-chip pull-up resistor connected software. N-ch open-drain input/output port. LEDs driven directly.
Input
WAIT ASTB
Non-port Pins (1/2)
Name INTP0 INTP1 INTP2 INTP3 SCK0 SCK1 BUSY Input/ Serial interface serial data input/output. output Input/ Serial interface serial clock input/output. output Output Serial interface automatic transmit/receive strobe output. Input Input Serial interface automatic transmit/receive busy input. External count clock input 16-bit timer (TM0). External count clock input 8-bit timer (TM1). External count clock input 8-bit timer (TM2). Output 16-bit timer (TM0) output (shared 14-bit output). 8-bit timer (TM1) output. 8-bit timer (TM2) output. Output Clock output (for main system clock, subsystem clock trimming). Output Buzzer output. Input Input Input Input Output Serial interface serial data output. Input Input Falling edge detection external interrupt request input. Serial interface serial data input. Input Input/ Function External interrupt request input which valid edge (rising edge, falling edge, both rising edge falling edge) specified. After Reset Input Alternate Function P00/TI0 P25/SB0 P26/SB1 P25/SI0 P26/SO0 Input Input Input Input P00/INTP0
µPD78P018F
Non-port Pins (2/2)
Name WAIT ASTB Input Input/ output Output High-order address external memory expansion. Output External memory read operation strobe signal output. External memory write operation strobe signal output. Wait insertion external memory access. Input Input Input Function Low-order address/data external memory expansion. After Reset Input Alternate Function
Output Strobe output which latches address information output port port Input access external memory. converter analog input. converter reference voltage input. converter analog power supply. Connect VDD. converter ground potential. Connect VSS. System reset input. Main system clock oscillation crystal connection. Input Subsystem clock oscillation crystal connection. Input Positive power supply. High voltage applied during program write/verify. normal operating mode, connect directly. Ground potential.
ANI0 ANI7 Input AVREF AVDD AVSS RESET Input Input Input Input
Pins During PROM Programming Mode
Name RESET Input Function Sets PROM programming mode. When +12.5 applied level applied RESET pin, microcontroller shifted PROM programming mode. Applies high voltage during PROM programming mode setting program write/verify. Address
Input Input
Input/ Data output Input Input Input PROM enable input/program pulse input. Read strobe input PROM. Program/program inhibit input PROM programming mode. Positive power supply Ground potential
µPD78P018F
Circuits Recommended Connection Unused Pins input/output circuit type each recommended connection unused pins shown Table 2-1. input/output circuit configuration each type, Figure 2-1. Table 2-1. Types Circuits
Name P00/INTP0/TI0 P01/INTP1 P02/INTP2 P03/INTP3 P04/XT1 P10/ANI0 P17/ANI7 P20/SI1 P21/SO1 P22/SCK1 P23/STB P24/BUSY P25/SI0/SB0 P26/SO0/SB1 P27/SCK0 P30/TO0 P31/TO1 P32/TO2 P33/TI1 P34/TI2 P35/PCL P36/BUZ P40/AD0 P47/AD7 P50/A8 P57/A15 P64/RD P65/WR P66/WAIT P67/ASTB RESET Input Leave open. Connect Connect Connect Connect directly VSS. 13-D Independently connect resistor. Independently connect resistor. Independently connect resistor. Independently connect resistor. 10-A Input Input/output Connect VDD. Independently connect resistor. Input/output Circuit Type Input Input/output Recommended Connection when Used Connect Independently connect resistor.
µPD78P018F
Figure 2-1. Input/Output Circuits
Type Type 10-A pullup enable data open drain output disable Schmitt-Triggered Input with Hysteresis Characteristic P-ch IN/OUT N-ch P-ch
Type pullup enable data output disable input enable Type pullup enable data output disable
P-ch
Type pullup enable data output disable Comparator
P-ch P-ch IN/OUT N-ch P-ch N-ch VREF (Threshold Voltage)
P-ch IN/OUT N-ch
input enable P-ch P-ch IN/OUT N-ch P-ch data output disable N-ch Type 13-D
IN/OUT
Middle-Voltage Input Buffer Type pullup enable data output disable P-ch IN/OUT N-ch P-ch Type feedback cut-off P-ch
µPD78P018F
INTERNAL MEMORY SIZE SWITCHING REGISTER (IMS)
This register used disable part internal memory software. setting this register (IMS), possible same memory that mask versions with different internal memory (ROM, RAM). with 8-bit memory manipulate instruction. RESET input sets CFH. Figure 3-1. Internal Memory Size Switching Register Format
Symbol Address FFF0H After reset
RAM2 RAM1 RAM0
ROM3 ROM2 ROM1 ROM0
ROM3 ROM2 ROM1 ROM0
Selection Internal Capacity Kbytes Kbytes Kbytes Kbytes Kbytes Kbytes KbytesNote Kbytes Setting prohibited
Other than above
RAM2 RAM1 RAM0
Selection Internal High-Speed Capacity bytes 1024 bytes Setting prohibited
Other than above
Note When external device expansion function used, internal capacity should Kbytes less. Table shows setting values which make memory same that mask versions. Table 3-1. Internal Memory Size Switching Register Setting Values
Target Mask Versions Setting Values
µPD78011F µPD78012F µPD78013F µPD78014F µPD78015F µPD78016F µPD78018F
µPD78P018F
INTERNAL EXPANSION SIZE SWITCHING REGISTER (IXS)
This register used disable part internal expansion capacity software. setting this register (IXS), possible same memory that mask versions with different internal expansion RAM. with 8-bit memory manipulate instruction. RESET input sets 0AH. Figure 4-1. Internal Expansion Size Switching Register Format
Symbol
Address FFF4H
After reset
IXRAM3 IXRAM2 IXRAM1 IXRAM0
IXRAM3 IXRAM2 IXRAM1 IXRAM0
Selection Internal Expansion Capacity 1024 bytes (F400H F7FFH) bytes (F600H F7FFH) bytes Setting prohibited
Other than above
Table shows setting values which make memory same that mask versions. Table 4-1. Internal Expansion Size Switching Register Setting Values
Target Mask Versions Setting Values 0CHNote
µPD78011F µPD78012F µPD78013F µPD78014F µPD78015F µPD78016F µPD78018F
Note Even program µPD78P018F which "MOV IXS, #0CH" written executed µPD78011F, 78012F, 78013F, 78014F, operations affected.
µPD78P018F
PROM PROGRAMMING
µPD78P018F internal 60-Kbyte PROM program memory. programming, PROM programming mode setting RESET pins. handling unused pins, refer CONFIGURATION (Top View) PROM programming mode. Caution When writing program, locations 0000H-EFFFH (Specify last address EFFFH). cannot write using PROM programmer that cannot specify addresses write. Operating Modes When +12.5 applied low-level signal applied RESET pin, PROM programming mode set. This mode will become operating mode shown Table when pins set. Further, when read mode set, possible read contents PROM. Table 5-1. Operating Modes PROM Programming
RESET Operating Mode Page data latch Page write Byte write Program verify Program inhibit +12.5 +6.5 Read Output disable Standby Data output High-impedance High-impedance Data input High-impedance Data input Data output High-impedance
µPD78P018F
Read mode Read mode set. Output disable mode Data output becomes high-impedance output disable mode set. Therefore, allows data read from device controlling pin, multiple PD78P018Fs connected data bus. Standby mode Standby mode set. this mode, data outputs become high-impedance irrespective status. Page data latch mode Page data latch mode beginning page write mode. this mode, page 4-byte data latched internal address/data latch circuit. Page write mode After page bytes addresses data latched page data latch mode, page write executed applying 0.1-ms program pulse (active low) with Then, program verification performed, set. programming performed one-time program pulse, write verification operations should executed repeatedly. Byte write mode Byte write executed when 0.1-ms program pulse (active low) applied with Then, program verification performed set. programming performed one-time program pulse, write verification operations should executed repeatedly. Program verify mode Program verify mode set. this mode, check write operation performed correctly, after write. Program inhibit mode Program inhibit mode used when pin, pin, pins multiple µPD78P018Fs connected parallel write performed those devices. When write operation performed, page write mode byte write mode described above used. this time, write performed device which driven high.
