RELIABILITY SEMICONDUCTOR DEVICES PHILOSOPHY QUALITY SEMICONDUCTO
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RELIABILITY SEMICONDUCTOR DEVICES
RELIABILITY SEMICONDUCTOR DEVICES
PHILOSOPHY QUALITY SEMICONDUCTOR RELIABILITY
RELIABILITY SEMICONDUCTOR DEVICES
RELIABILITY SEMICONDUCTOR DEVICES
PHILOSOPHY QUALITY
Since foundation, Mitsubishi Electric been seeking philosophy extending business contributing society with high quality products. turn this philosophy into reality, have "customers' first" policy.We always listen customers' quality demands every stage from design development production shipment.The through quality control outputs competitive products. .Mitsubishi Electric acquired 9001 certification (*1).We have been striving accomplish high quality reliability.To achieve this goal, enforce quality control from three standpoints: design, production, finished product.Putting quality first, everyone Mitsubishi Electric seeking customer satisfaction through quality.
Mitsubishi Electric's semiconductor quality assurance systems including development, design, shipment have acquired 9001 Standard Certificate (Certificates from England, Netherlands, Germany, Australia Zealand) 1995. 9001 international quality assurance standard examined registered LRQA.
RELIABILITY SEMICONDUCTOR DEVICES
SEMICONDUCTOR RELIABILITY
reliability semiconductor device represented failure rate curve shown Figure I-1(*2).This often called "bathtub curve" shape.The curve divided into three parts.The first part indicates initial failures that occur immediately short period after device started use.The second part, which relatively long, shows random failures.The final part represents wear-out failures that occurs fatigue degradation, which increase device expiring life.The reliability semiconductor device represented failure rate curve shown Figure I-1(*2).This often called "bathtub curve" shape.The curve divided into three parts.The first part indicates initial failures that occur immediately short period after device started use.The second part, which relatively long, shows random failures.The final part represents wear-out failures that occurs fatigue degradation, which increase device expiring life. .Initial failures, which often originate production testing stages, decrease time passes.Random failures depend device's inherent reliability.It determined design stable during middle period.Wear-out failures increase time passes increased deterioration fatigue.However, since semiconductor device very long life compared other devices ware-out period starts very last part life, generally problem. decrease initial failure rate improve reliability, Mitsubishi Electric carrying production quality control improvement activities, screenings including electrical characteristics testing burn-in. reduce random failures, enforce quality control design stage formal testing (endurance evaluation with life tests, Failure rate Initial failure period Random failure period Wear-out failure period
environmental/mechanical tests, quantitative tests) design verification.
Time(t)
Figure Failure Rate Curve (Bathtub Curve)
8115, device reliability defined degree characteristics that indicates functional stability device over time. degree reliability probability that device executes defined functions during estimated period under defined conditions. general, failure rate time expressed part million (ppm). failure rate during periods initial random failures expressed Failure time (Fit), where Fit=10 /time. wear-out failure period expressed Time Failure (TTF), which refers life until certain cumulative failure rate reached.
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