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1997.11.20 Rev.F 4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC


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M5M5V4R01J-12,-15
1997.11.20 Rev.F
4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC
DESCRIPTION M5M5V4R01J family 4194304-word 1-bit static RAMs, fabricated with high performance CMOS silicon gate process designed high speed application. M5M5V4R01J offered 32-pin plastic small outline Jlead package(SOJ). These device operate single 3.3V supply, directly compatible. They include power down feature well. address inputs chip select input CONFIGURATION (TOP VIEW)
FEATURES
M5M5V4R01J-12 12ns(max) M5M5V4R01J-15 15ns(max) power dissipation Active 297mW(typ) Stand 3.3mW(typ) Single +3.3V power supply Fully static operation clocks, refresh Test mode available Easy memory expansion Three-state outputs OR-tie capability prevents data contention Directly compatible inputs outputs Fast access time
(3.3V) (0V)
data inputs write control input address inputs
address inputs output enable input (0V) (3.3V) data outputs address inputs B1/B4 byte control input
M5M5V4R01J
32P0K
Outline
APPLICATION
High-speed memory units
PACKAGE
32pin 400mil
BLOCK DIAGRAM
address inputs
INPUT BUFFERS
MEMORY ARRAY ROWS 8192 COLUMNS
OUTPUT BUFFERS
ADDRESS DECODERS
outputs
data
COLUMN CIRCUITS COLUMN ADDRESS COLUMN ADDRESS DECODERS DECODERS COLUMN INPUT BUFFERS
DATA INPUT BUFFERS
inputs/ (3.3V)
data
B1/B4
address inputs
(0V)
MITSUBISHI ELECTRIC
M5M5V4R01J-12,-15
4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC
FUNCTION
operation mode M5M5V4R01J determined combination device control inputs Each mode summarized function table. write cycle executed whenever level overlaps with level address must set-up before write cycle must stable during entire cycle. data latched into cell trailing edge whichever occurs first, requiring set-up hold time relative these edge maintained. output enable input directly controls output stage. Setting high level, output stage high impedance state, data contention problem write cycle eliminated. read cycle excuted setting high level level while active state (S=L). When setting high level, chip non-selectable mode which both reading writing disable. this mode, output stage high-impedance state, allowing OR-tie with other chips memory expansion Signal-S controls power-down feature. When goes high, power dissapation reduced extremely. access time from equivalent address access time. works with organization 4194304-word bit,when B1/B4 floating. organization 10485 76-word 4bit also obtained reducing test time, when B1/B4 high.
FUNCTION TABLE
Mode selection Write Read High-impedance High-impedance High-impedance High-impedance High-impedance Dout High-impedance Stand Active Active Active
ABSOLUTE MAXIMUM RATINGS
Symbol Parameter Supply voltage Input voltage Output voltage Power dissipation Operating temperature Ta=25 With respect Conditions Ratings -2.0 -2.0 VCC+0.5 -2.0 VCC+0.5 1000
+10%
Unit
Tstg(bias) Storage temperature (bias) Storage temperature
*Pulse width 20ns, case DC:-0.5V
ELECTRICAL CHARACTERISTICS (Ta=0 Vcc=3.3V
Symbol Parameter High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Input current Condition
unless otherwise noted) Limits -0.3 Vcc+0.3 Unit
=-4mA IOL= 0~Vcc (S)= Output current off-state 0~Vcc Active supply current (TTL level) (S)= other inputs Output-open(duty 100%) 12ns cycle 12ns cycle 15ns cycle 15ns cycle
Stand current (TTL level)
(S)= (S)= Vcc0.2V other inputs I0.2V VIVcc-0.2V
Stand current
MITSUBISHI ELECTRIC
M5M5V4R01J-12,-15
4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC
CAPACITANCE (Ta=0 Vcc=3.3V
Symbol Parameter Input capacitance Output capacitance
+10%
unless otherwise noted) Test Condition Limit Unit
=GND, =25mVrms,f=1MHz O=GND, =25mVrms,f=1MHz
Note Direction current flowing into positive mark). Typical value Vcc=5V,Ta=25 CI,CO periodically sampled 100% tested.
ELECTRICAL CHARACTERISTICS (1)MEASUREMENT CONDITION
(Ta=0 Vcc=3.3V
+10%
unless otherwise noted)
Input pulse levels =3.0V, =0.0V Input rise fall time Input timing reference levels =1.5V, IL=1.5V Output timing reference levels OH=1.5V, =1.5V Output loads Fig1 ,Fig2
OUTPUT Z0=50 RL=50 VL=1.5V (including scope JIG)
Fig.1 Output load
Fig.2 Output load
MITSUBISHI ELECTRIC
M5M5V4R01J-12,-15
4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC
(2)READ CYCLE
Limits
Symbol Parameter
M5M5V4R01J
M5M5V4R01J
Unit
ta(S) (OE) tdis(S) tdis (OE) (OE) tv(A)
Read cycle time Address access time Chip select access time Output enable access time Output disable time after high Output disable time after high Output enable time after Output enable time after Data valid time after address change Power-up time after chip selection Power-down time after chip selection
(3)WRITE CYCLE
Limits
Symbol Parameter
M5M5V4R01J
M5M5V4R01J
Unit
tw(W) (A)1 (A)2 trec(W) tdis tdis
(OE)
Write cycle time Write pulse width Address setup time(W) Address setup time(S) Chip select setup time Data setup time Data hold time Write recovery time Output disable time after Output disable time after high Output enable time after high Output enable time after Address High
(OE) tsu(A-WH)
MITSUBISHI ELECTRIC
M5M5V4R01J-12,-15
4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC
(4)TIMING DIAGRAMS Read cycle 0~21
UNKNOWN DATA VALID PREVIOUS DATA VALID
OE=L
Read cycle (Note
ta(S)
(Note
tdis
(Note
UNKNOWN
DATA VALID
ICC1 ICC2 OE=L
Note Addresses valid prior coincident with transition low. Transition measured ±500mv from steady state voltage with specified loading Figure
Read cycle (Note
(OE)
(Note
tdis (OE)
(Note
(OE)
UNKNOWN DATA VALID
Note Addresses valid prior transition (ta(A)-ta(OE)), (ta(S)-ta(OE))
MITSUBISHI ELECTRIC
M5M5V4R01J-12,-15
4194304-BIT (4194304-WORD 1-BIT) CMOS STATIC
Write cycle control mode
0~21
(Note7)
(Note7)
(A-WH)
trec
th(D)
DATA STABLE
tdis(W) (Note tdis(OE)
(OE) (Note
Hi-Z
Write cycle control mode
0~21
trec
tw(W)
(Note7) (Note7)
DATA STABLE
tdis
(Note5)
(Note5)
Hi-Z
(Note8)
Note Hatching indicates state don't care. When falling edge simultaneous prior falling edge output maintained high impedance. en,tdis periodically sampled 100% tested.
MITSUBISHI ELECTRIC

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