µPD78P018F
PROM Write Procedure Figure 5-1. Page Program Mode Flow Chart
Start Address 12.5
Latch Address Address Latch Address Address Latch Address Address Address Address Latch
X=X+1 0.1-ms program pulse
Verify bytes Pass Address Pass
Fail
Verify bytes Pass Write
Fail
Defective product
Start address Program last address
µPD78P018F
Figure 5-2. Page Program Mode Timing
Page Data Latch
Page Program
Program Verify
Hi-Z Data Input Data Output
µPD78P018F
Figure 5-3. Byte Program Mode Flow Chart
Start Address 12.5
X=X+1 0.1-ms program pulse Address Address Fail Verify Pass Address Pass Fail
Verify bytes Pass Write
Defective product
Start address Program last address
µPD78P018F
Figure 5-4. Byte Program Mode Timing
Program
Program Verify
Hi-Z Data Input Data Output
Cautions should applied before after must exceed +13.5 including overshoot. Removing reinserting while +12.5 applied adversely affect reliability.
µPD78P018F
PROM Read Procedure contents PROM readable external data according read procedure shown below. RESET level, supply pin, handle other unused pins shown CONFIGURATION (Top View) PROM programming mode. Supply pins. Input address read data into pins. Read mode Output data pins. timings above steps shown Figure 5-5. Figure 5-5. PROM Read Timings
Address Input
(Input)
(Input)
Hi-Z
Data Output
Hi-Z
µPD78P018F
PROGRAM ERASURE (FOR µPD78P018FDW, 78P018FKK-S)
µPD78P018FDW, 78P018FKK-S capable erasing (FFH) contents data written program memory rewriting. When erasing contents data, irradiate light having wavelength less than about erasure window. Normally, irradiate ultraviolet rays wavelength. Volume irradiation required completely erase contents data follows: intensity erasing time: more Erasing time: min. longer (When lamp 12mW/cm2 used. However, longer time needed because deterioration performance lamp, contamination erasure window, etc.) When erasing contents data, lamp within from erasing window. Further, filter provided lamp, irradiate ultraviolet rays after removing filter.
OPAQUE FILM ERASURE WINDOW (FOR µPD78P018FDW, 78P018FKK-S)
protect from miserasure rays other than that lamp erasing EPROM contents, protect internal circuit other than EPROM from malfunction rays, stick opaque film erasure window when EPROM contents erasure performed.
ONE-TIME PROM VERSION SCREENING
one-time PROM versions (µPD78P018FCW, 78P018FGC-AB8, 78P018FGK-8A8) cannot tested completely before shipped, because structure. recommended perform screening verify PROM after writing necessary data performing high-temperature storage under conditions below.
Storage Temperature 125°C Storage Time hours
provides one-time PROM writing, marking, screening, verify service products designated "QTOP Microcontrollers." details, contact sales representative.
µPD78P018F
ELECTRICAL SPECIFICATIONS
Absolute Maximum Ratings 25°C)
Parameter Supply voltage Symbol AVDD AVREF AVSS Input voltage P04, P17, P27, P37, P47, P57, P67, XT2, RESET Open-drain PROM programming mode Test Conditions Ratings -0.3 +7.0 -0.3 +13.5 -0.3 -0.3 -0.3 +0.3 -0.3 Unit
Output voltage Analog input voltage Output current, high
-0.3 -0.3 +13.5 -0.3
Analog input
AVSS AVREF +150
Total P17, P27, Total P03, P47, P57, Output current, IOLNote Peak value value Total P47, Peak value value Total P03, P56, P57, Peak value value
Total P03, Peak value value Total P17, P27, Peak value Operating ambient temperature Storage temperature Tstg value.
Note value should calculated follows: [rms value] [peak value] duty Caution Product quality suffer absolute maximum ratings exceeded even momentarily parameter. That absolute maximum ratings rated values which product verge suffering physical damage, therefore product must used under conditions that ensure that absolute maximum ratings exceeded.
µPD78P018F
Capacitance 25°C,
Parameter Input capacitance capacitance Symbol Test Conditions Unmeasured pins returned P03, P17, P27, Unmeasured pins P37, P47, P57, returned MIN. TYP. MAX. Unit
Remark Unless specified othewise, characteristics alternate-function pins same those port pins. Main System Clock Oscillator Characteristics +85°C,
Resonator Ceramic resonator Recommended Circuit
Parameter Oscillation frequency (fX) Note
Test Conditions
MIN.
TYP.
MAX.
Unit
Oscillation stabilization time Note
After reaches oscillator voltage range MIN.
Crystal resonator
Oscillation frequency (fX) Note
Oscillation stabilization time External clock
Note
input frequency (fX) Note
10.0
µPD74HCU04
input high-/low-level width (tXH tXL)
Notes Indicates only oscillator characteristics. Refer Characteristics instruction execution time. Time required stabilize oscillation after reset STOP mode release. Cautions When using main system clock oscillator, wire area enclosed broken line above figures follows avoid adverse effect from wiring capacitance. Keep wiring length short possible. cross wiring with other signal lines. route wiring near signal line through which high fluctuating current flows. Always keep ground point oscillator capacitor same potential VSS. ground capacitor ground pattern which high current flows. fetch signals from oscillator. When main system clock stopped system operated subsystem clock, subsystem clock should switched again main system clock after oscillation stabilization time secured program.
µPD78P018F
Subsystem Clock Oscillator Characteristics +85°C,
Resonator Crystal resonator Recommended Circuit
Parameter Oscillation frequency (fXT) Note
Test Conditions
MIN.
TYP. 32.768
MAX.
Unit
Oscillation stabilization time
Note
External clock
input frequency (fXT) Note
µPD74HCU04
input high-/low-level width (tXTH tXTL)
Notes Indicates only oscillator characteristics. Refer Characteristics instruction execution time. Time required stabilize oscillation after reaches oscillation voltage range MIN. Cautions When using subsystem clock oscillator, wire area enclosed broken line above figures follows avoid adverse effect from wiring capacitance. Keep wiring length short possible. cross wiring with other signal lines. route wiring near signal line through which high fluctuating current flows. Always keep ground point oscillator capacitor same potential VSS. ground capacitor ground pattern which high current flows. fetch signals from oscillator. subsystem clock oscillator low-amplitude circuit order achive consumption current, more prone malfunction noise than main system clock oscillator. Particular care therefore required with wiring method when subsystem clock used.
