HIGH PERFORMANCE E2CMOS® TECHNOLOGY Maximum Propagation Delay Fmax Max
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GAL22V10/883
HIGH PERFORMANCE E2CMOS® TECHNOLOGY Maximum Propagation Delay Fmax Maximum from Clock Input Data Output Compatible Outputs UltraMOS® Advanced CMOS Technology ACTIVE PULL-UPS PINS COMPATIBLE WITH STANDARD 22V10 DEVICES Fully Function/Fuse-Map/Parametric Compatible with Bipolar UVCMOS 22V10 Devices REDUCTION POWER VERSUS BIPOLAR CELL TECHNOLOGY Reconfigurable Logic Reprogrammable Cells 100% Tested/100% Yields High Speed Electrical Erasure (<100ms) Year Data Retention OUTPUT LOGIC MACROCELLS Maximum Flexibility Complex Logic Designs PRELOAD POWER-ON RESET REGISTERS 100% Functional Testability APPLICATIONS INCLUDE: Control State Machine Control High Speed Graphics Processing Standard Logic Speed Upgrade ELECTRONIC SIGNATURE IDENTIFICATION
PRESET
Functional Block Diagram
I/CLK
RESET
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
PROGRAMMABLE AND-ARRAY (132X44)
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
OLMC
I/O/Q
Description
GAL22V10/883 high performance E2CMOS programmable logic device processed full compliance MIL-STD-883. This military grade device combines high performance CMOS process with Electrically Erasable (E2) floating gate technology provide highest speed performance available military qualified 22V10 device. CMOS circuitry allows GAL22V10 consume much less power when compared bipolar 22V10 devices. technology offers high speed (<100ms) erase times, providing ability reprogram reconfigure device quickly efficiently. generic architecture provides maximum design flexibility allowing Output Logic Macrocell (OLMC) configured user. GAL22V10 fully function/fuse map/parametric compatible with standard bipolar CMOS 22V10 devices. Unique test circuitry reprogrammable cells allow complete functional testing during manufacture. result, Lattice Semiconductor delivers 100% field programmability functionality products. addition, erase/write cycles data retention excess years specified.
Configuration
CERDIP
I/CLK I/O/Q I/O/Q
I/CLK I/O/Q I/O/Q
I/O/Q I/O/Q
I/O/Q
22V10
I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q I/O/Q
GAL22V10
View
I/O/Q I/O/Q
I/O/Q
I/O/Q
Copyright 1999 Lattice Semiconductor Corp. brand product names trademarks registered trademarks their respective holders. specifications information herein subject change without notice.
I/O/Q
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 681-0118; 1-888-ISP-PLDS; (503) 681-3037; http://www.latticesemi.com
February 1999
22v10mil_04
Specifications GAL22V10D/883
Absolute Maximum Ratings(1)
Supply voltage -0.5 Input voltage applied -2.5 +1.0V Off-state output voltage applied -2.5 +1.0V Storage Temperature 150°C Case Temperature with Power Applied 125°C
Stresses above those listed under "Absolute Maximum Ratings" cause permanent damage device. These stress only ratings functional operation device these other conditions above those indicated operational sections this specification implied (while programming, follow programming specifications).
Recommended Operating Conditions
Case Temperature (TC) 125°C Supply Voltage (VCC) with Respect Ground +4.50 +5.50V
Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Voltage Input High Voltage Input Leakage Current Input High Leakage Current Output Voltage Output High Voltage Level Output Current High Level Output Current Output Short Circuit Current Operating Power Supply Current VOUT 0.5V 25°C -10/-15/-20/-25/-30 (MAX.) 3.5V MAX. MAX. CONDITION MIN.
TYP.3
MAX. Vcc+1 -100 -2.0 -135
UNITS
IIL1 IOS2
0.5V 3.0V ftoggle 15MHz Outputs Open
leakage current internal pull-up pins. Input Buffer section more information. output time maximum duration second. Vout 0.5V selected avoid test problems caused tester ground degradation. Characterized 100% tested. Typical values
Specifications GAL22V10D/883
Switching Characteristics
Over Recommended Operating Conditions TEST COND.1 UNITS
PARAMETER
DESCRIPTION Input Combinatorial Output Clock Output Delay Clock Feedback Delay Setup Time, Input Feedback before Clock Hold Time, Input Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu tcf) Maximum Clock Frequency with Feedback Clock Pulse Duration, High Clock Pulse Duration, Input Output Enabled Input Output Disabled Input Asynchronous Reset Register Asynchronous Reset Pulse Duration Asynchronous Reset Clock Recovery Time Synchronous Preset Clock Recovery Time
MIN. MAX. MIN. MAX.
tcf2
76.9
fmax3
76.9
62.5
tdis tarw tarr tspr
Refer Switching Test Conditions section. Calculated from fmax with internal feedback. Refer fmax Description section. Refer fmax Description section.
