Item Operating Temperature Range Capacitance +100°C Within specified t

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Item Operating Temperature Range Capacitance +100°C Within specified t

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!SPECIFICATION TEST METHOD
Item Operating Temperature Range Capacitance +100°C Within specified tolerance. Specification Testing Method capacitance shall measured 20°C with 1±0.2kHz (r.m.s.) max. Dissipation Factor (D.F.) Insulation Resistance (I.R.) Dielectric Strength Between lead wires failure. Between lead wires 10000M min. 1.0% max. 2.5% max. insulation resistance shall measured with DC1000V within 60±5 charging. capacitors shall damage when voltage 150% rated voltage applied between lead wires 60±5 insulate liquid gas. (Charge/discharge currentV50mA) Body insulation failure. capacitors placed container with metal balls diameter that each lead wire, shortcircuited, kept approximately balls shown figure, voltage applied between capacitor lead wires small metals. (Charge/discharge currentV50mA) Temperature Characteristic Temp. Char. capacitance measurement shall made each step specified table. Capacitance change from value step shall exceed limit specified. Temp. Coefficient Max. Cap. Change -4700±1000ppm/°C ±10% Char. Soldering Effect Appearance marked defect. Step
Metal balls Approx.
Same condition capacitance.
20±2°C
-25±3°C
20±2°C 20±2°C
85±2°C 85±2°C
20±2°C 20±2°C
lead wires shall immersed into melted solder 350±10°C about 2.0mm from main body 3.5±0.5 Post-treatment: Capacitor shall stored 24±2 *room condition.
Capacitance Change Within ±10% Dielectric Strength (Between lead wires) Humidity (Under Steady State) Appearance marked defect. failure.
capacitor 240±8 40±2°C humidity. Post-treatment: Capacitor shall stored *room condition.
Capacitance Change Within ±10% D.F. I.R. Dielectric Strength (Between lead wires) 5000M min. failure. 1.5% max. 4.0% max.
Life
Appearance
marked defect.
Apply voltage 125% rated voltage 1000+48 silicon 85±2°C. 1.5% max. 4.0% max. Post-treatment: Capacitor shall stored 24±2 *room condition. (Charge/discharge currentV50mA)
Capacitance Change Within ±10% D.F. I.R. 5000M min.
Item Charge Discharge Test Appearance Capacitance Change D.F. I.R. Dielectric Strength (Between lead wires) 5000M min. failure. marked defect. Within ±10%
Specification
Testing Method Charge discharge test shall measured following test circuit cycle.
Applied voltage Rated voltage Cycle numbers 20000 cycles %max. %max. Post-treatment Capacitor shall stored *room condition.
<Circuit>
<Cycle>
Charge
Dicharg
specimen circuit protective resistor (300k) supplied energy .10Cx current limitting resistor (E/10) direct-current voltage source
Temperature Cycling
Appearance
marked defect.
Temperature cycling shall measured following test. Cycle numbers cycles Post-treatment Capacitor shall stored *room condition. 1.5% max. 4.0% max.
Capacitance Change Within ±10% D.F. I.R. Dielectric Strength (Between lead wires) 5000M min. failure.
+100°C
-30°C
Strength Lead
Pull
figure, body capacitor, apply tensile weight gradually each lead wire radial direction capacitor Lead wire shall off. 10N, keep 10±1
Bending
Capacitor shall broken.
Each lead wire shall subjected weight then bend, point egress, direciton, return original position, then bend opposite direction rate bend
Solderability Leads
Lead wire shall soldered with uniformly coated axial direction over circumferential direction.
lead wire capacitor shall dipped into methanol solution rosin then into molten solder 235±5°C 2±0.5 both cases depth dipping about 2.0mm from root lead wires.
(Note) Tests Dielectric Strength, Charge Discharge Test, Humidity, Temperature Cycle Life shall performed with specimens having molded resin (MR1023C made Murata) extending over surface. "room condition" temperature: 35D, humidity: 75%, atomospheric pressure: 106kPa

Item Operating Temperature Range Capacitance +100°C Within specified t

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