µPD78P018F
RECOMMENDED OSCILLATOR CONSTANTS Main system clock: Ceramic resonator +85°C)
Manufacturer Name Frequency (MHZ) 4.00 4.00 4.19 4.19 5.00 5.00 8.00 8.00 8.38 8.38 10.00 10.00 4.00 4.00 4.19 4.19 5.00 5.00 8.00 8.00 8.38 8.38 10.00 10.00 Recommended Oscillator Constants (pF) Oscillation Voltage Range Remarks
(pF) MIN. MAX. On-chip capacitor, surface mounting type On-chip capacitor, insertion type On-chip capacitor, surface mounting type On-chip capacitor, insertion type On-chip capacitor, surface mounting type On-chip capacitor, insertion type On-chip capacitor, surface mounting type On-chip capacitor, insertion type On-chip capacitor, surface mounting type On-chip capacitor, insertion type On-chip capacitor, surface mounting type On-chip capacitor, insertion type Insertion type On-chip capacitor, insertion type Insertion type On-chip capacitor, insertion type Insertion type On-chip capacitor, insertion type Insertion type On-chip capacitor, insertion type Insertion type On-chip capacitor, insertion type Insertion type On-chip capacitor, insertion type
CCR4.0MC3 FCR4.0MC5 CCR4.19MC3 FCR4.19MC5 CCR5.00MC3 FCR5.00MC5 CCR8.00MC FCR8.00MC5 CCR8.38MC FCR8.38MC5 CCR10.00MC FCR10.00MC5
On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip On-Chip
Murata Mfg. CSA4.00MG Co., Ltd. CST4.00MGW CSA4.19MG CST4.19MGW CSA5.00MG CST5.00MGW CSA8.00MTZ CST8.00MTW CSA8.38MTZ CST8.38MTW CSA10.00MTZ CST10.00MTW
On-Chip On-Chip
On-Chip On-Chip
On-Chip On-Chip
On-Chip On-Chip
On-Chip On-Chip
On-Chip On-Chip
Caution
oscillator constant oscillation voltage range indicate conditions stable oscillation. oscillation frequency precision guaranteed. applications requiring oscillation frequency precision, oscillation frequency must adjusted implementation circuit. details, please contact directly manufacturer resonator will use.
µPD78P018F
Main system clock: Ceramic resonator +80°C)
Manufacturer Name Frequency (MHZ) 4.00 4.00 4.00 4.00 5.00 5.00 5.00 5.00 8.00 10.00 Recommended Oscillator Constants (pF) Oscillation Voltage Range Remarks
(pF) MIN. MAX. Surface mounting type On-chip capacitor, surface mounting type Insertion type On-chip capacitor, insertion type Surface mounting type On-chip capacitor, surface mounting type Insertion type On-chip capacitor, insertion type Insertion type Insertion type
Kyocera PBRC4.00A Corporation PBRC4.00B KBR-4.00MSA KBR-4.00MKS PBRC5.00A PBRC5.00B KBR-5.00MSA KBR-5.00MKS KBR-8M KBR-10M
On-Chip On-Chip
On-Chip On-Chip
On-Chip On-Chip
On-Chip On-Chip
Caution
oscillator constant oscillation voltage range indicate conditions stable oscillation. oscillation frequency precision guaranteed. applications requiring oscillation frequency precision, oscillation frequency must adjusted implementation circuit. details, please contact directly manufacturer resonator will use.
µPD78P018F
Characteristics +85°C,
Parameter Input voltage, high Symbol VIH1 Test Conditions P17, P21, P23, P32, P37, P47, P57, P03, P20, P22, P27, P33, P34, RESET (N-ch open-drain) MIN. 0.85 Input voltage, VIL1 P17, P21, P23, P32, P37, P47, P57, P03, P20, P22, P27, P33, P34, RESET VNote VIH5 XT1/P04, VIL4 VIL5 XT1/P04, Output voltage, high Output voltage, VOH1 -100 VOL1 P57, P03, P17, P27, P37, P47, VOL2 SB0, SB1, SCK0 open-drain pulled-up VNote TYP. MAX. 0.15 Unit
VIH2
VIH3
VIH4
VIL2
VIL3
VOL3
Note When using XT1/P04 P04, input inverse XT2. Remark Unless specified othewise, characteristics alternate-function pins same those port pins.
µPD78P018F
Characteristics +85°C,
Parameter Input leakage current, high Symbol ILIH1 Test Conditions P03, P17, P27, P37, P47, P57, P67, RESET XT1/P04, P03, P17, P27, P37, P47, P57, P67, RESET XT1/P04, VOUT VOUT P03, P17, P27, P37, P47, P57, MIN. TYP. MAX. Unit
ILIH2 ILIH3 Input leakage current, ILIL1
ILIL2 ILIL3 Output leakage current, high Output leakage current, Software pull-up resistor ILOL ILOH
-3Note
Note P63, low-level input leak current -200 (MAX.) flows only during clocks (no-wait time) after instruction been executed read port (P6) port mode register (PM6). Outside period clocks following execution read-out instruction, current (MAX.). Remark Unless specified othewise, characteristics alternate-function pins same those port pins.
µPD78P018F
Characteristics +85°C,
Parameter Supply currentNote Symbol IDD1 Test Conditions 10.00-MHz crystal oscillation operation mode 10.00-MHz crystal oscillation HALT mode 32.768-kHz crystal oscillation operation modeNote %Note %Note %Note %Note MIN. TYP. 12.0 0.05 0.05 MAX. 24.0 Unit
IDD2
IDD3
IDD4
32.768-kHz crystal oscillation HALT modeNote
IDD5
STOP mode, when using feedback resistor STOP mode, when using feedback resistor
IDD6
Notes Refers current flowing pin. current flowing on-chip pull-up resistors, ports, converter included. High-speed mode operation (when processor clock control register (PCC) 00H) Low-speed mode operation (when 04H) When main system clock operation stopped.
µPD78P018F
Characteristics Basic Operation +85°C,
Parameter Cycle time (Min. instruction execution time) Symbol Test Conditions Operating main system clock Operating subsystem clock input high-/low-level width tTIH0, tTIL0 TI1, input frequency TI1, input high-/low-level width Interrupt input request high-/low-level width fTI1 MIN. 40Note 2/fsam 0.1Note TYP. MAX. Unit
2/fsam 0.2Note 2/fsam 0.5Note
tTIH1, tTIL1 tINTH, tINTL
INTP0
2/fsam 0.1Note 2/fsam 0.2Note
2/fsam 0.5Note
INTP1 INTP3, RESET low-level width tRSL
Notes Value when using external clock. When crystal resonator used, value becomes (MIN.). combination with bits (SCS0) (SCS1) sampling clock select register (SCS), selection fsam possible between fX/2N+1, fX/64, fX/128 (when
µPD78P018F
main system clock operation)
60.0
10.0
Operation Guaranteed Range
Cycle Time
Supply Voltage
µPD78P018F
Read/Write Operation +85°C,
Parameter ASTB high-level width Address setup time Address hold time Data input time from address Symbol tASTH tADS tADH tADD1 tADD2 Data input time from tRDD1 tRDD2 Read data hold time low-level width tRDH tRDL1 tRDL2 WAIT input time from tRDWT1 tRDWT2 WAIT input time from WAIT low-level width Write data setup time Write data hold time low-level width delay time from ASTB delay time from ASTB ASTB delay time from external fetch Address hold time from external fetch Write data output time from tRDADH tRDWD Write data output time from tWRWD Address hold time from tWRADH delay time from WAIT delay time from WAIT tWTRD tWTWR tWRWT tWTL tWDS tWDH tWRL tASTRD tASTWR tRDAST Load resistance (0.5 2n)tCY (2.5 2n)tCY (1.5 2n)tCY (2.5 2n)tCY 2n)tCY Test Conditions MIN. (2.5 2n)tCY 2n)tCY 2n)tCY (2.5 2n)tCY MAX. Unit
Remarks TCY/4 indicates number waits.
