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QUALITY SEMICONDUCTOR, INC. Guaranteed Skew CMOS Clock Driver/Buf


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QS5805T, QS52805T, QS5806T, QS52806T
QUALITY SEMICONDUCTOR, INC.
Guaranteed Skew CMOS Clock Driver/Buffer
DESCRIPTION
QS5805T QS5806T QS52805T QS52806T
output, skew clock signal buffer Guaranteed skew on-chip resistors available noise 0.3ns same bank 0.6ns opposite transition 1.0ns different devices Reduced swing outputs noise Input hysteresis better noise margin Monitor output Undershoot clamp diodes inputs Military product compliant MIL-STD-883 Available QSOP SOIC (SO)
QS5805T QS5806T clock driver/buffer circuits used clock buffering schemes where skew parameter. QS5805T offers banks five non-inverting outputs QS5806T provides inverting outputs. Designed QSI's proprietary QCMOS process, these devices provide propagation delay buffering with on-chip skew 0.3ns same-transition, same-bank signals. QS52805T QS52806T have on-chip series termination resistors lower noise clock signals. QS52805T QS52806T series resistor versions recommended driving unterminated lines with capacitive loading other noise sensitive clock distribution circuits. These clock buffer products designed high-performance workstations, embedded personal computing systems. Several devices used parallel scattered throughout system guaranteed skew, system-wide clock distribution networks.
Figure Functional Block Diagram
more information Application Note AN-21A more information low-skew clock buffers.
QS5805T, QS52805T
OA5-OA1 OB5-OB1
QS5806T, QS52806T
OA5-OA1 OB5-OB1
Note: QS52805T QS52806T devices have series termination resistors each clock output including monitor.
MDSL-00058-04 NOVEMBER 1997
QUALITY SEMICONDUCTOR, INC.
QS5805T, QS52805T, QS5806T, QS52806T Figure Configurations (All Pins View)
QS5805T, QS52805T QSOP, SOIC
VCCA GNDA GNDQ VCCB GNDB
QS5806T, QS52806T QSOP, SOIC
VCCA GNDA GNDQ VCCB GNDB
Table Descriptions
Name OEA, INA, OAn, OBn, OAn, MON, Description Output Enable Inputs Clock Inputs Clock Outputs Unbuffered Monitor Output
Table Absolute Maximum Ratings
Supply Voltage Ground -0.5V +7.0V Output Voltage VOUT -0.5V +7.0V Input Voltage -0.5V +7.0V Input Voltage (for pulse width 20ns) -3.0V Input Diode Current with -20mA Output Current Max. Sink Current/Pin 120mA Maximum Power Dissipation watts TSTG Storage Temperature -65° +150°C
Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS cause permanent damage devices that result functional reliability type failures.
Table Capacitance
25°C, 1MHz, VOUT QSOP Pins Pins SOIC Unit
Note: Capacitance characterized tested.
QUALITY SEMICONDUCTOR, INC.
MDSL-00058-04 NOVEMBER 1997
QS5805T, QS52805T, QS5806T, QS52806T Table Electrical Characteristics Over Operating Range
Industrial: -40°C 85°C, 5.0V Symbol ROUT Parameter Input HIGH Voltage Input Voltage Clamp Diode Voltage Output HIGH Voltage QS5805T/5806T Output HIGH Voltage QS52805T/52806T Output Voltage QS5805/5806T Output Voltage QS52805/52806T Input Leakage Current Output Leakage Current Short Circuit Current(2,3) Input Hysteresis Output Resistance QS52805/52806T
Military: -55°C 125°C, 5.0V Typ(1) -0.7 Unit -1.2 0.55 0.55 0.50 0.50
Test Conditions Guaranteed Logic HIGH Inputs Guaranteed Logic Inputs Min., -18mA Min., Min., Min., Min., -24mA (IND) -12mA (MIL) -8mA (IND) -4mA (MIL) 64mA (IND) 48mA (MIL) 12mA (IND) (MIL)
Max., VCC, Max., VOUT VCC, VOUT Max., VOUT VTLH VTHL Inputs Min., 12mA
Notes: Typical values indicate 5.0V 25°C. more than output should used test this high power condition duration second. Guaranteed design tested.
MDSL-00058-04 NOVEMBER 1997
QUALITY SEMICONDUCTOR, INC.
QS5805T, QS52805T, QS5806T, QS52806T Table Power Supply Characteristics
Symbol Parameter ICCD Quiescent Power Supply Current Supply Current Input HIGH Test Conditions(1) Max.,VIN Max., 3.4V, 0MHz Typ(3) 14.0 15.0 10.0 Unit
Dynamic Power Supply(2) Max., Current Output Outputs enabled, duty cycle Total Power Supply(2,4) Current Examples Max., duty cycle, 10MHz outputs toggling Max., duty cycle, 2.5MHz outputs toggling 3.4V 3.4V
Notes: conditions shown Min. Max., appropriate values specified under specifications. Guaranteed tested. Typical values reference only. Conditions 5.0V 25°C. (ICC)(DH)(NT) ICCD (fO)(NO) where: Input duty cycle Number HIGH inputs (one two) Output frequency Number outputs
QUALITY SEMICONDUCTOR, INC.
MDSL-00058-04 NOVEMBER 1997
QS5805T, QS52805T, QS5806T, QS52806T Figure Skew Characteristics Over Operating Range
Industrial: -40°C 85°C, 5.0V Military: -55°C 125°C, 5.0V QS5805T, QS5806T CLOAD 50pF, RLOAD 500. QS52805T, QS52806T CLOAD 50pF resistor). 5805T 5806T 52805T 52806T Symbol tSK(O1) tSK(O2) tSK(p) Description(1,2) Skew between outputs same transition, same bank 5805AT 5806AT 52805AT 52806AT 0.35 5805BT 5806BT
Unit
Skew between outputs same transition, different banks Pulse Skew: Opposite transition skew, same output (tPHL-tPLH) QS5805/52805 Pulse Skew: Opposite transition skew, same output (tPHL-tPLH) QS5806/52806 Part part skew(3)
tSK(p)
tSK(t)
Notes: Skew parameters guaranteed across temperature range, production tested. Skew parameters apply propagation delays only. Test Circuit Waveforms. tSK(t) only applies devices same transition, same part type, same temperature, power supply voltage, loading, package speed grade.
MDSL-00058-04 NOVEMBER 1997
QUALITY SEMICONDUCTOR, INC.
QS5805T, QS52805T, QS5806T, QS52806T Figure Switching Characteristics Over Operating Range
Industrial: -40°C 85°C, 5.0V Military: -55°C 125°C, 5.0V QS5805T, QS5806T CLOAD 50pF, RLOAD 500. QS52805T, QS52806T CLOAD 50pF resistor). 5805T 5806T 52805T 52806T Symbol tPLH tPHL tPZL tPZH tPLZ tPZH Description(1) Propagation Delay(2) Output Enable Time Output Disable Time(3) 5805AT 5806AT 52805AT 52806AT 5805BT 5806BT
Unit
Notes: Test Circuit Waveforms. Minimums guaranteed tested. propagation delay range indicated Min. Max. specifications results from process environmental variables. These propagation delay limits imply skew. Guaranteed tested.
QUALITY SEMICONDUCTOR, INC.
MDSL-00058-04 NOVEMBER 1997

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