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Devices August 1999, ver. 1.02 Introduction MAX® device
Top Searches for this datasheetIn-System Programmability Devices August 1999, ver. 1.02 Introduction MAX® devices programmable logic devices (PLDs), based Altera® Multiple Array MatriX (MAX) architecture that supports IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface. devices also in-system programmable, which adds programming flexibility provides benefits many phases product development, manufacturing, field use. This application note provides background information in-system programmability (ISP) IEEE Std. 1149.1 JTAG interface discusses advantages using ISP-capable devices. In-system design, prototyping, manufacturing, reduces cost, shortens development time, provides wider range programming options than standard device programming methods. With ISP, can: Features Benefits Program reprogram devices after they soldered onto printed circuit board (PCB), minimizing possibility lead damage electrostatic discharge (ESD) exposure. Manufacture systems before finalize device configuration. Perform boundary-scan test (BST) procedures program devices using in-circuit testers. Upgrade systems field after they have been shipped. Altera Corporation A-AN-095-01.02 In-System Programmability Devices Table describes features benefits using ISP-capable devices. Table ISP-Capable Device Features Benefits Product Development Phase Device prototyping Features Benefits Devices programmed with VCC-level Eliminates need 12.0-V programming voltage. programming voltage possibility accidental damage lower voltage parts. Also reduces system power requirements. Devices programmed while soldered PCB. Prototype systems assembled before device configuration finalized. Minimizes device handling, thereby protecting devices from lead damage. Cuts prototype development time saves development costs. Simplifies manufacturing, saves time, protects devices from lead damage. System manufacturing PLDs treated same other board-level devices because they programmed after assembled. implemented using IEEE Std. 1149.1 (JTAG) interface; therefore, circuit testing device programming combined into single manufacturing step using standard in-circuit tester. Programming data downloaded from in-circuit testers, PCs, workstations during final test. Devices programmed with test configurations. In-field programming Enhances design debugging boardlevel testing capabilities. Devices reprogrammed field. Adds versatility reduces service costs, thereby making products more attractive consumer. VCC-Level Programming ISP-capable devices support through VCC-level programming voltage. devices generate 12.0-V programming voltage internally program, verify, erase device's EEPROM cells, eliminating need external 12.0-V programming voltage typically required programming. ISP-capable devices guaranteed erase programming cycles with 100% programming functional yields. Altera Corporation In-System Programmability Devices Programming Systems Altera devices, implemented using IEEE Std.1149.1 JTAG interface, which streamlines testing device programming operations into single manufacturing step. ISP-capable devices supported following systems: MAX+PLUS development system In-circuit testers Embedded processors MAX+PLUS Development System UNIX workstation, MAX+PLUS Programmer, BitBlasterserial ByteBlasterMVparallel port download cable download Programmer Object Files (.pof), Files (.jam), JamByte-Code Files (.jbc)from MAX+PLUS software ISPcapable devices mounted PCB. This method more costeffective than other programming methods because design, simulation, prototyping performed using same UNIX workstation-based system. production, implement using Altera's free stand-alone programming software BitBlasterMV cable download POFs. PC-based stand-alone programming software, asap2.exe, available from Altera's site ftp.altera.com \pub\misc directory. Figure shows 10-pin female plug dimensions BitBlaster ByteBlaster download cable. Altera Corporation In-System Programmability Devices Figure 10-Pin Female Plug Dimensions Dimensions shown inches. spacing between centers inch. 0.425 Typ. Color Strip 0.250 Typ. 0.100 0.700 Typ. 0.025 Table identifies 10-pin female plug's names corresponding download mode. Table Female Plug's Names Download Modes JTAG Mode Signal Name Mode Signal Name DCLK CONFIG_DONE nCONFIG nSTATUS DATA0 Description Clock signal Signal ground Data from device Power supply JTAG state machine control connect connect connect Data device Signal ground Description Clock signal Signal ground Configuration control Power supply Configuration control connect Configuration status connect Data device Signal ground circuit board must supply ground ByteBlaster cable. Altera Corporation In-System Programmability Devices ISP-capable devices programmed device's JTAG pins: TCK, TMS, TDI, TDO. Figure shows BitBlaster ByteBlaster download cable interfaces with ISP-capable device. pins tri-stated during in-system programming. Figure ISP-Capable Device Programming with BitBlaster ByteBlaster Download Cable Target Altera Device 10-Pin Male Header (Top View) Search "Programming Single Device with BitBlaster ByteBlaster" MAX+PLUS Help, BitBlaster Serial Download Cable Data Sheet ByteBlaster Parallel Port Download Cable Data Sheet this handbook more information. In-Circuit Test Programming program ISP-capable devices during final testing stage using in-circuit testers IEEE Std. 1149.1 (JTAG) interface. program device using in-circuit testers, create File with MAX+PLUS software download this file from in-circuit test station more ISP-capable devices. Product Information Bulletin (Jam Programming Test Language Overview) Programming Test Language Specification, version this handbook more information Files. Altera Corporation In-System Programmability Devices Embedded Processor Programming program ISP-capable devices in-system using embedded processor. example, programming information stored EPROM shifted into ISP-capable device using 4-bit interface from processor device's JTAG