8-megabit (512K 1024K EPROM AT27C800 Recommended Designs Des

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8-megabit (512K 1024K EPROM AT27C800 Recommended Designs Des

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Read Access Time Word-wide Byte-wide Configurable 8-megabit Flash Mask Compatible Low-power CMOS Operation Maximum Standby Maximum Active Wide Selection JEDEC Standard Packages 42-pin PDIP 44-lead PLCC 44-lead SOIC (SOP) 48-lead TSOP Power Supply High-reliability CMOS Technology 2,000 Protection Latch-up Immunity RapidProgramming Algorithm µs/Word (Typical) CMOS- TTL-compatible Inputs Outputs Integrated Product Identification Code Commercial Industrial Temperature Ranges
8-megabit (512K 1024K EPROM AT27C800
Recommended Designs
Description
AT27C800 low-power, high-performance, 8,388,608-bit, UV-erasable, programmable read-only memory (EPROM) organized either 512K 1024K (continued)
Configurations
Name O15/A-1 BYTE/VPP Function Addresses Outputs
PDIP View
BYTE/VPP O15/A-1
SOIC (SOP)
BYTE/VPP O15/A-1
Output/Address Byte Mode/ Program Supply Chip Enable Output Enable Connect TSOP Type
PLCC View
BYTE/VPP O15/A-1
Note: PLCC Package DON'T CONNECT.
BYTE/VPP O15/A-1
Rev. 0801C-05/00
bits. requires single power supply normal read mode operation. word accessed less than eliminating need speed-reducing WAIT states. organization makes this part ideal highperformance 32-bit microprocessor systems. AT27C800 organized either word-wide byte-wide. organization selected BYTE/VPP pin. When BYTE/VPP asserted high (VIH), word-wide organization selected O15/A-1 used data output. When BYTE/VPP asserted (VIL), byte-wide organization selected O15/A-1 used address A-1. When AT27C800 logically regarded (word-wide), read bytewide mode, then with lower eight bits 16-bit word selected; with upper eight bits 16-bit word selected. read mode, AT27C800 typically consumes Standby mode supply current typically less than AT27C800 available industry-standard, JEDECapproved, one-time programmable (OTP) PLCC, PDIP, SOIC (SOP) TSOP, well UV-erasable windowed Cerdip packages. device features two-line control (CE,OE) eliminate contention high-speed systems. With high-density 512K-word 1024K-bit storage capability, AT27C800 allows firmware stored reliably accessed system without delays mass storage media.
Atmel's AT27C800 additional features that ensure high quality efficient production use. RapidProgramming Algorithm reduces time required program part guarantees reliable programming. Programming time typically only µs/word. Integrated Product Identification Code electronically identifies device manufacturer. This feature used industry-standard programming equipment select proper programming equipment voltages.
System Considerations
Switching between active standby conditions Chip Enable produce transient voltage excursions. Unless accommodated system design, these transients exceed datasheet limits, resulting device non-conformance. minimum, high-frequency, inherent inductance, ceramic capacitor should utilized each device. This capacitor should connected between Ground terminals device, close device possible. Additionally, stabilize supply voltage level printed circuit boards with large EPROM arrays, bulk electrolytic capacitor should utilized, again connected between Ground terminals. This capacitor should positioned close possible point where power supply connected array.
Block Diagram
AT27C800
AT27C800
Absolute Maximum Ratings*
Temperature under Bias -55°C +125°C Storage Temperature -65°C +150°C Voltage with with Respect Ground .-2.0V +7.0V(1) Voltage with Respect Ground .-2.0V +14.0V(1) Supply Voltage with Respect Ground .-2.0V +14.0V(1) Note: Minimum voltage -0.6V which undershoot -2.0V pulses less than Maximum output voltage 0.75V which overshoot 7.0V pulses less than *NOTICE: Stresses beyond those listed under "Absolute Maximum Ratings" cause permanent damage device. This stress rating only functional operation device these other conditions beyond those indicated operational sections this specification implied. Exposure absolute maximum rating conditions extended periods affect device reliability.
Operating Modes
Outputs Mode\Pin Read Word-wide Read Byte-wide Upper Read Byte-wide Lower Output Disable Standby Rapid Program(2) Verify Inhibit Product Identification Notes:
X(1)
X(1)
BYTE/VPP X(5)
DOUT DOUT DOUT
DOUT High-Z High-Z High-Z High-Z DOUT High-Z
O15/A-1 DOUT
X(1)
VH(3)
Identification Code
VIH. Refer programming characteristics tables this datasheet. 12.0 0.5V. identifier words selected. inputs held (VIL) except which which toggled (VIL) select Manufacturer's Identification word high (VIH) select Device Code word. Standby current (ISB) specified with will cause slight increase
Operating Conditions Read Operation
AT27C800 Com. Operating Temperature (Case) Ind. Power Supply -40°C 85°C -40°C 85°C -40°C 85°C 70°C 70°C 70°C
Operating Characteristics Read Operation
Symbol IPP1(2) Parameter Input Load Current Output Leakage Current VPP(1) Read/Standby Current VCC(1) Standby Current Active Current Notes: Input Voltage Input High Voltage Output Voltage Output High Voltage IOL= -400 Condition VOUT ISB1 (CMOS), VCC=± 0.3V ISB2 (TTL), 0.5V MHz, IOUT -0.6 ±1.0 ±5.0 Units
must applied simultaneously before VPP, removed simultaneously after VPP. connected directly except during programming. supply current would then IPP.
