RELIABILITY REPORT MAX4214EUK PLASTIC ENCAPSULATED DEVICES 2003

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RELIABILITY REPORT MAX4214EUK PLASTIC ENCAPSULATED DEVICES 2003

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MAX4214EUK Rev.
RELIABILITY REPORT MAX4214EUK PLASTIC ENCAPSULATED DEVICES
2003
MAXIM INTEGRATED PRODUCTS GABRIEL SUNNYVALE, 94086
Written
Reviewed
Pedicord Quality Assurance Reliability Manager
Bryan Preeshl Quality Assurance Executive Director
Conclusion MAX4214 successfully meets quality reliability standards required Maxim products. addition, Maxim's continuous reliability monitoring program ensures that outgoing product will continue meet Maxim's quality reliability standards. Table Contents .Device Description .Manufacturing Information III. .Packaging Information .Die Information .Quality Assurance Information .Reliability Evaluation .Attachments
Device Description General MAX4214 precision, closed-loop, gain buffer featuring high slew rates, high output current drive, differential gain phase error. operates with single +3.15V +11V supply with ±1.575V ±5.5V dual supplies. input common-mode voltage range extends 100mV beyond negative power-supply rail, output swings Rail-to-Rail This devices requires only 5.5mA quiescent supply current while achieving 230MHz -3dB bandwidth 600V/µs slew rate. Input voltage noise only 10nV/Hz, input current noise only 1.3pA/Hz. This buffer ideal low-power/low-voltage applications requiring wide bandwidth, such video, communications, instrumentation systems.
Absolute Maximum Ratings Item Supply Voltage (VCC VEE) IN_-, IN_+, OUT_, Output Short-Circuit Duration Operating Temperature Range Storage Temperature Range Lead Temperature (soldering, 10s) Continuous Power Dissipation 5-Lead SOT23 Derates above +70°C 5-Lead SOT23 Rating (VEE 0.3V) (VCC 0.3V) Continuous -40°C +85°C -65°C +150°C +300°C 571mW 7.1mW/°C
Manufacturing Information Description/Function: High-Speed, Single-Supply, Gain Closed-Loop, Rail-to-Rail Buffer with Enable Process: Number Device Transistors: Fabrication Location: Assembly Location: Date Initial Production: (Complementary Bipolar Process) Oregon, Malaysia Thailand December, 1997
III. Packaging Information Package Type: Lead Frame: Lead Finish: Attach: Bondwire: Mold Material: Assembly Diagram: Flammability Rating: Classification Moisture Sensitivity JEDEC standard JESD22-A112: Lead SOT-23 Copper Solder Plate Silver-filled Epoxy Gold dia.) Epoxy with silica filler 05-3001-0040 Class UL94-V0
Level
Information Dimensions: Passivation: Interconnect: Backside Metallization: Minimum Metal Width: Minimum Metal Spacing: Bondpad Dimensions: Isolation Dielectric: Separation Method: mils Si3N4/SiO2 (Silicon nitride/ Silicon dioxide) Gold None microns drawn) microns drawn) mil. SiO2 Wafer
Quality Assurance Information Quality Assurance Contacts: Pedicord (Manager, Reliability Operations Bryan Preeshl (Executive Director Kenneth Huening (Vice President) Outgoing Inspection Level: 0.1% electrical parameters guaranteed Datasheet. 0.1% Visual Defects. Observed Outgoing Defect Rate: Sampling Plan: Mil-Std-105D Reliability Evaluation Accelerated Life Test results 135°C biased (static) life test shown Table Using these results, Failure Rate calculated follows: MTTF 1.83 4389 (Chi square value MTTF upper limit)
Thermal acceleration factor assuming 0.8eV activation energy 3.39 10-9 3.39 F.I.T. (60% confidence level 25°C)
This failure rate represents data collected from Maxim's reliability qualification monitor programs. Maxim also performs weekly Burn-In samples from production assure reliability processes. reliability required lots which receive burn-in qualification F.I.T. confidence level, which equates failures piece sample. Maxim performs failure analysis lots exceeding this level. following Burn-In Schematic (Spec. 06-5215) shows static circuit used this test. Maxim also performs 1000 hour life test monitors quarterly each process. This data published Product Reliability Report (RR-1M). Moisture Resistance Tests Maxim evaluates pressure stress from every assembly process during qualification each design. Pressure testing must pass LTPD acceptance. Additionally, industry standard 85°C/85%RH HAST tests performed quarterly device/package family. E.S.D. Latch-Up Testing OP05-1 type been found have pins able withstand transient pulse ±2000V, Mil-Std-883 Method 3015 (reference attached Test Circuit). Latch-Up testing shown that this device withstands current ±250mA.
Table Reliability Evaluation Test Results MAX4214EUK
TEST ITEM TEST CONDITION FAILURE IDENTIFICATION SAMPLE SIZE NUMBER FAILURES
Static Life Test (Note 135°C Biased Time hrs. Moisture Testing (Note Pressure 121°C psi. 100% Time 168hrs. 85°C Biased Time 1000hrs.
Parameters functionality
Parameters functionality
85/85
Parameters functionality
Mechanical Stress (Note Temperature Cycle -65°C/150°C 1000 Cycles Method 1010 Parameters functionality
Note Life Test Data represent plastic D.I.P. qualification lots. Note Generic Package/Process data
Attachment TABLE combination tested.
Terminal (Each individually connected terminal with other floating) pins except VPS1 input output pins
Terminal (The common combination like-named pins connected terminal VPS1 pins other input-output pins
Table restated narrative form below. connects tested. Repeat combination each named Power supply ground (e.g., where VPS1 VDD, VCC, VSS, VBB, GND, +VS, -VS, VREF, etc). combinations tested. Each individually connected terminal with respect device ground pin(s) connected terminal pins except being tested ground pin(s) shall open. Each individually connected terminal with respect each different combination named power supply pins (e.g., connected terminal pins except being tested power supply pins shall open. Each input each output individually connected terminal with respect combination other input output pins connected terminal pins except input output being tested combination other input output pins shall open.
TERMINAL
TERMINAL REGULATED HIGH VOLTAGE SUPPLY
SOCKET
SHORT CURRENT PROBE (NOTE
TERMINAL
1.5k 100pf
TERMINAL 883D Method 3015.7 Notice
ONCE SOCKET
ONCE BOARD
OHMS OHMS 5VOLTS
MAXIM
0.1uF
0.1uF
OHMS
OHMS
DEVICES: MAX4074/76, 4091,MAX4123/25/31/4166; MAX4412/4414/ 4415; MAX4434/35; MAX4352/4452/4322/4323/4131
MAX. EXPECTED CURRENT 20mA
DRAWN CHRIS JAMBARO NOTES: current 4091 (OX54Z)
DOCUMENT I.D. 06-5215
REVISION
MAXIM TITLE: Circuit (MAX
PAGE

RELIABILITY REPORT MAX4214EUK PLASTIC ENCAPSULATED DEVICES 2003

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