AMERICAN MICROSYSTEMS, June, 1998 Preliminary micron CMOS Double

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AMERICAN MICROSYSTEMS, June, 1998 Preliminary micron CMOS Double

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ADC16S06
AMERICAN MICROSYSTEMS,
June, 1998 Preliminary micron CMOS Double Poly
ADC16S06 16-Bit Sigma-Delta
FUNCTIONAL BLOCK DIAGRAM
AVDD (power) AVSS (ground)
AVDD AVSS DVSS DVDD
IBIAS (bias current input) REFP (Positive reference voltage input) REFN (Negative reference voltage input) VAGND (Midway between AVDD AVSS) (analog input positive) (analog input negative) (clock input) D[15:0] (digital output)
Clock Genereator Decimation Filter Modulator
D(15:0)
VAGND REFP REFN IBIAS
FEATURES
Scaleable consisting third order sigma-delta modulator decimation filter. Clock rate 5.12MHZ Scaleable altering decimation ratio. Trading resolution sample rate. Operation over industrial temperature range -40o 85oC.
APPLICATIONS
Measurement circuits Audio processing Process control Digitizing low-frequency signals Sensors
GENERAL DESCRIPTION
ADC16S06 fully differential sigma delta Analog Digital converter. part operates from single +4.5 +5.5 supply. converter capable word rates KSPS bits. ADC16S06 scaled operate faster word rate fewer bits accuracy.
PRODUCT HIGHLIGHTS Single supply operation. This converter operates from single +4.5 +5.5 supply. Decimation filter included.
ADC16S06
AMERICAN MICROSYSTEMS,
June, 1998 Preliminary micron CMOS Double Poly
Parameter-Oversampling Ratio CLOCK INPUT WORD RATE RESOLUTION INPUT REFERRED NOISE (TYP) VREF=1.25v VREF=1.25v ACCURACY Integral Nonlinearity (INL) Differential Nonlinearity (DNL) Missing Codes Offset Offset Stability Gain Gain Stability TEMPERATURE DRIFT Offset Error Gain Error POWER SUPPLY REJECTION COMMON MODE REJECTION ANALOG INPUT Input Span VREF=1.25v Input (VINA VINB) Range Input Capacitance REFERENCE INPUT RESISTANCE POWER SUPPLIES Supply Voltages AVDD DVDD Supply Current IAVDD IDVDD POWER CONSUMPTION Vpeak 5.12 5.12 5.12 5.12 Units Bits Bits Guaranteed
ppm/°C ppm/°C
Diff. Diff.
ADC16S06
AMERICAN MICROSYSTEMS,
June, 1998 Preliminary micron CMOS Double Poly
Parameter-Oversampling Ratio DYNAMIC PERFORMANCE INPUT TEST FREQUENCY: (typ) Signal-to-Noise Ratio (SNR) Input Amplitude dBFS Input Amplitude dBFS Distortion (SINAD) Input Amplitude dBFS Input Amplitude dBFS Total Harmonic Distortion (THD) Input Amplitude dBFS Input Amplitude dBFS Spurious Free Dynamic Range (SFDR) Input Amplitude dBFS Input Amplitude dBFS INPUT TEST FREQUENCY: (typ) Signal-to-Noise Ratio (SNR) Input Amplitude dBFS Input Amplitude dBFS Distortion (SINAD) Input Amplitude dBFS Input Amplitude dBFS Total Harmonic Distortion (THD) Input Amplitude dBFS Input Amplitude dBFS Spurious Free Dynamic Range (SFDR) Input Amplitude dBFS Input Amplitude dBFS DYNAMIC CHARACTERISTICS Full Power Bandwidth Small Signal Bandwidth Units
ADC16S06
AMERICAN MICROSYSTEMS,
June, 1998 Preliminary micron CMOS Double Poly
Absolute Maximum Ratings Supply Voltage (Vdd) Analog-to-Digital Supply Voltage Differential Analog Input Voltage Digital Input Voltage Reference Input Voltage (+VREF VREF) Differential Reference Voltage Reference Midpoint Current Digital Output Current Storage Temperature Range Junction Temperature Lead Soldering Temperature sec.) Units

AMERICAN MICROSYSTEMS, June, 1998 Preliminary micron CMOS Double

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