Capacitance 25°C, MHz)
SYMBOL CI/O PARAMETER Input Capacitance Capacitance MAXIMUM* UNITS TEST CONDITIONS 5.0V, 2.0V 5.0V, VI/O 2.0V
*Characterized 100% tested.
Specifications GAL22V10D/883 Specifications GAL22V10/883
Switching Characteristics
Over Recommended Operating Conditions TEST COND.1 UNITS
PARAMETER
DESCRIPTION Input Combinatorial Output Clock Output Delay Clock Feedback Delay Setup Time, Input Feedback before Clock Hold Time, Input Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu tcf) Maximum Clock Frequency with Feedback Clock Pulse Duration, High Clock Pulse Duration, Input Output Enabled Input Output Disabled Input Asynchronous Reset Register Asynchronous Reset Pulse Duration Asynchronous Reset Clock Recovery Time Synchronous Preset Clock Recovery Time
MIN. MAX. MIN. MAX. MIN. MAX.
tcf2
31.2
fmax3
31.2
tdis tarw tarr tspr
Refer Switching Test Conditions section. Calculated from fmax with internal feedback. Refer fmax Description section. Refer fmax Description section.
Capacitance 25°C, MHz)
SYMBOL CI/O PARAMETER Input Capacitance Capacitance MAXIMUM* UNITS TEST CONDITIONS 5.0V, 2.0V 5.0V, VI/O 2.0V
*Characterized 100% tested.
Specifications GAL22V10/883
Switching Waveforms
INPUT FEEDBACK
VALID INPUT
INPUT FEEDBACK
VALID INPUT
COMBINATORIAL OUTPUT
Combinatorial Output
REGISTERED OUTPUT
(external fdbk)
Registered Output
INPUT FEEDBACK
OUTPUT
(int
Input Output Enable/Disable
REGISTERED FEEDBACK
fmax with Feedback
(w/o fdbk)
Clock Width
INPUT FEEDBACK DRIVING
INPUT FEEDBACK DRIVING
tarw
REGISTERED OUTPUT
tarr
REGISTERED OUTPUT
Synchronous Preset Asynchronous Reset
Specifications GAL22V10/883
fmax Descriptions
LOGIC ARRAY
REGISTER
LOGIC ARRAY
REGISTER
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback calculated from measured tco.
fmax with Internal Feedback 1/(tsu+tcf)
Note: calculated value, derived subtracting from period fmax w/internal feedback (tcf 1/fmax tsu). value used primarily when calculating delay from clocking register combinatorial output (through registered feedback), shown above. example, timing from clock combinatorial output equal tpd.
LOGIC ARRAY
REGISTER
fmax with Feedback
Note: fmax with feedback less than 1/(twh twl). This allow clock duty cycle other than 50%.
Switching Test Conditions
Input Pulse Levels Input Rise Fall Times Input Timing Reference Levels Output Timing Reference Levels Output Load 3.0V 1.5V 1.5V Figure
FROM OUTPUT (O/Q) UNDER TEST TEST POINT
3-state levels measured 0.5V from steady-state active level. Output Load Conditions (see figure) Test Condition Active High Active Active High Active 50pF 50pF 50pF
INCLUDES TEST FIXTURE PROBE CAPACITANCE
Specifications GAL22V10/883
GAL22V10 Ordering Information (MIL-STD-883 SMD)
Ordering (ns) (ns) (ns) (mA) Package 24-Pin CERDIP 28-Pin 24-Pin CERDIP 28-Pin 24-Pin CERDIP 28-Pin 24-Pin CERDIP 24-Pin CERDIP MIL-STD-883 GAL22V10D-10LD/883 GAL22V10D-10LR/883 GAL22V10D-15LD/883 GAL22V10D-15LR/883 GAL22V10D-20LD/883 GAL22V10D-20LR/883 GAL22V10D-25LD/883 GAL22V10D-30LD/883 5962-8984106LA 5962-89841063A 5962-8984103LA 5962-89841033A 5962-8984102LA 5962-89841023A 5962-8984104LA 5962-8984101LA
Note: Lattice Semiconductor recognizes trend military device procurement towards using compliant devices, such, ordering this number recommended.
Part Number Description
XXXXXXXX
GAL22V10D Device Name Speed (ns) Process /883 Process
Power Power
Package CERDIP
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