µPD78P018F
Serial Interface +85°C, Serial Interface Channel 3-wire serial mode (SCK0. Internal clock output)
Symbol tKCY1 Conditions MIN. 1600 3200 4800 SCK0 high-/low-level width setup time SCK0) tKH1, tKL1 tSIK1 tKCY1/2 tKCY1/2 hold time (from SCK0) output delay time from SCK0 tKSO1 pFNote tKSI1 TYP. MAX. Unit
Parameter SCK0 cycle time
Note load capacitance SCK0 output lines. (ii) 3-wire serial mode (SCK0. External clock input)
Parameter SCK0 cycle time Symbol tKCY2 Conditions MIN. 1600 3200 4800 SCK0 high-/low-level width tKH2, tKL2 1600 2400 setup time SCK0) hold time (from SCK0) output delay time from SCK0 SCK0 rise, fall time tSIK2 tKSI2 tKSO2 pFNote tR2, When external device expansion function used When external When 16-bit timer device expansion output function function used used When 16-bit timer output function used TYP. MAX. Unit
1000
Note load capacitance output line.
µPD78P018F
(iii) mode (SCK0. Internal clock output)
Parameter SCK0 cycle time Symbol tKCY3 Conditions MIN. 3200 4800 SCK0 high-/low-level width SB0, setup time SCK0) tKH3, tKL3 tSIK3 tKCY3/2 tKCY3/2 SB0, hold time (from SCK0) SB0, output delay time from SCK0 SB0, from SCK0 SCK0 from SB0, tKSI3 tKSO3 pFNote tKCY3/2 tKCY3 tKCY3 tKCY3 tKCY3 1000 TYP. MAX. Unit
tKSB tSBK
SB0, high-level width tSBH SB0, low-level width tSBL
Note load resistance load capacitance SB0, SCK0 output lines. (iv) mode (SCK0. External clock input)
Parameter SCK0 cycle time Symbol tKCY4 Conditions MIN. 3200 4800 SCK0 high-/low-level width tKH4, tKL4 1600 2400 SB0, setup time SCK0) tSIK4 SB0, hold time (from SCK0) SB0, output delay time from SCK0 SB0, from SCK0 SCK0 from SB0, tKSI4 tKSO4 pFNote tKCY4/2 tKCY4 tKCY4 tKCY4 tKCY4 When external device expansion function used When external When 16-bit timer device expansion output function function used used When 16-bit timer output function used 1000 TYP. MAX. Unit
tKSB tSBK
SB0, high-level width tSBH SB0, low-level width SCK0 rise, fall time tSBL tR4,
1000
Note load resistance load capacitance output lines.
µPD78P018F
2-wire serial mode (SCK0. Internal clock output)
Parameter SCK0 cycle time Symbol tKCY5 Conditions pFNote MIN. 1600 3200 4800 SCK0 high-level width tKH5 tKCY5/2 tKCY5/2 SCK0 low-level width tKL5 tKCY5/2 tKCY5/2 SB0, setup time SCK0) tSIK5 SB0, hold time (from SCK0) SB0, output delay time from SCK0 tKSI5 tKSO5 TYP. MAX. Unit
Note load resistance load capacitance SCK0, output lines. (vi) 2-wire serial mode (SCK0. External clock input)
Parameter SCK0 cycle time Symbol tKCY6 Conditions MIN. 1600 3200 4800 SCK0 high-level width tKH6 1300 2100 SCK0 low-level width tKL6 1600 2400 SB0, setup time SCK0) SB0, hold time (from SCK0) SB0, output delay time from SCK0 tSIK6 tKSI6 tKSO6 pFNote tKCY6/2 SCK0 rise, fall time tR6, When external device expansion function used When external When 16-bit timer device expansion output function function used used When 16-bit timer output function used TYP. MAX. Unit
1000
Note load resistance load capacitance output lines.
µPD78P018F
Serial Interface Channel 3-wire serial mode (SCK1. Internal clock output)
Symbol tKCY7 Conditions MIN. 1600 3200 4800 SCK1 high-/low-level width setup time SCK1) tKH7, tKL7 tSIK7 tKCY7/2 tKCY7/2 hold time (from SCK1) output delay time from SCK1 tKSI7 tKSO7 pFNote TYP. MAX. Unit
Parameter SCK1 cycle time
Note load capacitance SCK1 output lines. (ii) 3-wire serial mode (SCK1. External clock input)
Parameter SCK1 cycle time Symbol tKCY8 Conditions MIN. 1600 3200 4800 SCK1 high-/low-level width tKH8, tKL8 1600 2400 setup time SCK1) hold time (from SCK1) output delay time from SCK1 SCK1 rise, fall time tSIK8 tKSI8 tKSO8 pFNote tR8, When external device expansion function used When external When 16-bit timer device expansion output function function used used When 16-bit timer output function used TYP. MAX. Unit
1000
Note load capacitance output line.
µPD78P018F
(iii) 3-wire serial mode with automatic transmit/receive function (SCK1. Internal clock output)
Parameter SCK1 cycle time Symbol tKCY9 Conditions MIN. 1600 3200 4800 SCK1 high-/low-level width setup time SCK1) tKH9, tKL9 tSIK9 tKCY9/2 tKCY9/2 hold time (from SCK1) output delay time from SCK1 from SCK1 Strobe signal high-level width tKSI9 tKSO9 tSBD tSBW pFNote tKCY9/2 tKCY9 tKCY9 tKCY9 Busy signal setup time busy signal detection timing) Busy signal hold time (from busy signal detection timing) tBYH SCK1 from busy inactive tSPS 2tKCY9 tBYS tKCY9/2 tKCY9 tKCY9 tKCY9 TYP. MAX. Unit
Note load capacitance SCK1 output lines.
µPD78P018F
(iv) 3-wire serial mode with automatic transmit/receive function (SCK1. External clock input)
Parameter SCK1 cycle time Symbol tKCY10 Conditions MIN. 1600 3200 4800 SCK1 high-/low-level width tKH10, tKL10 1600 2400 setup time SCK1) hold time (from SCK1) output delay time from SCK1 SCK1 rise, fall time tR10, tF10 When external device expansion function used When external device expansion function used tKSO10 pFNote 1000 tSIK10 tKSI10 TYP. MAX. Unit
Note load capacitance output line.
µPD78P018F
Timing Test Point (Excluding Input)
Test Points
Clock Timing
1/fX
Input
VIH4 (MIN.) VIL4 (MAX.)
1/fXT tXTL tXTH
Input
VIH5 (MIN.) VIL5 (MAX.)