pins. This method lets program devices during burn-in upgrade devices field. program devices with embedded processor creating File from MAX+PLUS software downloading with Player. Application Note (Using Language Embedded Processor) more information embedded processor programming. Product Information Bulletin (Jam Programming Test Language Overview) Programming Test Language Specification, version this handbook more information Player. device JTAG pins functions described Table IEEE Std. 1149.1 Interface Table JTAG Pins Description Test data input Function Serial input data instructions, which shifted rising edge TCK. This signal needs externally pulled high during normal operation. Serial data output instructions data. Data shifted falling edge TCK. This signal tri-stated data being shifted device. Test data output Test mode select Input controls IEEE Std. 1149.1 JTAG state machine evaluated rising edge TCK. This signal needs externally pulled high during normal operation. Test clock Provides clock signal JTAG circuits. maximum operating frequency MHz. This signal needs externally pulled during normal operation. Altera Corporation In-System Programmability Devices During erasure, programming, verification, device pins tri-stated eliminate interference from other devices PCB. Devices programmed applying appropriate signals inputs shifting data into devices pins, respectively. After programming, IEEE Std. 1149.1 JTAG Test Access Port (TAP) controller state machine must advanced RESET state, which maintained external pull-up resistors TCK, TMS, pins. During normal operation, pull-up resistors prevent device from entering other modes. Figure shows timing waveforms IEEE Std. 1149.1 JTAG controller state machine. Figure JTAG Waveforms Devices tJCP tJCH tJCL tJPSU tJPH tJPZX tJPCO tJPXZ tJSSU tJSH Signal Captured Signal Driven tJSZX tJSCO tJSXZ Altera Corporation In-System Programmability Devices Table shows JTAG timing parameters values ISP-capable devices. Table JTAG Timing Parameters Values Devices Symbol tJCP tJCH tJCL tJPSU tJPH tJPCO tJPZX tJPXZ tJSSU tJSH tJSCO tJSZX tJSXZ clock period clock high time clock time JTAG port setup time JTAG port hold time JTAG port clock output JTAG port high impedance valid output JTAG port valid output high impedance Capture register setup time Capture register hold time Update register clock output Update register high impedance valid output Update register valid output high impedance Parameter Unit Programming ISP-Capable Devices Application Note (IEEE Std.1149.1 (JTAG) Boundary-Scan Testing Altera Devices) information IEEE Std.1149.1 JTAG controller state machine. IEEE Std.1149.1 JTAG-compatible header program single device chain devices, depending layout your PCB. Single-Device Programming PCBs that contain single ISP-capable device, JTAG-compatible header-such 10-pin BitBlaster ByteBlaster header-can used program device. Figure Altera Corporation In-System Programmability Devices Figure Single-Device Programming Target Device IEEE Std. 1149.1 JTAG Interface JTAG-Chain Device Programming When programming chain devices, JTAG-compatible plug, such BitBlaster ByteBlaster 10-pin male plug, connected several devices. number devices JTAG chain limited only drive capability BitBlaster ByteBlaster download cable. However, when three more devices connected JTAG chain, Altera recommends buffering TDO,TCK, TDI, pins. JTAG-chain device programming ideal when circuit board contains multiple devices, when circuit board tested using JTAG BST. Figure Altera Corporation In-System Programmability Devices Figure JTAG-Chain Device Programming with BitBlaster ByteBlaster Cable ByteBlaster 10-Pin Male Header Other IEEE Std. 1149.1 JTAGCompliant Device Target Altera Device Other IEEE Std. 1149.1 JTAGCompliant Device program single ISP-capable device JTAG chain, programming software puts other devices JTAG chain BYPASS mode. When BYPASS mode, devices pass programming data from through single bypass register. Bypassed devices affected internally, thereby enabling programming software erase, program, verify target device. Conclusion Application Note (IEEE 1149.1 (JTAG) Boundary-Scan Testing Altera Devices) more information BYPASS mode. ISP-capable devices offer benefits product design, prototyping, manufacturing. simplifies manufacturing flow allowing devices mounted with standard pick-and-place equipment before they programmed. ISP-capable devices programmed downloading information in-circuit testers, embedded processors, BitBlaster ByteBlaster download cables. addition, programming these devices after they placed board eliminates lead damage high pin-count packages, e.g., quad flat pack (QFP) packages, device handling. These devices also reprogrammed field (i.e., product upgrades performed field software modem). Altera Corporation In-System Programmability Devices Revision History information contained Application Note (In-System Programmability Devices) version 1.02 supersedes information published previous versions. Version 1.02 Changes Application Note (In-System Programmability Devices) version 1.02 contains following changes: Corrected information Table Corrected Figure Version 1.01 Changes Application Note (In-System Programmability Devices) version 1.01 contained following changes: Corrected information number devices connected JTAG chain "JTAG-Chain Device Programming" page Made minor illustrative, textual, style changes. 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Altera warrants performance semiconductor products current specifications accordance with Altera's standard warranty, reserves right make changes products services time without notice. Altera assumes responsibility liability arising application information, product, service described herein except expressly agreed writing Altera Corporation. Altera customers advised obtain latest version device specifications before relying published information before placing orders products services. Copyright 1999 Altera Corporation. rights reserved. Printed Recycled Paper. 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