Characteristics Read Operation
AT27C800 Symbol tACC(3)
(2,3)
Units
Parameter Address Output Delay Output Delay Output Delay High Output Float, whichever occured first Output Hold from Address whichever occured first BYTE High Output Valid BYTE Output Transition
Condition
tDF(4,5) tOH(4) tSTD Note:
2,3,4,5. Waveforms Read Operation diagram.
AT27C800
AT27C800
Byte-wide Read Mode Waveforms(1)
Note:
BYTE/VPP
Byte-wide Read Mode Waveforms(1)
Note:
BYTE/VPP
BYTE Transition Waveforms
VALID VALID
BYTE/VPP
tACC
DATA
DATA
HI-Z
DATA
tSTD
Notes: Timing measurement references 0.8V 2.0V. Input drive levels 0.45V 2.4V, unless otherwise specified. delayed after falling edge without impact tCE. delayed tACC after address valid without impact tACC. This parameter only sampled 100% tested. Output float defined point when data longer driven.
Input Test Waveforms Measurement Levels
Output Test Load
(10% 90%) Note: including capacitance.
Capacitance
MHz, 25°C(1)
Symbol COUT Note: Units Conditions VOUT
Typical values nominal supply voltage. This parameter only sampled 100% tested.
AT27C800
AT27C800
Programming Waveforms(1)
Notes:
Input Timing reference 0.8V 2.0V VIH. tDFP characteristics device must accommodated programmer. When programming AT27C800, capacitor required across ground suppress voltage transients.
Programming Characteristics
5°C, 0.25V, 13.0 0.25V
Limits Symbol ICC2 IPP2 Parameter Input Load Current Input Level Input High Level Output Voltage Output High Voltage Supply Current (Program Verify) Supply Current Product Identification Voltage 11.5 -400 12.5 Test Conditions VIL, -0.6 Units
Programming Characteristics
5°C, 0.25V, 13.0 0.25V
Limits Symbol tOES tDFP tVPS tVCS tPRT Notes: Parameter Address Setup Time Setup Time Data Setup Time Address Hold Time Data Hold Time High Output Float Delay Setup Time Setup Time Program Pulse Width Data Valid from BYTE /VPP Pulse Rise Time During Programming Output Timing Reference Level: 0.8V 2.0V
Test Conditions
Units
Input Rise Fall Times: (10% 90%) Input Pulse Levels: 0.45V 2.4V Input Pulse Levels: 0.8V 2.0V Input Timing Reference Level: 0.8V 2.0V
47.5 52.5
must applied simultaneously before removed simultaneously after VPP. This parameter only sampled 100% tested. Output Float defined point where data longer driven- timing diagram. Program Pulse width tolerance
Atmel's 27C800 Integrated Product Identification Code
Pins Codes Manufacturer Device Type Data 1E1E F8F8
AT27C800
AT27C800
Rapid Programming Algorithm
pulse width used program. address first location. raised 6.5V BYTE/VPP raised 13.0V. Each address first programmed with pulse without verification. Then verification/reprogramming loop executed each address. event word fails pass verification, successive pulses applied with verification after each pulse. word fails verify after pulses have been applied, part considered failed. After word verifies properly, next address selected until have been checked. then lowered 5.0V 5.0V. words read again compared with original data determine device passes fails.
Ordering Information
tACC (ns) (mA) Active Standby Ordering Code AT27C800-10JC AT27C800-10PC AT27C800-10RC AT27C800-10TC AT27C800-10JI AT27C800-10PI AT27C800-10RI AT27C800-10TI AT27C800-12JC AT27C800-12PC AT27C800-12RC AT27C800-12TC AT27C800-12JI AT27C800-12PI AT27C800-12RI AT27C800-12TI AT27C800-15JC AT27C800-15PC AT27C800-15RC AT27C800-15TC AT27C800-15JI AT27C800-15PI AT27C800-15RI AT27C800-15TI Package 42P6 42P6 42P6 42P6 42P6 42P6 Operation Range Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Commercial (0°C 70°C)
Industrial (-40°C 85°C)
Package Type 42P6 44-lead, Plastic J-leaded Chip Carrier (PLCC) 42-pin, 0.600" Wide, Plastic Dual Inline Package (PDIP) 44-lead, 0.525" Wide, Plastic Gull Wing Small Outline Package (SOIC/SOP) 48-lead, Plastic Thin Small Outline Package (TSOP)
AT27C800
AT27C800
Packaging Information
44J, 44-lead, Plastic J-leaded Chip Carrier (PLCC) Dimensions Inches (Millimeters) 42P6, 42-pin, 0.600" Wide, Plastic Dual Inline Package (PDIP) Dimensions Inches (Millimeters)
.045(1.14)
IDENTIFY
.045(1.14)
.012(.305) .008(.203)
.656(16.7) .650(16.5) .032(.813) .026(.660) .695(17.7) .685(17.4)
.630(16.0) .590(15.0) .021(.533) .013(.330)
.050(1.27) .500(12.7)
.043(1.09) .020(.508) .120(3.05) .090(2.29) .180(4.57) .165(4.19)
.022(.559) (3X)
44R, 44-lead, 0.525" Wide, Plastic Gull Wing Small Outline (SOIC) Dimensions Inches (Millimeters)
48T, 48-lead, Plastic Thin Small Outline Package (TSOP) Dimensions Millimeters (Inches)*
JEDEC OUTLINE MO-142
*Controlling dimension: millimeters
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0801C-05/00/xM
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