Timing
tTIL0
tTIH0
1/fTI1 tTIL1 tTIH1
TI1,TI2
µPD78P018F
Read/Write Operation External fetch wait):
Higher 8-Bit Address tADD1 Hi-Z
tADS tASTH ASTB
Lower 8-Bit Address
Operation Code tRDD1 tRDADH tRDAST
tADH
tASTRD tRDL1 tRDH
External fetch (Wait insertion):
Higher 8-Bit Address tADD1
tADS tASTH ASTB
Lower 8-Bit Address
Hi-Z tRDD1
Operation Code tRDADH tRDAST
tADH
tASTRD WAIT tRDWT1 tWTL tWTRD tRDL1 tRDH
µPD78P018F
External data access wait):
tADD2 tADS tASTH ASTB
Lower 8-Bit Address
Higher 8-Bit Address
Hi-Z tRDD2
Read Data
Hi-Z
Write Data
Hi-Z
tADH
tRDH
tASTRD tASTWR tWRL tRDL2 tRDWD tWRWD tWDS tWDH tWRADH
External data access (Wait insertion):
tADD2 tADS tADH tASTH ASTB tASTRD tRDL2 tASTWR WAIT tRDWT2 tWTL tRDD2
Lower 8-Bit Address
Higher 8-Bit Address Hi-Z Hi-Z Hi-Z
Read Data
Write Data
tRDH
tRDWD
tWDS tWRWD tWRL
tWDH
tWRADH
tWTRD tWRWT
tWTL
tWTWR
µPD78P018F
Serial Transfer Timing 3-wire serial mode:
tKCYm tKLm tKHm
SCK0,SCK1
tSIKm
tKSIm
SI0,SI1
Input Data
tKSOm
SO0,SO1
Output Data
mode (Bus release signal transfer):
tKCY3, tKL3, SCK0 tKSB tSBL tSBH tSBK tSIK3, tKSI3, tKH3,
SB0, tKSO3,
Mode (Command signal transfer):
tKCY3, tKL3, SCK0 tSIK3, tKH3,
tKSB
tSBK
tKSI3,
SB0, tKSO3,
µPD78P018F
2-wire serial mode:
tKCY5,6 tKL5,6 SCK0 tKSO5,6 SB0, tSIK5,6 tKSI5,6 tKH5,6
3-wire serial mode with automatic transmit/receive function:
tSIK9,10 tKSO9,10
tKSI9,10 tKH9,10 tF10
SCK1 tKL9,10 tKCY9,10 tR10 tSBD tSBW
3-wire serial mode with automatic transmit/receive function (Busy processing):
SCK1
Note
tBYS
Note
tBYH
Note
tSPS
BUSY (Active High)
Note signal actually driven here; shown such indicate timing.
µPD78P018F
Converter Characteristics +85°C, AVDD AVSS
Parameter Resolution Overall errorNote AVREF AVDD AVREF Conversion time tCONV AVREF AVDD AVREF Sampling time Analog input voltage Reference voltage resistance tSAMP VIAN AVREF RAIREF 19.1 38.2 24/fX AVSS AVREF AVDD Symbol Conditions MIN. TYP. MAX. Unit
Note Overall error excluding quantization error (±1/2 LSB). indicated ratio full-scale value. Data Memory STOP Mode Supply Voltage Data Retention Characteristics +85°C)
Parameter Data retention supply voltage Data retention supply current Release signal time Oscillation stabilization wait time Symbol VDDDR IDDDR VDDDR Subsystem clock stops feedback resistor disconnected Release RESET Release interrupt request 218/f Note Conditions MIN. TYP. MAX. Unit
tSREL tWAIT
Note combination with bits (OSTS0 OSTS2) oscillation stabilization time select register (OSTS), selection 213/fX 215/fX 218/fX possible. Data Retention Timing (STOP Mode Release RESET)
Internal Reset Operation HALT Mode STOP Mode Data Retention Mode Operating Mode
STOP Instruction Execution
VDDDR
tSREL
RESET tWAIT
µPD78P018F
Data Retention Timing (Standby Release Signal STOP Mode Release Interrupt Request Signal)
HALT Mode STOP Mode Data Retention Mode Operating Mode
VDDDR STOP Instruction Execution
tSREL
Standby Release Signal (Interrupt Request) tWAIT
Interrupt Request Input Timing
tINTL INTP0 INTP2 tINTH
tINTL
INTP3
RESET Input Timing
tRSL
RESET
µPD78P018F
PROM PROGRAMMING CHARACTERISTICS Characteristics PROM Write Mode ±0.25 12.5 ±0.3
Parameter Input voltage, high Input voltage, Output voltage, high Output voltage, Input leakage current supply voltage supply voltage supply current supply current Symbol SymbolNote 12.2 6.25 12.5 Conditions MIN. 12.8 6.75 TYP. MAX. Unit
Note Corresponding µPD27C1001A symbol PROM Read Mode ±5°C, ±0.5 ±0.6
Parameter Input voltage, high Input voltage, Output voltage, high Symbol VOH1 VOH2 Output voltage, Input leakage current Output leakage current supply voltage supply voltage supply current supply current SymbolNote VOH1 VOH2 ICCA1 -100 VOUT VDD, Conditions MIN. TYP. MAX. Unit
Note Corresponding µPD27C1001A symbol
µPD78P018F
Characteristics PROM Write Mode Page program mode ±5°C, ±0.25 12.5 ±0.3
Parameter Address setup time setup time setup time Input data setup time Address hold time (from Symbol tOES tCES tAHL tAHV Input data hold time (from Data output float delay time from setup time setup time Program pulse width Valid data delay time from pulse width during data latching setting time hold time hold time tVPS tVDS tPGMS tCEH tOEH SymbolNote tOES tCES tAHL tAHV tVPS tVCS tPGMS tCEH tOEH Conditions MIN. 0.095 0.105 TYP. MAX. Unit
Note Corresponding µPD27C1001A symbol Byte program mode ±5°C, ±0.25 12.5 ±0.3
Parameter Address setup time PGM) setup time setup time PGM) Input data setup time PGM) Address hold time (from Input data hold time (from PGM) Data output float delay time from setup time PGM) setup time PGM) Program pulse width Valid data delay time from hold time Symbol tOES tCES tVPS tVDS tOEH SymbolNote tOES tCES tVPS tVCS Conditions MIN. 0.095 0.105 TYP. MAX. Unit
Note Corresponding µPD27C1001A symbol
µPD78P018F
PROM Read Mode ±5°C, ±0.5 ±0.6
Parameter Data output time from address Data output delay time from Data output delay time from Data output float delay time from Data hold time from address Symbol tACC SymbolNote tACC Conditions MIN. TYP. MAX. Unit
Note Corresponding µPD27C1001A symbol PROM Programming Mode Setting 25°C,
Parameter PROM programming mode setup time Symbol tSMA Conditions MIN. TYP. MAX. Unit
PROM Write Mode Timing (Page program mode)
Page Data Latch
Page Program
Program Verify
Hi-Z Hi-Z tPGMS tVPS tVDS tCES tOES tCEH tOEH Data Input Data Output Hi-Z tAHL tAHV
µPD78P018F
PROM Write Mode Timing (Byte program mode)
Program Program Verify
Hi-Z Data Input Hi-Z Data Output Hi-Z
Cautions must applied before after VPP. must exceed +13.5 including overshoot. Removing reinserting while +12.5 applied adversely affect reliability. PROM Read Mode Timing
Effective Address
Note Note
Data Output
Note
Hi-Z
Hi-Z
Notes When reading within tACC range, input delay time from fall time must maximum tACC tOE. time from point which either (whichever first) reaches VIH.
µPD78P018F
PROM Programming Mode Setting Timing
RESET
Effective Address
µPD78P018F
CHARACTERISTIC CURVE (REFERENCE VALUE)
(Main System Clock: 10.0 MHz)
10.0
HALT Oscillation, Halt)
Supply Current [mA]
0.05
HALT Halt, Oscillation)
0.01
0.005 10.0 32.768
0.001 Supply Voltage
µPD78P018F
PACKAGE DRAWINGS
PLASTIC SHRINK (750 mils)
NOTE Each lead centerline located within 0.17 (0.007 inch) true position (T.P.) maximum material condition. Item center leads when formed parallel.
ITEM
MILLIMETERS 58.68 MAX. 1.78 MAX. 1.778 (T.P.) 0.50±0.10 MIN. 3.2±0.3 0.51 MIN. 4.31 MAX. 5.08 MAX. 19.05 (T.P.) 17.0 0.25+0.10 -0.05 0.17 0~15°
INCHES 2.311 MAX. 0.070 MAX. 0.070 (T.P.) 0.020+0.004 -0.005 0.035 MIN. 0.126±0.012 0.020 MIN. 0.170 MAX. 0.200 MAX. 0.750 (T.P.) 0.669 0.010+0.004 -0.003 0.007 0~15° P64C-70-750A,C-1
Remark dimensions materials versions same those mass-produced versions.
µPD78P018F
CERAMIC SHRINK (750 mils)
NOTES Each lead centerline located within 0.25 (0.010 inch) true position (T.P.) maximum material condition. Item center leads when formed parallel.
ITEM
MILLIMETERS 58.68 MAX. 1.78 MAX. 1.778 (T.P.) 0.46±0.05 MIN. 3.5±0.3 MIN. 5.08 MAX. 19.05 (T.P.) 18.8 0.25±0.05 0.25 0~15°
INCHES 2.310 MAX. 0.070 MAX. 0.070 (T.P.) 0.018±0.002 0.031 MIN. 0.138±0.012 0.039 MIN. 0.118 0.200 MAX. 0.750 (T.P.) 0.740 0.010 +0.002 -0.003 0.010 0~15°
8.89
0.350
P64DW-70-750A-1
µPD78P018F
PLASTIC
detail lead
NOTE Controlling dimension
ITEM MILLIMETERS 17.6±0.4 14.0±0.2 14.0±0.2 17.6±0.4 0.37 +0.08 -0.07 0.15 (T.P.) 1.8±0.2 0.8±0.2 0.17 +0.08 -0.07 0.10 2.55±0.1 0.1±0.1 5°±5° 2.85 MAX. INCHES 0.693±0.016 0.551 +0.009 -0.008 0.551 +0.009 -0.008 0.693±0.016 0.039 0.039 0.015 +0.003 -0.004 0.006 0.031 (T.P.) 0.071±0.008 0.031 +0.009 -0.008 0.007 +0.003 -0.004 0.004 0.100±0.004 0.004±0.004 5°±5° 0.113 MAX. P64GC-80-AB8-4
millimeter.
Each lead centerline located within 0.15 (0.006 inch) true position (T.P.) maximum material condition.
Remark dimensions materials versions same those mass-produced versions.
µPD78P018F
PLASTIC LQFP
detail lead
NOTE
ITEM MILLIMETERS 14.8±0.4 12.0±0.2 12.0±0.2 14.8±0.4 1.125 1.125 0.30±0.10 0.13 0.65 (T.P.) 1.4±0.2 0.6±0.2 0.15 +0.10 -0.05 0.10 0.125±0.075 5°±5° MAX. INCHES 0.583±0.016 0.472 +0.009 -0.008 0.472 +0.009 -0.008 0.583±0.016 0.044 0.044 0.012 +0.004 -0.005 0.005 0.026 (T.P.) 0.055±0.008 0.024 +0.008 -0.009 0.006 +0.004 -0.003 0.004 0.055 0.005±0.003 5°±5° 0.067 MAX. P64GK-65-8A8-1
Each lead centerline located within 0.13 (0.005 inch) true position (T.P.) maximum material condition.
Remark
dimensions materials versions same those mass-produced versions.
µPD78P018F
CERAMIC WQFN
X64KW-80A1
NOTE Each lead centerline located within 0.08 (0.003 inch) true position (T.P.) maximum material condition. ITEM MILLIMETERS 14.0 0.18 13.4 13.4 14.0 0.18 1.84 3.56 MAX. 0.51 0.08 (T.P.) 0.15 10.8 0.75 0.15 0.10 INCHES 0.551 0.007 0.528 0.528 0.551 0.007 0.072 0.141 MAX. 0.02 0.004 0.003 0.031 (T.P.) 0.039+0.007 -0.006 0.012 0.039 0.039 0.118 0.425 0.055 0.03+0.006 -0.007 0.004
µPD78P018F
RECOMMENDED SOLDERING CONDITIONS
µPD78P018F should soldered mounted under following recommended conditions. recommended soldering conditions, refer document Semiconductor Device Mounting Technology Manual (C10535E). soldering methods conditions other than those recommended below, contact your sales representative. Table 12-1. Surface Mounting Type Soldering Conditions µPD78P018FGC-AB8: 64-pin Plastic
Soldering Method Infrared rays reflow Wave soldering Partial heating Soldering Conditions Package peak temperature: 235°C, Time: seconds max. 210°C higher), Count: Three times less Package peak temperature: 215°C, Time: seconds max. 200°C higher), Count: Three times less Solder temperature: 260°C, Time: seconds max., Count: Once, Preheating temperature: 120°C max. (package surface temperature) temperature: 300°C below, Time: seconds max. (per row) Symbol IR35-00-3 VP15-00-3 WS60-00-1
µPD78P018FGK-8A8: 64-pin Plastic LQFP
Soldering Method Infrared rays reflow Soldering Conditions Package peak temperature: 235°C, Time: seconds max. 210°C higher), Count: Twice less, Exposure limit: days Note (after days, prebake 125°C hours) Package peak temperature: 215°C, Time: seconds max. 200°C higher), Count: Twice less, Exposure limit: days Note (after days, prebake 125°C hours) Solder temperature: 260°C, Time: seconds max., Count: Once, Preheating temperature: 120°C max. (package surface temperature), Exposure limit: days Note (after days, prebake 125°C hours) temperature: 300°C below, Time: seconds max. (per row) Symbol IR35-107-2
VP15-107-2
Wave soldering
WS60-107-1
Partial heating
Note Maximum allowable time from taking soldering packages pack soldering. Storage conditions: 25°C relative humidity less. Caution different soldering methods together (except partial heating).
Table 12-2. Insertion Type Soldering Conditions
PD78P018FCW: 64-pin Plastic Shrink (750 mils) PD78P018FDW: 64-pin Ceramic Shrink (with window) (750 mils)
Soldering Method Wave soldering (pin only) Partial heating Soldering Conditions Solder temperature: 260°C below, Time: seconds max. temperature: 300°C below, Time: seconds max. (per row)
Caution
Apply wave soldering only pins careful bring solder into direct contact with package.
µPD78P018F
APPENDIX DEVELOPMENT TOOLS
following development tools available system development using µPD78P018F. Also refer Cautions using development tools. Language Processing Software
RA78K/0 CC78K/0 DF78014 CC78K/0-L 78K/0 Series common assembler package 78K/0 Series common compiler package Device file µPD78018F Subseries 78K/0 Series common compiler library source file
PROM Writing Tools
PG-1500 PA-78P018CW PA-78P018GC PA-78P018GK PA-78P018KK-S PG-1500 controller PROM programmer Programmer adapter connected PG-1500
PG-1500 control program
Debugging Tool When using in-circuit emulator IE-78K0-NS
IE-78K0-NS IE-70000-MC-PS-B IE-70000-98-IF-C IE-70000-CD-I-A IE-70000-PC-IF-C IE-70000-PCI-IF IE-78018-NS-EM1 NP-64CW NP-64GC NP-64GK TGK-064SBW EV-9200GC-64 ID78K0-NSNote SM78K0 DF78014 In-circuit emulator common 78K/0 Series Power supply unit IE-78K0-NS Interface adapter when using PC-9800 series host machine (excluding notebook PCs, supported card interface cable when using notebook PC-9800 series host machine (PCMCIA socket supported) Interface adapter when using PC/ATcompatible host machine (ISA supported) Adapter when using that incorporates host machine Emulation board µPD78018F Subseries Emulation probe 64-pin plastic shrink type) Emulation probe 64-pin plastic (GC-AB8 type) Emulation probe 64-pin plastic LQFP (GC-8A8 type) Conversion adapter connecting target system board designed mount 64-pin plastic LQFP (GK8A8 type) NP-64GK. Socket mounted target system board manufactured 64-pin plastic (GC-AB8 type) Integrated debugger IE-78K0-NS System simulator common 78K/0 Series Device file µPD78018F Subseries
µPD78P018F
When using in-circuit emulator IE-78001-R-A
IE-78001-R-A IE-70000-98-IF-C IE-70000-PC-IF-C IE-78000-R-SV3 IE-70000-PCI-IF IE-78018-NS-EM1 IE-78K0-R-EX1 EP-78240CW-R EP-78240GC-R EP-78012GK-R TGK-064SBW EV-9200GC-64 ID78K0 SM78K0 DF78014 In-circuit emulator common 78K/0 Series Interface adapter when using PC-9800 series host machine (excluding notebook PCs, supported) Interface adapter when using PC/AT compatible host machine (ISA supported) Interface adapter cable when using host machine Adapter when using that incorporates host machine Emulation board µPD78018F Subseries Emulation probe conversion board IE-78018-NS-EM1 IE-78001-R-A Emulation probe 64-pin plastic shrink type) Emulation probe 64-pin plastic (GC-AB8 type) Emulation probe 64-pin plastic LQFP (GK-8A8 type) Conversion adapter connecting target system board designed mount 64-pin plastic LQFP (GK8A8) NP-64GK. Socket mounted target system board manufactured 64-pin plastic (GC-AB8 type) Integrated debugger IE-78001-R-A System simulator common 78K/0 Series Device file µPD78018F Subseries
Real-time
RX78K/0 MX78K0 Real-time 78K/0 Series 78K/0 Series
µPD78P018F
Cautions using development tools ID-78K0-NS, ID78K0, SM78K0 used combination with DF78014. CC78K/0 RX78K/0 used combination with RA78K/0 DF78014. NP-64CW, NP64GC, NP-64GK products made Naitou Densei Machidaseisakusho (+81-44822-3813). Contact dealer regarding purchase these products. TGK-064SBW product made TOKYO ELETECH CORPORATION. further information, connect Daimaru Kogyo, Ltd. Tokyo Electronics Dept. (+81-3-3820-7112) Osaka Electronics Dept. (+81-6-244-6672) third party development tools, 78K/0 Series Selection Guide (U11126E). host machines supporting each software follows.
Host Machine [OS] Software RA78K/0 CC78K/0 PG-1500 controller ID78K0-NS ID78K0 SM78K0 RX78K/0 MX78K0 PC-9800 series [WindowsTM] PC/AT compatible [Japanese/English Windows] Note Note Note Note Note HP9000 series 700[HP-UXTM] SPARCstation[SunOSTM, SolarisTM] NEWS(RISC) [NEWS-OSTM]
Note DOS-based software
µPD78P018F
Drawing Conversion Socket (EV-9200GC-64) Recommended Footprint Figure A-1. Drawing EV-9200GC-64 (for reference only)
EV-9200GC-64-G0 INCHES 0.74 0.555 0.555 0.74 0.118 0.031 0.236 0.622 0.728 0.236 0.622 0.728 0.315 0.307 0.098 0.079 0.053 0.014+0.004 -0.005
EV-9200GC-64
No.1 index
ITEM MILLIMETERS 18.8 14.1 14.1 18.8 15.8 18.5 15.8 18.5 1.35 0.35
0.091 0.059
µPD78P018F
Figure A-2. Recommended Footprint EV-9200GC-64 (for reference only)
EV-9200GC-64-P1E ITEM Caution MILLIMETERS 19.5 14.8 0.8±0.02 15=12.0±0.05 INCHES 0.768 0.583 0.031+0.002 -0.001 0.591=0.472 +0.003 -0.002
0.8±0.02 15=12.0±0.05 0.031+0.002 0.591=0.472 +0.003 -0.001 -0.002 14.8 19.5 6.00 0.08 6.00 0.08 0.02 0.583 0.768 0.236 +0.004 -0.003 0.236 +0.004 -0.003 0.197 +0.001 -0.002
2.36 0.03 1.57 0.03
0.093 +0.001 -0.002 0.087 +0.004 -0.005 0.062 +0.001 -0.002
Dimensions mount EV-9200 that target device (QFP) different some parts. recommended mount dimensions QFP, refer "SEMICONDUCTOR DEVICE MOUNTING TECHNOLOGY MANUAL" (C10535E).
µPD78P018F
Drawing Conversion Adapter (TGK-064SBW) Figure A-3. Drawing TGK-064SBW (for reference only)
TGK-064SBW (TQPACK064SB TQSOCKET064SBW) Package dimension (unit:
Protrusion height
ITEM MILLIMETERS 18.4 0.65x15=9.75 0.65 7.75 10.15 12.55 14.95 0.65x15=9.75 11.85 18.4 12.45 10.25 10.02 14.92 11.1 1.45 1.45 INCHES 0.724 0.026x0.591=0.384 0.026 0.305 0.400 0.494 0.589 0.026x0.591=0.384 0.467 0.724 0.079 0.490 0.404 0.303 0.394 0.587 0.437 0.057 0.057 0.051 0.071 0.197 ITEM MILLIMETERS INCHES
1.85 1.325 1.325
0.012
0.073 0.138 0.079 0.154 0.052 0.052 0.232 0.031 0.094 0.106 TGK-064SBW-G1E
0.209
0.039
3.55
0.140 0.035
note: Product TOKYO ELETECH CORPORATION.
µPD78P018F
APPENDIX RELATED DOCUMENTS
Device Related Documents
Document Name Document English Japanese U10280J U10955J U10659J U12326J U10903J U10904J IEM-5594 U12704J U13482J
µPD78011F, 78012F, 78013F, 78014F, 78015F, 78016F, 78018F Data Sheet µPD78P018F Data Sheet µPD78018F, 78018FY Subseries User's Manual
78K/0 Series User's Manual Instructions 78K/0 Series Instruction List 78K/0 Series Instruction
U10280E This document U10659E U12326E U12704E IEA-1289
µPD78018F Subseries Special Function Register Table
78K/0 Series Application Note Basics Floating-Point Arithmetic Programs
Development Tool Documents (User's Manual)
Document Name RA78K0 Assembler Package Operation Assembly Language Structured Assembly Language RA78K Series Structured Assembler Preprocessor CC78K0 Compiler Operation Language CC78K/0 Compiler Application Note PG-1500 PROM Programmer PG-1500 Controller PC-9800 Series (MS-DOSTM) Based PG-1500 Controller Series DOSTM) Based IE-78K0-NS IE-78001-R-A IE-78K0-R-EX1 IE-78018-NS-EM1 EP-78240 EP-78012GK-R SM78K0 System Simulator Windows Based SM78K Series System Simulator ID78K/0-NS Integrated Debugger Windows Based ID78K/0 Integrated Debugger Based ID78K/0 Integrated Debugger Based ID78K/0 Integrated Debugger Windows Based Reference External Part User Open Interface Specification Reference Reference Reference Guide Programming Know-How U11802E U11801E U11789E EEU-1402 U11517E U11518E U13034E U11940E EEU-1291 U10540E prepared prepared prepared prepared U10332E EEU-1538 U10181E U10092E U12900E U11539E U11649E Document English Japanese U11802J U11801J U11789J U12323J U11517J U11518J U13034J U11940J EEU-704 EEU-5008 prepared prepared prepared U13289J EEU-986 EEU-5012 U10181J U10092J U12900J U11151J U11539J U11649J
Caution
contents above related documents subject change without notice. latest documents should used design.
µPD78P018F
Embedded Software Documents (User's Manual)
Document Name 78K/0 Series Real-Time Basics Installation 78K/0 Series MX78K0 Basics U11537E U11536E U12257E Document English Japanese U11537J U11536J U12257J
Other Documents
Document Name Package Manual (CD-ROM) Semiconductor Device Mounting Technology Manual Quality Grades Semiconductor Devices Semiconductor Device Reliability/Quality Control System C13388E C10535E C11531E C10983E Document English Japanese C10535J C11531J C10983J C11892J U11416J
Guide Prevent Damage Semiconductor Devices Electrostatic Discharge (ESD) C11892E Guide Quality Assurance Semiconductor Devices Microcomputer Product Series Guide MEI-1202
Caution
contents above related documents subject change without notice. latest documents should used design.
µPD78P018F
[MEMO]
µPD78P018F
NOTES CMOS DEVICES
PRECAUTION AGAINST SEMICONDUCTORS
Note: Strong electric field, when exposed device, cause destruction gate oxide ultimately degrade device operation. Steps must taken stop generation static electricity much possible, quickly dissipate once, when occurred. Environmental control must adequate. When dry, humidifier should used. recommended avoid using insulators that easily build static electricity. Semiconductor devices must stored transported anti-static container, static shielding conductive material. test measurement tools including work bench floor should grounded. operator should grounded using wrist strap. Semiconductor devices must touched with bare hands. Similar precautions need taken boards with semiconductor devices
HANDLING UNUSED INPUT PINS CMOS
Note: connection CMOS device inputs cause malfunction. connection provided input pins, possible that internal input level generated noise, etc., hence causing malfunction. CMOS device behave differently than Bipolar NMOS devices. Input levels CMOS devices must fixed high using pull-up pull-down circuitry. Each unused should connected with resistor, considered have possibility being output pin. handling related unused pins must judged device device related specifications governing devices.
STATUS BEFORE INITIALIZATION DEVICES
Note: Power-on does necessarily define initial status device. Production process does define initial operation status device. Immediately after power source turned devices with reset function have been initialized. Hence, power-on does guarantee out-pin levels, settings contents registers. Device initialized until reset signal received. Reset operation must executed immediately after power-on devices having reset function.
µPD78P018F
Regional Information
Some information contained this document vary from country country. Before using product your application, pIease contact office your country obtain list authorized representatives distributors. They will verify:
Device availability Ordering information Product release schedule Availability related technical literature Development environment specifications (for example, specifications third-party tools components, host computers, power plugs, supply voltages, forth) Network requirements
addition, trademarks, registered trademarks, export restrictions, other legal issues also vary from country country.
Electronics Inc. (U.S.)
Santa Clara, California Tel: 408-588-6000 800-366-9782 Fax: 408-588-6130 800-729-9288
Electronics (Germany) GmbH
Benelux Office Eindhoven, Netherlands Tel: 040-2445845 Fax: 040-2444580
Electronics Hong Kong Ltd.
Hong Kong Tel: 2886-9318 Fax: 2886-9022/9044
Electronics Hong Kong Ltd. Electronics (France) S.A.
Velizy-Villacoublay, France Tel: 01-30-67 Fax: 01-30-67 Seoul Branch Seoul, Korea Tel: 02-528-0303 Fax: 02-528-4411
Electronics (Germany) GmbH
Duesseldorf, Germany Tel: 0211-65 Fax: 0211-65
Electronics (France) S.A. Electronics (UK) Ltd.
Milton Keynes, Tel: 01908-691-133 Fax: 01908-670-290 Spain Office Madrid, Spain Tel: 01-504-2787 Fax: 01-504-2860
Electronics Singapore Pte. Ltd.
United Square, Singapore 1130 Tel: 65-253-8311 Fax: 65-250-3583
Electronics Taiwan Ltd. Electronics Italiana s.r.1.
Milano, Italy Tel: 02-66 Fax: 02-66
Electronics (Germany) GmbH
Scandinavia Office Taeby, Sweden Tel: 08-63 Fax: 08-63
Taipei, Taiwan Tel: 02-2719-2377 Fax: 02-2719-5951
Brasil S.A.
Electron Devices Division Rodovia Presidente Dutra, 07210-902-Guarulhos-SP Brasil Tel: 55-11-6465-6810 Fax: 55-11-6465-6829
J98.
µPD78P018F
FIP, IEBus, QTOP trademarks Corporation. MS-DOS Windows either registered trademarks trademarks Microsoft Corporation United States and/or other countries. PC/AT trademarks International Business Machines Corporation. HP9000 Series HP-UX trademarks Hewlett-Packard Company. SPARCstation trademark SPARC International, Inc. Solaris SunOS trademarks Microsystems, Inc. NEWS NEWS-OS trademarks Sony Corporation. related documents indicated this publication include preliminary versions. However, preliminary versions marked such.
export these products from Japan regulated Japanese government. export some these products prohibited without governmental license. export re-export some these products from country other than Japan also prohibited without license from that country. Please call sales representative.
License needed:
µPD78P018FDW, 78P018FKK-S
customer must judge need license: µPD78P018FCW, 78P018FGC-AB8, 78P018FGK-8A8 part this document copied reproduced form means without prior written consent Corporation. Corporation assumes responsibility errors which appear this document. Corporation does assume liability infringement patents, copyrights other intellectual property rights third parties arising from device described herein other liability arising from such device. license, either express, implied otherwise, granted under patents, copyrights other intellectual property rights Corporation others. While Corporation been making continuous effort enhance reliability semiconductor devices, possibility defects cannot eliminated entirely. minimize risks damage injury persons property arising from defect semiconductor device, customers must incorporate sufficient safety measures design, such redundancy, fire-containment, anti-failure features. devices classified into following three quality grades: "Standard", "Special", "Specific". Specific quality grade applies only devices developed based customer designated "quality assurance program" specific application. recommended applications device depend quality grade, indicated below. Customers must check quality grade each device before using particular application. Standard: Computers, office equipment, communications equipment, test measurement equipment, audio visual equipment, home electronic appliances, machine tools, personal electronic equipment industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment medical equipment (not specifically designed life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems medical equipment life support, etc. quality grade devices "Standard" unless otherwise specified NEC's Data Sheets Data Books. customers intend devices applications other than those specified Standard quality grade, they should contact sales representative advance. Anti-radioactive design implemented this product.
96.5

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